JPH02259841A - System for managing test of information processor - Google Patents

Abstract

PURPOSE:To efficiently perform a test by automatically performing the interruption of a test program and the recovery of a device to be tested when the device to be tested goes down, and restarting the test after removing a test unit having a factor which causes the down of the device from a schedule. CONSTITUTION:A down instruction storage means 17 stores a test instruction 23 applied on the device 10 to be tested by the test unit of a test unit group 11 transiently. A test schedule means 18 interrupts the test once when receiving a down detecting signal 21, and a reset means 16 performs resetting on the device 10 to be tested, and outputs a reset success signal 22 when it succeeds in resetting. The test schedule means 18 refers to an every unit instruction storage means 12, and restarts the test after removing the test unit which performs the same test instruction as a down instruction stored in the down instruction storage means 17 out of the test units behind the next test unit. In such a way, it is possible to reduce the man-hours of maintenance and to efficiently perform the test of peripheral equipment.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an information processing device test management method, and more particularly to a peripheral device test management method for managing tests of peripheral devices using a test diagnosis program in an information processing system.

[Conventional technology]

In conventional peripheral device test management systems, if the device under test goes down during test execution, the test program is stopped, and a maintenance person has to manually recover the device under test and restart the test program.

[Problem to be solved by the invention]

In the conventional peripheral device test management method described above, if the device under test goes down, it is necessary for the maintenance person to manually recover the device under test, and restarting the test program is also done manually by the maintenance person. It had the disadvantage of requiring maintenance personnel to monitor it. In addition, since the test program is restarted with the cause of the failure of the device under test remaining, there is also the drawback that the device under test may go down again due to the same cause of failure, reducing test efficiency.

In view of the above-mentioned points, it is an object of the present invention to automatically interrupt a test program and recover the device under test when the device under test goes down, and further automatically eliminate the cause of the downtime of the device under test. An object of the present invention is to provide a peripheral device test management method that efficiently tests peripheral devices by removing a test unit that has a test unit from the test schedule and restarting the test.

[Means to solve the problem]

The information processing device test management system of the present invention includes a test program comprising a test unit group for testing a device under test and unit-by-unit test instruction storage means for storing test instructions to be performed by each test unit of the test unit group. , a down condition storage means for storing a down condition that is a condition for a test response when the device under test goes down, and a test response of the device under test is compared with the down condition stored in the down condition storage means. a down determination means for determining that the device under test is down and outputting a down detection signal when the down detection signal is received, and resetting the device under test if the reset is successful; a reset means for outputting a reset failure signal when the signal output 211 set fails; a down command storage means for storing a test command given to the device under test when the down detection signal is received; Each test unit of the unit group is executed sequentially, and when the down detection signal is received, the execution of the test unit group is interrupted, and when the reset success signal is received, the unit-by-unit instruction storage means is searched and the down detection signal is and test scheduling means for removing a test unit that carries out a test command that matches the down command stored in the command storage means and causing the test unit group to restart the test.

〔Example〕

Next, the present invention will be explained in detail with reference to the drawings.

FIG. 1 and FIG. 2 are a block diagram showing the configuration of a peripheral device test management method according to an embodiment of the present invention, and a flow chart showing the processing, respectively. The peripheral device test management system of this embodiment includes a device under test 1o, a test program 13 including a test unit group 11 and unit-by-unit instruction storage means 12, a down judgment means 14, a down condition storage means 15, and a reset means. 16, down command storage means 17, and test scheduling means 18.

The test knee unit group 11 includes a plurality of test units 11(1), 11(2), . . . 1 that test the device under test.
1(i)... (i: a positive number starting from 1), and the test unit IHi) is instructed to be executed by the test scheduler 18 (step 101). The test unit 11(i) issues test command 2 to device under test 1°.
3 (step 1o2).

The down command storage means 17 stores the test unit 11(i)
The test command 23 issued to the device under test 10 is temporarily stored (step 103).

The down judgment means 14 receives the test response 2o from the device under test 10 in response to the test command 23, and determines the down condition, which is a condition for a test response when the device under test 1° is down, which is stored in the down condition storage means 15. Determine whether there is a match. If the test response 2o does not match the down condition, the process returns to step 101 and the next test unit 11 (i+1>
Execute.

If the test response 20 matches the down condition, the down determination means 14 outputs the down detection signal 21 (step 104).

When the down command storage means 17 receives the down detection signal 21, it stores the next stored test command 23 as a down command (step 105). When the test scheduling means 18 receives the down detection signal 21,
Test unit 11(i) with device under test 1o down
The test is temporarily interrupted without instructing the execution of the next test unit 11 (i+1) (step 10).
6).

When the reset means 16 receives the down detection signal 21, it resets the device under test 10 in order to recover the device under test 10 (step 107). The reset means 16 outputs a reset success signal 22 when the reset is successful and the device under test 10 has recovered, and outputs a reset failure signal 24 when the reset has failed and the device under test 10 has not recovered (step 108). .

When the test scheduler 18 receives the reset failure signal 24, it stops the execution of the test unit 11 (i+1) and thereafter, and ends the test (step 109). When the test scheduler 18 receives the reset success signal 22, the test scheduler 18 refers to the per-unit test command storage means 12 that stores test commands to be performed by each test unit, and schedules the test for each test unit after the test unit 11(i+1). It is determined whether there is a test command that is the same as the down command stored in the down command storage means 17 among the commands. If there is no test command that is the same as the down command, the process proceeds to step 112 and the test execution is resumed from test unit 11 (i+1). If there is a test command that is the same as the down command, proceed to the next step 11.
1 (step 110).

The test schedule means 18 refers to the unit-by-unit instruction storage means 12 and selects a test unit that performs the same test command as the down command stored in the down command storage means 17 from among the test units after the test unit 11 (r+1>). Remove the schedule for subsequent exams (step 111)
. The test scheduling means 18 restarts the test and ends the operation of the peripheral device test management method of the present invention.

〔Effect of the invention〕

As explained above, the present invention automatically interrupts the test program and recovers the device under test when the device under test goes down, and further automatically By removing the test from the test schedule and restarting the test, it is possible to reduce maintenance man-hours and perform efficient testing of peripheral devices.

[Brief explanation of drawings]

FIG. 1 and FIG. 2 are a block diagram showing the configuration of an embodiment of the information processing device test management method of the present invention and a flow chart showing the processing, respectively. 10... Device under test, 11... Test unit group, 1
2... Unit-by-unit test command storage means, 13... Test program, 14... Down judgment means, 15... Down condition storage means, 16... Reset means, 17...
- Down command storage means, 18... test schedule means.

Claims (1)

[Claims] A test program consisting of a test unit group for testing a device under test, a unit-by-unit test instruction storage means for storing test instructions to be performed by each test unit of the test unit group, and a test when the device under test goes down. down condition storage means for storing down conditions that are response conditions;
a down determining means for comparing the down condition stored in the down condition storage means with the test response of the device under test and determining that the device under test is down when they match, and outputting a down detection signal; Resetting means for resetting the device under test when receiving a detection signal, outputting a reset success signal when the reset is successful, and outputting a reset failure signal when the reset fails; a down command storage means for storing a test command given to the device under test when the test unit is in use; When the reset success signal is received, the unit-by-unit instruction storage means is searched, and the test unit that matches the down command stored in the down command storage means is removed. 1. An information processing device test management method, comprising: a test scheduling means for restarting the test.