JPH02307204A - Sheathing method for electronic component - Google Patents
Sheathing method for electronic componentInfo
- Publication number
- JPH02307204A JPH02307204A JP1129267A JP12926789A JPH02307204A JP H02307204 A JPH02307204 A JP H02307204A JP 1129267 A JP1129267 A JP 1129267A JP 12926789 A JP12926789 A JP 12926789A JP H02307204 A JPH02307204 A JP H02307204A
- Authority
- JP
- Japan
- Prior art keywords
- resin
- electronic component
- terminal
- adhered
- lead terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 21
- 229920005989 resin Polymers 0.000 claims abstract description 50
- 239000011347 resin Substances 0.000 claims abstract description 50
- 238000002844 melting Methods 0.000 claims abstract description 4
- 230000008018 melting Effects 0.000 claims abstract description 4
- 229920001187 thermosetting polymer Polymers 0.000 claims abstract description 3
- 238000004806 packaging method and process Methods 0.000 claims description 11
- 238000010438 heat treatment Methods 0.000 claims description 5
- 239000003822 epoxy resin Substances 0.000 abstract description 5
- 229920000647 polyepoxide Polymers 0.000 abstract description 5
- 230000001680 brushing effect Effects 0.000 abstract description 3
- 238000007598 dipping method Methods 0.000 abstract description 2
- 238000003825 pressing Methods 0.000 abstract description 2
- 229910000679 solder Inorganic materials 0.000 description 14
- 239000003990 capacitor Substances 0.000 description 11
- 239000010410 layer Substances 0.000 description 9
- 238000007654 immersion Methods 0.000 description 6
- 238000005476 soldering Methods 0.000 description 4
- 238000009736 wetting Methods 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000013007 heat curing Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 239000002344 surface layer Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001723 curing Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000004519 grease Substances 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004850 liquid epoxy resins (LERs) Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Apparatuses And Processes For Manufacturing Resistors (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
【発明の詳細な説明】 産業上の利用分野 本発明は電子部品の外装方法に関するものである。[Detailed description of the invention] Industrial applications The present invention relates to a method for packaging electronic components.
従来の技術
従来、電子部品素子を樹脂外装する方法とじて液状(討
脂に浸漬して加熱硬化する方法、粉末状樹脂に浸漬して
加熱硬化する方法、樹脂ケースに収納する方法、モール
ド成型により外装する方法などが採用されているが、こ
の内粉末状樹脂を用いて外装する方法が比較的多く使用
されてきている。Conventional technology Conventionally, the methods for packaging electronic component elements with resin include methods such as immersing them in liquid resin and heat curing them, immersing them in powdered resin and heat curing them, storing them in resin cases, and molding them. Among these methods, the method of packaging with powdered resin has been used relatively often.
この場合電子部品にはリード端子が引出されているため
、該リード端子に樹脂が付着しその除去工程が付加され
ていた。例えば特開昭50−16857号公報のように
電子部品素子およびリード線を予熱した後粉末状樹脂に
浸漬して引き上げ、余分な部分に付層した樹脂を除去し
て加熱硬化したり、特開昭55−15306号公報のよ
うに電子部品素子およびリード端子を予熱した後、粉末
状樹脂に浸漬して引き上げ、これを加熱溶融して冷却し
た後余分な部分に付着した樹脂を除去し加熱硬化する外
装方法などが検討されていた。In this case, since lead terminals are drawn out from the electronic component, resin adheres to the lead terminals, and a process for removing the resin is added. For example, as in JP-A-50-16857, electronic component elements and lead wires are preheated, immersed in powdered resin, pulled up, excess resin layered, and heated to harden; As in Publication No. 55-15306, after preheating electronic component elements and lead terminals, they are immersed in powdered resin and pulled up, heated and melted, cooled, and then the resin adhering to excess parts is removed and heated to harden. The exterior packaging methods were being considered.
発明が解決しようとする問題点
上述のような粉末状樹脂を用いて外装する方法において
は、電子部品素子の外周部に均一な厚さの樹脂層を形成
するためには予熱、浸漬を数回繰返して行わねばならず
、そのためリード端子に数回繰返して付着した手討脂が
容易に除去できず、研磨時間が長くなって、リード端子
のメッキ部分まで傷がつきはんだ付は性が悪くなるなど
の問題があった。Problems to be Solved by the Invention In the method of packaging using powdered resin as described above, preheating and dipping are required several times in order to form a resin layer of uniform thickness around the outer periphery of the electronic component element. This has to be done repeatedly, and as a result, it is not easy to remove the grease that has adhered to the lead terminals several times, and the polishing time becomes long, causing scratches on the plated parts of the lead terminals, resulting in poor soldering properties. There were other problems.
