JPH0226244U - - Google Patents
Info
- Publication number
- JPH0226244U JPH0226244U JP10525988U JP10525988U JPH0226244U JP H0226244 U JPH0226244 U JP H0226244U JP 10525988 U JP10525988 U JP 10525988U JP 10525988 U JP10525988 U JP 10525988U JP H0226244 U JPH0226244 U JP H0226244U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- probing
- making
- utility
- registration request
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 2
- 239000000523 sample Substances 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10525988U JPH0226244U (ko) | 1988-08-09 | 1988-08-09 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10525988U JPH0226244U (ko) | 1988-08-09 | 1988-08-09 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0226244U true JPH0226244U (ko) | 1990-02-21 |
Family
ID=31337709
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10525988U Pending JPH0226244U (ko) | 1988-08-09 | 1988-08-09 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0226244U (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009176883A (ja) * | 2008-01-23 | 2009-08-06 | Tokyo Electron Ltd | 検査方法及びこの検査方法を記録したプログラム記録媒体 |
-
1988
- 1988-08-09 JP JP10525988U patent/JPH0226244U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009176883A (ja) * | 2008-01-23 | 2009-08-06 | Tokyo Electron Ltd | 検査方法及びこの検査方法を記録したプログラム記録媒体 |