JPH02271712A - Comparison circuit - Google Patents

Comparison circuit

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Publication number
JPH02271712A
JPH02271712A JP1094006A JP9400689A JPH02271712A JP H02271712 A JPH02271712 A JP H02271712A JP 1094006 A JP1094006 A JP 1094006A JP 9400689 A JP9400689 A JP 9400689A JP H02271712 A JPH02271712 A JP H02271712A
Authority
JP
Japan
Prior art keywords
voltage
input
input voltage
level
common
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1094006A
Other languages
Japanese (ja)
Inventor
Jiyunichi Ikuta
郁田 順一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1094006A priority Critical patent/JPH02271712A/en
Publication of JPH02271712A publication Critical patent/JPH02271712A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To extend an input voltage effective range up to fully the power voltage range by providing two comparators whose input voltage effective range differs from each other and switching an output voltage of the comparators in response to the level of the input voltage. CONSTITUTION:A level detection circuit 2 compares a noninverting input voltage VIN with a reference voltage between an effective lower limit input voltage VL and an effective lower limit input voltage VH. The circuit outputs a detection signal VDT at a high level when the voltage VIN is lower than an intermediate voltage VM and the detection signal VDT at a low level when the voltage VIN is higher than the intermediate voltage VM. Then an output voltage V01 of a 1st comparator 1A is selected by the signal VDT when the voltage VIN is lower than the voltage Vw and outputted and an output voltage V02, of a 1st comparator 1B is selected by the signal VDT when the voltage VIN is higher than the voltage VM and outputted. Thus, the input voltage effective range of the comparator circuits is extended up to fully the power voltage range from a low power level VSS to a high power level VDD and the stable operation is obtained within the range.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は比較回路に関し、特にCM□S半導体集積回路
で構成されマイクロコンピュータ等に内蔵されて単一電
源で動作する比較回路に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a comparison circuit, and more particularly to a comparison circuit constructed of a CM□S semiconductor integrated circuit, built into a microcomputer, etc., and operated with a single power supply.

〔従来の技術〕[Conventional technology]

従来の技術について図面を参照して説明する。 A conventional technique will be explained with reference to the drawings.

第4図(a>、(b)はそれぞれ従来の比較回路の第1
及び第2の例を示す回路図である。
FIG. 4 (a>, (b) shows the first comparison circuit of the conventional comparison circuit, respectively.
and FIG. 6 is a circuit diagram showing a second example.

これらの比較回路は、ゲートを出力電圧■。に対して同
相の同相入力電圧VINを入力する同相電圧入力端子T
INと接続するNチャネル(又はPチャネル)MOS型
の第1のトランジスタQ1(又はQll)と、ゲートを
出力電圧■。に対して逆相の基準電圧VREFを入力す
る基準電圧入力端子T REFと接続しソースを第1の
トランジスタQl(Qll)のソースと接続し、第1の
トランジスタQ11(Q+t)と同一の電流特性をもつ
Nチャネル(又はPチャネル)MOS型の第2のトラン
ジスタQ2(又はQ12)と、ソースを低電位側(又は
高電位側)の電源供給端子(電源電圧V55(又は電源
電圧Voo))と接続しドレインを第1及び第2のトラ
ンジスタQl 、 Q2  (Qll。
These comparison circuits gate the output voltage ■. A common-mode voltage input terminal T to which the common-mode input voltage VIN that is in phase with the common-mode input voltage VIN is input.
A first N-channel (or P-channel) MOS type transistor Q1 (or Qll) connected to IN and a gate connected to an output voltage ■. The reference voltage input terminal TREF is connected to the reference voltage input terminal TREF which inputs the reference voltage VREF having the opposite phase to an N-channel (or P-channel) MOS type second transistor Q2 (or Q12) with The drains are connected to the first and second transistors Ql, Q2 (Qll.

