JPH02253130A - Load cell weighing instrument - Google Patents
Load cell weighing instrumentInfo
- Publication number
- JPH02253130A JPH02253130A JP7545589A JP7545589A JPH02253130A JP H02253130 A JPH02253130 A JP H02253130A JP 7545589 A JP7545589 A JP 7545589A JP 7545589 A JP7545589 A JP 7545589A JP H02253130 A JPH02253130 A JP H02253130A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- voltage
- load cell
- strain gauge
- value
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005303 weighing Methods 0.000 title 1
- 238000001514 detection method Methods 0.000 claims description 15
- 238000010586 diagram Methods 0.000 description 2
- 241000283074 Equus asinus Species 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Measurement Of Force In General (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の目的〕
（産業上の利用分野）
本発明は、ロードセルの出方に温度補償を行なって温度
にかかわらず、一定の重量を計測するロードセル秤に関
する。DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a load cell scale that measures a constant weight regardless of temperature by temperature-compensating the direction of the load cell.
（従来の技術）
従来のこの種のロードセル秤は、起歪部に、ストレンゲ
ージおよびこのストレンゲージに直列に接続された３
５００ＰＰＭ ／’Ｃ程度の温度係数の大きな温度補償
用抵抗を設け、温度補償用抵抗の温度による抵抗値の変
化により、ストレンゲージの出力を変化させている。(Prior Art) A conventional load cell scale of this type has a strain gauge and a strain gauge connected in series to the strain gauge.
A temperature compensation resistor having a large temperature coefficient of about 500 PPM/'C is provided, and the output of the strain gauge is changed by changing the resistance value of the temperature compensation resistor depending on the temperature.
（発明が解決しようとする課題）
しかしながら、従来は、ロードセルの出力の温度による
変化を、そのまま、温度補償用抵抗の抵抗値の変化によ
り相殺するため、温度補償用抵抗の調整が非常に煩雑で
ある問題を有している。(Problem to be solved by the invention) However, in the past, the change in the output of the load cell due to temperature is directly offset by the change in the resistance value of the temperature compensation resistor, so adjusting the temperature compensation resistor is very complicated. I have a certain problem.
本発明は上記問題点に鑑みなされたもので、温度補償を
容易に行なうことができるロードセル秤を提供すること
を目的とする。The present invention was made in view of the above problems, and an object of the present invention is to provide a load cell scale that can easily perform temperature compensation.
（課題を解決するだめの手段）
本発明のロードセル秤は、起歪部にストレンゲージおよ
びこのストレンゲージに接続された温度補償用抵抗を設
けたロードセルを備え、このロードセルの出力に基づい
て重量を計測するロードセル秤において、前記温度補償
用抵抗の抵抗値の変化により変化する電圧を検出する電
圧検出手段と、この電圧検出手段で検出された電圧から
前記起歪部の温度を算出する温度検出手段と、温度補正
値を記憶する記憶手段と、前記温度検出手段で検出され
た温度に従って前記ストレンゲージの出力を温度補正値
により補正する補正手段とを具備したものである。(Another Means for Solving the Problems) The load cell scale of the present invention includes a load cell in which a strain gauge is provided in a strain generating part and a temperature compensation resistor connected to the strain gauge, and the weight is calculated based on the output of the load cell. In the load cell scale for measurement, a voltage detection means for detecting a voltage that changes due to a change in the resistance value of the temperature compensation resistor, and a temperature detection means for calculating the temperature of the strain generating part from the voltage detected by the voltage detection means. and a storage means for storing a temperature correction value, and a correction means for correcting the output of the strain gauge with the temperature correction value in accordance with the temperature detected by the temperature detection means.
（作用）
本発明は、温度補償用抵抗の抵抗値の変化によって変化
する電圧を電圧測定手段で検出し、この電圧値に基づい
て、温度検出手段で起歪部の温度を算出する。そして、
この温度に従って記憶手段に記憶されている温度補正値
により、補正手段でストレンゲージの出力を補正する。(Function) In the present invention, a voltage measuring means detects a voltage that changes due to a change in the resistance value of a temperature compensation resistor, and a temperature detecting means calculates the temperature of the strain-generating portion based on this voltage value. and,
According to this temperature, the output of the strain gauge is corrected by the correction means using the temperature correction value stored in the storage means.
（実施例）
以下、本発明のロードセル秤の一実施例を図面を参照し
て説明する。(Example) Hereinafter, one example of the load cell scale of the present invention will be described with reference to the drawings.
第１図に示すように、１はロードセルで、このロードセ
ル１は起歪部２に、ストレンゲージ３およびこのストレ
ンゲージ３に接続された温度補償用抵抗４が設けられ構
成されている。As shown in FIG. 1, reference numeral 1 denotes a load cell, and the load cell 1 includes a strain generating section 2, a strain gauge 3, and a temperature compensation resistor 4 connected to the strain gauge 3.
