JPH0247490Y2 - - Google Patents
Info
- Publication number
- JPH0247490Y2 JPH0247490Y2 JP13385082U JP13385082U JPH0247490Y2 JP H0247490 Y2 JPH0247490 Y2 JP H0247490Y2 JP 13385082 U JP13385082 U JP 13385082U JP 13385082 U JP13385082 U JP 13385082U JP H0247490 Y2 JPH0247490 Y2 JP H0247490Y2
- Authority
- JP
- Japan
- Prior art keywords
- rice
- electro
- hole
- light
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 235000013339 cereals Nutrition 0.000 claims description 51
- 241000209094 Oryza Species 0.000 claims description 43
- 235000007164 Oryza sativa Nutrition 0.000 claims description 43
- 235000009566 rice Nutrition 0.000 claims description 43
- 238000007689 inspection Methods 0.000 claims description 12
- 230000002093 peripheral effect Effects 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 3
- 230000010287 polarization Effects 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 230000001174 ascending effect Effects 0.000 description 1
- 238000012993 chemical processing Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000005488 sandblasting Methods 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Sorting Of Articles (AREA)
Description
【考案の詳細な説明】
本考案は、光学的米粒検査装置に係り、特に米
粒中に混在する胴割粒、変色粒などを検出し、そ
の混入率等を調べる光学的粒体検査装置に係る。[Detailed description of the invention] The present invention relates to an optical rice grain inspection device, and in particular to an optical grain inspection device that detects split grains, discolored grains, etc. mixed in rice grains, and examines their contamination rate. .
米粒中に含有している不良粒を電気光学的に検
出し選別する光学的粒体検査装置は、すでに公知
ある。例えば、本出願人の実願昭56−71974、実
開昭57−184813号および特願昭57−121235号実開
昭59−12340号にこのための最適な装置である光
学的粒体検査装置が提案されている。 Optical grain inspection devices that electro-optically detect and sort out defective grains contained in rice grains are already known. For example, the applicant's Utility Model Application No. 56-71974, Utility Model Application No. 57-184813, Japanese Utility Model Application No. 57-121235, and Utility Model Application No. 59-12340 are described in the optical particle inspection apparatus which is the most suitable device for this purpose. is proposed.
上述の特願昭57−121235号の光学的粒体検査装
置は、米粒一粒づつを入れる、米粒とほぼ同形状
の貫通孔を多数設けた移送板がスライド台上を滑
動するように設けられており、この貫通孔に米粒
を挿入して電気光学的検出器へと米粒の基準軸を
一定の方向に沿つて移送するように構成されてい
る。電気光学的検出器は、光源と電気光学素子と
で構成され、米粒の拡散透過光線の光量を測定す
るようになつている。このため前述のスライド台
のこの部分は、直交ニコル偏光フイルタが設けら
れ、移送板の貫通孔に光源からの直射光線が入射
しないようにしている。あるいは、直交ニコル偏
光フイルタを設ける代りに、貫通孔を照射する光
源を電気光学素子の直下に配置せず、ずらして配
置し、電気光学素子の直下に達した貫通孔に斜方
光線を照射する構成がとられている。このように
することにより、米粒と貫通孔との間に生じうる
隙間を光線が通過してノイズとして電気光学素子
に入射することを防止している。 The optical particle inspection device disclosed in Japanese Patent Application No. 57-121235 mentioned above is equipped with a transfer plate that slides on a slide table and has a large number of through-holes that are approximately the same shape as the rice grains, into which individual rice grains are inserted. The rice grain is inserted into the through hole and is configured to be transferred to the electro-optical detector along a reference axis of the rice grain in a certain direction. The electro-optical detector is composed of a light source and an electro-optical element, and is adapted to measure the amount of diffusely transmitted light through the rice grains. For this reason, this portion of the aforementioned slide table is provided with a crossed Nicol polarization filter to prevent direct light from the light source from entering the through hole of the transfer plate. Alternatively, instead of providing crossed Nicol polarization filters, the light source that illuminates the through-hole is not placed directly below the electro-optic element, but is shifted, and the through-hole that reaches directly below the electro-optic element is irradiated with an oblique light beam. The structure is taken. This prevents light rays from passing through gaps that may occur between the rice grains and the through holes and entering the electro-optical element as noise.
