JPH02294937A - Optical pickup device - Google Patents

Optical pickup device

Info

Publication number
JPH02294937A
JPH02294937A JP1115627A JP11562789A JPH02294937A JP H02294937 A JPH02294937 A JP H02294937A JP 1115627 A JP1115627 A JP 1115627A JP 11562789 A JP11562789 A JP 11562789A JP H02294937 A JPH02294937 A JP H02294937A
Authority
JP
Japan
Prior art keywords
light
output
laser beam
astigmatism
photodetector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1115627A
Other languages
Japanese (ja)
Inventor
Hitoshi Furuhata
均 古畑
Yoshinori Kano
鹿野 義則
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Electronic Corp filed Critical Pioneer Electronic Corp
Priority to JP1115627A priority Critical patent/JPH02294937A/en
Publication of JPH02294937A publication Critical patent/JPH02294937A/en
Pending legal-status Critical Current

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  • Automatic Focus Adjustment (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Optical Head (AREA)

Abstract

PURPOSE:To reduce an influence caused by the birefringence of a disk substrate to a focus error signal by providing an astigmatism generation photodetector having astigmatism generating function and photodetector function, and two quadripartite optical detector on a detecting system. CONSTITUTION:Reflected laser beam is made incident from the vertical magnetizing film 3b of a magneto-optical disk 3 respectively through an objective lens 14, beam splitter 12, 1/2 wavelength board 40 and detecting lens 41 on an astigmatism generation photodetector 42. For the magneto-optically deflected laser beam, the size of the quantity of light is changed by the photodetector 42. In the laser beam splitted by transmission and reflection, P polarized light transmitted through the photodetector 42 forms a spot on the light receiving surface of a first quadripartite optical detector 44 and S polarized light reflected on a polarizing film 42a of the photodetector 42 forms a spot on the light receiving surface of a second quadripartite optical detector 45. Since the focus error signal is generated based on the outputs of both detectors 44 and 45, the influence caused by the birefringence does not appear in the focus error signal.

Description

【発明の詳細な説明】 炎血尖1 本発明は光ピックアップ装冒に関し、特にレザビームを
用いて光磁気記録媒体から情報を続出し又は書込みをな
す光ピックアップ装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical pickup device, and more particularly to an optical pickup device that sequentially outputs or writes information from a magneto-optical recording medium using a laser beam.

ユ旦弦盟 従来から第6図に概略を示す光ピックアップ装置が知ら
れている。かかる装置は、光源系1及び検出系2からな
り、光磁気ディスク3ヘレーザビ〜ムを照射して情報の
記録再生をなづ−。
2. Description of the Related Art An optical pickup device schematically shown in FIG. 6 has been known. This device consists of a light source system 1 and a detection system 2, and records and reproduces information by irradiating a magneto-optical disk 3 with a laser beam.

光源系1は、レーザビーム源である半導体レーザ11,
コリメータレンズ12,P偏光反射率RPが20%で・
かつS偏光反射率Rs100%のビームスプリッタ13
,及び対物レンズ14から構成されている。
The light source system 1 includes a semiconductor laser 11 which is a laser beam source,
Collimator lens 12, P polarization reflectance RP is 20%.
and a beam splitter 13 with an S polarization reflectance Rs of 100%.
, and an objective lens 14.

検出系2は、1/2波長板20,P及びSの両偏光に分
離する偏光ビームスプリツタ(以F,PBSどいう)2
1,検出レンズ22a,非点収差発生素子である円柱レ
ンズ23,直交する2線分によって4分割ざれてなる4
つの受光面を有する4分割光検出器24,検出レンズ2
2b,及び1線分によって2分割されてなる2つの受光
面を有する2分割光検出器25から構成されている。こ
゛こで検出系2においては、1/2波長板20がその光
学軸をビームスプリッタ13の入射面に対して22.5
゜傾けて配設して、PBS21によるP及びS両偏光の
分離が対応する両光検出器24,25に対して同等とな
るJ;うにざれてある。J:た、このように1/2波長
板20を設りないで、検出系2を入射する直線偏光に対
して7!I5゜の角度で回転させても1/2波長板20
と同様の効果が得られる。
The detection system 2 includes a 1/2 wavelength plate 20 and a polarization beam splitter (hereinafter referred to as F, PBS) 2 that separates the light into both P and S polarizations.
1. Detection lens 22a, cylindrical lens 23 which is an astigmatism generating element, 4 divided by two orthogonal line segments.
4-split photodetector 24 with two light-receiving surfaces, detection lens 2
2b, and a two-split photodetector 25 having two light-receiving surfaces divided into two by one line segment. Here, in the detection system 2, the 1/2 wavelength plate 20 has its optical axis set at 22.5 points with respect to the incident surface of the beam splitter 13.
They are arranged at an angle of .degree., so that the separation of both P and S polarized light by the PBS 21 is equivalent for both the corresponding photodetectors 24 and 25. J: 7! for linearly polarized light entering the detection system 2 without providing the 1/2 wavelength plate 20 like this! Even when rotated at an angle of I5°, the 1/2 wavelength plate 20
The same effect can be obtained.

