JPH02287243A - Method for detecting peak of measuring output - Google Patents
Method for detecting peak of measuring outputInfo
- Publication number
- JPH02287243A JPH02287243A JP1110980A JP11098089A JPH02287243A JP H02287243 A JPH02287243 A JP H02287243A JP 1110980 A JP1110980 A JP 1110980A JP 11098089 A JP11098089 A JP 11098089A JP H02287243 A JPH02287243 A JP H02287243A
- Authority
- JP
- Japan
- Prior art keywords
- peak
- value
- measuring output
- background
- subtracting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims description 8
- 238000005259 measurement Methods 0.000 abstract description 12
- 238000001514 detection method Methods 0.000 abstract description 7
- 229920000136 polysorbate Polymers 0.000 abstract 1
- 238000002083 X-ray spectrum Methods 0.000 description 4
- 238000004458 analytical method Methods 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 238000000441 X-ray spectroscopy Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 235000015278 beef Nutrition 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野）
本発明は波長分散型ｘ！１９Ｉ分析装置とかＸ線回折装
置等における測定出力のピーク検出方法に関する。[Detailed Description of the Invention] (Industrial Application Field) The present invention is a wavelength-dispersive x! The present invention relates to a method for detecting peaks of measurement output in 19I analyzers, X-ray diffraction devices, etc.
（従来の技術）
波長分散型Ｘ！ｌ！ｉ！分析装置ではバックグラウンド
が短波長側で大きくなるためピーク検出が不正確になり
、短波長側でＸ線分光分析の信頼度が低下していた。同
様なことはＸＩＩ！ｉ１回折装置でも回折Ｘ線の方向が
照射Ｘ線の方向と平行に近くなる程バックグラウンドが
強くなって回折線ピークの検出を困難にしており、−船
釣に測定出力中におけるバックグラウンド強度が占める
割合が増大して来るとピーク検出が不離なものとなる。(Conventional technology) Wavelength dispersion type X! l! i! In analyzers, the background becomes larger on the shorter wavelength side, making peak detection inaccurate, and the reliability of X-ray spectroscopy lowers on the shorter wavelength side. The same thing is true in XII! Even with the i1 diffractometer, the background becomes stronger as the direction of the diffracted X-rays approaches parallel to the direction of the irradiated X-rays, making it difficult to detect the diffraction peaks. As the proportion increases, peak detection becomes indispensable.
（発明が解決しようとする課題）
本発明は測定出力中のバックグラウンド強度が大である
場合のピーク検出の信頼性を高めようとするものである
。(Problems to be Solved by the Invention) The present invention aims to improve the reliability of peak detection when the background intensity in the measurement output is large.
く課題を解決するための手段）
測定出力から測定出力の平方根に比例する値を引算した
値が、バックグラウンド強度からバックグラウンドの平
方根に比例した値を引算した値より、所定値以上大なる
ときピーク有りと判定するようにした。The value obtained by subtracting the value proportional to the square root of the measured output from the measured output is greater than the value obtained by subtracting the value proportional to the square root of the background from the background intensity by a predetermined value or more. When this happens, it is determined that there is a peak.
（作用）
本発明は式で書くと、測定出力を３１バックグラウンド
強度をＢとし、所定値をＣとすると、（Ｓ−に、／Ｓ
＞ −（Ｎ十に′Ｊ”Ｔ；ｒ＞ ≧ｃ ＞Ｏ・（１）で
あればピーク有りとするものである。(Function) The present invention can be written in the form of a formula: When the measurement output is 31, the background intensity is B, and the predetermined value is C, (S-, /S
>−(N0′J”T;r>≧c>O・(1), it is assumed that a peak exists.
Ｘｌ＆ｌＩの測定では測定出力とかバックグラウンドの
測定値に統計的ゆらぎがないときはＳ−Ｂ’＞０であれ
ばピーク有りであり、Ｓ−Ｂの値はピーク強度を示す。In the measurement of Xl&lI, when there is no statistical fluctuation in the measured output or the background measured value, if S-B'>0, a peak is present, and the value of S-B indicates the peak intensity.
しかし実際の測定では統計的ゆらぎが存在するので、Ｓ
−Ｂ＞Ｏをピーク有りの条件とすることはできない。However, since statistical fluctuations exist in actual measurements, S
-B>O cannot be a condition for the presence of a peak.
