JPH02275617A - Resist coating device - Google Patents
Resist coating deviceInfo
- Publication number
- JPH02275617A JPH02275617A JP9796389A JP9796389A JPH02275617A JP H02275617 A JPH02275617 A JP H02275617A JP 9796389 A JP9796389 A JP 9796389A JP 9796389 A JP9796389 A JP 9796389A JP H02275617 A JPH02275617 A JP H02275617A
- Authority
- JP
- Japan
- Prior art keywords
- resist
- nozzle
- tip
- solvent
- cap
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011248 coating agent Substances 0.000 title claims abstract description 21
- 238000000576 coating method Methods 0.000 title claims abstract description 21
- 238000012856 packing Methods 0.000 claims abstract description 5
- 239000007788 liquid Substances 0.000 claims abstract description 4
- 239000000758 substrate Substances 0.000 claims abstract description 4
- 239000004065 semiconductor Substances 0.000 claims description 3
- 239000002904 solvent Substances 0.000 abstract description 23
- 230000000903 blocking effect Effects 0.000 abstract 1
- 238000001035 drying Methods 0.000 description 5
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
Landscapes
- Coating Apparatus (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Formation Of Insulating Films (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、レジスト塗布装置に関し、特に半導体集積回
路の製造に使用されるレジスト塗布装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a resist coating apparatus, and particularly to a resist coating apparatus used for manufacturing semiconductor integrated circuits.
第3図は従来の一例を示すレジスト塗布装置のノズル縦
断面図である。従来、この種のレジスト塗布装置のノズ
ルは、その先端部を乾燥しないようにレジストの乾燥防
止機構がついている。この乾燥防止機構は、第3図に示
すように、ノズル2の先端をレジスト1の溶剤8を封入
された装置側受部7の開口部に接することによってノズ
ルの先端部に付着するレジストを溶剤雰囲気6にさらす
ことにより乾燥を防ぐ方法が知られている。FIG. 3 is a longitudinal cross-sectional view of a nozzle of a resist coating apparatus showing an example of the conventional technique. Conventionally, the nozzle of this type of resist coating device has a resist drying prevention mechanism to prevent the tip from drying out. As shown in FIG. 3, this drying prevention mechanism is implemented by bringing the tip of the nozzle 2 into contact with the opening of the device side receiving part 7 in which the solvent 8 of the resist 1 is sealed, thereby removing the resist attached to the tip of the nozzle. A method of preventing drying by exposing to atmosphere 6 is known.
しかしながら、上述した従来のレジスト塗布装置では、
ノズル先端のレジストと接する溶剤雰囲気の濃度が調整
できないため、ノズルの先端部付近のレジスト成分比(
ポリマーと溶剤の成分比)を一定に保つことができない
という欠点がある。However, in the conventional resist coating apparatus described above,
Since the concentration of the solvent atmosphere in contact with the resist at the nozzle tip cannot be adjusted, the resist component ratio near the nozzle tip (
The disadvantage is that the component ratio (component ratio of polymer and solvent) cannot be kept constant.
さらに、レジスト塗布の為、ノズル先端部が装置側受部
を離れた時に、溶剤雰囲気が拡散し、溶剤が気化し続け
るため、溶剤を適時、補充しなければならず、溶剤雰囲
気を装置外へ流出させない為に、排気ダクトを装置側受
部付近に設置しなければならないという欠点がある。レ
ジスト成分を一定に保てなければ、レジストの粘度を変
化させ、レジスト塗布時にレジスト膜厚が均一にならず
、塗布ムラが発生し、エツチング後のパターン寸法精度
に影響を及ぼしてしまう。Furthermore, when the nozzle tip leaves the device side receiving part for resist coating, the solvent atmosphere diffuses and the solvent continues to vaporize, so the solvent must be replenished from time to time, and the solvent atmosphere is removed from the device. There is a drawback that an exhaust duct must be installed near the receiving part on the side of the device to prevent leakage. If resist components cannot be kept constant, the viscosity of the resist will change, the resist film thickness will not be uniform during resist coating, uneven coating will occur, and pattern dimensional accuracy after etching will be affected.
