JPH02273026A - Temperature abnormality detection circuit for electronic device - Google Patents

Temperature abnormality detection circuit for electronic device

Info

Publication number
JPH02273026A
JPH02273026A JP1093459A JP9345989A JPH02273026A JP H02273026 A JPH02273026 A JP H02273026A JP 1093459 A JP1093459 A JP 1093459A JP 9345989 A JP9345989 A JP 9345989A JP H02273026 A JPH02273026 A JP H02273026A
Authority
JP
Japan
Prior art keywords
temperature
rack
temperature abnormality
contacts
electronic device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1093459A
Other languages
Japanese (ja)
Inventor
Kazuhiko Umezawa
梅澤 和彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1093459A priority Critical patent/JPH02273026A/en
Publication of JPH02273026A publication Critical patent/JPH02273026A/en
Pending legal-status Critical Current

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  • Measuring Temperature Or Quantity Of Heat (AREA)

Abstract

PURPOSE:To protect a device against malfunction by connecting plural contacts of temperature sensors in parallel close to a rack in which a wiring substrate loaded with integrated circuit elements is enclosed and which is applied with cooling fans and by opening the contacts when the temperature abnormality is detected. CONSTITUTION:At least one cooling fan 2 is provided to a rack 1 where at least a piece of wiring substrate loaded with integrated circuit elements is enclosed and the inside of the rack 1 is forcibly cooled. close to the rack 1 temperature sensors 3 composed of plural thermostats are provided, where contacts are provided which will open when the temperature rises higher than the reference temperature. Each contact is connected in parallel for each group and when all the contacts connected in parallel are opened, a power supply control circuit 5 stops power transmission.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は電子装置の温度異常検出回路に関し、特に温度
があらかじめ定めた規定の温度以上になったことを検知
して、供給されている電源を切断する電子装置の温度異
常検出回路に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a temperature abnormality detection circuit for an electronic device, and in particular detects that the temperature has exceeded a predetermined temperature and detects whether or not the power is being supplied. The present invention relates to a temperature abnormality detection circuit for an electronic device that disconnects.

〔従来の技術〕[Conventional technology]

情報処理装置などの電子機器は、集積回路素子を搭載し
た複数の配線基板を複数の架に収容し、集積回路素子の
温度上昇を防止して信頼性を保つために、それぞれの架
に幾つかの冷却ファンを使用して、空気を強制対流させ
ることにより、それぞれの架の集積回路素子を強制空冷
した状態で稼働している。
Electronic equipment such as information processing equipment has multiple wiring boards mounted with integrated circuit elements mounted on multiple racks, and in order to prevent the temperature of the integrated circuit elements from rising and maintain reliability, each rack has several The integrated circuit devices on each rack are operated in a forced air-cooled state by using a cooling fan to force air convection.

そして、冷却ファンの故障などにより、集積回路素子の
温度が上昇して破損することを防ぐために、架の近傍の
温度を検知し、その温度が規定の温度を超えたときに、
電源回路に異常信号を送り、架を含む各部に供給されて
いる電源を切断している。
In order to prevent the integrated circuit elements from rising in temperature and being damaged due to failure of the cooling fan, etc., the temperature near the rack is detected, and when the temperature exceeds a specified temperature,
It sends an abnormality signal to the power supply circuit and cuts off the power supplied to each part, including the rack.

第2図は従来の電子装置の温度異常検出回路の一例を示
すブロック図である。
FIG. 2 is a block diagram showing an example of a conventional temperature abnormality detection circuit of an electronic device.

従来の電子装置の温度異常検出回路は、第2図に示すよ
うに、集積回路素子を搭載した複数の配線基板を架21
に収容し、集積回路素子の温度上昇を防止する幾つかの
冷却ファン22を架21に使用して、空気を強制対流さ
せている。
As shown in FIG. 2, a conventional temperature abnormality detection circuit for an electronic device consists of a plurality of wiring boards mounted with integrated circuit elements mounted on a rack 21.
Several cooling fans 22 are used in the rack 21 to provide forced air convection, which is housed in the rack 21 and prevents the temperature of the integrated circuit elements from rising.

