JPH02302678A - Apparatus for measuring temperature characteristics of electronic circuit part - Google Patents

Apparatus for measuring temperature characteristics of electronic circuit part

Info

Publication number
JPH02302678A
JPH02302678A JP1123145A JP12314589A JPH02302678A JP H02302678 A JPH02302678 A JP H02302678A JP 1123145 A JP1123145 A JP 1123145A JP 12314589 A JP12314589 A JP 12314589A JP H02302678 A JPH02302678 A JP H02302678A
Authority
JP
Japan
Prior art keywords
electronic circuit
pulse current
relay
connector
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1123145A
Other languages
Japanese (ja)
Inventor
Motohide Miyoshi
三好 基秀
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP1123145A priority Critical patent/JPH02302678A/en
Publication of JPH02302678A publication Critical patent/JPH02302678A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To enhance the reliability of measurement by providing a pulse current passing circuit between a meter and a relay and turning the same ON to allow a pulse current to flow to a wiring route beforehand to reduce the contact resistance of an interposed contact part. CONSTITUTION:A pulse current passing circuit 20 consisting of a load resistor 22 and a switch 24 is provided between the voltmeter 18 of the wiring route positioned outside a thermostatic tank 2 and wiring change-over relays 16a - 16n. When the relay 16a corresponding to the electronic circuit part 6a among electronic circuit parts 6a after the switch 24 of the circuit 20 is turned ON, the pulse current determined by the output voltage of the part 6a and a load resistor 22 successively flows through the circuit 20 from a socket 4a, a connector 8, a cable 10, a connector 14 and the relay 16a and, therefore, an arc is generated in the mechanical connection parts of them and, as a result, an oxide film is destructed and contact resistance is reduced. In the same way, by successively changing over the relays 16b - 16n and reducing the contact resistances of all routes, measurement of high reliability can be performed.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明は、恒温槽内に電子回路部品を配置してその温度
特性を調べる場合に使用される温度特性測定装置に関す
る。
DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention relates to a temperature characteristic measuring device used when electronic circuit components are placed in a constant temperature bath and their temperature characteristics are investigated.

〈従来の技術〉 一般に、半導体素子を含む電子回路部品では、その温度
特性を調査して温度補償が確実に行われるか否か等を調
べることが必要となることがある。
<Prior Art> Generally, it is sometimes necessary to investigate the temperature characteristics of electronic circuit components including semiconductor elements to determine whether temperature compensation can be performed reliably.

このような場合には、従来、第2図に示す温度特性測定
装置が使用されている。この装置10は、恒温槽2を備
え、この恒温槽2の内部に測定ボード3が収納され、こ
の測定ボード3上にソケット4a〜4nを介して測定対
象となる電子回路部品63〜6nが装着される。また、
測定ボード3は、恒温槽2内に設けたコネクタ8に接続
され、このコネクタ8にはケーブル10が接続されてお
り、各ケーブル10が恒温槽2の外部に引き出されて測
定112に接続されている。この測定器12は、各ケー
ブル10を接続するためのコネクタ14、各電子回路部
品64〜6nを選択切り換えするための配線切換リレー
16a=16n、および各電子回路部品6a〜6nの出
力電圧を測定する電圧計18を備える。
In such cases, a temperature characteristic measuring device shown in FIG. 2 has conventionally been used. This device 10 includes a constant temperature bath 2, a measurement board 3 is housed inside the constant temperature bath 2, and electronic circuit components 63 to 6n to be measured are mounted on the measurement board 3 via sockets 4a to 4n. be done. Also,
The measurement board 3 is connected to a connector 8 provided inside the thermostatic oven 2, and cables 10 are connected to the connector 8, and each cable 10 is pulled out to the outside of the thermostatic oven 2 and connected to a measurement 112. There is. This measuring device 12 measures the connector 14 for connecting each cable 10, the wiring switching relay 16a=16n for selecting and switching each electronic circuit component 64 to 6n, and the output voltage of each electronic circuit component 6a to 6n. A voltmeter 18 is provided.

そして、一つの配線切換リレーたとえば16aが選択接
続されると、恒温槽2内に配置された電子回路部品6a
からの出力がソケット4a、コネクタ8、ケーブル10
a1コネクタ14、リレー16aを順次弁して電圧計1
8に加えられて出力電圧が測定される。こうして、配線
切換リレーl6a−16nが順次切り換えられることに
より、各々の電子回路部品63〜6nの出力電圧が測定
される。
When one wiring switching relay, for example 16a, is selectively connected, the electronic circuit component 6a arranged in the thermostatic oven 2
Output from socket 4a, connector 8, cable 10
Valve the a1 connector 14 and relay 16a in order and check the voltmeter 1.
8 and the output voltage is measured. In this way, the wiring switching relays l6a-16n are sequentially switched, thereby measuring the output voltage of each of the electronic circuit components 63-6n.

