JPH02278356A - Testing system for main storage device - Google Patents

Abstract

PURPOSE:To execute a memory test and the starting processing of a program in parallel by testing a first memory in a main storage device by a first testing means prior to the start of a system, and afterwards, testing a second memory by a second testing means, and starting the program to execute the processing of the system by a controlling means. CONSTITUTION:When a memory test part 13 receives a test start signal (a), it accesses the main storage device 2 through a memory access control part 12, and tests a starting area 21 and a memory control part 23 (first testing means). Besides, when the memory test part 13 receives the test start signal (b) from a main control part 11, it accesses the main storage device 2 through the memory access control part 12, and tests similarly an expanded area 22 (second testing means), and the controlling means 11 starts software. Thus, both the test of the second memory by the second testing means and the starting processing of the program by the controlling means are executed in parallel.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for testing a main memory device in a system, and particularly to a method for testing a main memory device at the time of system startup.

[Prior Art] Conventional main memory testing methods require additional time if a defect in the main memory is discovered after the system has been started up. In order to do this, the main memory device will be tested before the system is taken down.

[Problems to be Solved by the Invention] In this conventional main memory testing method, the main memory is tested before starting up the system, so as the capacity of the main memory increases, the test time also increases. increase,
Therefore, there was a problem in that the start-up of the system was delayed and the start of system operational services was delayed.

[Means for Solving the Problems] In order to solve such problems, the main storage device testing method according to the present invention provides a test method for main storage devices in which programs and data for processing the system are stored. and a second memory, a first test means for testing the first memory prior to starting the program, and when the test result by the first test means is normal, the second memory.
a second test means for testing the memory of the second test means; a control means for starting the program when the test by the second test means is started; and a determination means for determining whether or not to execute processing by the program.

[For cattle] Before launching the program that processes the system,
The first test means tests the first memory. When this is completed, the second test means tests the second memory;
The control means starts up the software. As a result,
The test of the second memory by the second test means and the program start-up process by the control means are executed in parallel.

[Example] Next, the present invention will be explained with reference to the drawings.

FIG. 1 is a block diagram showing an embodiment of a test method for a main memory device according to the present invention. In the figure, 1 is a central processing unit, and 2 is a main storage device connected to the central processing unit 1. This system is composed of a central processing unit 1 and a main storage device 2. In addition, the central processing unit 1
is structured as follows. That is, in the central processing unit 1, 11 is a main control unit that performs main control, and 12 is a main control unit that performs main control.
is a memory access control unit that performs memory access, 13
14 is a display register for displaying the memory test result, and a and b are test start signals for starting the memory test, which will be described later. Further, the main storage device 2 is configured as follows.

That is, in the main storage device 2, 21 is a startup area (first memory) that stores programs and data necessary at the beginning of system startup, and 22 is a startup area (first memory) that is unnecessary at the beginning of system startup. Expansion area (second memory) that stores programs and data to be executed after startup,
Reference numeral 23 denotes a memory control unit that is controlled by the memory access control unit 12 and controls the startup area 21 and the expansion area 22. Note that the expansion #i area 22 has a larger storage capacity than the startup area 21, and the storage capacity increases as more functions are added, so it is a storage area that takes a long time to test. be.

When the memory test section 13 receives the test activation signal a, it accesses the main storage device 2 via the memory access control section 12 and tests the startup area 21 and the memory control section 23 (first test). means). Note that the test contents of the start-up area 21 and the memory control section 23 are similar to known memory test contents. Further, upon receiving the test activation signal from the main control unit 11, the memory test unit 13 accesses the main storage device 2 via the memory access control unit 12, and similarly tests the extended area 22 (second test methods).

In any of the above tests, the memory test section 13 accesses the display register 14 and displays the test results.

Note that the memory access control section 12 performs write or read control for the main storage device 2 according to access requests from the main control section 11 and the memory testing section 13; If there are simultaneous access requests from the main control unit 11, priority is given to the access request from the main control unit 11.

The detailed operation of the test method for the main memory device configured as described above will be explained based on the flowcharts shown in FIGS. 2 and 3.

