JPH02307073A - Characteristic measuring instrument for dielectric material - Google Patents

Abstract

PURPOSE:To measure material constants such as the specific dielectric constant and dielectric tangent of a dielectric material in the milliwave band by providing a columnar resonator made of the dielectric material to be measured in a cylindrical case and constituting a rotationally symmetrical resonance system. CONSTITUTION:The upper part 1 and lower part 2 of the case are joined vertically, a columnar space is formed at the upper part in the case lower part 2 and two coupling holes 3 and 4 are formed opposite the side part. The columnar dielectric resonator 5 made of the dielectric material to be measured is held by a holding base 6 and installed at the center part in the columnar space of the case lower part 2. Further, the flange parts of waveguides 7 and 8 which are sectioned rectangularly are fitted with screws 9 while the upper part 1 and lower part 2 of the case are joined together. Then, the resonator 5 is arranged in the columnar space to obtain the rotationally symmetrical resonance system and the coupling holes 3 and 4 can be connected to an external network analyzer, etc., through the waveguides 7 and 8, so the resonance frequency and non-load Q of the resonator 5 can be measured without using any coaxial connector.

Description

DETAILED DESCRIPTION OF THE INVENTION (Al Industrial Field of Application) The present invention relates to an apparatus for constructing a dielectric resonator using a dielectric material to be measured and measuring electrical characteristics of the dielectric material.

fbl Conventional technology The relative dielectric constant (εr) and dielectric loss tangent ([an"δ
), etc., the dielectric constant and dielectric loss tangent are determined by constructing a dielectric resonator using the dielectric material to be measured and measuring its resonant frequency and no-load Q.

FIG. 3 is a sectional view of a measuring device showing an example of this, in which a dielectric resonator 5 made of a dielectric material to be measured is installed via a holding table 6 in a shield case consisting of a metal case 19 and a metal cover 20. has been done.

This shield case is provided with coaxial connectors 16 and 17, which are coupled to the dielectric resonator 5 by a coupling rod.

(Problem to be solved by the C1 invention) However, in measurement devices that input and output signals using coaxial connectors, the characteristics of the coaxial connector (especially the reflection characteristics) deteriorate when the frequency exceeds 20 GHz. It is not possible to accurately determine the electrical properties of materials.

Therefore, as a measuring device that does not use a coaxial connector, it is conceivable to install a dielectric resonator made of a dielectric material to be measured in a cut-off waveguide, as shown in FIG. 4, for example. In FIG. 4, 18 is a cut-off waveguide, 5 is a dielectric resonator made of a dielectric material to be measured, and 6 is a holder thereof.

However, when a cutoff waveguide is used in this way, the cross section of the cutoff waveguide is rectangular and the system is not rotationally symmetrical, making it difficult to analyze the relative dielectric constant and dielectric loss tangent. Therefore, there was a problem in that the dielectric constant and dielectric loss tangent could not be immediately determined from the resonant frequency and the no-load Q.

The purpose of this invention is to provide a measuring device that can measure the electrical characteristics of dielectric materials in the millimeter wave band by using a waveguide and making the resonance system of a dielectric resonator rotationally symmetrical. be.

(Means for Solving Problem d1) The dielectric material characteristic measuring device of the present invention has a coupling hole for electromagnetic coupling with a waveguide connected to the outside, and has a dielectric material to be measured inside. The present invention is characterized in that a cylindrical case is installed in which a cylindrical resonator consisting of a cylindrical resonator is installed, and a waveguide is connected to this 5° space and electrically coupled through the coupling hole.

fe) Function In the dielectric material characteristic measuring device of the present invention, a rotationally symmetrical resonant system is obtained by installing a cylindrical resonator made of the dielectric material to be measured in a cylindrical case.
It is coupled to a waveguide connected to the outside by a coupling hole.

Therefore, by directly connecting this waveguide to a network analyzer, etc., it is possible to measure the resonant frequency and no-load Q of the dielectric resonator without using a coaxial connector. Electrical properties such as coefficient and dielectric loss tangent can be easily determined.