Q12)のソースと接続しゲートに所定の電圧を入力す
る定電流源のNチャネル(又はPチャネル〉MOS型の
第3のトランジスタQ3  (又はQ13)と、ソース
を高電位側(又は低電位側)の電源端子(VDD(又は
Vss))と接続しゲート及びドレインを第1のトラン
ジスタQ 1  (Q 1 t )のドレインと接続す
るPチャネル(又はNチャネル)MOS型の第4のトラ
ンジスタQ4  (又はQ14)と、ソースを高電位側
(又は低電位側)の電源端子(VDD(又はVSS))
と接続しゲートを第3のトランジスタQ3  (Q13
)のゲートと接続しドレインを出力端子To及び第2の
トランジスタQ2(Q12)のトレインと接続するPチ
ャネル(又はNチャネル)MOS型の第5のトランジス
タQ5(又はQ15)とを備え、カレントミラー型CM
O8差動増幅器構成となっている。
N-channel (or P-channel) MOS type third transistor Q3 (or Q13) of a constant current source that is connected to the source of Q12) and inputs a predetermined voltage to the gate, and the source is connected to the high potential side (or low potential side). ) is connected to the power supply terminal (VDD (or Vss)) of the P-channel (or N-channel) MOS type fourth transistor Q4 ( or Q14) and the power supply terminal (VDD (or VSS)) with the source on the high potential side (or low potential side)
and connect the gate to the third transistor Q3 (Q13
), and a P-channel (or N-channel) MOS type fifth transistor Q5 (or Q15) whose drain is connected to the output terminal To and the train of the second transistor Q2 (Q12). Type commercial
It has an O8 differential amplifier configuration.

次に、これら比較回路の動作について説明する。Next, the operation of these comparison circuits will be explained.

第5図は第4図(a)に示された比較回路の動作を説明
するためのPチャネル及びNチャネルのトランジスタの
電流・電圧特性図である。
FIG. 5 is a current/voltage characteristic diagram of P-channel and N-channel transistors for explaining the operation of the comparison circuit shown in FIG. 4(a).

まず、アナログの同相入力電圧VIN及び基準電圧VI
FがV I N = V REFの関係にあるときの比
較回路の動作点は、Nチャネルのトランジスタの電流・
電圧特性曲線CN2とPチャネルのトランジスタの電流
・電圧特性曲線CP2との交点のA点に設定されている
First, analog common-mode input voltage VIN and reference voltage VI
The operating point of the comparator circuit when F is in the relationship V I N = V REF is the current of the N-channel transistor.
It is set at point A, which is the intersection of the voltage characteristic curve CN2 and the current/voltage characteristic curve CP2 of the P-channel transistor.

いま、V IN> V FLepの関係になったとき、
節点N1の電位は低レベルとなり、動作点はB点へ移行
する。また、V I N < V REFの関係になっ
たとき、節点N1の電位は高レベルとなり動作点は0点
へ移行する。
Now, when the relationship is V IN > V FLep,
The potential at node N1 becomes a low level, and the operating point shifts to point B. Further, when the relationship of V I N < V REF is established, the potential of the node N1 becomes high level and the operating point shifts to the 0 point.

そしてこれら各動作点のレベルが増幅されて最終的な比
較結果が得られる。
The levels at each of these operating points are then amplified to obtain the final comparison result.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の比較回路は、ゲートを同相電圧入力端子
TINと接続する第1のトランジスタQl(又はQ 目
)と、ゲートを基準電圧入力端子TREPと接続する第
2のトランジスタQ2(又はQ12)と、これら第1及
び第2のトランジスタQ+ +、Q2  (又はQ+t
、 Q12)のソースと電源供給端子(Vss(又はV
DD))との間に接続された第3のトランジスタQ3(
又はQ13)とを備えた構成となっているので、これら
第1〜第3のトランジスタQl〜Q3(又はQll〜Q
13)はそれぞれしきい値電圧をもつために、同相入力
電圧V IN、基準電圧VREFがこれらしきい値電圧
より低く(又は高く)なると正常な比較動作が行なわれ
ず正しい比較結果が得られなくなり、入力電圧に対する
有効範囲、すなわち入力電圧有効範囲が低電位側及び高
電位側間の電源電圧範囲より狭くなるという欠点がある
The conventional comparison circuit described above includes a first transistor Ql (or Q-th transistor) whose gate is connected to the common-mode voltage input terminal TIN, and a second transistor Q2 (or Q12) whose gate is connected to the reference voltage input terminal TREP. , these first and second transistors Q+ +, Q2 (or Q+t
, Q12) and the power supply terminal (Vss (or V
A third transistor Q3(DD)) connected between
or Q13), these first to third transistors Ql to Q3 (or Qll to Q
13) each have a threshold voltage, so if the common-mode input voltage V IN and reference voltage VREF are lower (or higher) than these threshold voltages, normal comparison operation will not be performed and correct comparison results will not be obtained. There is a drawback that the effective range for the input voltage, that is, the effective input voltage range is narrower than the power supply voltage range between the low potential side and the high potential side.