問題点を解決するための手段
本発明は上述の問題を解決したもので、電子部品素子を
予熱して粉末状の熱硬化性樹脂に浸漬し、該樹脂を付着
させた後加熱硬化する電子部品の外装方法において、電
子部品素子を予熱および浸漬を繰返してリード端子の根
元より突出しない位置まで樹脂を付着する工程と、該電
子部品素子を予熱して該素子全体およびリード端子の所
定の長さまで上記樹脂に浸漬して引き上げ、これを加熱
溶融せずリード端子の余分な部分に付着している樹脂を
除去した後、加熱硬化することを特徴とする電子部品の
外装方法である。Means for Solving the Problems The present invention solves the above-mentioned problems, and provides an electronic component in which an electronic component element is preheated and immersed in a powdered thermosetting resin, and after the resin is attached, the electronic component is heated and cured. In the packaging method, the electronic component element is repeatedly preheated and immersed to adhere the resin to a position that does not protrude from the base of the lead terminal, and the electronic component element is preheated to a predetermined length of the entire element and the lead terminal. This is a method for packaging an electronic component, which is characterized in that the lead terminal is immersed in the resin and pulled up, and then the resin adhering to the excess portion of the lead terminal is removed without being heated and melted, and then heated and hardened.
作用
上述の外装方法により電子部品素子のみが予熱、樹脂浸
漬が繰返されるので、該素子の外周部にほぼ均一な厚さ
の樹脂層が形成され、リード端子の余分な部分に付着し
た樹脂は加熱溶融せず、除去工程に移されるため樹脂が
容易にはがれ、研磨時間が短縮され、リード端子のメッ
キ部分まで傷が付かずはんだ付は性が著しく向上するな
どの効果がある。Effect: By the above-mentioned packaging method, only the electronic component element is repeatedly preheated and immersed in resin, so a resin layer of almost uniform thickness is formed around the outer periphery of the element, and the resin attached to the excess portion of the lead terminal is heated. Since the resin is transferred to the removal process without being melted, the resin is easily peeled off, the polishing time is shortened, and the plated parts of the lead terminals are not damaged, resulting in significantly improved soldering properties.
実施例
以下、本発明を第1図〜第5図に示すフィルムコンデン
サの実施例により説明する。EXAMPLES The present invention will be explained below with reference to examples of film capacitors shown in FIGS. 1 to 5.
まず第4図のように治具3に固定された複数個のフィル
ムコンデンサ素子1を100〜120℃にて予備加熱し
た後粘度300〜500cps 、表面張力24dyn
e/cmの液状エポキシ樹脂に浸漬して温度100〜1
25°Cにて40〜60分間加熱硬化した後、該温度に
て加熱されたコンデンサ素子1を第1図(イ)のように
軟化温度50〜70℃の粉末状のエポキシ樹脂4中に浸
漬して第1図(ロ)のように引き上げる。3はリード端
子、5は浸漬して付着溶融した樹脂層である。次いでは
同様に予熱した後、第1図(ハ)のように粉末状のエポ
キシ樹脂4に浸漬して第1図(ニ)のように引き上げる
。第1図(イ)および第1図(ハ)においても浸漬深さ
J、、j22はリード端子3の根元より突出しない位置
すなわち12と同じまたはそれ以下の寸法まで浸漬して
引き上げ樹脂層6を形成する。そしてさらに該フィルム
コンデンサ素子を予熱した後、第1図(ホ)のように粉
末状エポキシ樹脂4中で該素子全体およびリード端子3
の所定の長さi3を含む距離まで浸漬して引き上げる。First, as shown in Fig. 4, a plurality of film capacitor elements 1 fixed to a jig 3 are preheated at 100 to 120°C, and then the viscosity is 300 to 500 cps and the surface tension is 24 dyn.