(fl Example) The structure of a dielectric material characteristic measuring device which is a first example of the present invention is shown in FIGS. 1(A) and 1(B).
is a vertical cross-sectional view, and Figure 1 (B) is a line taken along A-A in Figure 1 (A).
FIG.

In Figures 1 (A) and (B), ■ indicates the upper part of the case,
2 is the lower part of the case, and both are joined in the vertical direction. There is a cylindrical space inside the upper part of the case lower part 2,
Two coupling holes 3.4 are formed opposite to each other on the sides. 5
1) A cylindrical dielectric resonator made of a regular dielectric material, 6 a holding stand, and installed in the center of the cylindrical space in the lower part 2 of the case. Further, 7 and 8 are waveguides each having a rectangular cross section, and the flange portions of the waveguides 7 and 8 are attached with screws 9 while the case upper part l and the case lower part 2 are joined.

In the measuring device having the structure shown in FIG. 1, a cylindrical case is formed inside with the case upper part l and the case lower part 2 joined together, and the resonance system is rotationally symmetrical. In addition, the waveguides 7 and 8
TE,. An electromagnetic wave whose fundamental mode is propagated. At this time, the magnetic lines of force (indicated by broken lines in the figure) run in the longitudinal direction of the waveguide cross section, and the axis of the dielectric resonator 5 is parallel to the longitudinal direction of the waveguide cross section, so electromagnetic waves propagate through the waveguide. mode and the mode of the dielectric resonator are coupled. The strength of this bond can be adjusted by changing the shape and size of the bonding holes 3.4.

The structure of a dielectric material characteristic measuring device according to a second embodiment of the present invention is shown in FIGS. 2(A) and 2(B). Figure 2 (
A) is a longitudinal cross-sectional view of the device, and FIG. 2(B) is a longitudinal cross-sectional view of the A-A section in FIG. 2(A).

In FIG. 2, 1) is the upper part of the waveguide, and 12 is the lower part of the waveguide, and when both are joined by screws 13, a circular waveguide is formed. In addition, in the upper waveguide 1) and the lower waveguide 12, a coupling hole 14 is formed in the central axis portion when both are joined, and a coupling hole 15 is formed in the center of the nodes 1), a, and 12a. Clauses 1) b and i2b are provided. 1 by joining the upper waveguide 1) and the lower waveguide 12.
) A cylindrical case is constituted by two nodes consisting of a, l'la and llb, 12b. Inside this cylindrical case, a cylindrical dielectric resonator 5 made of a dielectric material to be measured is supported on a concentric axis by a ring-shaped support frame 10.

In the measurement device shown in Fig. 2, i'EOI is applied to the circular waveguide.
The electromagnetic wave propagates in the T mode and passes through the coupling hole 14.15.
It is coupled to the E or mode dielectric resonator 5. The strength of this bond is the connection hole i4. , 15 by changing the shape and size of h? A can be adjusted.

fg) Effects of the Invention As described above, according to the present invention, the resonance system of the cylindrical dielectric resonator made of the dielectric material to be measured can be made rotationally symmetrical, and the signal can be transmitted without using a coaxial connector. 2, which was difficult in the past.
Relative permittivity of dielectric material at 0 GHz or higher, y,! It becomes possible to measure material constants such as tangent.

[Brief explanation of the drawing]

FIGS. 1(A) and (B) are diagrams showing the structure of a dielectric material characteristic measuring device according to the first embodiment of the present invention, and FIGS. FIG. 2 is a diagram showing the structure of a dielectric material characteristic measuring device according to an example. FIGS. 3 and 4 are diagrams showing an example of a conventional device for measuring characteristics of dielectric materials. 1-upper part of the case, 2-lower part of the nogoose, 3.4-coupling hole, 5-dielectric resonator, 6-holding stand, 7.8 one-sided waveguide, (1)+12)-circular waveguide, 14 .15-Binding pore.

Claims (1)

[Claims] (1) A cylindrical case that has a coupling hole for electromagnetic coupling with a waveguide connected to the outside, and in which a cylindrical resonator made of a dielectric material to be measured is installed, and this case. An apparatus for measuring characteristics of a dielectric material, which comprises connecting the waveguide to the waveguide.