本発明の目的は、入力電圧有効範囲を低電位側及び高電
位側間の電源電圧範囲一ばいに拡げることができる比較
回路を提供することにあ゛る。
SUMMARY OF THE INVENTION An object of the present invention is to provide a comparator circuit that can widen the effective input voltage range to the power supply voltage range between the low potential side and the high potential side.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の比較回路は、低電位側及び高電位側の電源供給
端子間に設けられ、第1の入力端を第1の出力電圧に対
して同相の同相入力電圧を入力する同相電圧入力端子と
接続し、第2の入力端を前記第1の出力電圧に対して逆
相の基準電圧を入力する基準電圧入力端子と接続し、前
記同相入力電圧及び基準電圧に対して低電位側電源電圧
と有効上限入力電圧との間の入力電圧有効範囲をもち、
前記同相入力電圧を前記基準電圧と比較して前記第1の
出力電圧を出力する0MO3型の第1の比較器と、前記
低電位側及び高電位側の電源供給端子間に設けられ、第
1の入力端を第2の出力電圧に対して同相となる前記同
相入力電圧を入力する前記同相電圧入力端子と接続し、
第2の入力端を前記第2の出力電圧に対して逆相となる
前記基準電圧を入力する前記基準電圧入力端子と接続し
、前記同相入力電圧及び基準電圧に対して高電位側電源
電圧と有効下限入力電圧との間の入力電圧有効範囲をも
ち、前記同相入力電圧を前記基準電圧と比較して前記第
2の出力電圧を出力する0MO8型の第2の比較器と、
前記同相入力電圧が前記有効上限入力電圧と前記有効下
限入力電圧との中間の中間電圧より低いときには第1の
レベルとなり高いときには第2のレベルとなる検出信号
を出力するレベル検出回路と、前記検出信号が第1のレ
ベルのとき前記第1の出力電圧を出力し第2のレベルの
とき第2の出力電圧を出力する切換回路とを有している
The comparison circuit of the present invention is provided between power supply terminals on a low potential side and a high potential side, and has a first input terminal as a common-mode voltage input terminal for inputting a common-mode input voltage that is in phase with a first output voltage. A second input terminal is connected to a reference voltage input terminal into which a reference voltage having a reverse phase with respect to the first output voltage is input, and a low potential side power supply voltage is connected with respect to the in-phase input voltage and the reference voltage. It has a valid input voltage range between the valid upper limit input voltage,
a 0MO3 type first comparator that compares the common-mode input voltage with the reference voltage and outputs the first output voltage; and a first comparator provided between the low potential side and high potential side power supply terminals; connects an input terminal of the input terminal to the common mode voltage input terminal into which the common mode input voltage that is in phase with the second output voltage is input;
A second input terminal is connected to the reference voltage input terminal into which the reference voltage having a phase opposite to the second output voltage is input, and a high potential side power supply voltage is connected to the in-phase input voltage and the reference voltage. a 0MO8 type second comparator that has an input voltage effective range between the effective lower limit input voltage and compares the common-mode input voltage with the reference voltage and outputs the second output voltage;
a level detection circuit that outputs a detection signal that is at a first level when the common-mode input voltage is lower than an intermediate voltage between the effective upper limit input voltage and the effective lower limit input voltage and is at a second level when it is higher; and a switching circuit that outputs the first output voltage when the signal is at a first level and outputs the second output voltage when the signal is at a second level.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明する
Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の第1の実施例を示す回路図である。FIG. 1 is a circuit diagram showing a first embodiment of the present invention.

