JPH0231154U - - Google Patents
Info
- Publication number
- JPH0231154U JPH0231154U JP10950688U JP10950688U JPH0231154U JP H0231154 U JPH0231154 U JP H0231154U JP 10950688 U JP10950688 U JP 10950688U JP 10950688 U JP10950688 U JP 10950688U JP H0231154 U JPH0231154 U JP H0231154U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor layer
- conductivity type
- layer
- stacked
- receiving element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10950688U JPH0231154U (de) | 1988-08-20 | 1988-08-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10950688U JPH0231154U (de) | 1988-08-20 | 1988-08-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0231154U true JPH0231154U (de) | 1990-02-27 |
Family
ID=31345811
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10950688U Pending JPH0231154U (de) | 1988-08-20 | 1988-08-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0231154U (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002319697A (ja) * | 2001-04-23 | 2002-10-31 | Seiko Instruments Inc | 光センサ及びその検査方法 |
-
1988
- 1988-08-20 JP JP10950688U patent/JPH0231154U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002319697A (ja) * | 2001-04-23 | 2002-10-31 | Seiko Instruments Inc | 光センサ及びその検査方法 |
| JP4527311B2 (ja) * | 2001-04-23 | 2010-08-18 | セイコーインスツル株式会社 | 光センサ及びその検査方法 |