かかる装置の動作は、まず半導体レーザー1からのレー
ザビームはコリメータレンズ12で平行レーザビームに
され、ビームスブリッター3を透過して対物レンズ14
で光磁気ディスク3に向iJて集光される。光磁気ディ
スク3に集光された集束レーザビームは基板3aを介し
て垂直磁化膜3bで反射され、この反則レーザビームは
対物レンズ14で平行レーザビームにされてビームスブ
リッタ13によって検出系2の1/2波長板20を介し
てPBS21に向(プられる。
The operation of this device is as follows: First, a laser beam from a semiconductor laser 1 is collimated into a parallel laser beam by a collimator lens 12, passes through a beam splitter 3, and passes through an objective lens 14.
The light is focused toward the magneto-optical disk 3 at iJ. The focused laser beam focused on the magneto-optical disk 3 is reflected by the perpendicular magnetization film 3b via the substrate 3a, and this repulsed laser beam is converted into a parallel laser beam by the objective lens 14 and sent to one of the detection systems 2 by the beam splitter 13. The signal is directed to the PBS 21 via the /2 wavelength plate 20.

PBS21はビームスプリッタ13からの光をP,S両
偏光に分離づ′る.,PBS21を透過したP偏光は検
出レンズ22aで集光され集束レーザビームとなり、非
点収差発生素子23を介し−c4分割光検出器24の受
光面にスポットを形成する。
The PBS 21 separates the light from the beam splitter 13 into both P and S polarization. , P-polarized light transmitted through the PBS 21 is condensed by the detection lens 22a to become a focused laser beam, which forms a spot on the light receiving surface of the -c4 split photodetector 24 via the astigmatism generating element 23.

PBS21で反射されたS偏光は検出レンズ22bを介
して2分割光検出器25の受光面にスボットを形成する
The S-polarized light reflected by the PBS 21 forms a spot on the light receiving surface of the two-split photodetector 25 via the detection lens 22b.

4分割光検出器24におけるスポットの形状は、レーザ
ビームが光磁気ディスク3に合焦したときは円になり、
焦点が外れたどきは非点収差により4分割の対角位置の
方向に伸びた楕円状になる。
The shape of the spot on the 4-split photodetector 24 becomes a circle when the laser beam is focused on the magneto-optical disk 3;
When the lens is out of focus, it becomes an ellipse that extends in the diagonal direction of the four divisions due to astigmatism.

また、2分割光検出器25の分割線は光学的にディスク
のトラック方向に一致されており、レーザビームがトラ
ックに乗っているときは2つの受光面の光量が同じにな
り、1〜ラックから外れているときは2つの受光面の光
量に差が生じる。
In addition, the dividing line of the two-split photodetector 25 is optically aligned with the track direction of the disk, and when the laser beam is on the track, the light intensity on the two light receiving surfaces is the same, and from When it is off, there will be a difference in the amount of light between the two light receiving surfaces.

また、光磁気ディスク3に照射されるレーザビームは半
導体レーザー1の特性によって直線偏光にされており、
この直線偏光は垂直磁化膜3bの磁化方向く記録情報)
に応じて左右いずれかの方向に回転ざれる。そして、こ
の回転方向は4分割光検出器24と2分割光検出器25
にJ′3i−Jる受光量の差となって現れ、その受光量
差から光磁気再生信号が得られる。
Furthermore, the laser beam irradiated onto the magneto-optical disk 3 is linearly polarized due to the characteristics of the semiconductor laser 1.
This linearly polarized light is recorded in the magnetization direction of the perpendicularly magnetized film 3b (recorded information).
Rotates either left or right depending on the location. This rotation direction is determined by the four-split photodetector 24 and the two-split photodetector 25.
This appears as a difference in the amount of received light J'3i-J, and a magneto-optical reproduction signal is obtained from the difference in the amount of received light.

第7図は検出系2におりる回路図であり、4分割光検出
器2/Iの4つの受光面2 4 a〜24dによる各受
光出力は、2対の対角位置の各々2つの受光面(24a
と24c,24bと24d)ごとに加算され、この加算
出力同士の差がフォーカスエラー信号として取り出ざれ
る。また、2分割光検出器25の2つの受光面25a,
25bの各受光出力の差が1へラッキングエラー信号と
1ノで取り出される。さらに、4分割光検出器24の総
受光出力と2分割光検出器25の総受光出力との差は光
磁気再生信号として取り出され、これによって同相のノ
イズ成分が除去されるとともに、直線偏光の回転方向ず
なわら光磁気ディスク3に記録された情報が差動検出さ
れる。
FIG. 7 is a circuit diagram of the detection system 2, and each light receiving output from the four light receiving surfaces 24a to 24d of the 4-split photodetector 2/I is generated by two light receiving outputs at each of two pairs of diagonal positions. Surface (24a
and 24c, 24b, and 24d), and the difference between the added outputs is extracted as a focus error signal. Furthermore, the two light receiving surfaces 25a of the two-split photodetector 25,
The difference between the respective light reception outputs of 25b is extracted as a racking error signal of 1 and 1. Furthermore, the difference between the total received light output of the 4-split photodetector 24 and the total received light output of the 2-split photodetector 25 is extracted as a magneto-optical reproduction signal, which removes in-phase noise components and removes linearly polarized light. Information recorded on the magneto-optical disk 3 is differentially detected in all directions of rotation.

ところで、光磁気ディスク用の透明基板3aどしては、
光学均一性に優れたガラス基板が適しているが、量産性
やコス1〜の面からプラスチック化が望まれており、」
ンパク1・ディスクなどに使用されているポリカーボネ
ー1〜基板が有力となっている。しかしながら、このポ
リカーボネー1〜は複屈折が犬ぎいため次のような現象
が生じる。
By the way, as for the transparent substrate 3a for magneto-optical disk,
A glass substrate with excellent optical uniformity is suitable, but a plastic substrate is desired from the standpoint of mass production and low cost.
Polycarbonate 1~ substrates, which are used in discs, etc., are becoming popular. However, these polycarbonates 1 to 1 have extremely high birefringence, and therefore the following phenomenon occurs.

