JPH0360380B2 - - Google Patents

Info

Publication number
JPH0360380B2
JPH0360380B2 JP3391585A JP3391585A JPH0360380B2 JP H0360380 B2 JPH0360380 B2 JP H0360380B2 JP 3391585 A JP3391585 A JP 3391585A JP 3391585 A JP3391585 A JP 3391585A JP H0360380 B2 JPH0360380 B2 JP H0360380B2
Authority
JP
Japan
Prior art keywords
powder
falling
transparent rotating
pair
rotating bodies
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP3391585A
Other languages
Japanese (ja)
Other versions
JPS61191944A (en
Inventor
Toshihiro Kajiura
Norio Taneda
Junnosuke Abe
Seiji Sugyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kanebo Ltd
Original Assignee
Kanebo Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kanebo Ltd filed Critical Kanebo Ltd
Priority to JP3391585A priority Critical patent/JPS61191944A/en
Publication of JPS61191944A publication Critical patent/JPS61191944A/en
Publication of JPH0360380B2 publication Critical patent/JPH0360380B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Sorting Of Articles (AREA)
  • Closed-Circuit Television Systems (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 この発明は、医薬品(細粒、顆粒、粉末)、電
子材料(セラミツクス粉末)、食品(粉末原料、
パン粉などの粉製品)などの粉粒体の外観検査を
行つて不良品、異物等を選別除去する粉粒体検査
装置に関するものである。
[Detailed Description of the Invention] Industrial Application Fields This invention is applicable to pharmaceuticals (fine particles, granules, powder), electronic materials (ceramics powder), foods (powder raw materials,
The present invention relates to a powder inspection device that performs an appearance inspection of powder products such as bread crumbs, etc., and selects and removes defective products, foreign substances, etc.

従来の技術 この種の粉粒体の外観検査および選別は、従来
ベルトコンベヤ上に粉粒体をシート状に載せ、こ
れを搬送しながら目視により検査し、不良品や異
物等があるとそれを除去することにより行つてい
たが、検査員の個人差、疲労などによつて検査精
度がばらつき、不良品、異物等の見逃がし等のお
それが十分にあり、信頼性が低いものであつた。
また、検査精度向上のためには、粉粒体の搬送速
度を遅くし、かつ粉粒体をできるかぎり薄くシー
ト状に拡げる必要があるが、このようにすると、
処理能率がきわめて悪くなるという問題があつ
た。さらに、人間が介在するため、クローズド化
が困難であるという問題もあつた。
Conventional technology The appearance inspection and sorting of this type of powder and granular materials has conventionally been carried out by placing the powder and granular materials in a sheet form on a belt conveyor, visually inspecting the sheet while conveying it, and detecting any defective products or foreign objects. However, inspection accuracy varied due to individual differences and fatigue among inspectors, and there was a high risk of overlooking defective products or foreign objects, resulting in low reliability. .
In addition, in order to improve inspection accuracy, it is necessary to slow down the conveyance speed of the powder and spread the powder into a sheet as thin as possible.
There was a problem that processing efficiency became extremely poor. Furthermore, there was the problem that it was difficult to create a closed system due to human intervention.

このような問題を解消する目的で、撮像素子を
用いて粉粒体の外観検査を行い、不良品、異物等
を自動的に選別除去する粉粒体検査装置が提案さ
れている。この粉粒体検査装置は、粉粒体を自然
落下させ、この粉粒体を表側から反射照明すると
ともに、裏側から透過照明し、良品の反射光量と
透過光量とを等しく設定し、粉粒体を表側から撮
像して画像処理することにより、良品と明度の異
なる不良品、異物等の存在を検出し、これをエア
ーガン等によつて選別除去するように構成したも
のである。
In order to solve these problems, a powder inspection device has been proposed that uses an image sensor to visually inspect powder and granule and automatically selects and removes defective products, foreign objects, and the like. This powder and granule inspection device allows powder and granules to fall naturally, illuminates them by reflection from the front side, and transmits light from the back, and sets the amount of reflected light and transmitted light to be equal for a good product. By taking an image from the front side and processing the image, it is possible to detect the presence of defective products and foreign objects whose brightness differs from that of non-defective products, and to select and remove them using an air gun or the like.

発明が解決しようとする問題点 上記のような粉粒体検査装置は、粉粒体を単に
自然落下させる構成であつたため、一定厚みの薄
い粉粒体層を作ることが困難で、検査精度が安定
せず、また、粉粒体がある長さ落下すると粉粒体
が自然に広がるため、粉粒体通路が不安定とな
り、また粉が舞うことにより、エアーガンなどに
よる選別除去が困難であつて実用不能となるとい
う問題点があつた。
Problems to be Solved by the Invention The above-mentioned powder inspection device was configured to simply allow the powder to fall naturally, making it difficult to create a thin powder layer with a constant thickness, resulting in poor inspection accuracy. It is not stable, and if the powder or granules fall for a certain length, they will naturally spread out, making the powder passage unstable, and the powder will fly around, making it difficult to sort and remove it with an air gun, etc. There was a problem that it became impractical.

