JPH023162Y2 - - Google Patents

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Publication number
JPH023162Y2
JPH023162Y2 JP13208782U JP13208782U JPH023162Y2 JP H023162 Y2 JPH023162 Y2 JP H023162Y2 JP 13208782 U JP13208782 U JP 13208782U JP 13208782 U JP13208782 U JP 13208782U JP H023162 Y2 JPH023162 Y2 JP H023162Y2
Authority
JP
Japan
Prior art keywords
gas
container
heater
temperature
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13208782U
Other languages
Japanese (ja)
Other versions
JPS5935859U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13208782U priority Critical patent/JPS5935859U/en
Publication of JPS5935859U publication Critical patent/JPS5935859U/en
Application granted granted Critical
Publication of JPH023162Y2 publication Critical patent/JPH023162Y2/ja
Granted legal-status Critical Current

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  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Description

【考案の詳細な説明】 本考案は、高温ガスの熱試験装置に関する。例
えばヘリウムガスは、数百度という高温度で熱媒
体として使用される。
[Detailed Description of the Invention] The present invention relates to a thermal testing device for high temperature gas. For example, helium gas is used as a heat carrier at temperatures as high as several hundred degrees.

このようなガスの性状を加圧状態かつ高温状態
の下で試験する場合、ガスを高温にする装置と試
験部を別体とし、これらを配管で連絡するのが装
置の大型化、複雑化をさける上で一般的である。
しかるに高温のガスを配管を通して移送するた
め、移送する間に熱損失のため温度が低下するお
それがある。ガス流量が大きい場合には、この温
度低下はそれ程問題にならないがガス流量が小さ
いときには大きくなり、何らかの処置が必要とな
る。なぜならば試験部としての性質上、その部分
の温度が流量を所定の条件下にしなければならな
いからである。
When testing the properties of such gases under pressure and high temperatures, it is best to separate the equipment that heats the gas and the test section, and connect them with piping, which increases the size and complexity of the equipment. It is common to avoid.
However, since high-temperature gas is transferred through piping, the temperature may drop due to heat loss during transfer. When the gas flow rate is large, this temperature drop does not pose much of a problem, but when the gas flow rate is small, it becomes large and requires some kind of treatment. This is because, due to its nature as a testing section, the temperature of that section must bring the flow rate under predetermined conditions.

したがつて、試験部の入口近傍に補助(補償)
加熱用のヒーターを設置することが必要とされて
いる。
Therefore, it is necessary to provide assistance (compensation) near the entrance of the testing section.
It is necessary to install a heater for heating.

しかして、配管ヒーターは、高価となるきらい
があり、又、外部加熱器は、複雑高価となるきら
いがあるので、現実的でなく、試験部を囲繞する
容器内に、円筒形ヒーター(内筒の外面に電熱線
を巻装し、ガスは円筒の中の円形断面流路を流れ
る。)を設けることが提案されていた。
However, pipe heaters tend to be expensive, and external heaters tend to be complicated and expensive. It was proposed that a heating wire be wrapped around the outside of the cylinder, and the gas would flow through a circular cross-sectional flow path inside the cylinder.

しかして、前述の円筒形ヒーターは、ガスの低
流量時の温度低下に対処するものであるが、ヘリ
ウム等のガスは、低流速時において加熱すると除
熱能力(熱伝達率)の低下現象(層流化現象)を
起しやすく、特に円形断面流路で層流化現象が発
生しやすいという問題が生じ、次のような欠点が
ある。
The above-mentioned cylindrical heater copes with the temperature drop during low gas flow rates, but when gases such as helium are heated at low flow rates, the heat removal ability (heat transfer coefficient) decreases ( A problem arises in that the laminar flow phenomenon is likely to occur, particularly in a circular cross-sectional flow path, and the following disadvantages arise.

(ア) ヒーターの設置箇所が、設定温度のほしい場
所から離れているために、途中での熱放散が多
い。
(a) Because the heater is installed far from the desired temperature setting, there is a lot of heat dissipation along the way.

