JPH0247503A - Wire width measurer - Google Patents

Wire width measurer

Info

Publication number
JPH0247503A
JPH0247503A JP19934588A JP19934588A JPH0247503A JP H0247503 A JPH0247503 A JP H0247503A JP 19934588 A JP19934588 A JP 19934588A JP 19934588 A JP19934588 A JP 19934588A JP H0247503 A JPH0247503 A JP H0247503A
Authority
JP
Japan
Prior art keywords
sample stage
sample
lens
line width
photodetector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19934588A
Other languages
Japanese (ja)
Inventor
Nobuyoshi Yamauchi
信義 山内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Kyushu Ltd
Original Assignee
NEC Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Kyushu Ltd filed Critical NEC Kyushu Ltd
Priority to JP19934588A priority Critical patent/JPH0247503A/en
Publication of JPH0247503A publication Critical patent/JPH0247503A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To prevent the abrasion of a driving part and to improve the precision in measurement by moving a lens or a mirror which is light instead of a heavy sample stage on the occasion of focusing. CONSTITUTION:The image of a sample 5 on a sample stage 4 is formed on a photodetector 1 by using an objective lens 3 and an eyepiece 2. The focusing on the occasion is executed by moving the eyepiece 2 in relation to the photodetector 1 by a driving device 6a, instead of moving the sample stage 4, and by varying thereby an optical path. The objective lens 3 may be moved instead of moving the eyepiece 2. Since a part moved is the lens 2 or 3 being lighter in weight than the sample stage 4, the abrasion of a gear or the like caused by the weight of the sample stage 4 is lessened.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半導体装置製造用の線幅測定器に関し、特に、
光学的なコントラストの差異を光検知器で検出し試料の
線幅を測定する線幅測定器に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a line width measuring device for semiconductor device manufacturing, and in particular,
This invention relates to a line width measuring device that measures the line width of a sample by detecting differences in optical contrast using a photodetector.

〔従来の技術〕[Conventional technology]

従来、この種の線幅測定器は第3図に示すように、基本
的には試料台4上の試料5の像を、対物レンズ3、接眼
レンズ2を用いて光検知器1に結像させており、その際
の焦点合わせは駆動装置6bにて試料台4を上下させ試
料5と対物レンズ3の間の距離を変化させて行っていた
Conventionally, this type of line width measuring instrument basically focuses an image of a sample 5 on a sample stage 4 onto a photodetector 1 using an objective lens 3 and an eyepiece 2, as shown in FIG. Focusing at this time was performed by moving the sample stage 4 up and down using the drive device 6b and changing the distance between the sample 5 and the objective lens 3.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

前述した従来の線幅測定器は、試料台4を機械的に人力
又はモーターによって、歯車等の組み合わせで上下させ
ていたが、試料台4は微細な半導体装置の線幅を測定す
るなめに高精度な平坦度傾き精度1位置精度が要求され
、かなりの重量が必要であった。そのため、歯車等の摩
耗が激しく、その位置精度を低下させていた。この位置
精度の低下は、測定時の光学系の焦点ズレをひきおこし
、測定精度を低下させ、製品の歩留り及びその品質を低
下させるという重大な問題があった。
In the conventional line width measuring instrument mentioned above, the sample stage 4 was moved up and down mechanically by hand or a motor using a combination of gears, etc. However, the sample stage 4 was raised and lowered in order to measure the line width of minute semiconductor devices. Accurate flatness, tilt accuracy, and 1 position accuracy were required, and a considerable amount of weight was required. As a result, gears and the like are subject to severe wear, reducing their positional accuracy. This decrease in positional accuracy causes a focus shift in the optical system during measurement, resulting in a serious problem of lowering measurement accuracy and lowering the yield and quality of products.

本発明の目的は前記課題を解決した線幅測定器を提供す
ることにある。
An object of the present invention is to provide a line width measuring device that solves the above problems.

〔発明の従来技術に対する相違点〕[Differences between the invention and the prior art]

前述した従来の線幅測定器に対し、本発明は光検知器と
の間の光学的距離を変化させて焦点合わせを行うという
相違点を有する。
The present invention differs from the conventional line width measuring device described above in that focusing is performed by changing the optical distance between the device and the photodetector.

〔課題を解決するための手段〕[Means to solve the problem]

前記目的を達成するため、本発明は試料の光学的なコン
トラストの差異により試料の線幅を測定する線幅測定器
において、試料の像を光検知器上に結像させるレンズ又
はミラーと、該レンズ又はミラーと光検知器との間の光
路長を変化させて焦点合わせを行う機構とを有するもの
である。
To achieve the above object, the present invention provides a line width measuring device that measures the line width of a sample based on the difference in optical contrast of the sample, which includes a lens or mirror that forms an image of the sample on a photodetector; It has a mechanism that performs focusing by changing the optical path length between the lens or mirror and the photodetector.

〔実施例〕〔Example〕

以下、本発明の実施例を図により説明する。 Embodiments of the present invention will be described below with reference to the drawings.

(実施例1) 第1図は本発明の実施例1を示す構成図である。(Example 1) FIG. 1 is a configuration diagram showing a first embodiment of the present invention.