〈発明が解決しようとする課題〉 しかしながら、従来の上記構成の装置においては、特に
恒温槽2内に設けられた測定ボード3上のソケット48
〜4nおよびコネクタ8は、温度の影響を受けて表面が
酸化し易く、その結果、接触不良を起こすことがある。
<Problems to be Solved by the Invention> However, in the conventional device having the above configuration, the socket 48 on the measurement board 3 provided in the thermostatic chamber 2
~4n and the connector 8 are susceptible to oxidation on their surfaces under the influence of temperature, which may result in poor contact.

電圧計等のインピーダンスの高い計器を使用したときに
は、配線経路に流れる電流は極めて小さいので、上記の
ように配線経路に介在するソケット48〜4n、コネク
タ8.14さらには配線切換リレー16a−16nが僅
かに接触不良を起こした場合でも出力電圧が変動し、精
度良い測定結果が得られなくなる。
When a high impedance meter such as a voltmeter is used, the current flowing through the wiring path is extremely small, so the sockets 48 to 4n, connectors 8 and 14, and wiring switching relays 16a to 16n interposed in the wiring path are Even if a slight contact failure occurs, the output voltage will fluctuate, making it impossible to obtain accurate measurement results.

く課題を解決するための手段〉 本発明は、このような事情に鑑みてなされたものであっ
て、電子回路部品の温度特性の測定開始にあたって、事
前に配線経路に介在するソケット、コネクタ、リレー等
の接触抵抗を軽減できるようして、常に信頼性の高い測
定結果が得られるようにするものである。
Means for Solving the Problems> The present invention has been made in view of the above circumstances, and it is necessary to check the sockets, connectors, and relays intervening in the wiring path in advance before starting the measurement of the temperature characteristics of electronic circuit components. It is possible to reduce the contact resistance such as, etc., so that highly reliable measurement results can be obtained at all times.

そのため、本発明では、恒!t!と、この恒温槽内に配
置される電子回路部品の電気的特性を前記恒温槽の外部
において測定する電圧計、電流計等の計器と、この計器
を前記電子回路部品に電気的に接続する配線経路とから
なり、この配線経路は、前記恒温槽の内部から外部に引
き出されたケーブル、このケーブルの一端を前記恒温槽
内において電子回路部品に接続するコネクタ、ソケット
等の接触子、および前記ケーブルの他端を計器に接続す
るするリレーが介在されてなる電子回路部品の温度特性
測定装置において、 前記恒温槽の外部に位置する配線経路の前記計器とリレ
ーとの間に、負荷抵抗とスイッチからなるパルス電流通
過回路を設けたことを特徴としている。
Therefore, in the present invention, Heng! T! and a meter such as a voltmeter or an ammeter for measuring the electrical characteristics of the electronic circuit components placed in the thermostatic chamber outside the thermostatic chamber, and wiring that electrically connects this meter to the electronic circuit component. The wiring route consists of a cable drawn out from inside the thermostatic oven, a connector that connects one end of this cable to an electronic circuit component in the thermostatic oven, a contact such as a socket, and the cable. In an apparatus for measuring temperature characteristics of electronic circuit components, the other end of which is connected to a meter, a relay is interposed between the load resistor and the switch between the meter and the relay in a wiring path located outside the thermostatic oven. It is characterized by the provision of a pulse current passing circuit.

く作用〉 上記構成において、恒温槽内に配置された電子回路部品
の温度特性を調べるのに際しては、最初にパルス電流通
過回路のスイッチをオンにした後、次に、電子回路部品
に対応した配線経路のリレーをオンにする。すると、こ
れに伴って配線経路とパルス電流通過回路とを通じてパ
ルス電流が流れるので、リレー、ソケット、コネクタ等
の機械的接触部にアーク等が生じ、その結果、酸化皮膜
が破壊されて接触抵抗が小さくなる。
In the above configuration, when investigating the temperature characteristics of electronic circuit components placed in a constant temperature oven, first turn on the switch of the pulse current passing circuit, and then turn on the wiring corresponding to the electronic circuit components. Turn on the route relay. As a result, a pulse current flows through the wiring path and the pulse current passing circuit, causing arcs and the like to occur at mechanical contact points such as relays, sockets, connectors, etc. As a result, the oxide film is destroyed and the contact resistance increases. becomes smaller.