(イ) 低流量時、対象ガスがヒータ面の周囲だけを
対流し、中央部には、低温の流体が下方に押し
だされていく。
(a) At low flow rates, the target gas convects only around the heater surface, and low-temperature fluid is pushed downwards in the center.

(ウ) 低流量時、ヒータ面が円滑に、対象ガスによ
り冷却されないので、ヒータ面の温度がすぐに
上がる。その結果ヒータ自身が過熱する。
(c) At low flow rates, the heater surface is not cooled smoothly by the target gas, so the temperature of the heater surface rises quickly. As a result, the heater itself overheats.

本考案は、前記した事情に鑑みなされたもので
ある。
The present invention has been developed in view of the above-mentioned circumstances.

すなわち、本考案は、試験体部を囲繞する容器
内に、環状断面流路をもち、かつ熱膨張差吸収構
造をもつ加熱接続管を内装し、接続管を試験体部
と容器の入口管との間に介装してなり、低流量時
の層流化現象の発生を抑制して、低流量から大流
量にわたつて試験体部への供給ガス温度を好適に
設定しうるようにした試験装置を提供せんとする
ものである。
That is, in the present invention, a heating connecting tube having an annular cross-sectional flow path and a thermal expansion difference absorbing structure is installed inside a container surrounding the test specimen section, and the connecting tube is connected between the test specimen section and the inlet pipe of the container. The test material is interposed between the test specimen and the test specimen to suppress the occurrence of laminar flow phenomenon at low flow rates, and to suitably set the temperature of the gas supplied to the test specimen from low flow rates to high flow rates. The aim is to provide the equipment.

以下、本考案を図示の実施例に基づいて説明す
る。
Hereinafter, the present invention will be explained based on the illustrated embodiments.

第1図において、圧力容器10の内部に試験体
部13が形成され、上方に突出した入口部15が
設けられている。容器10の胴上部に貫設された
入口管17は、加熱ガスすなわち高温ヘリウムガ
スの供給源(図示しない)に連絡し、更に内端は
閉じ、側部に円形断面の開口19が設けられてい
る。
In FIG. 1, a test specimen section 13 is formed inside a pressure vessel 10, and an inlet section 15 that projects upward is provided. An inlet pipe 17 extending through the upper part of the body of the container 10 communicates with a source of heating gas, i.e., high-temperature helium gas (not shown), and is closed at its inner end and provided with an opening 19 of circular cross section at the side. There is.

入口部15の側部に連結して固定され、鉛直上
方に延びた加熱接続管すなわちヒーター21の上
端拡大部は、開口19の中に挿通され、間にシー
ルリング23が嵌装されている。ヒータ21と共
に軸方向に変位するリング23は、開口19の内
面を摺動し、ガスの洩れを防止しながら熱膨張差
を吸収する。
An enlarged upper end portion of a heating connecting tube, that is, a heater 21, which is connected and fixed to the side of the inlet portion 15 and extends vertically upward, is inserted into the opening 19, and a seal ring 23 is fitted therebetween. The ring 23, which is axially displaced together with the heater 21, slides on the inner surface of the opening 19 and absorbs the difference in thermal expansion while preventing gas leakage.

第1図において図示されていないが、圧力容器
10の内面には、断熱材が添設されている。
Although not shown in FIG. 1, a heat insulating material is attached to the inner surface of the pressure vessel 10.

第2図は、ヒータ21の断面を示したもので、
外管25と内管27の間には、保温材29が充填
され、更に内管27の外面に接して、6本のシー
ズヒータ31が設けられている。
FIG. 2 shows a cross section of the heater 21.
A heat insulating material 29 is filled between the outer tube 25 and the inner tube 27, and six sheathed heaters 31 are provided in contact with the outer surface of the inner tube 27.

更に、内管27の中心部には、同軸状にシーズ
ヒータ33が設けられ、内管27の中にヘリウム
ガスの環状流路35が形成されている。
Further, a sheathed heater 33 is coaxially provided at the center of the inner tube 27, and an annular flow path 35 for helium gas is formed in the inner tube 27.