第1の比較器IAは、第4図(b)に示された比較回路
と同様の回路で構成されて低電位側及び高電位側の電源
供給端子間に設けられ、第1の入力端を第1の出力電圧
V01に対して同相の同相入力電圧’VIHを入力する
同相電圧入力端子TINと接続し、第2の入力端を第1
の出力電圧V。1に対して逆相の基準電圧VREPを入
力する基準電圧入力端子T RlFと接続し、同相入力
電圧VIN及び基準電圧VREPに対して低電位側電源
電圧(VSS)と有効上限入力電圧(VH)との間の入
力電圧有効範囲(VRl)をもち、同相入力電圧VIN
を基準電圧V R,、と比較して第1の出力電圧■ol
を出力する。
The first comparator IA is constructed of a circuit similar to the comparison circuit shown in FIG. 4(b), and is provided between the power supply terminals on the low potential side and the high potential side, The second input terminal is connected to the common mode voltage input terminal TIN which inputs the common mode input voltage 'VIH which is in phase with the first output voltage V01, and the second input terminal is connected to the first output voltage V01.
The output voltage V. Connected to the reference voltage input terminal T RlF that inputs the reference voltage VREP with the opposite phase to 1, and outputs the low potential side power supply voltage (VSS) and the effective upper limit input voltage (VH) with respect to the in-phase input voltage VIN and the reference voltage VREP. has a valid input voltage range (VRl) between
is compared with the reference voltage VR, , and the first output voltage ■ol
Output.

第2の比較器IBは、第4図(a)に示された比較回路
と同様の回路で構成されて低電位側及び高電位側の電源
供給端子間に設けられ、第1の入力端を第2の出力電圧
Vo2に対して同相となる同相入力電圧VINを入力す
る同相電圧入力端子TINと接続し、第2の入力端を第
2の出力電圧V02に対して逆相となる基準電圧VRE
Fを入力する基準電圧入力端子TRP、Fと接続し、同
相入力電圧V’B及び基準電圧■RIl:Fに対して高
電位側電源電圧(■DD)と有効下限入力電圧(Vt)
との間の入力電圧有効範囲VR2をもち、同相入力電圧
VINを基準電圧VRF、Fと比較して第2の出力電圧
Vo2を出力する。
The second comparator IB is constructed of a circuit similar to the comparison circuit shown in FIG. 4(a), and is provided between the power supply terminals on the low potential side and the high potential side, A reference voltage VRE is connected to a common-mode voltage input terminal TIN that inputs a common-mode input voltage VIN that is in phase with the second output voltage Vo2, and the second input terminal is connected to a reference voltage VRE that is in reverse phase with respect to the second output voltage V02.
The reference voltage input terminal TRP that inputs F is connected to F, and the high potential side power supply voltage (■DD) and effective lower limit input voltage (Vt) are connected to the common-mode input voltage V'B and the reference voltage ■RIl:F.
It has a valid input voltage range VR2 between , and outputs a second output voltage Vo2 by comparing the in-phase input voltage VIN with the reference voltages VRF and F.

レベル検出回路2は、比較器21と2つのインバータ1
.、I2とを備え、同相入力電圧VINが有効上限入力
電圧(VH>と有効下限入力電圧(VL)との中間の中
間電圧VMより低いときには高レベルとなり高いときに
は低レベルとなる検出信号VDTを出力する。
The level detection circuit 2 includes a comparator 21 and two inverters 1
.. , I2, and outputs a detection signal VDT which becomes a high level when the common mode input voltage VIN is lower than an intermediate voltage VM between the effective upper limit input voltage (VH> and the effective lower limit input voltage (VL)) and becomes a low level when it is higher. do.