ディスクに集光される集束レーザビームは円錐状に絞り
込まれるので、その集束レーザビ〜ムの波面の中心部で
は基板3aに対して垂直になるが、波面の周辺部になる
に従って基板3aに対する入躬角が大きくなる。このた
め、反射したレーザビームの波面の周辺部分の光は基板
3aの複屈折によるリターディションを受で楕円偏光ど
なる。
Since the focused laser beam focused on the disk is narrowed down into a conical shape, the wavefront of the focused laser beam is perpendicular to the substrate 3a at the center, but as it approaches the periphery of the wavefront, it becomes less intrusive to the substrate 3a. The angle becomes larger. Therefore, the light at the periphery of the wavefront of the reflected laser beam receives retardation due to birefringence of the substrate 3a and becomes elliptically polarized light.

従って、楕円偏光成分により光検出器24,25の受光
面における強度分布が不均一になり、第8図に示したよ
うに、合焦位置におけるスポットSOを受(ノる4分割
光検出器24の4つの受光面のうち一方の対角対(24
b,24d)の受光量が他方の対角対(24a,24C
)の受光量より多くなる部分Spが生じる。この現象に
より、光検出器からのフォーカスエラー信号にオフセッ
トが生じたり、光検出器上でのトラック横切り成分がア
ンバランスとなる。
Therefore, the intensity distribution on the light receiving surfaces of the photodetectors 24 and 25 becomes non-uniform due to the elliptically polarized light components, and as shown in FIG. One diagonal pair (24
b, 24d) is different from the other diagonal pair (24a, 24C).
) is generated. This phenomenon causes an offset in the focus error signal from the photodetector, and an unbalanced cross-track component on the photodetector.

このため、複屈折の大きなポリカーボネー1へを基板と
した光磁気ディスクの記録iJi生を行う場合は、複屈
折が殆どないガラスやPMMA等を塁板にした光磁気デ
ィスクを用いた場合よりも、ベス1・フォーカス位置が
ずれたりフA一カス]丁ラー信号への1〜ラック横切り
ノイズが増加するという問題がある。
Therefore, when performing recording on a magneto-optical disk using polycarbonate 1 as a substrate, which has a large birefringence, it is better to use a magneto-optical disk with a substrate made of glass, PMMA, etc., which has almost no birefringence. There is a problem in that the 1-to-rack cross-crossing noise to the 1-to-1 rack signal increases.

また、従来の光磁気記録再生装『イの光ビックアップ装
置の構造は、以上のように部品点数が多く、構成が複雑
化するので、小型化で,さ゛ず、」ス1〜も高くなると
いう問題もある。
In addition, the structure of the conventional optical pickup device for magneto-optical recording and reproducing equipment has a large number of parts as described above, and the configuration is complicated. There is also the problem.

l肛五且1 本発明の目的は、上記のような欠点を解決しかつ装置を
椛成する各構成機能素子を集約化して簡素化しつつディ
スク基板の複屈折によるフォーカスエラー信号への影響
を低減さける光磁気記録再生装置の光ピックアップ装置
を提供J−るこどにある。
1. It is an object of the present invention to solve the above-mentioned drawbacks and to reduce the influence of the birefringence of the disk substrate on the focus error signal while consolidating and simplifying each constituent functional element that makes up the device. Our company provides optical pickup devices for magneto-optical recording and reproducing devices.

本発明は、光学式記録媒体に集束レーザビームを照射し
て情報を読み取る光ピックアップ装置にiJNプるフォ
ーカスエラー信号発生装置であって、前記記録媒体から
入rlA1る集束レーり゛ビームを二光線束に分離しつ
つこれらに非点収差を伺与する非点収差発生機能、及び
該集束レーザビームの偏光を検出する検光子機能を有す
る非点収差発生検光手段と、 前記二光線束の光路中に各々配設されかつ直交する2線
分にJ;って4分割された4つの受光面を有する一対の
4分割光検出器と、 前記光検出器に各々接続されかつこれらから発せられる
信号出力を演算して少なくともフォーカスエラー信号を
出力する演算手段とからなり、前記非点収差発生検光手
段は、透明な一対の両面平行板と前記両面平行板の間に
扶持された偏光膜とからなり、入射するレーザビームの
波面に対して前記偏光膜を所定角度で傾斜せしめたこと
ことを特徴とする。
The present invention is a focus error signal generating device that is applied to an optical pickup device that reads information by irradiating a focused laser beam onto an optical recording medium, and which outputs a focused laser beam that enters from the recording medium into two light beams. an astigmatism generation/analysis means having an astigmatism generation function that separates the laser beam into a bundle and imparts astigmatism thereto, and an analyzer function that detects the polarization of the focused laser beam; and an optical path of the two-ray bundle. a pair of 4-split photodetectors each having a light-receiving surface divided into 4 parts along two orthogonal line segments; the astigmatism generation analyzing means includes a pair of transparent double-sided parallel plates and a polarizing film supported between the double-sided parallel plates; The polarizing film is characterized in that the polarizing film is inclined at a predetermined angle with respect to the wavefront of the incident laser beam.

夫一』L一例 以下、本発明による実施例を図面を参照しつつ説明づる
An example of the present invention will now be described with reference to the drawings.

