JPH0225881U - - Google Patents
Info
- Publication number
- JPH0225881U JPH0225881U JP10385988U JP10385988U JPH0225881U JP H0225881 U JPH0225881 U JP H0225881U JP 10385988 U JP10385988 U JP 10385988U JP 10385988 U JP10385988 U JP 10385988U JP H0225881 U JPH0225881 U JP H0225881U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor product
- jig
- measuring
- semiconductor
- pressing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 5
- 230000003139 buffering effect Effects 0.000 claims 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10385988U JPH0225881U (de) | 1988-08-05 | 1988-08-05 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10385988U JPH0225881U (de) | 1988-08-05 | 1988-08-05 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0225881U true JPH0225881U (de) | 1990-02-20 |
Family
ID=31335062
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10385988U Pending JPH0225881U (de) | 1988-08-05 | 1988-08-05 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0225881U (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08172117A (ja) * | 1994-12-20 | 1996-07-02 | Nec Corp | ベアチップテストキャリア |
-
1988
- 1988-08-05 JP JP10385988U patent/JPH0225881U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH08172117A (ja) * | 1994-12-20 | 1996-07-02 | Nec Corp | ベアチップテストキャリア |