しかしながら、直交ニコル偏光フイルタ等を設
けて、貫通孔にT方からの光線を照射したとして
も、貫通孔の内周壁面にこの下方光線があたりこ
れが反射して散乱光となり偏光フイルタでは、消
しきれないノイズとして電気光学素子に入射する
場合がある。 However, even if a crossed Nicol polarizing filter or the like is installed and a light beam from the T direction is irradiated into the through hole, the downward light beam hits the inner circumferential wall of the through hole and is reflected and becomes scattered light, which cannot be completely erased by the polarizing filter. This may enter the electro-optical element as non-existent noise.
本考案は、上述の貫通孔に下方光線が反射して
電気光学素子にノイズとして入射しないようにし
た構成を有する電気光学的米粒検査装置を提供す
ることを目的とするものである。 An object of the present invention is to provide an electro-optical rice grain inspection device having a structure in which the downward light beam is not reflected by the above-mentioned through-hole and is not incident on the electro-optical element as noise.
本考案によれば、米粒一粒を容易に受容する米
粒とほぼ同形状の貫通孔を複数配列した移送板
と、この移送板に沿つて設けられ、貫通孔中の米
粒一粒に下方光線を照射する光源と米粒の拡散透
過光量を測定する電気光学素子とを含む電気的検
出装置とを有する電気光学的米粒検査装置におい
て、貫通孔の内周壁面につや消し微細な多数の凹
凸又は多数の周方向溝を設けて、内周壁面をギザ
ギザにしたことを特徴とする電気光学的米粒検査
装置が提供される。 According to the present invention, there is a transfer plate having a plurality of through holes arranged in the same shape as the rice grains that easily receive each grain of rice, and a transfer plate provided along the transfer plate to direct downward light to each rice grain in the through holes. In an electro-optical rice grain inspection device that has an electrical detection device including a light source for irradiation and an electro-optical element for measuring the amount of diffusely transmitted light through the rice grains, the inner peripheral wall surface of the through hole has a large number of matte fine irregularities or a large number of peripheries. An electro-optical rice grain inspection device is provided which is characterized in that a directional groove is provided and the inner circumferential wall surface is jagged.
以下に本発明を実施例の形で添付図とともに詳
細に説明する。 The invention will be explained in detail below in the form of examples and with reference to the accompanying drawings.
第1図と第2図を参照して、無端ベルト1は、
従動プーリ2、モータ3駆動の駆動プーリ4およ
び補助プーリ5のまわりをめぐり走行し、従動プ
ーリ2を下端として上端の駆動プーリ4までを米
粒を整送する上昇走行面として配設させ、複数列
の貫通孔1aが無端ベルトの走行方向にならんで
設けられている。走行面の上昇傾斜角度は約45度
が好ましい。この貫通孔1aは、縦長の形状をし
ており、その縦軸方向を無端ベルト1の走行方向
に向けられて設けられている。貫通孔1aの形状
およびサイズは、米粒一粒と相似の形状をしてお
り、かつひとまわり大きなサイズとされ、米粒一
粒が、その縦軸方向(以下基準軸と称す)を貫通
孔1aのその縦軸方向と沿えて整合した時、貫通
孔1aにスムースに落下するようなものとされて
いる。又貫通孔1aは無端ベルト1の表面から裏
面までその断面形状巨視的には不変のまま貫通し
ている。しかして貫通孔1aの内周壁面1bは、
後述するようにギザギザとされており反射光が受
光素子に及ぶことを防止している。無端ベルト1
の裏面は、コンベアループの内側に設けられたス
ライド台6a,6b,6cのスライド面上を滑動
しうるように配設され、よつて貫通孔1a中の米
粒一粒がコンベアループの内側に入り込むことが
防止されている。又貫通孔中の米粒の配置状態
は、光学的検知出力に非常に大きな影響を与える
ため、出来るだけ均一な状態で入り込む事が望ま
しい。貫通孔の米粒はスライド台を滑動すること
により、最初不安定な状態であつても徐々に安定
してくる効果がある。 With reference to FIGS. 1 and 2, the endless belt 1 is
It travels around a driven pulley 2, a drive pulley 4 driven by a motor 3, and an auxiliary pulley 5, with the driven pulley 2 at the lower end and the drive pulley 4 at the upper end arranged as an ascending running surface for sorting rice grains. Through holes 1a are provided along the running direction of the endless belt. The upward inclination angle of the running surface is preferably about 45 degrees. This through hole 1a has a vertically long shape, and is provided with its vertical axis directed toward the running direction of the endless belt 1. The shape and size of the through hole 1a are similar to that of a single grain of rice, and the size is slightly larger. When aligned along the vertical axis direction, it falls smoothly into the through hole 1a. Further, the through-holes 1a pass through the endless belt 1 from the front surface to the back surface with its cross-sectional shape macroscopically unchanged. Therefore, the inner peripheral wall surface 1b of the through hole 1a is
As will be described later, it is jagged to prevent reflected light from reaching the light receiving element. Endless belt 1
The back surface of the rice grain is arranged so that it can slide on the sliding surfaces of slide tables 6a, 6b, and 6c provided inside the conveyor loop, so that each grain of rice in the through hole 1a enters the inside of the conveyor loop. This is prevented. Furthermore, since the arrangement of rice grains in the through-hole has a very large effect on the optical detection output, it is desirable that the rice grains enter the through-hole in as uniform a state as possible. By sliding the rice grains in the through-hole on the slide table, even if the rice grains are initially unstable, they gradually become stable.