第1図(aHb)は本実施例の光ピックアップ装賀の概
略図である。尚、第1図において第6図と同符号の部材
は同一の部拐を示す故にその説明は省略する。本装置の
検出系4は、1/2波長板40検出レンズ41,非点収
差発生検光子/I2,mlの4分割光検出器,及び第2
の4分割光検出器44,45から構成されている。これ
ら4分割光検出器はフォーカスサーボ機横により光磁気
ディスクと対物レンズどの距離を自動制御づ−るための
−ノオーカスエラー信号を非点収差を有するレーザビー
ムから検出する。
FIG. 1 (aHb) is a schematic diagram of the optical pickup mounting according to this embodiment. Incidentally, in FIG. 1, members having the same symbols as those in FIG. 6 indicate the same parts, and therefore their explanations will be omitted. The detection system 4 of this device includes a 1/2 wavelength plate 40, a detection lens 41, an astigmatism generating analyzer/I2, a 4-split photodetector of ml, and a second
It is composed of four-divided photodetectors 44 and 45. These 4-split photodetectors detect a nocus error signal from a laser beam having astigmatism for automatically controlling the distance between the magneto-optical disk and the objective lens by the side of the focus servo machine.

非点収差発生検光子42は、透明な同一月利でかつ同一
厚さの一対の両面平行板の間に偏光膜42aを挟持させ
た素子である。かかる非点収差発生検光子42は、これ
に人0’J 71−るレーザビーl\の波面に対して所
定角度で傾斜せしめることによって、レーザビームに非
点収差をイζ1与する非点収差発生機能と、磁気光学的
に振動面が回転したレリ“ビームの偏光の有無を検出す
る検光子機能とを有し、P偏光成分はほぼ100%透過
しS偏光成分ははほ100%反射づーるものである。非
点収差発生検光子42は、偏光膜A2aに関して対称に
両面平行板が形成されている故に、偏光膜42aの両側
に同量の非点収差を得ることがでぎる、,このように、
非点収差発生検光子42は、レーザビームを三光線束に
分離しつつこれら二光線束に非点収差を得られざえすれ
ば、対称な両面平行板の代わりに、両側で厚さが異なり
屈折率等の異なる材料からなる両面平行板若しくは実平
行板で形成してもよい。例えば、屈折率の大なる両面平
行板と屈折率の小なる両面平行板とを組合せた場合には
、屈折率の大なるものの厚さを屈折率の小なるものより
も薄く形成して非点収差発生検光子を形成する。尚、第
1及び第2の4分割光検出器4.4.45は、双方の受
光面が非点収差発生検光子42の偏光膜に対して鏡像位
置に位置するように配置されている。
The astigmatism generating analyzer 42 is an element in which a polarizing film 42a is sandwiched between a pair of transparent double-sided parallel plates having the same monthly rate and the same thickness. The astigmatism generating analyzer 42 is tilted at a predetermined angle with respect to the wavefront of the laser beam generated by the person, thereby generating an astigmatism that imparts astigmatism to the laser beam. It has an analyzer function that detects the presence or absence of polarization of the Lely beam whose vibration plane has been magneto-optically rotated, and almost 100% of the P-polarized light component is transmitted and almost 100% of the S-polarized light component is reflected. Since the astigmatism generating analyzer 42 has double-sided parallel plates formed symmetrically with respect to the polarizing film A2a, it is possible to obtain the same amount of astigmatism on both sides of the polarizing film 42a. like,
If the astigmatism generating analyzer 42 can separate the laser beam into three ray bundles and obtain astigmatism for these two ray bundles, the astigmatism generating analyzer 42 can be used instead of a symmetrical double-sided parallel plate with different thicknesses on both sides. It may be formed of double-sided parallel plates or real parallel plates made of materials with different ratios. For example, when a double-sided parallel plate with a high refractive index and a double-sided parallel plate with a low refractive index are combined, the thickness of the plate with the higher refractive index is made thinner than the plate with the lower refractive index, and the astigmatism is formed. Form an aberration generating analyzer. The first and second four-split photodetectors 4, 4, and 45 are arranged such that both light receiving surfaces are located in mirror image positions with respect to the polarizing film of the astigmatism generating analyzer 42.

また、この検出系4は、1/2波長板40を用いる代わ
りに第6図について説明した検出系2と同様に、第1図
(b)  に示ず如く光源系1からの直線偏光に対して
45゜回転さけても同様の効果を得る。
Furthermore, instead of using the 1/2 wavelength plate 40, this detection system 4 is similar to the detection system 2 described with reference to FIG. The same effect can be obtained even if the rotation is avoided by 45 degrees.

かかる実施例の装置の動作は、まず、光磁気ディスク3
の垂直磁化膜3bからの反射レーザビームは、対物レン
ズ1/′Iで集光ざれてごームスプリッタ13に向りら
れる。このビームスブリツタ13からのレーザビームは
1/2波長板40を介して検出レンズ41で集束されて
非点収差発生検光子42に入用される。ここで光磁気的
に偏光されているレーザビームは検光子42にJ;り光
伍の大小の変化を受+jる。透過及び反射により分N1
されたレーザビームにd3いては、検光子42を透過し
たP偏光は第1の4分割光検出器44の受光面にスボッ
]〜を形成し、検光子42の偏光膜4 2 aで反射さ
れたS偏光は第2の4分割光検出器45の受光面にスポ
ットを形成する。
The operation of the apparatus of this embodiment is as follows: First, the magneto-optical disk 3
The reflected laser beam from the perpendicularly magnetized film 3b is focused by the objective lens 1/'I and directed to the beam splitter 13. The laser beam from the beam splitter 13 passes through a 1/2 wavelength plate 40, is focused by a detection lens 41, and is input into an astigmatism generating analyzer 42. Here, the optically polarized laser beam passes through an analyzer 42 and is subjected to changes in the magnitude of the light beam. Minute N1 due to transmission and reflection
In the laser beam d3, the P-polarized light transmitted through the analyzer 42 forms a spot on the light-receiving surface of the first 4-split photodetector 44, and is reflected by the polarizing film 42a of the analyzer 42. The S-polarized light forms a spot on the light receiving surface of the second 4-split photodetector 45.