切換回路3は、2つのアナログスイッチAS1AS2と
インバータI3とを備え、検出信号V07゜が高レベル
のとき第1の比較器IAの出力電圧■o1を出力し、低
レベルのとき第2の比較器IBの出力電圧V(,2を出
力する。
The switching circuit 3 includes two analog switches AS1AS2 and an inverter I3, and outputs the output voltage o1 of the first comparator IA when the detection signal V07° is high level, and outputs the output voltage o1 of the first comparator IA when the detection signal V07° is low level. Outputs the output voltage V(,2) of IB.

増幅器4は、切換回路3の出力電圧を増幅して出力する
The amplifier 4 amplifies the output voltage of the switching circuit 3 and outputs the amplified voltage.

次に、この実施例の動作について説明する。Next, the operation of this embodiment will be explained.

第2図はこの実施例の動作を説明するための第1及び第
2の比較器の入力電圧有効範囲を示す特性図である。
FIG. 2 is a characteristic diagram showing the effective input voltage ranges of the first and second comparators for explaining the operation of this embodiment.

第1の比較器IAは、前述したように第4図(b)に示
された比較回路と同様の回路構成となっており、第1〜
第3のトランジスタQll〜Q!3はそれぞれしきい値
電圧をもっているので、高電位側電源電圧VDDがらト
ランジスタQ+3のしきい値電圧とトランジスタQ11
1Q12のしきい値電圧とを加算した電圧(以下、これ
を単にしきい値電圧■Tと呼ぶ)を引いた電圧より高い
同相入力電圧V 、N、基準電圧VREFに対しては正
常な比較動作を行なわなくなる。この高電位側電源電圧
VDDからしきい値電圧■。を引いた電圧が前述した有
効上限入力電圧■8である。
As mentioned above, the first comparator IA has the same circuit configuration as the comparison circuit shown in FIG.
Third transistor Qll~Q! 3 each have a threshold voltage, so the threshold voltage of transistor Q+3 and transistor Q11 are determined from the high potential side power supply voltage VDD.
Normal comparison operation for the common mode input voltage V, N, and reference voltage VREF that is higher than the voltage obtained by adding the threshold voltage of 1Q12 (hereinafter referred to simply as the threshold voltage ■T). will no longer be carried out. Threshold voltage ■ from this high potential side power supply voltage VDD. The voltage obtained by subtracting is the effective upper limit input voltage (8) mentioned above.

従って、この第1の比較器IAの入力電圧有効範囲は、
低電圧側電源電圧■ssから有効上限入力電圧VHまで
となる。
Therefore, the effective input voltage range of this first comparator IA is:
The voltage ranges from the low voltage side power supply voltage ■ss to the effective upper limit input voltage VH.

第2の比較器IBは、前述したように第4図(a)に示
された比較回路と同様の回路構成となっており、第1の
比較器IAと同様の観点から、入力電圧有効範囲は、高
電位側電源電圧V。Dから(Vss+V丁)の有効下限
入力電圧■Lまでとなる。
As mentioned above, the second comparator IB has a circuit configuration similar to that of the comparison circuit shown in FIG. is the high potential side power supply voltage V. D to the effective lower limit input voltage ■L of (Vss+Vd).

レベル検出回路2においては、有効下限入力電圧VLと
有効上限入力電圧VHとの丁度中間の電圧、すなわち中
間電圧VMを基準として同相入力電圧VINのレベルが
比較され、同相入力電圧VINが中間電圧VMより低い
ときには高レベル、高いときには低レベルの検出信号V
DTを出力する。
In the level detection circuit 2, the level of the common-mode input voltage VIN is compared with a voltage exactly intermediate between the effective lower limit input voltage VL and the effective upper limit input voltage VH, that is, the intermediate voltage VM, as a reference, and the common-mode input voltage VIN is compared with the intermediate voltage VM. The detection signal V is high level when it is lower and low level when it is higher.
Output DT.