この発明は、上記した問題点に鑑みてなされた
もので、一定厚みの薄い粉粒体層を作ることがで
きて検査精度が安定し、かつ不良品、異物等の選
別除去を容易かつ確実に行うことができる粉粒体
検査装置を提供することを目的とする。
This invention was made in view of the above-mentioned problems, and it is possible to create a thin powder layer with a constant thickness, stabilize inspection accuracy, and easily and reliably separate and remove defective products and foreign objects. The purpose of the present invention is to provide a powder/grain material inspection device that can perform the following tests.

問題点を解決するための手段 この発明の粉粒体検査装置は、前後に所定間隔
をあけて平行対面するように並設して相互対面部
分で粉粒体落下通路を形成し中心軸を回転軸とし
て回転する一対の透明回転体と、前記粉粒体落下
通路の上端に落下口を位置決めして粉粒体をシー
ト状にして搬送する粉粒体搬送手段と、前記粉粒
体落下通路の下方の粉粒体落下経路近傍に設置し
て粉粒体を除去する選別装置と、前記一対の透明
回転体の相互対向面をそれぞれ前記粉粒体落下通
路以外の位置で清掃するクリーナと、前記粉粒体
落下通路中を落下している粉粒体を前記一対の透
明回転体の前方位置から反射照明する反射光源
と、前記粉粒体落下通路中を落下している粉粒体
を前記一対の透明回転体の後方位置から透過照明
する透過光源と、前記粉粒体落下通路中を落下し
ている粉粒体を前記一対の透明回転体の前方位置
から撮像する撮像装置と、この撮像装置の画像信
号を処理することにより前記粉粒体落下通路中を
落下している粉粒体中の不良品、異物等の存在を
検出して不良信号を発生する画像処理手段と、こ
の画像処理手段からの不良信号に応答して前記選
別装置を所定時間作動させることにより不良品粉
粒体、異物等が含まれた粉粒体を除去させる選別
装置制御手段とを備え、前記反射光源の光の良品
粉粒体による反射光量と前記透過光源からの光の
前記一対の透明回転体のうち後方のものの透過光
量とを略等しく設定したものである。
Means for Solving the Problems The powder and granule inspection device of the present invention is arranged side by side so as to face each other parallel to each other with a predetermined interval in the front and rear, and forms a powder and granule falling path at the mutually facing portions, and rotates a central axis. a pair of transparent rotating bodies that rotate as shafts; a powder transport means for conveying the powder and granular material in a sheet form by positioning a drop opening at the upper end of the powder and granular material falling passage; a sorting device installed in the vicinity of the powder and granular material falling path below to remove the powder and granular material; a cleaner that cleans mutually opposing surfaces of the pair of transparent rotating bodies at positions other than the powder and granular material falling path; a reflected light source that reflects and illuminates the powder and granular material falling in the powder and granular material falling path from a position in front of the pair of transparent rotating bodies; a transmitted light source that transmits illumination from a rear position of the transparent rotating bodies, an imaging device that images the powder and granular material falling in the powder and granular material falling path from a front position of the pair of transparent rotating bodies, and this imaging device an image processing means for detecting the presence of defective products, foreign objects, etc. in the powder or granule material falling in the powder or granule material falling path by processing the image signal of the powder or granule material and generating a defect signal; a sorting device control means that operates the sorting device for a predetermined period of time in response to a defective signal from the screen, thereby removing defective powder particles, powder particles containing foreign matter, etc.; The amount of light reflected by the non-defective granular material and the amount of light transmitted by the rear one of the pair of transparent rotating bodies of the light from the transmitted light source are set to be approximately equal.

作 用 このように、一対の透明回転体を所定の間隔を
あけて設置することにより粉粒体落下通路を形成
し、この粉粒体落下通路中を粉粒体が落下するよ
うにしたため、一体の透明回転体の間隔を適正に
設定することで、一定厚みの薄い粉粒体層を容易
に作ることができ、検査精度を安定させることが
できる。また、粉粒体落下通路によつて粉粒体の
拡散を規制しているため、不良品、異物等の選別
除去を容易かつ確実に行える。また、クリーナで
透明回転体を清掃しているため、透明回転体に粉
粒体が付着して検査不能になることもない。
Function In this way, by installing a pair of transparent rotating bodies at a predetermined interval, a powder falling passage is formed, and the powder falling through this powder falling passage, so that the powder and granules fall in one piece. By appropriately setting the interval between the transparent rotating bodies, a thin powder layer with a constant thickness can be easily created, and inspection accuracy can be stabilized. Furthermore, since the powder falling passage restricts the dispersion of the powder, defective products, foreign matter, etc. can be easily and reliably sorted and removed. Furthermore, since the transparent rotating body is cleaned with a cleaner, there is no possibility that particles will adhere to the transparent rotating body and make inspection impossible.