第2図は、ビームスブリッタ13,非点収差発生検光子
42,並びに第1及び第2の4分割光検出器44.4!
)の位置関係を概略的に示す図である。第1及び第2の
4分割光検出器44.4.5の受光面における分割線は
、光磁気ディスク3の1〜ラック方向およびそれと直交
する方向に光学的に一致されている。また、非点収差発
生素子42に」:る非点収差時の楕円状のスポッ1〜は
、図示のように4つの受光面の対角位置の方向に伸びる
ように形成される。
FIG. 2 shows the beam splitter 13, the astigmatism generating analyzer 42, and the first and second 4-split photodetectors 44.4!
) is a diagram schematically showing the positional relationship between the two. The dividing lines on the light receiving surfaces of the first and second four-part photodetectors 44.4.5 are optically aligned with the 1-to-rack direction of the magneto-optical disk 3 and the direction orthogonal thereto. Further, the elliptical spots 1 to 1 at the time of astigmatism in the astigmatism generating element 42 are formed so as to extend in the direction of the diagonal positions of the four light-receiving surfaces as shown in the figure.

第3図は、第1及び第2の4分割光検出器44,45の
受光面に形成ざれるスポットを示す図であり、同図(a
)は第1の4分割光検出器を、同図《b)は第2の4分
割光検出器を各々示す。
FIG. 3 is a diagram showing spots formed on the light-receiving surfaces of the first and second 4-split photodetectors 44, 45;
) shows the first 4-split photodetector, and FIG. 1(b) shows the second 4-split photodetector.

光t41気ディスク3に焦点が合っているときは、スポ
ツ1へS○が形成ざれる。遠点または近点のいずれか一
方に焦点がずれているときは格円状のスボッ1〜S1が
形成され、他方に焦点がずれているときはスポッ1〜8
1と直角な方向に楕円状のスボッ1〜S2が形成される
。また、前記のように楕円偏光が生じると、例えばスボ
ツ1〜Soに斜線で示したようにレーザビーム周辺で光
量が強くなる部分Spが生じる。
When the optical disk 3 is in focus, S○ is not formed on the spot 1. When the focus is shifted to either the far point or the near point, circle-shaped spots 1 to S1 are formed, and when the focus is shifted to the other point, spots 1 to 8 are formed.
Elliptical slots 1 to S2 are formed in a direction perpendicular to 1. Further, when elliptically polarized light is generated as described above, a portion Sp where the amount of light is strong is generated around the laser beam, as indicated by diagonal lines in the slots 1 to So, for example.

焦点がずれているとぎ、第1の4分割光検出器44にお
いては、スポッ1〜82方向の対角位置にある受光面4
4.b,446の光市が強くなり、スポットS1方向の
対角位置にある受光面4. /I a ,4. /l.
 Cの光聞か弱くなる。また、第2の4分割光検出器4
5においては、スポットS1方向の対角位置にある受光
面45a,45Gの光邑が強くなり、スポッ1〜S2方
向の対角位置にある受光面45b,45dの光量が弱く
なる。
When the focus is out of focus, in the first 4-split photodetector 44, the light-receiving surface 4 at the diagonal position in the spot 1-82 direction
4. b, 446 becomes stronger, and the light receiving surface 4.b, located at a diagonal position in the direction of spot S1. /I a, 4. /l.
The light of C becomes weaker. In addition, a second 4-split photodetector 4
5, the light intensity of the light-receiving surfaces 45a and 45G at diagonal positions in the spot S1 direction becomes strong, and the light intensity of the light-receiving surfaces 45b and 45d at diagonal positions in the spot 1-S2 direction becomes weak.

第4図は実施例にお(プる回路図であり、図示のように
、第1の4分割光検出器44において、方の対角位置に
ある受光面44b,44dの各受光出ノ〕の加算出力ノ
〕冒ろ、他の対角位置の受光面44a,44Gの各受光
出力の加算出力が減算され、また、第2の4分割光検出
器4 5において、一方の対角位置にある受光面/15
b,45dの各受光出力の加算出力から、他の対角位置
の受光面14. 5a,/I5cの各受光出力の加算出
力が減算ざれる。
FIG. 4 is a circuit diagram according to an embodiment, and as shown in the figure, in the first 4-split photodetector 44, the light receiving surfaces 44b and 44d at diagonal positions are connected to each other. The addition output of each light receiving output of the light receiving surfaces 44a and 44G at the other diagonal positions is subtracted, and in the second 4-split photodetector 45, the addition output of each light receiving output of the light receiving surfaces 44a and 44G at the other diagonal positions is subtracted. A certain light-receiving surface/15
From the summed output of the respective light receiving outputs of 45d and 45d, the light receiving surface 14 at the other diagonal position is determined. The summed output of each light reception output of 5a and /I5c is subtracted.

そして、第1の4分割光検出器44におりる減算出力と
第2の4分割フA1〜ディテクタ/15における減算出
力とが加算されてフォーカスエラー信号が生成される。
Then, the subtraction output from the first 4-division photodetector 44 and the subtraction output from the second 4-division filters A1 to Detector/15 are added to generate a focus error signal.

