JPH0235072U - - Google Patents
Info
- Publication number
- JPH0235072U JPH0235072U JP11455188U JP11455188U JPH0235072U JP H0235072 U JPH0235072 U JP H0235072U JP 11455188 U JP11455188 U JP 11455188U JP 11455188 U JP11455188 U JP 11455188U JP H0235072 U JPH0235072 U JP H0235072U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- electrode
- probe card
- measurement signal
- insulating substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 8
- 238000005259 measurement Methods 0.000 claims 2
- 239000000758 substrate Substances 0.000 claims 2
- 239000012212 insulator Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11455188U JPH0235072U (zh) | 1988-08-31 | 1988-08-31 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11455188U JPH0235072U (zh) | 1988-08-31 | 1988-08-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0235072U true JPH0235072U (zh) | 1990-03-06 |
Family
ID=31355405
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11455188U Pending JPH0235072U (zh) | 1988-08-31 | 1988-08-31 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0235072U (zh) |
-
1988
- 1988-08-31 JP JP11455188U patent/JPH0235072U/ja active Pending
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