図において、接眼レンズ2、対物レンズ3を介して試料
台4上の試料5の像を光検知器1に結像させる構成は従
来と同じである。
In the figure, the configuration in which an image of a sample 5 on a sample stage 4 is formed on a photodetector 1 via an eyepiece lens 2 and an objective lens 3 is the same as the conventional one.

本発明は接眼レンズ2(又は対物レンズ3)を光検知器
1に対して移動させ、その光路長を変化させることによ
り焦点合わせを行う駆動装置6aを装備したものである
The present invention is equipped with a drive device 6a that moves the eyepiece lens 2 (or objective lens 3) relative to the photodetector 1 and performs focusing by changing the optical path length.

実施例において、焦点合わせの際は接眼レンズ2(又は
対物レンズ3)を移動させて焦点合わせを行う。
In the embodiment, focusing is performed by moving the eyepiece 2 (or objective lens 3).

本発明では移動する部分が試料台4と比べて軽量のレン
ズ2,3であり、試料台4の重量に起因する歯車等の摩
耗が少ない。
In the present invention, the movable parts are the lenses 2 and 3, which are lighter than the sample stage 4, and there is less wear on gears and the like due to the weight of the sample stage 4.

(実施例2) 第2図は本発明の実施例2を示す構成図である。(Example 2) FIG. 2 is a configuration diagram showing a second embodiment of the present invention.

本実施例は凹状ミラー7.8を光学系として使用した場
合であり、第1図と同様に駆動装置6aは接眼ミラー7
又は対物ミラー8につけられており、焦点合わせは接眼
ミラー7又は対物ミラー8を移動させて行う。
In this embodiment, a concave mirror 7.8 is used as an optical system, and as in FIG.
Alternatively, it is attached to the objective mirror 8, and focusing is performed by moving the eyepiece mirror 7 or the objective mirror 8.

この実施例では光学系として鏡を使用するため、色収差
の影響を受けないという利点かある。
Since this embodiment uses a mirror as the optical system, it has the advantage of not being affected by chromatic aberration.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は焦点合わせの際の移動部を
重い試料台から軽いレンズ又はミラーにすることにより
、駆動部分の摩耗を防ぎ、測定精度を向上させる効果が
ある4又、モーター等で自動的に焦点を合わせる場合に
も移動部が軽いため、焦点合わせのための時間を短縮で
き、位置決め精度の向上を図ることができる効果を有す
る。
As explained above, the present invention uses a four-pronged motor, etc., which is effective in preventing wear of the driving part and improving measurement accuracy by changing the moving part during focusing from a heavy sample stage to a light lens or mirror. Even when focusing automatically, since the moving part is light, the time for focusing can be shortened and positioning accuracy can be improved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例1を示す構成図、第2図は本発
明の実施例2を示す構成図、第3図は従来例を示す構成
図である。 1・・・光検知器     2・・・対物レンズ3・・
接眼レンズ    4・・・試料台5・・・試料   
    6a・・・駆動装置7・・・接眼ミラー   
 8・・・対物ミラーそど柊 5r:、:、q) を姑ツ 第1図 第2図 〜20− 第3図
FIG. 1 is a block diagram showing a first embodiment of the present invention, FIG. 2 is a block diagram showing a second embodiment of the present invention, and FIG. 3 is a block diagram showing a conventional example. 1... Photodetector 2... Objective lens 3...
Eyepiece lens 4... Sample stage 5... Sample
6a... Drive device 7... Eyepiece mirror
8... Objective mirror Sodo Hiiragi 5r:, :, q) Figure 1 Figure 2 ~ Figure 20- Figure 3

Claims (1)

【特許請求の範囲】[Claims] (1)試料の光学的なコントラストの差異により試料の
線幅を測定する線幅測定器において、試料の像を光検知
器上に結像させるレンズ又はミラーと、該レンズ又はミ
ラーと光検知器との間の光路長を変化させて焦点合わせ
を行う機構とを有することを特徴とする線幅測定器。
(1) In a line width measuring device that measures the line width of a sample based on the difference in optical contrast of the sample, a lens or mirror that forms an image of the sample on a photodetector, and the lens or mirror and the photodetector A line width measuring instrument characterized by having a mechanism that performs focusing by changing the optical path length between the line width measuring device and the line width measuring device.
JP19934588A 1988-08-10 1988-08-10 Wire width measurer Pending JPH0247503A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19934588A JPH0247503A (en) 1988-08-10 1988-08-10 Wire width measurer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19934588A JPH0247503A (en) 1988-08-10 1988-08-10 Wire width measurer

Publications (1)

Publication Number Publication Date
JPH0247503A true JPH0247503A (en) 1990-02-16

Family

ID=16406227

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19934588A Pending JPH0247503A (en) 1988-08-10 1988-08-10 Wire width measurer

Country Status (1)

Country Link
JP (1) JPH0247503A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61124809A (en) * 1984-11-22 1986-06-12 Hitachi Ltd Inspection and inspecting apparatus
JPS62212532A (en) * 1986-03-14 1987-09-18 Shimadzu Corp Pyroelectric type linear array sensor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61124809A (en) * 1984-11-22 1986-06-12 Hitachi Ltd Inspection and inspecting apparatus
JPS62212532A (en) * 1986-03-14 1987-09-18 Shimadzu Corp Pyroelectric type linear array sensor

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