（１）式を図示すると、第１図のようになる。測定出力
ＳはＳを中心に±Ｎｓの範囲でばらつ（値であり、この
ばらつきはポアソン分布に従うものでＳ−に、／Ｓはそ
のばらつきの下限に相当する。同様にバックグラウンド
強度はＢを中心に上下にＮｂだけばらつく値でＢ＋に’
、／Ｂはそのばらつく値の上限である。従って（Ｓ−ｋ
ｆｆ）−（Ｂ−にＦ「）＝ＤがＯ以下であればピーク
は測定値の統計的変動の範囲であり、ピークの有無を確
言できない。Ｄが正なる値Ｃより大であればピークの存
在を確言できることになる。Equation (1) is illustrated in FIG. 1. The measured output S varies within a range of ±Ns around S (value; this variation follows a Poisson distribution and corresponds to S-, /S corresponds to the lower limit of the variation. Similarly, the background intensity is B B+ with a value that varies up and down by Nb around .
, /B is the upper limit of the variation. Therefore (S-k
ff) - (B- to F') = If D is less than or equal to O, the peak is within the range of statistical fluctuation of the measured value, and it is not possible to confirm the presence or absence of a peak.If D is greater than the positive value C, there is a peak. This means that we can confirm the existence of
（実施例）
第２図はＸ線分光分析において本発明方法を自動的に実
行する場合の動作のフローチャートである。この分析動
作は試料中に成る元素が存在するか否かを調査するのも
ので、存在を検出しようとする元素の特性Ｘ線波長をλ
とする。まずＸ線分光装置を波長λ−△にセットして時
間ｔだけＸ線検出信号を積分する（イ）。この測定結果
を８１とする。次に波長をλにセットして同じ時間だけ
ＸＭ検出信号を積分する（口〉。この測定結果をＳとす
る。次に波長をλ＋△に移して同様の測定を行う（ハ）
。このときの測定結果を８２とする。Ｂ１．Ｂ２は目的
元素のピーク両側におけるバックグラウンド強度である
。ステップ（二〉において、Ｂ＝ （Ｂ １ ＋８２）
／２を算出し、上記ＳおよびこのＢの値を用いて、前記
（１）式による判定を行う（ホ）。判定において差りが
Ｃより大なるとき、その元素ありの表示（へ）、Ｃより
小なるときはその元素なしの表示（ト）を行って、元素
の有無判定の動作を終り、次の元素の有無判定に移る。(Example) FIG. 2 is a flowchart of operations when automatically executing the method of the present invention in X-ray spectroscopic analysis. This analysis operation investigates whether or not the element exists in the sample, and the characteristic X-ray wavelength of the element whose presence is to be detected is
shall be. First, the X-ray spectrometer is set to wavelength λ-Δ and the X-ray detection signal is integrated for time t (a). This measurement result is assumed to be 81. Next, set the wavelength to λ and integrate the XM detection signal for the same amount of time (X). Let this measurement result be S. Next, change the wavelength to λ + △ and perform the same measurement (C)
. The measurement result at this time is assumed to be 82. B1. B2 is the background intensity on both sides of the peak of the target element. In step (2), B= (B 1 +82)
/2 is calculated, and using the values of S and B, a determination is made using the equation (1) (e). If the difference in the judgment is greater than C, it is displayed that the element is present (G), and if it is smaller than C, it is displayed that the element is absent (G), and the element presence/absence judgment operation is completed. The process moves on to determining the presence or absence of .
上述実施例は予め決めた元素の有無判定に本発明方法を
用いたものである。Ｘ 線スペクトル測定から成るピー
クが真のピークかノイズかを判定する場合、Ｘ線分光装
置で波長走査を行ってＸ線スペクトルのデータをメモリ
しておき、Ｘ線スペクトルを画かせる。このＸＭスペク
トルから、ピーク判定すべきピークの波長λを求め、そ
の波長におけるＸ線スペクトル強度をＳとし、その波長
の前後△だけ距った波長における二つのＸ１１１１スペ
クトル強度値の平均をバックグラウンド強度Ｂとして、
前述（１）式による判定を行って、目的ピークが真のピ
ークかノイズかを判定する。The above embodiment uses the method of the present invention to determine the presence or absence of a predetermined element. When determining whether a peak formed by X-ray spectrum measurement is a true peak or noise, an X-ray spectrometer performs wavelength scanning, stores the X-ray spectrum data in memory, and draws the X-ray spectrum. From this XM spectrum, find the wavelength λ of the peak to be judged, let the X-ray spectrum intensity at that wavelength be S, and calculate the average of the two X1111 spectrum intensity values at wavelengths before and after that wavelength, which are separated by △, as the background intensity. As B,
The above-mentioned equation (1) is used to determine whether the target peak is a true peak or noise.