実施例 この発明の一実施例を第1図ないし第8図に基
づいて発明する。この粉粒体検査装置は、第1図
および第2図に示すように、透明な2枚のガラス
円板(プラスチツク製でもよい)1,2を、部分
的に前後に所定の間隔をあけて平行対面するよう
に左右に並設し、かつ上記2枚のガラス円板1,
2の相互対向面間に所定の間隔をあけて平行に2
枚のガイド側板3,4を並設することにより、検
査すべき粉粒体に対する粉粒体落下通路Sを作
り、振動フイーダ5などの粉粒体載置搬送手段の
落下口を上記粉粒体落下通路Sの上端に位置決め
するとともにエアによる吸引(排出)除去方式の
選別装置6を上記粉粒体落下通路Sの下方の粉粒
体落下経路の近傍に設置し、振動フイーダ5によ
つて粉粒体7を薄いシート状にならして搬送し、
粉粒体7を上記粉粒体落下通路Sを通して拡散を
規制しながら落下させ、粉粒体7が粉粒体落下通
路Sを通つている間に検査を行い、不良品や異物
が含まれておれば、選別装置6を作動させて不良
品や異物が含まれている領域の粉粒体7を吸引除
去し、良品については粉粒体落下通路Sの直下に
配した良品回収容器8に蓄積するようになつてい
る。9は、粉粒体7を粉粒体落下通路Sに案内す
るガイドである。
Embodiment An embodiment of the present invention will be described based on FIGS. 1 to 8. As shown in Figures 1 and 2, this powder inspection device consists of two transparent glass discs (which may be made of plastic) 1 and 2, which are partially spaced at a predetermined distance from front to back. The two glass disks 1 are arranged side by side on the left and right so as to face parallel to each other, and the two glass disks 1,
2 in parallel with a predetermined interval between the mutually opposing surfaces of 2.
By arranging two guide side plates 3 and 4 in parallel, a powder falling path S for the powder and granular material to be inspected is created, and a drop opening of a powder loading and conveying means such as a vibrating feeder 5 is connected to the powder and granular material to be inspected. A sorting device 6 which is positioned at the upper end of the falling passage S and uses suction (discharge) removal using air is installed near the falling route of the powder and granular material below the powder falling passage S, and the vibrating feeder 5 removes the powder. The granules 7 are smoothed into a thin sheet and conveyed,
The powder and granular material 7 is dropped through the powder and granule material falling passage S while regulating diffusion, and while the powder and granular material 7 is passing through the powder and granule material falling passage S, it is inspected to determine whether it contains defective products or foreign matter. If so, the sorting device 6 is operated to suction and remove the powder 7 in the area containing defective products or foreign matter, and the good products are accumulated in the good product collection container 8 placed directly under the powder drop passage S. I'm starting to do that. Reference numeral 9 denotes a guide that guides the powder or granular material 7 to the powder or granular material falling path S.

このように、2枚のガラス円板1,2と2枚の
ガイド側板3,4とにより厚みの小さい粉粒体落
下通路Sを作り、この粉粒体落下通路S中を粉粒
体7が通過するようにしているので、落下する粉
粒体7の位置精度が良く、また粉粒体7を薄い層
にできるため、検査精度を向上させることができ
る。また、粉粒体7が拡散しないため、選別装置
6による不良品、異物等を含んだ領域の粉粒体7
の除去も容易で確実である。
In this way, the two glass discs 1, 2 and the two guide side plates 3, 4 create a small powder/granular material falling path S, and the powder/granular material 7 passes through this powder/granular material falling path S. Since it passes through, the positioning accuracy of the falling powder 7 is good, and since the powder 7 can be made into a thin layer, the inspection accuracy can be improved. In addition, since the powder or granule material 7 does not spread, the powder or granule material 7 in the area containing defective products, foreign matter, etc., is detected by the sorting device 6.
Removal is also easy and reliable.

そして、上記した2枚のガラス円板1,2は、
粉粒体7の付着による汚れを除去するために、中
心軸を回転軸として互いに逆方向(矢印A1,A2
に定速で回転し(モータで駆動される)、相互対
向面が粉粒体落下通路S以外の位置でクリーナ1
0;11により清掃される。このクリーナ10;
11は、各々、平行に配置した2個のドラム10
a,10b;11a,11bとこのドラム10
a,10b;11a,11bを包絡するループ状
のクリーナ布10c;11cと、クリーナ布10
c;11cに付着した粉粒体7を吸引除去するエ
アー吸引部10d;11dとからなり、一方のド
ラム10a;11aがクリーナ布10c,11c
を介してガラス円板1,2の粉粒体付着面に密着
し、ドラム10a,10b;11a,11bを回
転させることによつてガラス円板1,2の表面を
クリーナ布10c,11cで清掃し、クリーナ布
10c;11cに付着した粉粒体7をエアー吸引
部10d;11dによつて除去し、クリーナ布1
0c;11cでガラス円板1,2の表面を繰り返
し清掃するようになつている。
The two glass disks 1 and 2 mentioned above are
In order to remove dirt due to adhesion of powder and granular material 7, the central axis is the rotation axis and the directions are opposite to each other (arrows A 1 and A 2 ).
The cleaner 1 rotates at a constant speed (driven by a motor), and the mutually opposing surfaces
Cleaned by 0;11. This cleaner 10;
11 are two drums 10 arranged in parallel.
a, 10b; 11a, 11b and this drum 10
a, 10b; 11a, 11b; a loop-shaped cleaner cloth 10c; 11c; and the cleaner cloth 10
c; consists of an air suction section 10d; 11d that sucks and removes the powder particles 7 attached to the drum 11c, and one drum 10a;
Clean the surfaces of the glass disks 1, 2 with cleaner cloths 10c, 11c by rotating the drums 10a, 10b; 11a, 11b. Then, the powder 7 adhering to the cleaner cloth 10c; 11c is removed by the air suction part 10d; 11d, and the cleaner cloth 1
The surfaces of the glass disks 1 and 2 are repeatedly cleaned at 0c and 11c.

