JPH0233366U - - Google Patents

Info

Publication number
JPH0233366U
JPH0233366U JP11288388U JP11288388U JPH0233366U JP H0233366 U JPH0233366 U JP H0233366U JP 11288388 U JP11288388 U JP 11288388U JP 11288388 U JP11288388 U JP 11288388U JP H0233366 U JPH0233366 U JP H0233366U
Authority
JP
Japan
Prior art keywords
electronic components
electrodes
electrically contacting
testing device
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11288388U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11288388U priority Critical patent/JPH0233366U/ja
Publication of JPH0233366U publication Critical patent/JPH0233366U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP11288388U 1988-08-29 1988-08-29 Pending JPH0233366U (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11288388U JPH0233366U (de) 1988-08-29 1988-08-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11288388U JPH0233366U (de) 1988-08-29 1988-08-29

Publications (1)

Publication Number Publication Date
JPH0233366U true JPH0233366U (de) 1990-03-02

Family

ID=31352227

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11288388U Pending JPH0233366U (de) 1988-08-29 1988-08-29

Country Status (1)

Country Link
JP (1) JPH0233366U (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021229714A1 (ja) * 2020-05-13 2021-11-18 三菱電機株式会社 電子デバイス検査装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021229714A1 (ja) * 2020-05-13 2021-11-18 三菱電機株式会社 電子デバイス検査装置
JPWO2021229714A1 (de) * 2020-05-13 2021-11-18

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