FIG. 2 is a flowchart of a startup operation of the central processing unit 1, that is, a memory test performed before launching a program (hereinafter referred to as software) that performs system processing. Power on or start switch (not shown)
When is pressed, the main control section 11 in the solid processing device 1 transmits a test activation signal a to the memory testing section 13. The memory test section 13 receives this and executes a memory test.

That is, the memory test section 13 tests the predetermined start-up area 21 and the memory control section 23 in step 31. This startup area 21 is the minimum memory area necessary for software startup.

Next, when this memory test is completed, the memory test section 13 sets this test result in the display register 14. On the other hand, the main control section 11 waits until this memory test is completed in step 32, and when this is [Y], that is, when the test result set in the display register 14 by the memory test section 13 is detected, the main control section 11 proceeds to step 33 to detect the test result set in the display register 14. Determine whether or not it is normal. When this is "Y", that is, if it is normal, the main control unit 11 performs system start-up control in step 34, that is, passes control to the software that starts the bootstrap operation and processes the system, and in step 35 To start the test of the expansion area 22, that is, to send the test start signal b3 to the memory test section 13, the system starts up. When "N" is determined in step 33, that is, if it is abnormal, an error is displayed in step 36 and the test is stopped.

FIG. 3 is a flowchart of the main control unit 11 in accordance with software instructions after the system startup state, that is, after the startup operation. First, the system startup process in step 41 is performed. This process is a system initialization process performed by software stored in the start-up area 21 that has already been tested. next,
In step 42, it is detected whether or not the test of the extended area 22 is finished, that is, the result of the test performed by the memory test unit 13 started in step 35 is set in the display register 14. If this is "N", the test is finished. If the result is "Y", that is, if it is detected, it is determined in step 43 whether or not this test result is normal. If this is "Y", that is, normal, system operation processing is started using the expansion area 22 in step 44. Note that if the system start-up process executed in step 41 has not been completed at this time, this start-up process is continued, and after it is completed, system operation processing is started.

If the result in step 43 is "N", that is, the test result is abnormal, an error is displayed in step 45. Then, the content of this test result is analyzed, and it is determined in step 46 whether or not the system can be operated even if the content is degraded. If this is "N", that is, it is a fatal error, system processing will be stopped, and if it is "Y", that is, if it is possible to downsize and start up the system due to some memory failure, etc. The process moves to step 44 and system operation processing is started.

As explained above, prior to starting up the system, after testing the low storage area 21 with a small storage capacity, the expansion area 22, which has a large storage capacity and therefore takes a long time to test, is tested and the system is started. This is done in parallel with the uploading process.

[Effects of the Invention] As is clear from the explanation below, according to the main storage testing method according to the present invention, the first testing means tests the first test in the main storage before starting the system. The second test means tests the second memory in the main storage device after testing the memory, and the control means starts up a program that performs system processing, so the memory test and program The start-up process can be executed in parallel, and even if the storage capacity of the main storage device increases, there is no delay in starting system operation services. At the same time, it also has the effect of allowing early detection and early repair of defects in the main storage device.

[Brief explanation of drawings]

FIG. 11 is a block diagram showing an embodiment of the main memory device testing method according to the present invention, and FIGS. 2 and 3 are flowcharts for explaining this operation. 1...Central processing unit, 2...Main storage device, 11
...Main control section, 12..Memory access control section, 13..Memory test section, 14..Display register, 21..Startup area, 22..Extension Area, 23...Memory control unit, a, b...Test activation signal.

Claims (1)

[Claims] In a main storage device testing method at the time of system startup, a first memory and a second memory in the main storage device in which programs and data for processing the system are stored; , a first test means for testing the first memory prior to starting the program; and a second test means for testing the second memory when the test result by the first test means is normal. a test means; a control means for starting the program when a test by the second test means is started; and whether or not to execute processing by the program according to a test result by the second test means. 1. A test method for a main storage device, characterized in that the memory test by the second test means and the program start-up process are performed in parallel.