〈実施例〉 第1図は本発明の実施例に係る電子回路部品の温度特性
測定装置の回路構成図であり、第2図に示した従来例に
対応する部分には、同一の符号を付す。
<Example> Fig. 1 is a circuit configuration diagram of a temperature characteristic measuring device for electronic circuit components according to an embodiment of the present invention, and parts corresponding to the conventional example shown in Fig. 2 are given the same reference numerals. .

第1図において、符号lは温度特性測定装置の全体を示
し、2は恒温槽、3は恒温槽2内に配置された測定ボー
ド、4a〜4nは測定ボード3上に設けられたソケット
、6a〜6nは各ソケット48〜4nに接続された電子
回路部品、8は測定ボード3の接続用のコネクタ、lO
は恒温槽2の内部から外部に引き出された各ケーブル、
12は測定器、14はケーブル10の接続用のコネクタ
、16a〜+6nは各電子回路部品6a〜6nを選択切
り換えするための配線切換リレー、18は各電子口°路
部品6a〜6nの出力電圧を測定する計器である電圧計
であり、これらの構成は第2図に示した従来例の場合と
同様である。
In FIG. 1, reference numeral l indicates the entire temperature characteristic measuring device, 2 is a constant temperature bath, 3 is a measurement board placed in the constant temperature bath 2, 4a to 4n are sockets provided on the measurement board 3, 6a ~6n is an electronic circuit component connected to each socket 48~4n, 8 is a connector for connecting the measurement board 3, lO
are each cable pulled out from the inside of thermostatic chamber 2,
12 is a measuring device, 14 is a connector for connecting the cable 10, 16a to +6n is a wiring switching relay for selectively switching each electronic circuit component 6a to 6n, and 18 is an output voltage of each electronic circuit component 6a to 6n. This is a voltmeter which is an instrument for measuring , and the configuration thereof is the same as that of the conventional example shown in FIG.

本発明の特徴とするところは、恒温槽2の外部に位置す
る配線経路の電圧計18と配線切換リレー16a〜16
nとの間に、負荷抵抗22とスイッチ(本例ではリレー
スイッチ24)からなるパルス電流通過回路20を設け
たことである。
The present invention is characterized by a voltmeter 18 in the wiring route located outside the thermostatic oven 2 and wiring switching relays 16a to 16.
A pulse current passing circuit 20 consisting of a load resistor 22 and a switch (in this example, a relay switch 24) is provided between the terminal and the terminal.

したがって、上記構成において、恒温槽2内に配置され
た電子回路部品63〜6nの温度特性を調べるのに際し
ては、最初にパルス電流通過回路20のリレースイッチ
24をオンにした後、次に、一つの電子回路部品たとえ
ば6aに対応した配線経路の配線切換リレー16aをオ
ンにする。すると、これに伴って電子回路部品6aの出
力電圧と負荷抵抗22とで決まるパルス電流がソケット
4a1 コネクタ8、ケーブルlO、コネクタ14、配
線切換リレー16aからパルス電流通過回路20を通じ
て流れるので、上記のソケット4a、コネクタ8.14
、配線切換リレー16aの各々の機械的接触部にアーク
等が生じ、その結果、酸化皮膜が破壊されて接触抵抗が
小さくなる。同様に、各配線切換リレー16b〜16n
を順次切り換えることにより、全ての配線経路の機械的
接触部の接触抵抗が軽減される。
Therefore, in the above configuration, when investigating the temperature characteristics of the electronic circuit components 63 to 6n arranged in the thermostatic chamber 2, first turn on the relay switch 24 of the pulse current passing circuit 20, and then turn on the relay switch 24 of the pulse current passing circuit 20. The wiring switching relay 16a of the wiring route corresponding to one electronic circuit component, for example 6a, is turned on. As a result, a pulse current determined by the output voltage of the electronic circuit component 6a and the load resistance 22 flows from the socket 4a1, connector 8, cable IO, connector 14, and wiring switching relay 16a through the pulse current passing circuit 20. Socket 4a, connector 8.14
An arc or the like occurs at each mechanical contact portion of the wiring switching relay 16a, and as a result, the oxide film is destroyed and the contact resistance is reduced. Similarly, each wiring switching relay 16b to 16n
By sequentially switching , the contact resistance of the mechanical contact portions of all wiring paths is reduced.

その後は、パルス電流通過回路20のリレースイッチ2
4をオフにしてから、本来の電子回路部品6a〜6nの
出力電圧を電圧計18で測定する。
After that, the relay switch 2 of the pulse current passing circuit 20
4 is turned off, the output voltages of the original electronic circuit components 6a to 6n are measured with the voltmeter 18.