本発明の目的は、かかる問題を解消するノズルを有する
レジスト塗布装置を提供することにある。An object of the present invention is to provide a resist coating device having a nozzle that solves this problem.
本発明のレジスト塗布装置は、レジストを半導体基板に
塗布するためのレジスト液滴下用のノズルを有するレジ
スト塗布装置において、パッキングを介して前記ノズル
の噴出口を塞ぐキャップを備え構成される。A resist coating apparatus of the present invention is a resist coating apparatus having a nozzle for dropping a resist liquid for coating a semiconductor substrate with a resist, and includes a cap that closes an ejection port of the nozzle via a packing.
次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.
第1図は本発明のノズルの一実施例を示す縦断面図であ
る。このノズルは、その噴出口をパッキングである0リ
ング4を介して塞ぐキャップ3を設けたことである。通
常、レジスト1がノズル2中に存在しているときは、レ
ジスト塗布後の液ダレ防止のために、レジスト1はサッ
クバックされ(押し戻され)でいる。従って、レジスト
1の境界面5は、ノーズルの先端より後方に位置する。FIG. 1 is a longitudinal sectional view showing one embodiment of the nozzle of the present invention. This nozzle is provided with a cap 3 that closes the ejection port via an O-ring 4 which is a packing. Normally, when the resist 1 is present in the nozzle 2, the resist 1 is sucked back (pushed back) to prevent liquid dripping after resist application. Therefore, the boundary surface 5 of the resist 1 is located behind the tip of the nozzle.
ここで、ノズル2の先端には、キャップ3がOリング4
を介して取付けられているので、境界面5の接する空間
はシールされていることになる。このことにより境界面
5からレジストの溶剤が気化し、キャップ内に充満する
。従って、境界面5から気化する溶剤の量と、逆に溶剤
雰囲気6からレジスト中に溶解する溶剤の量がバランス
したところで、溶剤雰囲気の濃度は、一定に保たれる。Here, a cap 3 is attached to an O-ring 4 at the tip of the nozzle 2.
Since it is attached through the interface, the space where the boundary surface 5 contacts is sealed. As a result, the resist solvent evaporates from the interface 5 and fills the cap. Therefore, when the amount of solvent vaporized from the interface 5 and the amount of solvent dissolved into the resist from the solvent atmosphere 6 are balanced, the concentration of the solvent atmosphere is kept constant.
次に、このノズルの動作を説明する。まず、このレジス
ト塗布装置のキャップ3を外す。このことにより塗布可
能な状態となる。このとき、ノズルの先端部の溶剤雰囲
気が拡散してしまうが、失われる溶剤の量は、溶剤雰囲
気の空間を極小にすることにより、若干量に押えられ、
レジスト成分の変化は無視できるレベルとなる。Next, the operation of this nozzle will be explained. First, the cap 3 of this resist coating device is removed. This makes it ready for coating. At this time, the solvent atmosphere at the tip of the nozzle diffuses, but the amount of solvent lost can be suppressed to a small amount by minimizing the space for the solvent atmosphere.
Changes in resist components are at a negligible level.
例えば、レジストとして市販されているスチレン系のレ
ジストをレジスト塗布装置のノズルに充填し、レジスト
をノズルの先端から出し、ノズルの先端から5mm程度
サックバックさせ、本発明のキャップとOリングを介し
て手で接続した。接続後、1日間放置し、キャップと0
リングを手で外し、すぐに連続的に、マスクブランクス
10枚を塗布し、レジスト膜厚を測定した所、全て、5
000±100人に入っており、塗布順によるレジスト
膜厚の傾向的変化は見られなかった。また、プレート中
の膜厚分布のバラツキも1〜10枚において傾向的変化
は見られなかった。これは、本発明により、ノズルの先
端部と後方部のレジストの粘度変化がなかったことを意
味し、ノズル先端での乾燥防止の成功を示唆するもので
ある。For example, a commercially available styrene-based resist is filled into the nozzle of a resist coating device, the resist is taken out from the tip of the nozzle, the resist is sucked back about 5 mm from the tip of the nozzle, and then the resist is placed through the cap and O-ring of the present invention. Connected by hand. After connecting, leave it for one day and remove the cap and zero.
