JPH0235052U - - Google Patents
Info
- Publication number
- JPH0235052U JPH0235052U JP11417288U JP11417288U JPH0235052U JP H0235052 U JPH0235052 U JP H0235052U JP 11417288 U JP11417288 U JP 11417288U JP 11417288 U JP11417288 U JP 11417288U JP H0235052 U JPH0235052 U JP H0235052U
- Authority
- JP
- Japan
- Prior art keywords
- fulcrum pin
- transfer jig
- support plate
- rotor blade
- conjunction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000006073 displacement reaction Methods 0.000 claims 2
- 238000006243 chemical reaction Methods 0.000 claims 1
- 239000012530 fluid Substances 0.000 claims 1
Landscapes
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11417288U JPH0235052U (OSRAM) | 1988-08-31 | 1988-08-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11417288U JPH0235052U (OSRAM) | 1988-08-31 | 1988-08-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0235052U true JPH0235052U (OSRAM) | 1990-03-06 |
Family
ID=31354677
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11417288U Pending JPH0235052U (OSRAM) | 1988-08-31 | 1988-08-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0235052U (OSRAM) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015107538A (ja) * | 2013-12-04 | 2015-06-11 | 株式会社神戸工業試験場 | 狭隘部サンプル採取ヘッド、狭隘部サンプル採取方法および余寿命診断方法 |
-
1988
- 1988-08-31 JP JP11417288U patent/JPH0235052U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015107538A (ja) * | 2013-12-04 | 2015-06-11 | 株式会社神戸工業試験場 | 狭隘部サンプル採取ヘッド、狭隘部サンプル採取方法および余寿命診断方法 |