immersed in liquid epoxy resin of e/cm at a temperature of 100 to 1
After curing by heating at 25°C for 40 to 60 minutes, the capacitor element 1 heated at the temperature is immersed in powdered epoxy resin 4 with a softening temperature of 50 to 70°C as shown in FIG. 1(a). and pull it up as shown in Figure 1 (b). 3 is a lead terminal, and 5 is a resin layer that has been immersed and melted. Next, after preheating in the same manner, it is immersed in powdered epoxy resin 4 as shown in FIG. 1(c) and pulled up as shown in FIG. 1(d). In FIGS. 1(a) and 1(c), the immersion depth J, j22 is the same as or smaller than 12, where the immersion depth J22 is the same as or smaller than 12, and the resin layer 6 is pulled up. Form. After further preheating the film capacitor element, the entire element and lead terminals 3 are placed in a powdered epoxy resin 4 as shown in FIG.
It is immersed to a distance including a predetermined length i3 of , and then pulled up.
このときフィルムコンデンサ素子のリード端子3の外表
面には最終段における予熱温度により初めて付着溶融し
た状態の樹脂層7が第2図のように形成される。次に該
素子を加熱溶融せず第2図のようにリード端子3の余分
な部分に付着している樹脂層7に治具歯8を当接して切
れ目を付けた後プレスし、さらにブラッシングして余分
の樹脂層を除去し、温度110℃の加熱炉中で90〜1
20分間加熱して上述の樹脂層を溶融流動させて硬化さ
せ第3図のように光沢のある美しい表面層を形成する。At this time, a resin layer 7 is formed on the outer surface of the lead terminal 3 of the film capacitor element, as shown in FIG. 2, which is adhered and melted for the first time due to the preheating temperature in the final stage. Next, without heating and melting the element, as shown in Fig. 2, jig teeth 8 are brought into contact with the resin layer 7 adhering to the excess portion of the lead terminal 3 to make cuts, followed by pressing, and further brushing. Remove the excess resin layer and heat in a heating furnace at a temperature of 110°C.
The resin layer is heated for 20 minutes to melt and flow and harden to form a glossy and beautiful surface layer as shown in FIG.
そして該表面層上に紫外線硬化性インクを用いて定格を
表示し完成する。なお、上記浸漬深さj21、および1
2の位置はフィルムコンデンサ素子の形状、大きさによ
って設定することにより完成した表面の樹脂層の厚さを
ほぼ均一にすることができる。Then, the rating is indicated on the surface layer using ultraviolet curable ink to complete the process. In addition, the above immersion depth j21 and 1
By setting the position 2 depending on the shape and size of the film capacitor element, the thickness of the resin layer on the completed surface can be made almost uniform.
表は上述の実施例に基づいて製作した本発明法によるフ
ィルムコンデンサと従来法によるものとの比較例である
。The table shows a comparison example between a film capacitor manufactured by the method of the present invention based on the above-mentioned example and one manufactured by the conventional method.
表
表中のリード端子への樹脂付着不良率は、摺脂外装後外
観検査において、不要な樹脂がリード端子3に残存して
いる製品の不良率、またリード線のはんだ濡れ性は、上
記製品のリード端子を予め温度60°C1湿度90〜9
5%の恒温槽中に72時間放置後、常温に1時間放置し
、フラックスに浸漬して温度230℃の溶融はんだ橿に
よりソルダーグラフで試験した結果を示す。そして表中
の時間は、ソルダーグラフ試験において浸漬深さ2mm
、浸漬時間4秒とし、第5図に示すソルダーグラフ曲線
において、thの接線とはんだ濡れ平衡点t4の交点t
4がはんだ濡れ開始より何秒であるかを調べた値である
。第5図においてtlははんだ槽に浸漬開始、t2はは
んだ槽上昇停止、t3ははんだ濡れ開始、thは濡れが
進み変位0、t4ははんだ濡れ平衡点、t5ははんだ槽
下降、t6ははんだ浴面を離れる点である。The defective rate of resin adhesion to lead terminals in the table is the defective rate of products in which unnecessary resin remains on the lead terminal 3 in the external appearance inspection after the resin coating, and the solder wettability of the lead wire is the defective rate of products mentioned above. Preheat the lead terminals to a temperature of 60°C and a humidity of 90 to 9.
The results of a solder graph test using a molten solder rod at a temperature of 230° C. after being left in a 5% thermostatic bath for 72 hours, left at room temperature for 1 hour, and immersed in flux are shown. And the time in the table is the immersion depth of 2mm in the solder graph test.