なお、検出系2は、光磁気ディスク3の照射したビーム
の径が最小になったときに上記フォーカスエラー信号が
零になるように調整されている。
The detection system 2 is adjusted so that the focus error signal becomes zero when the diameter of the beam irradiated onto the magneto-optical disk 3 becomes the minimum.

このJ;うに、第1の4分割光検出器44における減算
出力とが極性を合わばて加算されているので、各4分割
光検出器44.45にお(プる強度分布の不均一性が互
いに相殺され、この加算出力すなわちフォーカスエラー
信号には基板の複屈折による影響が現れなくなる。また
、上記のフォーカスエラー信号は、2つの4分割光検出
器に基づいて生成されるため、第6図及び第7図のよう
な従来のものに比べて出ノノが倍になり、フォーカスザ
ボがより安定するという利点がある。
Since the subtracted output from the first 4-split photodetector 44 is added with the same polarity, each 4-split photodetector 44. cancel each other out, and the effect of the birefringence of the substrate does not appear on this added output, that is, the focus error signal.Also, since the above focus error signal is generated based on the two 4-split photodetectors, the 6th Compared to the conventional ones as shown in FIG.

なお、第2の4分割光検出器45の隣接する受光面45
b,45Cの受光出力の加算出ノjから、他の隣接する
受光面45a, /I5dの受光出力の加算出ノノが減
算され、1〜ラッキングエラー信号が生成される。ざら
に、第1の4分割光検出器44の各受光面448〜41
dの受光出力の総出力から、第2の4分割光検出器45
の各受光而45a〜4 5 dの受光出力の総出力が減
算され、光磁気再生信号が差動検出される。
Note that the adjacent light receiving surface 45 of the second 4-split photodetector 45
The sum of the light receiving outputs of the other adjacent light receiving surfaces 45a and /I5d is subtracted from the sum of the light receiving outputs of the light receiving surfaces b and 45C, and a racking error signal of 1 to 1 is generated. Roughly speaking, each of the light receiving surfaces 448 to 41 of the first 4-split photodetector 44
From the total output of the received light output of d, the second 4-split photodetector 45
The total output of the light receiving outputs of each of the light receiving devices 45a to 45d is subtracted, and the magneto-optical reproduction signal is differentially detected.

上記の実施例では、第1,第2の4分割光検出器44,
4.5について先に対角位置同七の受光出力を減算し、
この減算出力を加算してフォーカスエラー信号を生成す
るようにしているが、例えば第5図に示したように回路
を構成しても同様の効果が得られる。
In the above embodiment, the first and second quadrant photodetectors 44,
For 4.5, first subtract the received light output at the same diagonal position,
Although the focus error signal is generated by adding the subtracted outputs, the same effect can be obtained by configuring the circuit as shown in FIG. 5, for example.

すなわち、第1及び第2の4分割光検出器44,45の
各4分割された受光面の受光出力について、スポッ1〜
S+  (第3図)に対して出力が大となる4つの受光
面(44a,44c,45a及び/45C)について出
力を加算し、スポットS2に対して出力が大どなる4つ
の受光面(4./l.b, 4.4d,45b及び45
d)について出力を加算し、各加算出ノjの差に基づい
てフォーカスエラー信号を牛成するようにしてもよい。
That is, regarding the light receiving output of each of the four-divided light receiving surfaces of the first and second four-divided photodetectors 44 and 45, spots 1 to 45
The outputs of the four light-receiving surfaces (44a, 44c, 45a and /45C) that have large outputs with respect to S+ (FIG. 3) are added, and the outputs of the four light-receiving surfaces (4. /l.b, 4.4d, 45b and 45
The outputs for d) may be added and a focus error signal may be generated based on the difference between the summed outputs j.

なお、上記各実施例は情報の再生時について説明したが
、情報の記録時あるいは消去時にも同様の構成で適正な
フォーカスエラー信号を生成することがでぎるこどはい
うまでもない。また、光磁気ディスクについての記録再
生を行う光ピックアップ装置でなくても、検出系に非点
収差発生検光子を用いるものであれば同様の効果が得ら
れる。
Although each of the above embodiments has been described with respect to information reproduction, it goes without saying that an appropriate focus error signal can be generated using the same configuration when information is recorded or erased. Further, even if the optical pickup device does not perform recording/reproduction on a magneto-optical disk, the same effect can be obtained as long as the detection system uses an astigmatism-generating analyzer.

さらに、検出系が直線偏光に対し45゜からずれた場合
や、偏光膜特性の不均一、或いは受光素子の感度・分布
にムラがある場合等に、各委鼻受光面の出力が不均衡と
なり、フォーカスエラーにオフセット成分が生じること
がある。このため各史恍受光面の出力を演樟する際に、
少なくとも1つの可変抵抗手段によってオフセツ1一成
分を除去するようにしてもよい。この可変抵抗手段は、
例えば第4図の実施例では加算器の1人力側に、第5図
の実施例では減算器の1人力側に配置しているが、これ
に特定されるものではなく、各々洸受光面から得られる
出力から最終的にフォーカスエラーを得る出力に至るま
での間において適宜配置して、オフゼッ1〜成分を除去
でれば良い。
Furthermore, if the detection system deviates from 45 degrees with respect to linearly polarized light, if the polarizing film characteristics are uneven, or if there is unevenness in the sensitivity or distribution of the light receiving element, the output of each light receiving surface may become unbalanced. , an offset component may occur in the focus error. Therefore, when calculating the output of each historical light receiving surface,
The offset 1 component may be removed by at least one variable resistance means. This variable resistance means is
For example, in the embodiment shown in Fig. 4, the adder is placed on the one-manpower side, and in the embodiment shown in Fig. 5, it is placed on the one-manpower side of the subtracter. It is only necessary to remove the offset components by appropriately disposing them between the output obtained and the output finally obtaining the focus error.

