JPH0235072U - - Google Patents

Info

Publication number
JPH0235072U
JPH0235072U JP11455188U JP11455188U JPH0235072U JP H0235072 U JPH0235072 U JP H0235072U JP 11455188 U JP11455188 U JP 11455188U JP 11455188 U JP11455188 U JP 11455188U JP H0235072 U JPH0235072 U JP H0235072U
Authority
JP
Japan
Prior art keywords
probe
electrode
probe card
measurement signal
insulating substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11455188U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11455188U priority Critical patent/JPH0235072U/ja
Publication of JPH0235072U publication Critical patent/JPH0235072U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP11455188U 1988-08-31 1988-08-31 Pending JPH0235072U (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11455188U JPH0235072U (zh) 1988-08-31 1988-08-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11455188U JPH0235072U (zh) 1988-08-31 1988-08-31

Publications (1)

Publication Number Publication Date
JPH0235072U true JPH0235072U (zh) 1990-03-06

Family

ID=31355405

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11455188U Pending JPH0235072U (zh) 1988-08-31 1988-08-31

Country Status (1)

Country Link
JP (1) JPH0235072U (zh)

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