そして、ストレンゲージ３に、このストレンゲージ３の
電圧を検出する電圧検出手段５が接続され、この電圧検
出手段５には、この電圧検出手段で測定された電圧から
前記起歪部２の温度を算出する温度検出手段６が接続さ
れている。A voltage detection means 5 for detecting the voltage of the strain gauge 3 is connected to the strain gauge 3, and the voltage detection means 5 calculates the temperature of the strain generating section 2 from the voltage measured by the voltage detection means. A temperature detecting means 6 for calculating the temperature is connected.
また、７は記憶手段で、この記憶手段７は温度補正値を
記憶し、この記憶手段７は、ストレンゲージ３および温
度検出手段６とともに補正手段８に接続され、この補正
手段８は、温度検出手段６で検出された温度に従って、
ストレンゲージの出力を記憶手段７の温度補正値により
補正し出力する。Further, 7 is a storage means, this storage means 7 stores a temperature correction value, this storage means 7 is connected to the correction means 8 together with the strain gauge 3 and the temperature detection means 6, and this correction means 8 is connected to the temperature correction value. According to the temperature detected by means 6,
The output of the strain gauge is corrected by the temperature correction value in the storage means 7 and output.
次に、ロードセル１の具体的な構成について、第２図を
参照して説明する。Next, a specific configuration of the load cell 1 will be explained with reference to FIG. 2.
このロードセル１は、側面間を連通した略８字状の連通
孔１１が設けられた長方体状のロバ−パル機構の起歪部
２の上側は薄肉部の上面に、下側は薄肉部の下面に、そ
れぞれ２枚ずつストレンゲージ３が計４枚装着されてい
る。また、上面のストレンゲ−９３間には温度係数が約
３５００ ＰＰＭ／℃の温度補償用抵抗４が装着されて
いる。そして、このロードセル１は、たとえば第３図に
示すように、アルミニウム材などにて形成される四角形
状の基体１２の上面四隅に、一端が取付台１３にて固定
して取付けられ、他端は基体１２に設けられた過荷重ス
トッパー４に対向するように自由端になっている。This load cell 1 has a rectangular donkey pal mechanism with a substantially figure-eight-shaped communication hole 11 that communicates between its sides. A total of four strain gauges 3, two on each side, are attached to the bottom surface of the strain gauge. Further, a temperature compensation resistor 4 having a temperature coefficient of about 3500 PPM/° C. is installed between the strain gauges 93 on the upper surface. As shown in FIG. 3, for example, this load cell 1 is attached to the four corners of the upper surface of a rectangular base 12 made of aluminum or the like, with one end fixed by a mounting base 13, and the other end The free end faces the overload stopper 4 provided on the base body 12.
また、上面には突体１５が設けられ、この突体１５の上
部には、下方が開口し、前記基体１２よりゃや大きい載
せ皿１６の内部が当接され、載せ皿１６を上下方向可動
に支持している。そして、基体１２の上面の、基体１２
と載せ皿１６の間には電子部品収納箱１７が載置されて
いる。Further, a protruding body 15 is provided on the upper surface, and the upper part of the protruding body 15 is open at the bottom, and the inside of a mounting plate 16, which is larger than the base body 12, is brought into contact with the upper part of the protruding body 15, so that the mounting plate 16 can be moved in the vertical direction. I support it. Then, the base 12 on the upper surface of the base 12
An electronic component storage box 17 is placed between the mounting plate 16 and the mounting plate 16.
さらに、基体１２の裏面には、高さが可変できる脚部１
８が設けられ、基体１２を水平に保持するようになって
いる。Further, on the back side of the base body 12, there are legs 1 whose height can be changed.
8 is provided to hold the base 12 horizontally.
そして、上記ロードセル１の１つに対応する回路は、第
４図に示すようになっている。A circuit corresponding to one of the load cells 1 is shown in FIG.