及旦JL宛里 以上説明したように本発明の光ピックアップ装置によれ
ば、検出系において、透明な同一材別でかつ同一厚さの
一対の両面平行板とこれらの間に扶持ざれた偏光膜とか
らなりロ入用するレーり゛ビームの波面に対して偏光j
14!を所定角度で傾斜ロしめた非点収差発生検光手段
を用いて、1つの検光子に非点収差発生機能ど検光子機
能とをもたけるように構成したので、装百仝休を小型軽
量化リることがでぎると共に、部品点数及びコス1〜を
低減することができる。さらに、非点収差発生検光手段
によって分離された二光束、覆−なわちP.S両偏光成
分を各々4分割の光検出器で受光し、第1の光検出器に
おける強度分布と第2の光検出器にお(ブる強度分布の
不均一性を〃いに相殺してフォーカスエラー信号を生成
し、ディスクの複屈折の大小によるフォーカスエラー信
号への影響をなくすようにしたので、ガラス基板のディ
スクやポリカーボネー1〜基板のディスク等のJ、うに
基板材わ1の複屈折の大小に拘らず、ベス1〜フA一カ
ス位置のずれをなくすとともに1〜ラック横切りノイズ
をなくすことができる。また、従来に比べてフA−カス
エラー信号を生成する受光出力が倍になり、フA一カス
ザーボが安定する。
As explained above, according to the optical pickup device of the present invention, the detection system includes a pair of transparent double-sided parallel plates made of the same material and of the same thickness, and a polarizing film supported between them. Polarized light j with respect to the wavefront of the laser beam to be used
14! By using an astigmatism generation analysis means tilted at a predetermined angle, one analyzer is configured to have both an astigmatism generation function and an analyzer function, making the device compact and lightweight. It is possible to reduce the number of parts and the cost. Furthermore, two beams of light separated by the astigmatism generating/analyzing means, ie, P. Both S-polarized light components are received by a photodetector divided into four parts, and the non-uniformity of the intensity distribution in the first photodetector and the second photodetector is carefully offset. Since a focus error signal is generated and the effect of the magnitude of birefringence of the disk on the focus error signal is eliminated, it is possible to Regardless of the magnitude of refraction, it is possible to eliminate deviations in the position of the focus 1 to focus A and cross-crossing noise of the focus 1 to rack.In addition, the light receiving output that generates the focus A error signal is doubled compared to the conventional method. As a result, the fuselage becomes stable.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明による実施例の光ピックアップ装置の光
学系を示す概略線図、第2図は実施例の光学系におCプ
る光検出器の位置関係を示す概略線図、第3図は実施例
におけるレーザビームのスポッ1・の状態を示す光検出
器の受光面の正面図、第4図は実施例における光ピック
アップ装買の回路図、第5図は他の実施例における回路
図、第6図は従来の光ビックアップ装胃の光学系を示づ
−概略線図、第7図は従来の光ピックアップ装置の回路
図、第8図は複屈折によるレーザビームのスボッ1・の
状態を示す光検出器の受光而の正面図であってスポット
の強度分布の不均一をJ}明する図Cある。 主要部分の符号の説明 42・・・・・・非点収差発生検光子 44・・・・・・第1の4分υj光検出器45・・・・
・・第2の4分割光検出器出京1人
FIG. 1 is a schematic diagram showing the optical system of an optical pickup device according to an embodiment of the present invention, FIG. 2 is a schematic diagram showing the positional relationship of a photodetector in the optical system of the embodiment, and FIG. The figure is a front view of the light-receiving surface of the photodetector showing the state of the laser beam spot 1 in the embodiment, FIG. 4 is a circuit diagram of the optical pickup device in the embodiment, and FIG. 5 is a circuit in another embodiment. 6 is a schematic diagram showing the optical system of a conventional optical pickup device, FIG. 7 is a circuit diagram of a conventional optical pickup device, and FIG. 8 is a schematic diagram of the optical system of a conventional optical pickup device. Figure C is a front view of the light-receiving body of the photodetector showing the state of FIG. Explanation of symbols of main parts 42... Astigmatism generating analyzer 44... First quarter υj photodetector 45...
・Second 4-split photodetector 1 person from Tokyo

Claims (7)