そしてこの検出信号VDTにより、同相入力電圧VIN
が中間電圧vMより低いときには第1の比較器IAの出
力電圧V01が選択され、高いときには第2の比較器I
Bの出力電圧V。2が選択されて出力されるので、この
比較回路の入力電圧有効範囲は、低電位側電源電圧VS
Sから高電位側電源電圧VDDまでの電源電圧範囲一ば
いに拡大され、かつこの範囲で安定した結果が得られる
Then, by this detection signal VDT, the common mode input voltage VIN
is lower than the intermediate voltage vM, the output voltage V01 of the first comparator IA is selected, and when it is higher, the output voltage V01 of the second comparator IA is selected.
B's output voltage V. 2 is selected and output, the effective input voltage range of this comparison circuit is the low potential side power supply voltage VS
The power supply voltage range from S to the high potential side power supply voltage VDD is widened, and stable results can be obtained within this range.

第3図は本発明の第2の実施例を示す回路図である。FIG. 3 is a circuit diagram showing a second embodiment of the present invention.

この実施例は、スイッチ回路5を設け、このスイッチ回
路5により、同相入力電圧V1,4及び基準電圧vhE
pの一方を選択してこれら電圧のレベルを中間電圧V、
と比較するようにしたもので、これら電圧のレベルが中
間電圧7M付近にあるときにはレベル検出回路2の比較
器21の貫通電流が流れ消費電流が増大するので、この
場合、これら電圧を切換えることにより、消費電流が増
大するのを防止することができるという利点がある。
In this embodiment, a switch circuit 5 is provided, and this switch circuit 5 allows the common mode input voltages V1, 4 and the reference voltage vhE to
p is selected and the level of these voltages is set to an intermediate voltage V,
When the level of these voltages is around the intermediate voltage 7M, a through current flows through the comparator 21 of the level detection circuit 2, increasing the current consumption.In this case, by switching these voltages, , there is an advantage that it is possible to prevent an increase in current consumption.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、入力電圧有効範囲の異な
る2つの比較器を設け、入力電圧のレベルに応じてこれ
ら比較器の出力電圧を切換える構成とすることにより、
入力電圧有効範囲を電源電圧範囲一ばいまで拡大するこ
とができる効果がある。
As explained above, the present invention has a configuration in which two comparators with different effective input voltage ranges are provided and the output voltages of these comparators are switched according to the level of the input voltage.
This has the effect of expanding the effective input voltage range to the full extent of the power supply voltage range.

子、TREE・・・基準電圧入力端子。Child, TREE...Reference voltage input terminal.

Claims (1)