また、この逆にまったく未知のプロファイルのピークを
見つけるときは通常、次の方法による。Conversely, when finding a peak in a completely unknown profile, the following method is usually used.
まずプロファイルデータの数点（５〜２５点程）をとり
、このデータに対しコンボリューション（たたき込み）
を行い、平均傾斜率ｔを求めると云う計算を、 長波長
側から短波長側（或は短波長から長波長）に向けて移動
しながら繰り返すと、プロファイルにピークが現れると
ｔ〉α（αは正の定数）となる点がある。ここを１方の
バックグラウンド波長とする。さらに上述計算をつづけ
ると１＝０となる。ここがビーフである。さら１こｔく
−αとなる点が２つ目のバックグラウンド波長となる。First, take several points (approximately 5 to 25 points) of the profile data and perform convolution on this data.
If we repeat the calculation to find the average slope rate t while moving from the long wavelength side to the short wavelength side (or from the short wavelength side to the long wavelength side), when a peak appears in the profile, t〉α(α is a positive constant). Let this be one background wavelength. If the above calculation is continued further, 1=0. This is the beef. The point at which the wavelength is 1 t - α becomes the second background wavelength.
この方法によるとピークの位置が不明のプロファイルに
対し、複数のピークとバックグラウンドが見つかるが、
短波長側でバックグラウンドのレベルが高くなると実ピ
ークよりもノイズによるピークの方が多くなる。このと
き、前述（１）式を用いてやればより有効である。With this method, multiple peaks and background can be found for a profile where the peak position is unknown, but
When the background level increases on the short wavelength side, there are more peaks due to noise than actual peaks. At this time, it is more effective to use the above-mentioned equation (1).
（発明の効果）
本発明によれば、強いバックグラウンドの上に小さなピ
ークが乗っているような場合でも、ノイズをピークと誤
判定するようなことなく、ピーク検出の確度が著しく向
上できる。(Effects of the Invention) According to the present invention, even when a small peak is placed on top of a strong background, the accuracy of peak detection can be significantly improved without erroneously determining that noise is a peak.
第１図は本発明の作用説明図、第２図は本発明をＸ線分
光分析に適用した場合の分析動作のフローチャートであ
る。
代理人 弁理士 縣 浩 介FIG. 1 is an explanatory diagram of the operation of the present invention, and FIG. 2 is a flowchart of analysis operation when the present invention is applied to X-ray spectroscopic analysis. Agent Patent Attorney Kosuke Agata
Claims (1)
算した値が、バックグラウンド強度測定出力からそのバ
ックグラウンド測定出力の平方根に比例した値を引算し
た値より、所定値以上大であるときピークありと判定す
ることを特徴とする測定出力のピーク検出方法。The value obtained by subtracting a value proportional to the square root of the measured output from the measured output is greater than the value obtained by subtracting the value proportional to the square root of the background measured output from the background intensity measured output by a predetermined value or more. A method for detecting a peak in a measured output, characterized in that it is determined that a peak exists when the peak occurs.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1110980A JP2751378B2 (en) | 1989-04-28 | 1989-04-28 | Peak detection method of measurement output |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1110980A JP2751378B2 (en) | 1989-04-28 | 1989-04-28 | Peak detection method of measurement output |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02287243A true JPH02287243A (en) | 1990-11-27 |
| JP2751378B2 JP2751378B2 (en) | 1998-05-18 |
Family
ID=14549351
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1110980A Expired - Lifetime JP2751378B2 (en) | 1989-04-28 | 1989-04-28 | Peak detection method of measurement output |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2751378B2 (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55129735A (en) * | 1979-03-30 | 1980-10-07 | Jeol Ltd | Discrimination method of presence of element |
| JPS63191950A (en) * | 1987-02-04 | 1988-08-09 | Nippon X-Ray Kk | Peak position detecting method for spectrum signal |
-
1989
- 1989-04-28 JP JP1110980A patent/JP2751378B2/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55129735A (en) * | 1979-03-30 | 1980-10-07 | Jeol Ltd | Discrimination method of presence of element |
| JPS63191950A (en) * | 1987-02-04 | 1988-08-09 | Nippon X-Ray Kk | Peak position detecting method for spectrum signal |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2751378B2 (en) | 1998-05-18 |
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