【特許請求の範囲】[Claims] (1)光学式記録媒体に集束レーザビームを照射して情
報を読み取る光ピックアップ装置におけるフォーカスエ
ラー信号発生装置であって、 前記記録媒体から入射する集束レーザビームを二光線束
に分離しつつこれらに非点収差を付与する非点収差発生
機能、及び該集束レーザビームの偏光を検出する検光子
機能を有する非点収差発生検光手段と、 前記二光線束の光路中に各々配設されかつ直交する2線
分によつて4分割された4つの受光面を有する一対の4
分割光検出器と、 前記光検出器に各々接続されかつこれらから発せられる
信号出力を演算して少なくともフォーカスエラー信号を
出力する演算手段とからなり、前記非点収差発生検光手
段は、透明な一対の両面平行板と前記両面平行板の間に
挟持された偏光膜とからなり、入射するレーザビームの
波面に対して前記偏光膜を所定角度で傾斜せしめたこと
を特徴とする装置。
(1) A focus error signal generating device in an optical pickup device that reads information by irradiating a focused laser beam onto an optical recording medium, the device separating the focused laser beam incident from the recording medium into two beam bundles and dividing the focused laser beam into two beams. astigmatism generating and analyzing means having an astigmatism generating function for imparting astigmatism and an analyzer function for detecting the polarization of the focused laser beam; A pair of 4 light-receiving surfaces divided into four by two line segments
It consists of a split photodetector, and a calculation means connected to each of the photodetectors and for calculating signal outputs emitted from these and outputting at least a focus error signal, and the astigmatism generating and analyzing means is a transparent 1. A device comprising a pair of double-sided parallel plates and a polarizing film sandwiched between the double-sided parallel plates, the polarizing film being tilted at a predetermined angle with respect to the wavefront of an incident laser beam.
(2)前記両面平行板の各々は、同一材料でかつ同一厚
さであることを特徴とする請求項1記載の装置。
2. The apparatus according to claim 1, wherein each of said double-sided parallel plates is made of the same material and has the same thickness.
(3)前記4分割光検出器は、双方の受光面が前記偏光
膜に対して鏡像位置に位置するように配置されているこ
とを特徴とする請求項1または2記載の装置。
(3) The device according to claim 1 or 2, wherein the four-split photodetector is arranged such that both light-receiving surfaces are located in mirror image positions with respect to the polarizing film.
(4)前記4分割光検出器の各受光面の出力を前記演算
手段に供給し、前記演算手段は一の非点収差に対して受
光出力が大となる全ての受光面の和出力と残余の全ての
受光面の和出力との差出力を求め、前記差出力をフォー
カスエラー信号とすることを特徴とする請求項3記載の
装置。
(4) The output of each light-receiving surface of the 4-split photodetector is supplied to the calculation means, and the calculation means calculates the sum output of all the light-receiving surfaces whose light reception output is large for one astigmatism and the residual. 4. The apparatus according to claim 3, wherein a difference output from a sum output of all light receiving surfaces is determined, and the difference output is used as a focus error signal.
(5)前記演算手段は、前記4分割光検出器の各々に対
応して、一の非点収差に対して受光出力が大となる受光
面の和出力を求める第1加算手段と、残余の受光面の和
出力を求める第2加算手段と、前記第1加算手段の和出
力と前記第2加算手段の和出力との差を求める減算手段
とを含み、前記4分割光検出器の各々に対応する前記減
算手段の差出力の和を求める第3加算手段を備えること
を特徴とする請求項第4項記載の装置。
(5) The arithmetic means includes a first addition means for calculating the sum output of the light-receiving surfaces where the light-receiving output is large for one astigmatism, corresponding to each of the four-split photodetectors; a second addition means for calculating the sum output of the light-receiving surface; and a subtraction means for calculating the difference between the sum output of the first addition means and the sum output of the second addition means; 5. The apparatus according to claim 4, further comprising third adding means for calculating the sum of the difference outputs of the corresponding subtracting means.
(6)前記演算手段は、前記4分割光検出器の全ての受
光面のうち一の非点収差に対して受光出力が大となる全
ての受光面の和出力を求める第1加算手段と、残余の受
光面の和出力を求める第2加算手段と、上記第1及び第
2加算手段の和出力の差を求める減算手段とを備えるこ
とを特徴とする請求項第4項記載の装置。
(6) The calculation means includes a first addition means for calculating the sum output of all the light receiving surfaces in which the light receiving output is large with respect to the astigmatism of one of all the light receiving surfaces of the four-split photodetector; 5. The apparatus according to claim 4, further comprising a second addition means for determining the sum output of the remaining light-receiving surfaces, and a subtraction means for determining the difference between the sum outputs of the first and second addition means.
(7)前記演算手段は、少なくとも1つの可変抵抗手段
を含んで構成されていることを特徴とする請求項第1項
ないし第6項いずれかに記載の装置。
(7) The device according to any one of claims 1 to 6, wherein the calculation means includes at least one variable resistance means.
JP1115627A 1989-05-09 1989-05-09 Optical pickup device Pending JPH02294937A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1115627A JPH02294937A (en) 1989-05-09 1989-05-09 Optical pickup device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1115627A JPH02294937A (en) 1989-05-09 1989-05-09 Optical pickup device

Publications (1)

Publication Number Publication Date
JPH02294937A true JPH02294937A (en) 1990-12-05

Family

ID=14667331

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1115627A Pending JPH02294937A (en) 1989-05-09 1989-05-09 Optical pickup device

Country Status (1)

Country Link
JP (1) JPH02294937A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5438562A (en) * 1992-10-09 1995-08-01 Olympus Optical Co., Ltd. Optical head for recording and/or reproducing information on and/or from opto-magnetic record medium
JP2019032177A (en) * 2017-08-04 2019-02-28 Dmg森精機株式会社 Displacement detector

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5922242A (en) * 1982-07-26 1984-02-04 Foster Denki Kk Circuit for detecting optical controlling signal in information reproducing device
JPS61261837A (en) * 1985-05-15 1986-11-19 Toshiba Corp Erasable optical head
JPS63306539A (en) * 1987-06-05 1988-12-14 Sharp Corp Optical head

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5922242A (en) * 1982-07-26 1984-02-04 Foster Denki Kk Circuit for detecting optical controlling signal in information reproducing device
JPS61261837A (en) * 1985-05-15 1986-11-19 Toshiba Corp Erasable optical head
JPS63306539A (en) * 1987-06-05 1988-12-14 Sharp Corp Optical head

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5438562A (en) * 1992-10-09 1995-08-01 Olympus Optical Co., Ltd. Optical head for recording and/or reproducing information on and/or from opto-magnetic record medium
JP2019032177A (en) * 2017-08-04 2019-02-28 Dmg森精機株式会社 Displacement detector

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