また、温度検出手段である3個のサーモスタット23は
、あらかじめ定めた規定の温度以上になったことを検知
して、内蔵の接点を開にしている。
Moreover, the three thermostats 23, which are temperature detection means, open their built-in contacts when they detect that the temperature has exceeded a predetermined temperature.

そこで、温度異常認識手段である温度異常認識回路24
は、架21の近傍に配置した3個のサーモスタット23
の接点を直列に接続して、何れかの接点が開になったこ
とにより、温度の異常を認識している。
Therefore, the temperature abnormality recognition circuit 24, which is a temperature abnormality recognition means,
are three thermostats 23 placed near the rack 21.
A temperature abnormality is recognized when one of the contacts is connected in series and one of the contacts is open.

そして、電源制御手段である電源制御回路25は、温度
異常認識回路24が温度の異常を認識したことにより、
架21を含む各部に供給されている電源を切断している
Then, when the temperature abnormality recognition circuit 24 recognizes the temperature abnormality, the power supply control circuit 25, which is the power supply control means,
The power supplied to each part including the rack 21 is cut off.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の電子装置の温度異常検出回路は、サーモ
スタットが一つでも誤動作して、その接点が開いた状態
になると温度異常ではないにもかかわらず、電源制御回
路は、架を含む各部に供給されている電源を切断してし
まうという欠点を有している。
In the temperature abnormality detection circuit of the conventional electronic device described above, if even one thermostat malfunctions and its contacts are open, the power control circuit stops supplying power to each part including the rack, even though there is no temperature abnormality. This has the disadvantage that the power source that is connected to the device is cut off.

本発明の目的は、温度異常認識回路で温度異常を検出す
る複数個の接点を並列に接続することにより、一つの接
点が誤動作により開いても、他の接点が正常に動作して
、各部に供給されている電源を誤って切断してしまうこ
とを防止することができる電子装置の温度異常検出回路
を提供することにある。
The purpose of the present invention is to connect multiple contacts in parallel to detect temperature abnormalities in a temperature abnormality recognition circuit, so that even if one contact opens due to malfunction, the other contacts will operate normally and each part will be An object of the present invention is to provide a temperature abnormality detection circuit for an electronic device that can prevent the supplied power from being accidentally cut off.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の電子装置の温度異常検出回路は、集積回路素子
を搭載した少なくとも一枚の配線基板を架に収容し、少
なくとも一個の冷却ファンにより、前記架を強制空冷し
た状態で稼働する電子装置の温度異常検出回路において
、 (A)温度があらかじめ定めた規定の温度以上になった
ことを検知して、内蔵の接点が開となる温度検出手段、 (B)前記架の近傍に配置した複数個の前記温度検出手
段の接点を並列に接続し、並列に接続された複数個の接
点が同時に開になったことにより、温度の異常を認識す
る温度異常認識手段、 (C)前記温度異常認識手段が温度の異常を認識したこ
とにより、前記架を含む各部に供給されている電源を切
断する電源制御手段、を備えて構成されている。
The temperature abnormality detection circuit for an electronic device according to the present invention operates in a state where at least one wiring board mounted with an integrated circuit element is housed in a rack, and the rack is forcedly cooled by at least one cooling fan. In the temperature abnormality detection circuit, (A) a temperature detection means that opens a built-in contact when it detects that the temperature has exceeded a predetermined temperature; (B) a plurality of temperature detection means arranged near the rack; (C) Temperature abnormality recognition means which connects contacts of said temperature detection means in parallel and recognizes temperature abnormality when a plurality of parallel connected contacts open simultaneously; (C) said temperature abnormality recognition means; The apparatus further includes a power supply control means that cuts off the power supplied to each part including the rack when the temperature abnormality is recognized.