このように、クリーナ10;11によつてガラ
ス円板1,2に付着した粉粒体7を常時清掃除去
しているので、粉粒体7が落下中にガラス円板
1,2に付着して検査不能になることはない。し
かも、清掃により検査が妨げられることはなく、
検査能率が高い。
In this way, since the powder and granules 7 adhering to the glass discs 1 and 2 are constantly cleaned and removed by the cleaners 10 and 11, the powder and granules 7 do not adhere to the glass discs 1 and 2 while falling. This will not make the test impossible. Moreover, cleaning does not interfere with the inspection;
High inspection efficiency.

つぎに、粉粒体7の検査は、つぎのようにして
行う。すなわち、2枚のガラス円板1,2の相互
対向面部の前方位置にテレビカメラ12を設置
し、2枚のガラス円板1,2の相互対向面に設定
した検査視野Pを含む領域をテレビカメラ12で
所定時間毎に撮像するようになし、テレビカメラ
12とガラス円板1,2との間にハーフミラー1
3を配置し、ガラス円板1,2の前方位置から、
反射光源14よりハーフミラー13を介して落下
中の粉粒体7に光を照射し、粉粒体7からの反射
光をハーフミラー13を介してテレビカメラ12
に入射させ、また、ガラス円板1,2の後方位置
から、透過光源15より落下中の粉粒体7に向か
つて光を照射し、ガラス円板1,2および粉粒体
7のすき間を透過した光をさらにハーフミラー1
3を通してテレビカメラ12に入射させるように
している。この場合、反射光源14による良品の
反射光量と透過光源15からの光のガラス円板2
の透過光量を等しく設定している。具体的には、
ガラス円板2のの透過率、透過光源15の光量調
整等によつて設定する。
Next, the powder and granular material 7 is inspected as follows. That is, a television camera 12 is installed in front of the mutually opposing surfaces of the two glass disks 1 and 2, and the area including the inspection field of view P set on the mutually opposing surfaces of the two glass disks 1 and 2 is set on the television. A camera 12 is configured to take images at predetermined time intervals, and a half mirror 1 is provided between the television camera 12 and the glass disks 1 and 2.
3 and from the front position of the glass disks 1 and 2,
Light is irradiated from the reflected light source 14 to the falling powder or granular material 7 via the half mirror 13, and the reflected light from the powder or granular material 7 is transmitted via the half mirror 13 to the television camera 12.
Also, from the rear position of the glass discs 1 and 2, light is irradiated from the transmitted light source 15 toward the falling powder and granular material 7, and the gap between the glass discs 1 and 2 and the powder and granular material 7 is filled. The transmitted light is further transferred to a half mirror 1.
The light is made to enter the television camera 12 through 3. In this case, the amount of light reflected by the reflective light source 14 and the light from the transmitted light source 15 on the glass disk 2
The amount of transmitted light is set equally. in particular,
It is set by adjusting the transmittance of the glass disk 2, the light amount of the transmitted light source 15, etc.

このように構成すると、落下している粉粒体7
のすべてが良品である場合は、テレビカメラ12
により撮像された画像は、検査視野Pの全域にわ
たつて同一明度となり、粉粒体7は全く見えなく
なる。ところが、粉粒体7中に不良品や異物等が
混入していると、不良品や異物等は、反射光量が
良品と相違し、すなわち明度が良品と異なること
になり、このときのテレビカメラ12の画像には
不良品、異物に対応して暗点あるいは輝点が生じ
ることになる。そして、以下で詳述する画像処理
装置16によつて、画像中の暗点あるいは輝点の
有無を検出し、暗点あるいは輝点があれば、選別
装置制御手段17,18によつて選別装置6を一
定時間作動させ、不良品、異物が含まれている領
域の粉粒体7を吸引除去するようになつている。
With this configuration, the falling powder 7
If all of the items are in good condition, the TV camera 12
The image captured by this has the same brightness over the entire inspection field of view P, and the powder 7 is completely invisible. However, if defective products or foreign matter are mixed into the powder or granular material 7, the amount of reflected light of the defective product or foreign matter will be different from that of the non-defective product, that is, the brightness will be different from that of the non-defective product. Dark spots or bright spots will appear in the image No. 12 corresponding to defective products or foreign objects. Then, the image processing device 16, which will be described in detail below, detects the presence or absence of dark spots or bright spots in the image, and if there is a dark spot or bright spot, the sorting device control means 17 and 18 control the sorting device. 6 is operated for a certain period of time, and the powder and granular material 7 in the area containing defective products and foreign matter is removed by suction.

つぎに、テレビカメラ12の画像をもとにして
不良信号を発生させる画像処理装置12および選
別装置制御手段17,18について第3図ないし
第6図に基づいて詳しく説明する。
Next, the image processing device 12 and the sorting device control means 17, 18, which generate a defective signal based on the image of the television camera 12, will be explained in detail with reference to FIGS. 3 to 6.