〈発明の効果〉 本発明によれば、電子回路部品の温度特性の測定開始に
あたって、パルス電流通過回路をオンにして事前に配線
経路にパルス電流を流すことができるので、配線経路に
介在するソケット、コネクタ、リレー等の接触抵抗が軽
減され、その結果、信頼性の高い測定結果が得られるよ
うになる等の優れた効果が発揮される。
<Effects of the Invention> According to the present invention, when starting the measurement of the temperature characteristics of electronic circuit components, the pulse current passing circuit can be turned on to flow a pulse current through the wiring path in advance, so that the socket intervening in the wiring path can be , the contact resistance of connectors, relays, etc. is reduced, and as a result, excellent effects such as the ability to obtain highly reliable measurement results are exhibited.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例に係る電子回路部品の温度特性
測定装置の回路構成図、第2図は従来例の電子回路部品
の温度特性測定装置の回路構成図である。 !・・・電子回路部品の温度特性測定装置、2・・・恒
温槽、48〜4n・・・ソケット、6a〜6n・・・電
子回路部品、8.10・・・コネクタ、16a−16n
・・・リレー、18・・・電圧計(計器)、20・・パ
ルス電流通過回路、22・・・負荷抵抗、24・・・ス
イッチ(リレースイッチ)。
FIG. 1 is a circuit configuration diagram of a temperature characteristic measuring device for electronic circuit components according to an embodiment of the present invention, and FIG. 2 is a circuit configuration diagram of a conventional example of a temperature characteristic measuring device for electronic circuit components. ! ...Temperature characteristic measuring device for electronic circuit components, 2...Thermostatic chamber, 48-4n...Socket, 6a-6n...Electronic circuit component, 8.10...Connector, 16a-16n
... Relay, 18... Voltmeter (meter), 20... Pulse current passing circuit, 22... Load resistance, 24... Switch (relay switch).

Claims (1)

【特許請求の範囲】[Claims] (1)恒温槽と、この恒温槽内に配置される電子回路部
品の電気的特性を前記恒温槽の外部において測定する電
圧計、電流計等の計器と、この計器を前記電子回路部品
に電気的に接続する配線経路とからなり、この配線経路
は、前記恒温槽の内部から外部に引き出されたケーブル
、このケーブルの一端を前記恒温槽内において電子回路
部品に接続するコネクタ、ソケット等の接触子、および
前記ケーブルの他端を計器に接続するするリレーが介在
されてなる電子回路部品の温度特性測定装置において、 前記恒温槽の外部に位置する配線経路の前記計器とリレ
ーとの間に、負荷抵抗とスイッチからなるパルス電流通
過回路を設けたことを特徴とする電子回路部品の温度特
性測定装置。
(1) A thermostatic oven, a meter such as a voltmeter or an ammeter that measures the electrical characteristics of the electronic circuit components placed in the thermostatic oven outside the thermostatic oven, and a This wiring route consists of a cable drawn out from inside the thermostatic oven to the outside, and a connector, socket, etc. that connects one end of this cable to an electronic circuit component inside the thermostatic oven. and a relay connecting the other end of the cable to a meter. A device for measuring temperature characteristics of electronic circuit components, characterized by having a pulse current passing circuit consisting of a load resistor and a switch.
JP1123145A 1989-05-16 1989-05-16 Apparatus for measuring temperature characteristics of electronic circuit part Pending JPH02302678A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1123145A JPH02302678A (en) 1989-05-16 1989-05-16 Apparatus for measuring temperature characteristics of electronic circuit part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1123145A JPH02302678A (en) 1989-05-16 1989-05-16 Apparatus for measuring temperature characteristics of electronic circuit part

Publications (1)

Publication Number Publication Date
JPH02302678A true JPH02302678A (en) 1990-12-14

Family

ID=14853308

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1123145A Pending JPH02302678A (en) 1989-05-16 1989-05-16 Apparatus for measuring temperature characteristics of electronic circuit part

Country Status (1)

Country Link
JP (1) JPH02302678A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104670152A (en) * 2013-11-27 2015-06-03 株式会社有信 Electric rotation locking apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104670152A (en) * 2013-11-27 2015-06-03 株式会社有信 Electric rotation locking apparatus
JP2015101263A (en) * 2013-11-27 2015-06-04 株式会社ユーシン Electric steering lock device
CN104670152B (en) * 2013-11-27 2018-04-20 株式会社有信 Electric steering-lock device

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