このような実施例において、供給源からの高温
ヘリウムガスは、図示しない移送管路内で熱損失
により温度低下を生じつつ、入口管17に入り、
更にヒータ21に入る。
In such embodiments, hot helium gas from the source enters the inlet pipe 17 with a temperature drop due to heat loss in a transfer line (not shown);
Furthermore, it enters the heater 21.

温度低下量は、流量値によつてほゞ定まるか
ら、流量値と試験体部の設定値とを勘案して、必
要な電力がシーズヒータ31,33に印加され、
ヘリウムガスは設定温度まで補償加熱される(必
要に応じ、フイードバツク回路が設けられる)。
Since the amount of temperature decrease is almost determined by the flow rate value, the necessary electric power is applied to the sheathed heaters 31 and 33 in consideration of the flow rate value and the set value of the test specimen part,
The helium gas is compensated and heated to a set temperature (if necessary, a feedback circuit is provided).

そして、設定温度のヘリウムガスは、試験体部
13に流入して、種々の試験に供される。
The helium gas at the set temperature then flows into the test body section 13 and is subjected to various tests.

前記した実施例によれば、ヒータ21のヘリウ
ムガス流路を環状断面とし、流路の中心部と外周
部にシーズヒータを配設したので、低流量時にお
いても層流化現象が生ずることなく、効率よくガ
スが加熱され、広い流量範囲にわたつて、ヘリウ
ムガスを設定温度にすることができる。
According to the embodiment described above, the helium gas flow path of the heater 21 has an annular cross section, and the sheathed heaters are arranged at the center and outer periphery of the flow path, so that no laminar flow phenomenon occurs even at low flow rates. , the gas is efficiently heated and the helium gas can be brought to the set temperature over a wide flow rate range.

更に、シーズヒータ31,33からガスへの熱
伝達が良好に行なわれるので、過熱によるシーズ
ヒータ31,33の焼損がないなど、極めてすぐ
れた実用的効果を奏する。
Furthermore, since heat transfer from the sheathed heaters 31, 33 to the gas is performed well, extremely excellent practical effects such as no burnout of the sheathed heaters 31, 33 due to overheating are achieved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本考案の実施例を示す概念図、第2
図は第1図の−線に沿つた断面図である。 10……容器、21……ヒータ、31,33…
…シーズヒータ、35……環状流路。
Figure 1 is a conceptual diagram showing an embodiment of the present invention;
The figure is a sectional view taken along the - line in FIG. 1. 10... Container, 21... Heater, 31, 33...
...Sheathed heater, 35...Annular flow path.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 内面に断熱材が添設された容器、該容器内に設
けられ内部に試験空間を画成する試験体部、該容
器の胴を直角に貫ぬいて設けられ先端側部に開口
を具えたガス入口管及び該試験体部に一端が固定
され他端が該開口に摺動自在に嵌合した加熱接続
管を有し、該接続管の流路の中心部と外周部にシ
ーズヒータを配設したことを特徴とする高温ガス
の熱試験装置。
A container with a heat insulating material attached to the inner surface, a test body part provided inside the container and defining a test space inside, and a gas container provided by penetrating the body of the container at right angles and having an opening on the side of the tip. It has an inlet pipe and a heating connecting pipe whose one end is fixed to the test body part and whose other end is slidably fitted into the opening, and a sheathed heater is arranged at the center and outer periphery of the flow path of the connecting pipe. This is a thermal testing device for high-temperature gas.
JP13208782U 1982-08-31 1982-08-31 High temperature gas thermal test equipment Granted JPS5935859U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13208782U JPS5935859U (en) 1982-08-31 1982-08-31 High temperature gas thermal test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13208782U JPS5935859U (en) 1982-08-31 1982-08-31 High temperature gas thermal test equipment

Publications (2)

Publication Number Publication Date
JPS5935859U JPS5935859U (en) 1984-03-06
JPH023162Y2 true JPH023162Y2 (en) 1990-01-25

Family

ID=30298404

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13208782U Granted JPS5935859U (en) 1982-08-31 1982-08-31 High temperature gas thermal test equipment

Country Status (1)

Country Link
JP (1) JPS5935859U (en)

Also Published As

Publication number Publication date
JPS5935859U (en) 1984-03-06

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