テレビカメラ12からの映像信号を処理する画
像処理装置16は、第3図に示すように、映像信
号を増幅・フイルタ回路16Aに通すことで映像
信号の増幅および雑音除去を行い、さらに微分回
路16Bに通すことで画像中の特異点に対応した
特徴信号を得、この特徴信号を正負微分レベルコ
ンパレータ16Cでレベル弁別し、一方、同期信
号にもとづいてマスク信号発生回路16Dから検
査視野Pを規定するマスク信号を発生させ、この
マスク信号でアンドゲート16Eを制御すること
により有効エリア(検査視野に対応する)内に暗
点または輝点があつたときに不良信号を出力する
ようになつている。
As shown in FIG. 3, the image processing device 16 that processes the video signal from the television camera 12 amplifies the video signal and removes noise by passing the video signal through an amplification/filter circuit 16A, and further includes a differentiation circuit 16B. A characteristic signal corresponding to a singular point in the image is obtained by passing it through the image, and the level of this characteristic signal is discriminated by a positive/negative differential level comparator 16C.Meanwhile, an inspection field of view P is defined by a mask signal generation circuit 16D based on a synchronization signal. By generating a mask signal and controlling the AND gate 16E with this mask signal, a defect signal is output when a dark spot or bright spot occurs within the effective area (corresponding to the inspection field of view).

例えばテレビカメラ12による画像が第4図に
示すようになり、有効エリアQに異物に応じた暗
点Zが存在した場合、M番目の走査線lM上の映像
信号は第5図Aのようになり、この映像信号を微
分した微分信号は第5図Cに示すように映像信号
の前縁と後縁に対応してパルスが現れるが、この
パルスは第5図Bのマスク信号のオン期間の外で
あるため、アンドゲート16Eから不良信号は第
5図DのようにLレベルのまま(良品のみ)であ
る。
For example, if the image taken by the television camera 12 is as shown in FIG. 4 and there is a dark spot Z corresponding to a foreign object in the effective area Q, the video signal on the Mth scanning line l M will be as shown in FIG. 5A. In the differential signal obtained by differentiating this video signal, pulses appear corresponding to the leading and trailing edges of the video signal as shown in Figure 5C, but these pulses correspond to the ON period of the mask signal in Figure 5B. Therefore, the defective signal from the AND gate 16E remains at the L level (only for non-defective products) as shown in FIG. 5D.

ところが、暗点Zと交差する位置のN番目の走
査線lN上の映像信号は第6図Aに示すように、暗
点Zの位置に応じたタイミングでレベルが低くな
つており、(輝点のときは高くなる)、微分信号は
第6図Cに示すように、映像信号の前縁および後
縁と暗点Zとに対応してパルスが現われ、第6図
Bのマスク信号のオン期間内のパルス(暗点に対
応)がアンドゲート16Eを通り不良信号(Hレ
ベル)として出力される。
However, as shown in Figure 6A, the level of the video signal on the Nth scanning line l N at the position intersecting the dark spot Z decreases at a timing corresponding to the position of the dark spot Z, and the (brightness) As shown in FIG. 6C, pulses appear in the differential signal corresponding to the leading and trailing edges of the video signal and the dark spot Z, and when the mask signal is turned on in FIG. 6B, A pulse within the period (corresponding to a dark spot) passes through the AND gate 16E and is output as a defect signal (H level).

そして、このアンドゲート16Eから出力され
る第7図Aに示すような不良信号(Hレベル)が
遅延回路17を通してリトリガブルワンシヨツト
マルチバイブレータ18に加えられ、このリトリ
ガブルワンシヨツトマルチバイブレータ18の出
力パルス発生期間中選別装置16が作動して粉粒
体7を吸引除去することになる。上記遅延回路1
7は、不良信号をΔt時間遅延してリトリガブル
ワンシヨツトマルチバイブレータ18に加えるも
ので、不良品、異物等が検査視野S内に位置して
不良信号が発生した後不良品、異物等が選別装置
6の吸込み口まで達するまでの時間および選別装
置6の動作遅れ等を考慮して遅延時間Δtを決定
し、粉粒体7の良品のロスを少なくするようにし
ている。
Then, a defect signal (H level) as shown in FIG. 7A output from this AND gate 16E is applied to the retriggerable one-shot multivibrator 18 through the delay circuit 17. During the output pulse generation period, the sorting device 16 operates to suction and remove the particulate material 7. Above delay circuit 1
7 is to apply a defective signal to the retriggerable one-shot multivibrator 18 with a delay of Δt time, and after a defective product, foreign object, etc. is located within the inspection field of view S and a defective signal is generated, the defective product, foreign object, etc. is detected. The delay time Δt is determined in consideration of the time required for the powder to reach the suction port of the sorting device 6 and the delay in the operation of the sorting device 6, so as to reduce the loss of non-defective products of the powder and granular material 7.