After removing the ring by hand, I immediately coated 10 mask blanks in succession and measured the resist film thickness, all of which were 5.
000±100 people, and no trend change in resist film thickness depending on the order of coating was observed. Moreover, no trend change was observed in the variation in film thickness distribution among the plates from 1 to 10 plates. This means that there was no change in the viscosity of the resist at the tip and rear portions of the nozzle according to the present invention, which suggests that drying at the tip of the nozzle was successfully prevented.
第2図は本発明のノズルの第2の実施例を示す縦断面図
である。この実施例では、前述の実施例でのキャップの
代わりに、装置側でキャップの機能を果たす装置側受部
7を有している。この為、前述の実施例のときのように
人の手によるキャップの取り外しといった面倒なことが
なく、装置側受部7を装置の代に固定し、ノズル2を上
下することで対応出来るという利点がある。FIG. 2 is a longitudinal sectional view showing a second embodiment of the nozzle of the present invention. In this embodiment, instead of the cap in the previous embodiment, an apparatus-side receiving part 7 is provided on the apparatus side, which functions as a cap. Therefore, there is no need for troublesome removal of the cap by hand as in the above-mentioned embodiments, and the advantage is that it can be handled by fixing the device side receiving part 7 to the device and moving the nozzle 2 up and down. There is.
以上説明したように本発明は、ノズルの先端に脱着可能
なキャップをパッキングであるOリングを介して取り付
けることにより、ノズル先端部付近のレジスト成分を維
持でき、基板上のレジスト膜厚を一定に保ち、エツチン
グ後のパターン寸法バラツキを低減でき、レジストの溶
剤の補給も必要としないとy)う効果がある。As explained above, in the present invention, by attaching a removable cap to the tip of the nozzle via an O-ring which is a packing, the resist components near the nozzle tip can be maintained, and the resist film thickness on the substrate can be kept constant. It has the following effects: it is possible to maintain the resist pattern, reduce pattern size variations after etching, and eliminate the need for replenishment of resist solvent.
第1図は本発明のノズルの第1の実施例1を示す縦断面
図、第2図は本発明のノズルの第2の実施例を示す縦断
面図、第3図は従来の一例を示すレジスト塗布装置のノ
ズルの縦断面図である。
1・・・レジスト、2・・・ノズル、3・・・キャップ
、4・・・Oリング、5・・・境界面、6・・・溶剤雰
囲気、7・・・装置側受部、8・・・溶剤。FIG. 1 is a vertical sectional view showing a first embodiment of the nozzle of the present invention, FIG. 2 is a longitudinal sectional view of the second embodiment of the nozzle of the present invention, and FIG. 3 is a conventional example. FIG. 3 is a longitudinal cross-sectional view of a nozzle of the resist coating device. DESCRIPTION OF SYMBOLS 1...Resist, 2...Nozzle, 3...Cap, 4...O ring, 5...Boundary surface, 6...Solvent atmosphere, 7...Device side receiving part, 8... ··solvent.
Claims (1)
用のノズルを有するレジスト塗布装置において、パッキ
ングを介して前記ノズルの噴出口を塞ぐキャップを備え
ることを特徴とするレジスト塗布装置。What is claimed is: 1. A resist coating apparatus having a nozzle for dropping a resist liquid to apply a resist onto a semiconductor substrate, the resist coating apparatus comprising a cap that closes an ejection port of the nozzle through a packing.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9796389A JPH02275617A (en) | 1989-04-17 | 1989-04-17 | Resist coating device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9796389A JPH02275617A (en) | 1989-04-17 | 1989-04-17 | Resist coating device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02275617A true JPH02275617A (en) | 1990-11-09 |
Family
ID=14206331
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9796389A Pending JPH02275617A (en) | 1989-04-17 | 1989-04-17 | Resist coating device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02275617A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021084081A (en) * | 2019-11-28 | 2021-06-03 | 株式会社東京精密 | Dripping prevention mechanism and coating applicator |
-
1989
- 1989-04-17 JP JP9796389A patent/JPH02275617A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2021084081A (en) * | 2019-11-28 | 2021-06-03 | 株式会社東京精密 | Dripping prevention mechanism and coating applicator |
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