, the immersion time is 4 seconds, and in the solder graph curve shown in FIG.
4 is the value obtained by examining how many seconds have elapsed since the start of solder wetting. In Figure 5, tl is the start of immersion in the solder bath, t2 is the stop of rising of the solder bath, t3 is the start of solder wetting, th is the progress of wetting and the displacement is 0, t4 is the solder wetting equilibrium point, t5 is the descent of the solder bath, and t6 is the solder bath. This is the point where it leaves the surface.
表からあきらかなように本発明法による製品は外観不良
が少なく、リード線のはんだ付は性が著しく改善されて
いる。なお上述の実施例はフィルムコンデンサについて
述べたが、タンタルコンデンサ、抵抗器など他の電子部
品についても同様な効果を奏することはいうまでもない
。As is clear from the table, the products manufactured by the method of the present invention have fewer defects in appearance, and the soldering properties of the lead wires are significantly improved. Although the above-described embodiments have been described with respect to film capacitors, it goes without saying that similar effects can be achieved with other electronic components such as tantalum capacitors and resistors.
発明の効果
以上のように本発明法によれば外装樹脂の厚さをほぼ均
一にできかつリード端子のはんだ付は性が著しく向上す
る。ブラッシングなど樹脂除去が容易になり、摩耗寿命
が増し取替え点検保守期間が長くなるなど生産管理面に
おいても有利となる。Effects of the Invention As described above, according to the method of the present invention, the thickness of the exterior resin can be made almost uniform, and the soldering properties of the lead terminals are significantly improved. It is also advantageous in terms of production management, as it makes it easier to remove the resin by brushing, increases wear life, and lengthens replacement, inspection and maintenance periods.
第1図〜第4図は本発明の電子部品の外装方法により製
造されるフィルムコンデンサの製造過程における説明図
。第5図はリード端子のはんだ漏れ性を評価するための
ソルダーグラフ曲線図である。
1:フィルムコンデンサ素子
2:リード端子
3:粉末状エポキシ樹脂FIGS. 1 to 4 are explanatory diagrams of the manufacturing process of a film capacitor manufactured by the electronic component packaging method of the present invention. FIG. 5 is a solder graph curve diagram for evaluating solder leakage of lead terminals. 1: Film capacitor element 2: Lead terminal 3: Powdered epoxy resin
Claims (1)
、該樹脂を付着させた後加熱硬化する電子部品の外装方
法において、電子部品素子を予熱および浸漬を繰返して
リード端子の根元より突出しない位置まで樹脂を付着す
る工程と、該電子部品素子を予熱して該素子全体および
リード端子の所定の長さまで上記樹脂に浸漬して引き上
げ、これを加熱溶融せずリード端子の余分な部分に付着
している樹脂を除去した後、加熱硬化することを特徴と
する電子部品の外装方法。In an electronic component packaging method in which an electronic component element is preheated and immersed in a powdered thermosetting resin, and the resin is adhered and then heated and cured, the electronic component element is repeatedly preheated and dipped, and then the base of the lead terminal is removed. A process of attaching the resin to a position where it does not protrude, and preheating the electronic component element, immersing the entire element and the lead terminal in the resin to a predetermined length, and pulling it up, and removing the excess portion of the lead terminal without heating and melting it. A method for packaging electronic parts, which comprises removing resin attached to the parts and then curing them by heating.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1129267A JPH02307204A (en) | 1989-05-23 | 1989-05-23 | Sheathing method for electronic component |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1129267A JPH02307204A (en) | 1989-05-23 | 1989-05-23 | Sheathing method for electronic component |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02307204A true JPH02307204A (en) | 1990-12-20 |
Family
ID=15005352
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1129267A Pending JPH02307204A (en) | 1989-05-23 | 1989-05-23 | Sheathing method for electronic component |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02307204A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100395397B1 (en) * | 2001-08-31 | 2003-08-27 | 서병인 | A method for plating a metal glaze on a ceramic rod and a metal glazed ceramic rod prepared thereby |
-
1989
- 1989-05-23 JP JP1129267A patent/JPH02307204A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100395397B1 (en) * | 2001-08-31 | 2003-08-27 | 서병인 | A method for plating a metal glaze on a ceramic rod and a metal glazed ceramic rod prepared thereby |
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