また、リトリガブルワンシヨツトマルチバイブ
レータ18は、不良信号の入力後t0時間パルスを
出力するもので、不良品、異物等の吸引除去に必
要な時間に設定されており、第7図Aの不良信号
に対して第7図Bのようなパルスを選別信号とし
て出力することになる。
Furthermore, the retriggerable one-shot multivibrator 18 outputs a pulse for an hour t0 after inputting a defective signal, and is set to the time required for suctioning and removing defective products, foreign objects, etc., as shown in FIG. 7A. In response to a defective signal, a pulse as shown in FIG. 7B is output as a selection signal.

第8図A〜Hは、透過光源15および反射光源
14の状態、粉粒体7の量、不良品や異物等の有
無による画像の状態を示している。第8図Aは反
射光のみの場合で粉粒体7が少ないときを示し、
粉粒体7が白になり、背景が黒となる。第8図B
は反射光のみの場合で粉粒体7がきわめて多い
(全面が粉粒体で覆われる)ときを示し、全面が
白となる。第8図Cは透過光のみの場合で粉粒体
7が少ないときを示し、粉粒体7が黒になり、背
景が白になる。第8図Dは透過光のみの場合で粉
粒体7がきわめて多いときを示し、全面が黒とな
る。第8図Eは反射光と透過光とがバランスした
場合で粉粒体7が少ないときで、かつ良品のみの
ときを示し、全面が白となる。第8図Fは反射光
と透過光とがバランスした場合で粉粒体7がきわ
めて多いときで、かつ良品のみのときを示し、全
面が白となる。第8図Gは反射光と透過光とがバ
ランスした場合で粉粒体7が少なく、かつ髪や異
色粒等が存在するときを示し、髪や異色粒が暗点
となり、背景が白となる。第8図Hは反射光と透
過光とがバランスした場合で粉粒体7がきわめて
多いときで、かつ髪や異色粒が存在するときを示
し、髪や異色粒が暗点となり、背景が白となる。
8A to 8H show the state of the image depending on the state of the transmitted light source 15 and the reflected light source 14, the amount of powder and granular material 7, and the presence or absence of defective products or foreign matter. FIG. 8A shows the case where there is only reflected light and the amount of powder 7 is small;
The powder 7 becomes white and the background becomes black. Figure 8B
indicates a case where there is only reflected light and there is an extremely large amount of powder 7 (the entire surface is covered with powder), and the entire surface is white. FIG. 8C shows a case where only transmitted light is transmitted and the amount of granular material 7 is small, and the granular material 7 becomes black and the background becomes white. FIG. 8D shows a case where there is only transmitted light and there is an extremely large amount of powder particles 7, and the entire surface becomes black. FIG. 8E shows a case where the reflected light and the transmitted light are balanced, there is little powder 7, and there are only good products, and the entire surface is white. FIG. 8F shows a case where the reflected light and the transmitted light are balanced, there is an extremely large amount of powder particles 7, and there are only good products, and the entire surface is white. Fig. 8G shows a case where the reflected light and the transmitted light are balanced, there is little powder 7, and there are hairs, different-colored particles, etc., and the hair and different-colored particles become dark spots, and the background becomes white. . FIG. 8H shows a case where reflected light and transmitted light are balanced, there is a large amount of powder and granules 7, and there are hairs and different colored grains, and the hair and different colored grains become dark spots and the background is white. becomes.

この実施例の粉粒体検査装置は、落下する粉粒
体7の位置が2枚のガラス円板1,2で規制され
るため、位置精度が良く、また薄い層にすること
ができ、検査精度を高めることができ、また、不
良品、異物等の除去も確実に行える。
In the powder inspection device of this embodiment, since the position of the falling powder 7 is regulated by the two glass disks 1 and 2, the positioning accuracy is good, and a thin layer can be formed, allowing inspection. Accuracy can be improved, and defective products, foreign objects, etc. can be reliably removed.

また、ガラス円板1,2を用いていることで、
反射および透過光量の調節を容易に行うことがで
き(ガラス円板1,2の透過率を調節することに
よる)、不良品の光学的抽出が容易になる。また、
ガラス円板1,2を回転させ、粉粒体落下通路S
以外の位置でガラス円板1,2の粉粒体付着面を
クリーナ10,11によつて清掃しているため、
検査を中断せずに清掃を行うことができ、また、
検査を妨げないように清掃を行つているので、検
査精度を保証し、かつ能率を高めることができ
る。
In addition, by using the glass disks 1 and 2,
The amount of reflected and transmitted light can be easily adjusted (by adjusting the transmittance of the glass disks 1 and 2), and defective products can be easily optically extracted. Also,
By rotating the glass disks 1 and 2, the powder falling passage S
Since the powder adhesion surfaces of the glass disks 1 and 2 are cleaned by the cleaners 10 and 11 at other positions,
Cleaning can be performed without interrupting the inspection, and
Since cleaning is performed without interfering with the inspection, inspection accuracy can be guaranteed and efficiency can be increased.

なお、上記実施例では、テレビカメラ12を用
いて2次元画像を一定時間毎に撮像して画像処理
を行つたが、2次元のイメージセンサを用いて撮
像してもよい。また、1次元のイメージセンサに
より1次元画像を得、これを処理することにより
粉粒体の検査を行うこともできる。なお、画像の
撮像周期は検査視野内における粉粒体の落下速度
によつて決る。
In the above embodiment, the television camera 12 is used to capture two-dimensional images at regular intervals and image processing is performed, but a two-dimensional image sensor may be used to capture the images. Further, by obtaining a one-dimensional image using a one-dimensional image sensor and processing this image, it is also possible to inspect the powder or granular material. Note that the image capturing period is determined by the falling speed of the powder within the inspection field of view.