走行面の下端部には米粒投入ホツパ7が設けら
れ、ここに投入された米粒は、ホツパ7の底部の
作用をなし、下面を走行面がスライドするガイド
板8が設けられている。このガイド板8は第2図
で明瞭に理解されるように、無端ベルト1に設け
た貫通孔1aの各列と整合する複数のテーパ溝8
aが櫛型に設けられており、このテーパ溝8aの
最小幅は、米粒一粒の幅とほぼ等しくされている
から、ホツパ5に投入された米粒は、このテーパ
溝8aに落込んでその基準軸を走行面の走行方向
に、すなわち貫通孔1aの縦軸方向にそろえて整
向される。 A rice grain input hopper 7 is provided at the lower end of the running surface, and the rice grains introduced here function as the bottom of the hopper 7. A guide plate 8 is provided on the lower surface of which the running surface slides. As clearly understood in FIG. 2, this guide plate 8 has a plurality of tapered grooves 8 aligned with each row of through holes 1a provided in the endless belt 1.
a is provided in a comb shape, and the minimum width of this tapered groove 8a is made almost equal to the width of one grain of rice, so the rice grains put into the hopper 5 fall into this tapered groove 8a and meet the standard. It is oriented with its axis aligned in the running direction of the running surface, that is, in the longitudinal axis direction of the through hole 1a.
投入ホツパ7の下流側には、板ばね9aと剛毛
ブラシ9bを担持するならし装置9が設けらてい
る。先ず板ばね9aで余分な米粒をはじき飛し更
に、この剛毛ブラシ9bの先端で、無端ベルト1
の貫通孔1aに米粒の表面をなでることにより一
粒づつを確実に入りこませるようにさせ、単に貫
通孔1aに引掛かつて移送されている米粒をはじ
いてホツパ7にもどすようにしている。よつてガ
イド板8の先端はすくい角を与えて無端ベルト1
の走行面をすべり落ちてくる米粒が容易にホツパ
7内にもどされるようにすることが好ましい。 A leveling device 9 is provided downstream of the input hopper 7 and carries a leaf spring 9a and a bristle brush 9b. First, the leaf spring 9a flicks off the excess rice grains, and then the end of the bristle brush 9b is applied to the endless belt 1.
By stroking the surface of the rice grains into the through-hole 1a, the rice grains are ensured to enter one by one, and the rice grains that are caught in the through-hole 1a and previously transported are simply repelled and returned to the hopper 7. Therefore, the tip of the guide plate 8 is given a rake angle and the endless belt 1 is
It is preferable that rice grains sliding down the running surface of the hopper 7 are easily returned to the hopper 7.
さらに上流側には、電気光学的検出器10が設
けられ、光源10aからの光を無端ベルト1の貫
通孔1aに照射し、米粒一粒を通過した光線の光
量を受光素子10bで検出する。 Further upstream, an electro-optical detector 10 is provided, which irradiates light from a light source 10a into the through-holes 1a of the endless belt 1, and detects the amount of light that passes through each rice grain with a light-receiving element 10b.
第3図を参照して電気光学的検出器10を詳細
に説明する。 The electro-optic detector 10 will be described in detail with reference to FIG.