【特許請求の範囲】[Claims]  低電位側及び高電位側の電源供給端子間に設けられ、
第1の入力端を第1の出力電圧に対して同相の同相入力
電圧を入力する同相電圧入力端子と接続し、第2の入力
端を前記第1の出力電圧に対して逆相の基準電圧を入力
する基準電圧入力端子と接続し、前記同相入力電圧及び
基準電圧に対して低電位側電源電圧と有効上限入力電圧
との間の入力電圧有効範囲をもち、前記同相入力電圧を
前記基準電圧と比較して前記第1の出力電圧を出力する
CMOS型の第1の比較器と、前記低電位側及び高電位
側の電源供給端子間に設けられ、第1の入力端を第2の
出力電圧に対して同相となる前記同相入力電圧を入力す
る前記同相電圧入力端子と接続し、第2の入力端を前記
第2の出力電圧に対して逆相となる前記基準電圧を入力
する前記基準電圧入力端子と接続し、前記同相入力電圧
及び基準電圧に対して高電位側電源電圧と有効下限入力
電圧との間の入力電圧有効範囲をもち、前記同相入力電
圧を前記基準電圧と比較して前記第2の出力電圧を出力
するCMOS型の第2の比較器と、前記同相入力電圧が
前記有効上限入力電圧と前記有効下限入力電圧との中間
の中間電圧より低いときには第1のレベルとなり高いと
きには第2のレベルとなる検出信号を出力するレベル検
出回路と、前記検出信号が第1のレベルのとき前記第1
の出力電圧を出力し第2のレベルのとき第2の出力電圧
を出力する切換回路とを有することを特徴とする比較回
路。
Provided between the power supply terminals on the low potential side and high potential side,
A first input terminal is connected to a common-mode voltage input terminal that inputs a common-mode input voltage that is in phase with the first output voltage, and a second input terminal is connected to a reference voltage that is in reverse phase with respect to the first output voltage. has a valid input voltage range between the low potential side power supply voltage and the effective upper limit input voltage with respect to the common-mode input voltage and the reference voltage, and connects the common-mode input voltage to the reference voltage input terminal. A first comparator of CMOS type that outputs the first output voltage by comparing the first output voltage with the first output voltage, and a first comparator that is provided between the power supply terminals on the low potential side and the high potential side, and connects the first input terminal to the second output voltage. The reference is connected to the common-mode voltage input terminal that inputs the common-mode input voltage that is in phase with the voltage, and the second input terminal is connected to the reference voltage that inputs the reference voltage that is in reverse phase with respect to the second output voltage. is connected to a voltage input terminal, has a valid input voltage range between a high potential side power supply voltage and an effective lower limit input voltage with respect to the common mode input voltage and a reference voltage, and compares the common mode input voltage with the reference voltage. a CMOS type second comparator that outputs the second output voltage; and when the common mode input voltage is lower than an intermediate voltage between the effective upper limit input voltage and the effective lower limit input voltage, the voltage becomes a first level and is high. a level detection circuit that outputs a detection signal that sometimes becomes a second level; and a level detection circuit that outputs a detection signal that is at a second level at times, and a
and a switching circuit that outputs a second output voltage when the output voltage is at a second level.
JP1094006A 1989-04-12 1989-04-12 Comparison circuit Pending JPH02271712A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1094006A JPH02271712A (en) 1989-04-12 1989-04-12 Comparison circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1094006A JPH02271712A (en) 1989-04-12 1989-04-12 Comparison circuit

Publications (1)

Publication Number Publication Date
JPH02271712A true JPH02271712A (en) 1990-11-06

Family

ID=14098347

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1094006A Pending JPH02271712A (en) 1989-04-12 1989-04-12 Comparison circuit

Country Status (1)

Country Link
JP (1) JPH02271712A (en)

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JP2010045579A (en) * 2008-08-12 2010-02-25 Fujitsu Ltd Comparator circuit, and analog digital converter having the same
JP2010517336A (en) * 2007-01-19 2010-05-20 パワー・インテグレーションズ・インコーポレーテッド Comparator with complementary differential input stage
DE102017216559A1 (en) 2017-02-06 2018-08-09 Mitsubishi Electric Corporation Comparator, AD converter, semiconductor integrated circuit and rotation detector
US10084464B1 (en) 2017-11-10 2018-09-25 Mitsubishi Electric Corporation Ad converter, semiconductor integrated circuit, and rotation detector

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010517336A (en) * 2007-01-19 2010-05-20 パワー・インテグレーションズ・インコーポレーテッド Comparator with complementary differential input stage
JP2010045579A (en) * 2008-08-12 2010-02-25 Fujitsu Ltd Comparator circuit, and analog digital converter having the same
DE102017216559A1 (en) 2017-02-06 2018-08-09 Mitsubishi Electric Corporation Comparator, AD converter, semiconductor integrated circuit and rotation detector
JP2018129571A (en) * 2017-02-06 2018-08-16 三菱電機株式会社 Comparator, ad converter, semiconductor integrated circuit, and rotation detecting device
US10110215B2 (en) 2017-02-06 2018-10-23 Mitsubishi Electric Corporation Comparator, AD converter, semiconductor integrated circuit, and rotation detector
DE102017216559B4 (en) 2017-02-06 2022-05-25 Mitsubishi Electric Corporation Comparator, AD converter, semiconductor integrated circuit and rotation detector
US10084464B1 (en) 2017-11-10 2018-09-25 Mitsubishi Electric Corporation Ad converter, semiconductor integrated circuit, and rotation detector

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