発明の効果 この発明の粉粒体検査装置は、一対の透明回転
体を所定の間隔をあけて設置することにより粉粒
体落下通路を形成し、この粉粒体落下通路中を粉
粒体が落下するようにしたため、一対の透明回転
体の間隔を適正に設定することで、一定厚みの薄
い粉粒体層を容易に作ることができ、検査精度を
安定させることができる。また、粉粒体落下通路
によつて粉粒体の拡散を規制しているため、不良
品、異物等の選別除去を容易かつ確実に行える。
また、クリーナで透明回転体を清掃しているた
め、透明回転体に粉粒体が付着して検査不能にな
ることもない。
Effects of the Invention The powder and granule inspection device of the present invention forms a powder and granule falling passage by installing a pair of transparent rotating bodies at a predetermined interval, and the powder and granules pass through this powder and granule falling passage. Since it is made to fall, by appropriately setting the interval between the pair of transparent rotating bodies, a thin powder layer with a constant thickness can be easily created, and inspection accuracy can be stabilized. Furthermore, since the powder falling passage restricts the dispersion of the powder, defective products, foreign matter, etc. can be easily and reliably sorted and removed.
Furthermore, since the transparent rotating body is cleaned with a cleaner, there is no possibility that particles will adhere to the transparent rotating body and make inspection impossible.

【図面の簡単な説明】[Brief explanation of drawings]

第1図および第2図はそれぞれこの発明の一実
施例の構成を示す概略図、第3図は第1図の要部
の詳細なブロツク図、第4図はテレビ画像を示す
概略図、第5図およず第6図は第4図における各
部の波形図、第7図は第1図における各部の波形
図、第8図はテレビ画像の有効エリアの領域の映
像を示す概略図である。 1,2……ガラス円板(透明回転体)、3,4
……ガイド側板、5……振動フイーダ(粉粒体搬
送手段)、6……選別装置、7……粉粒体、10,
11……クリーナ、12……テレビカメラ(撮像
装置)、14……反射光源、15……透過光源、
16……画像処理装置、17……遅延回路(選別
装置制御手段)、18……リトリガブルワンシヨ
ツトマルチバイブレータ(選別装置制御手段)。
1 and 2 are schematic diagrams showing the configuration of an embodiment of the present invention, FIG. 3 is a detailed block diagram of the main part of FIG. 1, and FIG. 4 is a schematic diagram showing a television image. Figures 5 and 6 are waveform diagrams of each part in Figure 4, Figure 7 is a waveform diagram of each part in Figure 1, and Figure 8 is a schematic diagram showing the video of the effective area of the television image. . 1, 2... Glass disk (transparent rotating body), 3, 4
... Guide side plate, 5 ... Vibrating feeder (powder transport means), 6 ... Sorting device, 7 ... Powder and granule material, 10,
11...Cleaner, 12...TV camera (imaging device), 14...Reflected light source, 15...Transmitted light source,
16... Image processing device, 17... Delay circuit (sorting device control means), 18... Retriggerable one-shot multivibrator (sorting device control means).

Claims (1)

【特許請求の範囲】[Claims] 1 前後に所定間隔をあけて平行対面するように
並設して相互対面部分で粉粒体落下通路を形成し
中心軸を回転軸として回転する一対の透明回転体
と、前記粉粒体落下通路の上端に落下口を位置決
めして粉粒体をシート状にして搬送する粉粒体搬
送手段と、前記粉粒体落下通路の下方の粉粒体落
下経路近傍に設置して粉粒体を除去する選別装置
と、前記一対の透明回転体の相互対向面をそれぞ
れ前記分粒体落下通路以外の位置で清掃するクリ
ーナと、前記粉粒体落下通路中を落下している粉
粒体を前記一対の透明回転体の前方位置から反射
照明する反射光源と、前記粉粒体落下通路中を落
下している粉粒体を前記一対の透明回転体の後方
位置から透過照明する透過光源と、前記粉粒体落
下通路中を落下している粉粒体を前記一対の透明
回転体の前方位置から撮像する撮像装置と、この
撮像装置の画像信号を処理することにより前記粉
粒体落下通路中を落下している粉粒体中の不良
品、異物等の存在を検出して不良信号を発生する
画像処理手段と、この画像処理手段からの不良信
号に応答して前記選別装置を所定時間作動させる
ことにより不良品粉粒体、異物等が含まれた粉粒
体を除去させる選別装置制御手段とを備え、前記
反射光源の光の良品粉粒体による反射光量と前記
透過光源からの光の前記一対の透明回転体のうち
後方のものの透過光量とを略等しく設定した粉粒
体検査装置。
1. A pair of transparent rotating bodies that are arranged parallel to each other so as to face each other at a predetermined distance in the front and back so that the mutually facing portions form a powder/grain material falling path and rotate about a central axis as a rotation axis, and the powder/granular material falling path. A powder conveying means that positions a falling port at the upper end and conveys the powder in the form of a sheet, and is installed near the powder falling path below the powder falling path to remove the powder. a sorting device for cleaning the mutually opposing surfaces of the pair of transparent rotating bodies at positions other than the particle sizer falling passage; a reflected light source that illuminates the powder by reflection from a position in front of the pair of transparent rotating bodies; a transmitted light source that illuminates the powder falling in the powder falling path from a rear position of the pair of transparent rotating bodies; an imaging device that takes an image of the powder falling through the powder falling path from a position in front of the pair of transparent rotating bodies; image processing means for detecting the presence of defective products, foreign matter, etc. in the powder or granular material and generating a defect signal; and operating the sorting device for a predetermined period of time in response to the defect signal from the image processing means. and a sorting device control means for removing defective powder and granular materials, powder and granular materials containing foreign matter, etc., and controlling the amount of light reflected by the good powder and granular materials from the reflected light source and the light from the transmitted light source. A powder inspection device in which the amount of light transmitted through the rear transparent rotating body is set to be approximately equal to the amount of light transmitted through the rear transparent rotating body.
JP3391585A 1985-02-20 1985-02-20 Bulk material inspector Granted JPS61191944A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3391585A JPS61191944A (en) 1985-02-20 1985-02-20 Bulk material inspector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3391585A JPS61191944A (en) 1985-02-20 1985-02-20 Bulk material inspector