〔実施例〕〔Example〕

次に本発明の実施例について図面を参照して説明する。 Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の電子装置の温度異常検出回路の一実施
例を示すブロック図である。
FIG. 1 is a block diagram showing an embodiment of a temperature abnormality detection circuit for an electronic device according to the present invention.

本実施例の電子装置は、第1図に示すように、集積回路
素子を搭載した複数の配線基板を架lに収容し、集積回
路素子の温度上昇を防止する幾つかの冷却ファン2を架
1に使用して、空気を強制対流させて、架1を強制空冷
した状態で稼働している。
As shown in FIG. 1, the electronic device of this embodiment accommodates a plurality of wiring boards mounted with integrated circuit elements in a rack 1, and installs several cooling fans 2 on the rack 1 to prevent the temperature of the integrated circuit elements from rising. 1, the rack 1 is operated with forced air cooling by forced convection of air.

また、温度検出手段である6個のサーモスタット3は、
温度があらかじめ定めた規定の温度以上になったことを
検知して、内蔵の接点を開にしている。
In addition, the six thermostats 3, which are temperature detection means,
When it detects that the temperature has exceeded a predetermined temperature, it opens a built-in contact.

そこで、温度異常認識手段である温度異常認識回路4は
、架1の近傍に配置した2個のサーモスタット3の2個
の接点を並列に接続し、さらにそれらの2個ずつの3個
を直列に接続しているので、並列に接続された2個の接
点の何れかが同時に開になったときに、温度の異常を認
識している。
Therefore, the temperature abnormality recognition circuit 4, which is a temperature abnormality recognition means, connects two contacts of two thermostats 3 placed near the rack 1 in parallel, and connects three of them in series. Since they are connected, a temperature abnormality is recognized when either of the two parallel-connected contacts open at the same time.

そして、電源制御手段である電源制御回路5は、温度異
常認識回路4が温度の異常を認識したことにより、架1
を含む各部に供給されている電源を切断している。
Then, when the temperature abnormality recognition circuit 4 recognizes the temperature abnormality, the power supply control circuit 5, which is a power control means,
The power supplied to each part, including the power supply, is turned off.

以上述べたように、本実施例の電子装置の温度異常検出
回路は、温度異常認識回路で温度異常を検出する2個の
接点を並列に接続することにより、一つの接点が誤動作
により開いても、もう一つの接点が正常に動作して、各
部に供給されている電源を誤って切断してしまうことを
防止することができる。
As described above, the temperature abnormality detection circuit of the electronic device of this embodiment connects two contacts in parallel for detecting temperature abnormality in the temperature abnormality recognition circuit, so that even if one contact opens due to malfunction, , the other contact operates normally, and it is possible to prevent the power supply supplied to each part from being accidentally cut off.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、本発明の電子装置の温度異常検出
回路は、温度異常認識回路で温度異常を検出する複数個
の接点を並列に接続することにより、一つの接点が誤動
作により開いても、他の接点が正常に動作して、各部に
供給されている電源を誤って切断してしまうことを防止
することができるという効果を有している。
As explained above, the temperature abnormality detection circuit of the electronic device of the present invention connects in parallel a plurality of contacts for detecting temperature abnormality in the temperature abnormality recognition circuit, so that even if one contact opens due to malfunction, This has the effect of preventing other contacts from operating normally and accidentally cutting off the power supplied to each part.

この結果、本発明の電子装置の温度異常検出回路は、温
度の異常を検出する動作の確実性を向上させることによ
り、電子装置の信頼性を高めることができるという効果
を有している。
As a result, the temperature abnormality detection circuit for an electronic device according to the present invention has the effect of increasing the reliability of the electronic device by improving the reliability of the operation for detecting temperature abnormality.