第3図において、スライド台6aには、それ自
体を横断するようにスロツト10cが設けられて
おり、そこには透光板10dがその上面をスライ
ド台6aのスライド面と同面になるようにはめ込
まれ、さらにその透光板10dの下面に対し、第
1偏光板10eがはりつけられるようにしてはめ
込まれている。又この透光板10dと対向する位
置において、無端ベルト1の直上には、第2偏光
板10fが設けられている。この第2偏光板10
fに対向してさらにその上方に受光素子10bが
設けられている。第1と第2の偏光板10e,1
0fは、対となつて直交ニコル偏光フイルタを構
成している。このため光源10aからの直接光を
透光板10d、貫通孔1aを通して、受光素子1
0bが受光することがないため、受光素子10b
には米粒一粒を拡散透過した光線のみ達しせしめ
るようになつている。なお受光素子10bは、無
端ベルト1に設けられた貫通孔1aの列の数だ
け、この列に対向して設けられている。 In FIG. 3, the slide table 6a is provided with a slot 10c so as to cross itself, and a transparent plate 10d is inserted therein so that its upper surface is flush with the sliding surface of the slide table 6a. The first polarizing plate 10e is fitted onto the lower surface of the transparent plate 10d. Further, a second polarizing plate 10f is provided directly above the endless belt 1 at a position facing the transparent plate 10d. This second polarizing plate 10
A light receiving element 10b is provided opposite to and above f. First and second polarizing plates 10e, 1
0f constitute a pair of orthogonal Nicol polarization filters. Therefore, direct light from the light source 10a is passed through the transparent plate 10d and the through hole 1a to the light receiving element 1.
Since 0b does not receive light, the light receiving element 10b
The system is designed so that only the rays that diffusely pass through each grain of rice can reach it. Note that the light receiving elements 10b are provided in the same number of rows as the through holes 1a provided in the endless belt 1, facing the rows.
受光素子10bは、受光量を電気信号に変換し
て、これを処理演算回路(図示せず)に送り、整
粒、不良粒の判定を行う。スライド台6aを透明
ガラス板等にしておけば、スロツト10cおよび
透光板10dは不要となる。 The light-receiving element 10b converts the amount of light received into an electrical signal, sends this to a processing arithmetic circuit (not shown), and performs grain size adjustment and determination of defective grains. If the slide table 6a is made of a transparent glass plate or the like, the slot 10c and the transparent plate 10d become unnecessary.
駆動ローラ4を通過した後無端ベルト1は、急
降下し、補助プーリ5をまわつた所で面が下方を
向くため、貫通孔1aの米粒は落下して受け容器
11に受容される。なお参照番号12は剛毛ブラ
シ12aを有する掃除ブラシ装置である。 After passing the drive roller 4, the endless belt 1 descends rapidly, and after passing around the auxiliary pulley 5, the surface thereof faces downward, so that the rice grains in the through holes 1a fall and are received in the receiving container 11. Note that reference number 12 is a cleaning brush device having a bristle brush 12a.
第3図で明らかなように、貫通孔1aの内周壁
面1bは、多数の周方向溝が設けられ、光源10
aからの光線が内周壁面10aにあたつて下方に
はね返されるようになつている。これにより、内
周壁面10aで反射した光がノイズ光として貫通
孔1aより受光素子10bに向わないようにされ
る。 As is clear from FIG. 3, the inner circumferential wall surface 1b of the through hole 1a is provided with a large number of circumferential grooves, and the light source 10
The light rays from the inner peripheral wall surface 10a are reflected downward. This prevents the light reflected by the inner circumferential wall surface 10a from being directed toward the light receiving element 10b from the through hole 1a as noise light.
特種断面形状の貫通孔1aに、上述のごとく多
数の溝を形成する方法は、機械加工、インサート
の挿入サンドブラスト加工、薬品処理加工など各
種の公知の方法で行いうるが、ギザギザ形成の方
法は、本考案の主体ではないので説明を省略す
る。 The method of forming a large number of grooves as described above in the through hole 1a having a special cross-sectional shape can be performed by various known methods such as machining, insert insertion sandblasting, chemical processing, etc., but the method of forming jagged grooves is as follows. Since this is not the main subject of this invention, its explanation will be omitted.
以上本考案を実施例の形で説明したが本考案
は、上記実施例に限定されず、実用新案登録請求
の範囲で限定される範囲で様々に変更可能であ
る。 Although the present invention has been described above in the form of embodiments, the present invention is not limited to the above-mentioned embodiments, but can be modified in various ways within the scope of the claims for utility model registration.