Publications (2)

Publication Number Publication Date
JPS61191944A JPS61191944A (en) 1986-08-26
JPH0360380B2 true JPH0360380B2 (en) 1991-09-13

Family

ID=12399812

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3391585A Granted JPS61191944A (en) 1985-02-20 1985-02-20 Bulk material inspector

Country Status (1)

Country Link
JP (1) JPS61191944A (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63119887A (en) * 1986-11-06 1988-05-24 カネボウ株式会社 Selector
JPS63282640A (en) * 1987-05-14 1988-11-18 Fuji Electric Co Ltd Automatic inspecting instrument for foreign matter in powder
JP2603038Y2 (en) * 1992-03-10 2000-02-14 鐘紡株式会社 Powder inspection equipment
JP2722376B2 (en) * 1994-10-04 1998-03-04 東洋ガラス株式会社 Apparatus for removing foreign matter in transparent bodies
JP2009022870A (en) * 2007-07-19 2009-02-05 Anzai Seisakusho:Kk Feeding unit and feeding method for sorting apparatus
JP2010182239A (en) 2009-02-09 2010-08-19 Denso Corp Plug-in vehicle management system
JP5579645B2 (en) * 2011-03-24 2014-08-27 大成建設株式会社 Image capturing device for particle size distribution measurement
JP6435847B2 (en) * 2014-12-19 2018-12-12 株式会社サタケ Grain quality discrimination device
JP6435856B2 (en) * 2014-12-26 2018-12-12 株式会社サタケ Grain quality discrimination device
CN107250774B (en) 2014-12-19 2020-07-31 株式会社佐竹 Grain grade discriminating device
JP6435858B2 (en) * 2014-12-26 2018-12-12 株式会社サタケ Grain quality discrimination device
JP6851234B2 (en) * 2017-03-17 2021-03-31 大成建設株式会社 Imaging device for particle size distribution measurement
DE102018120722A1 (en) * 2018-08-24 2020-02-27 Nils Dickfeld Process for the selective separation of free-flowing products

Also Published As

Publication number Publication date
JPS61191944A (en) 1986-08-26

Similar Documents

Publication Publication Date Title
US4830194A (en) Granule inspection apparatus
US4352430A (en) Method and apparatus for sorting foreign bodies from material on a moving conveyor belt
EP0789633B1 (en) Sorting apparatus
JPH0360380B2 (en)
US6078018A (en) Sorting apparatus
JP3613769B2 (en) A two-dimensional monitoring device for continuous thin webs of fiber material
EP1170584B1 (en) Inspection of edges
US5132791A (en) Optical sheet inspection system
JPS6022977A (en) Classifier
US5309773A (en) Powder and granule inspection apparatus
CA2251323A1 (en) Surface defect inspection system and method
JPS61210929A (en) Inspecting instrument for granule
RU2117276C1 (en) Apparatus and method for measuring parameters of structural members in samples of textile materials (versions)
JP2005172608A (en) Appearance inspecting apparatus
JP3358560B2 (en) Method and apparatus for inspecting foreign matter in powder
JP2603038Y2 (en) Powder inspection equipment
JPS61216787A (en) Mechanism deciding, selecting and removing mixed foreign matter
CA2607200A1 (en) System and method for characterization of a particle flow
JP2868076B2 (en) Method for inspecting foreign matter in particulate matter and apparatus for inspecting foreign matter in particulate matter
JP2003294641A (en) Particle foreign object inspecting method and apparatus thereof
JPH06229945A (en) Equipment and method for measuring particulate contamination
JP3121593B1 (en) Dry laver inspection equipment
JP2815633B2 (en) Rice Grain Classifier
US2937750A (en) Color separation process and apparatus for the removal of impurities from whole corn kernels
US20090206286A1 (en) System and method for particle stream characterization

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term