本発明の電子装置の温度異常検出回路は、特にほとんど
停止することなく、稼働することを要求されるシステム
に対して有効である。
The temperature abnormality detection circuit for an electronic device of the present invention is particularly effective for systems that are required to operate almost without stopping.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の電子装置の温度異常検出回路の一実施
例を示すブロック図、第2図は従来の電子装置の温度異
常検出回路の一例を示すブロック図である。 1・・・・・・架、2・・・・・・冷却ファン、3・・
・・・・サーモスタット、4・・・・・・温度異常認識
回路、5・・・・・・電源制御回路、21・・・・・・
架、22・・・・・・冷却ファン、23・・・・・・サ
ーモスタット、24・・・・・・温度異常認識回路、2
5・・・・・・電源制御回路。
FIG. 1 is a block diagram showing an embodiment of a temperature abnormality detection circuit for an electronic device according to the present invention, and FIG. 2 is a block diagram showing an example of a conventional temperature abnormality detection circuit for an electronic device. 1... Shelf, 2... Cooling fan, 3...
...Thermostat, 4 ... Temperature abnormality recognition circuit, 5 ... Power supply control circuit, 21 ...
rack, 22... cooling fan, 23... thermostat, 24... temperature abnormality recognition circuit, 2
5...Power control circuit.

Claims (1)

【特許請求の範囲】 集積回路素子を搭載した少なくとも一枚の配線基板を架
に収容し、少なくとも一個の冷却ファンにより、前記架
を強制空冷した状態で稼働する電子装置の温度異常検出
回路において、 (A)温度があらかじめ定めた規定の温度以上になった
ことを検知して、内蔵の接点が開となる温度検出手段、 (B)前記架の近傍に配置した複数個の前記温度検出手
段の接点を並列に接続し、並列に接続された複数個の接
点が同時に開になつたことにより、温度の異常を認識す
る温度異常認識手段、 (C)前記温度異常認識手段が温度の異常を認識したこ
とにより、前記架を含む各部に供給されている電源を切
断する電源制御手段、 を備えることを特徴とする電子装置の温度異常検出回路
[Scope of Claims] A temperature abnormality detection circuit for an electronic device in which at least one wiring board mounted with an integrated circuit element is accommodated in a rack, and the rack is operated with forced air cooling by at least one cooling fan, comprising: (A) Temperature detection means that opens a built-in contact when it detects that the temperature has exceeded a predetermined temperature; (B) A plurality of temperature detection means arranged near the rack. Temperature abnormality recognition means that connects contacts in parallel and recognizes a temperature abnormality when a plurality of contacts connected in parallel open simultaneously; (C) the temperature abnormality recognition means recognizes a temperature abnormality; A temperature abnormality detection circuit for an electronic device, comprising: power supply control means for cutting off power supplied to each part including the rack.
JP1093459A 1989-04-12 1989-04-12 Temperature abnormality detection circuit for electronic device Pending JPH02273026A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1093459A JPH02273026A (en) 1989-04-12 1989-04-12 Temperature abnormality detection circuit for electronic device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1093459A JPH02273026A (en) 1989-04-12 1989-04-12 Temperature abnormality detection circuit for electronic device

Publications (1)

Publication Number Publication Date
JPH02273026A true JPH02273026A (en) 1990-11-07

Family

ID=14082914

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1093459A Pending JPH02273026A (en) 1989-04-12 1989-04-12 Temperature abnormality detection circuit for electronic device

Country Status (1)

Country Link
JP (1) JPH02273026A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006066126A (en) * 2004-08-25 2006-03-09 Toyota Motor Corp Power supply device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58218195A (en) * 1982-06-11 1983-12-19 三菱電機株式会社 Method of monitoring cooling fan in electric device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58218195A (en) * 1982-06-11 1983-12-19 三菱電機株式会社 Method of monitoring cooling fan in electric device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006066126A (en) * 2004-08-25 2006-03-09 Toyota Motor Corp Power supply device
JP4670281B2 (en) * 2004-08-25 2011-04-13 トヨタ自動車株式会社 Power supply

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