例えば、上記実施例では、移送板は、無端ベル
トとして説明されているが、実願昭56−71947号
に記載のごとく、周辺部に貫通孔を配列した円板
形状のものでも良い。 For example, in the above embodiment, the transfer plate is described as an endless belt, but it may also be in the form of a disc with through holes arranged around its periphery, as described in Japanese Utility Model Application No. 71947/1983.
第1図は、本発明の一実施例である米粒の電気
光学的粒体検査装置を概略的に断面図で図示する
図。第2図は、第1図に図示の電気光学的検査装
置の上面図。第3図は、第1図の−線に沿う
拡大断面図。
1……無端ベルト、1a……貫通孔、1b……
内周壁面、2……従動ローラ、3……モータ、4
……駆動ローラ、5……補助ローラ、6a,6
b,6c……スライド台、7……投入ホツパ、8
……ガイド板、8a……テーパ溝、9……ならし
装置、9a……板ばね、9b……剛毛ブラシ、1
0……電気光学的検出器、10a……光源、10
b……受光素子、10c……スロツト、10d…
…透光板、10e,10f……偏光板(直交ニコ
ル偏光フイルタ)、11……受け容器、12……
掃除ブラシ装置、12a……剛毛ブラシ。
FIG. 1 is a schematic cross-sectional view of an electro-optical grain inspection apparatus for rice grains, which is an embodiment of the present invention. FIG. 2 is a top view of the electro-optical inspection apparatus shown in FIG. 1; FIG. 3 is an enlarged sectional view taken along the - line in FIG. 1. 1...Endless belt, 1a...Through hole, 1b...
Inner peripheral wall surface, 2...Followed roller, 3...Motor, 4
... Drive roller, 5 ... Auxiliary roller, 6a, 6
b, 6c...Slide stand, 7...Insertion hopper, 8
... Guide plate, 8a ... Tapered groove, 9 ... Leveling device, 9a ... Leaf spring, 9b ... Bristle brush, 1
0... Electro-optical detector, 10a... Light source, 10
b... Light receiving element, 10c... Slot, 10d...
...Transparent plate, 10e, 10f...Polarizing plate (crossed Nicol polarizing filter), 11...Receiving container, 12...
Cleaning brush device, 12a... bristle brush.
Claims (1)
貫通孔を複数配列した移送板と、この移送板に沿
つて設けられ、貫通孔中の米粒一粒に下方光線を
照射する光源と米粒の拡散透過光量を測定する電
気光学素子を含む電気的検出装置とを有する電気
光学的米粒検査装置において 貫通孔の内周壁面につや消し、微細な多数の凹
凸又は多数の周方向溝を設けて、内周壁面をギザ
ギザにしたことを特徴とする電気光学的米粒検査
装置。[Claim for Utility Model Registration] A transfer plate with a plurality of through-holes arranged in a shape almost identical to that of rice grains to easily receive each grain of rice, and a transfer plate provided along this transfer plate and arranged downwardly for each rice grain in the through-hole. In an electro-optical rice grain inspection device that has a light source that irradiates a light beam and an electric detection device that includes an electro-optical element that measures the amount of diffusely transmitted light through the rice grains, the inner peripheral wall surface of the through hole is matted, has many fine irregularities, or has many An electro-optical rice grain inspection device characterized in that a circumferential groove is provided and the inner peripheral wall surface is jagged.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13385082U JPS5937551U (en) | 1982-09-03 | 1982-09-03 | Electro-optical rice grain inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13385082U JPS5937551U (en) | 1982-09-03 | 1982-09-03 | Electro-optical rice grain inspection device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5937551U JPS5937551U (en) | 1984-03-09 |
JPH0247490Y2 true JPH0247490Y2 (en) | 1990-12-13 |
Family
ID=30301783
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13385082U Granted JPS5937551U (en) | 1982-09-03 | 1982-09-03 | Electro-optical rice grain inspection device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5937551U (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE470465B (en) * | 1992-09-07 | 1994-04-18 | Agrovision Ab | Method and apparatus for automatic assessment of grain cores and other granular products |
-
1982
- 1982-09-03 JP JP13385082U patent/JPS5937551U/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5937551U (en) | 1984-03-09 |
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