ホイートストンブリッジが構成されたストレンゲージ３
の、ホイートストンブリッジの一方の入力端は温度補償
用抵抗４を介して、直流電源２１の正極に、他方の入力
端は直流電源２Ｊの負極に接続されている。また、ホイ
ートストンブリッジの出力端は、重量検出用のアナログ
・デジタル変換器（Ａ／Ｄ変換器）２２が接続され、こ
のアナログ・デジタル変換器２２には、マイクロ・コン
ピュータ・システム２３が接続されている。さらに、ホ
イートストンブリッジの入力端間には、３つの抵抗２４
、２５．２６が直列に接続されており、抵抗２５の両端
には温度検出用のアナログ・デジタル変換器２７が接続
され、このアナログ・デジタル変換器２７も、マイクロ
・コンピュータ・システム２３に接続されている。そし
て、このマイクロ・コンピュータ・システム２３には、
たとえば重量、金額等を表示する表示器２８、および、
温度補正値、単価等を入力するキーボード２９が接続さ
れている。なお、アナログ・デジタル変換器２２．２？
およびマイクロ・コンピュータ・システム２３は、電子
部品収納箱１７に収納されている。さらに、マイクロ・
コンピュータ・システム２３は、電圧検出手段５、温度
検出手段６、記憶手段７および補正手段８の機能を有し
ている。Strain gauge 3 with Wheatstone bridge configured
One input end of the Wheatstone bridge is connected to the positive pole of the DC power supply 21 via the temperature compensation resistor 4, and the other input end is connected to the negative pole of the DC power supply 2J. Further, an analog/digital converter (A/D converter) 22 for weight detection is connected to the output end of the Wheatstone bridge, and a microcomputer system 23 is connected to this analog/digital converter 22. There is. Additionally, there are three resistors 24 between the input ends of the Wheatstone bridge.
, 25 and 26 are connected in series, and an analog-to-digital converter 27 for temperature detection is connected to both ends of the resistor 25, and this analog-to-digital converter 27 is also connected to the microcomputer system 23. ing. And this micro computer system 23 has
For example, a display 28 that displays weight, amount, etc., and
A keyboard 29 for inputting temperature correction values, unit prices, etc. is connected. In addition, analog-to-digital converter 22.2?
The microcomputer system 23 is housed in an electronic component storage box 17. In addition, micro
The computer system 23 has the functions of voltage detection means 5, temperature detection means 6, storage means 7, and correction means 8.
次に、上記実施例の動作について説明する。Next, the operation of the above embodiment will be explained.
温度補償用抵抗４の温度係数は約３５００ＰＰＭ／℃で
あるのに対して、ストレンゲージ３の温度係数は数ＰＰ
Ｍ／℃であるので、起歪部２の温度が変化すると、抵抗
２５に分圧される電圧値が変化する。この電圧値の温度
に対する変化を算出する。なお、直流電源２１の電圧を
Ｖｏ、ストレンゲージ３のホイートストンブリッジの入
力端間の抵抗値をＲＩ＋ 、温度補償用抵抗４のある温
度での抵抗値をＲ６、抵抗２４の抵抗値をＲ１、抵抗２
５の抵抗値をＲ２、抵抗２６の抵抗値をＲ３とする。The temperature coefficient of the temperature compensation resistor 4 is about 3500 PPM/℃, while the temperature coefficient of the strain gauge 3 is several ppm/℃.
Since it is M/° C., when the temperature of the strain generating section 2 changes, the voltage value divided across the resistor 25 changes. The change in this voltage value with respect to temperature is calculated. In addition, the voltage of the DC power supply 21 is Vo, the resistance value between the input terminals of the Wheatstone bridge of the strain gauge 3 is RI+, the resistance value at a certain temperature of the temperature compensation resistor 4 is R6, the resistance value of the resistor 24 is R1, and the resistance value is R1. 2
The resistance value of resistor 5 is R2, and the resistance value of resistor 26 is R3.
まず、ある温度Ｔにおける抵抗２５の分圧電圧■Ｔは、 このｖｌをＲｓで微分すると、 となる。First, the divided voltage ■T of the resistor 25 at a certain temperature T is Differentiating this vl with respect to Rs, we get becomes.
Ｒ，＋Ｒｓ
係数αであり単位温度変化した場合の△ｖ１の電圧の変
化△Ｖ、は、
となる。R, +Rs is the coefficient α, and the change in the voltage of Δv1 when the unit temperature changes, ΔV, is as follows.
この（３）式の値はすべて既知、であるので△Ｖ１を求
めたとえばキーボード２９にて入力し、たとえばＲＡＭ
などの記憶手段７に記憶する。Since the values of this equation (3) are all known, △V1 is determined and inputted using the keyboard 29, for example.
It is stored in the storage means 7 such as.
そして、マイクロコンピュータ・システム２３でアナロ
グ・デジタル変換し、△ＶＴをデジタル化した値を〔△
■１〕と、起歪部２の温度による変化のデジタル値を１
℃当り〔Ｓ〕とすると、単位温度〔△ｖ、）’ｃ変化し
たときの温度補償値は、〔△■□〕 〔Ｓ〕となる。Then, the microcomputer system 23 performs analog-to-digital conversion, and the digitized value of △VT is converted to [△
■1] and the digital value of the change due to temperature of the strain-generating part 2 is 1
Assuming [S] per °C, the temperature compensation value when the unit temperature changes [△v,)'c becomes [△■□] [S].
また、温度補正に際しては、ストレンゲージ３のホイー
トストンブリッジの入力端間の電圧の、抵抗２５の分圧
値をアナログ・デジタル変換器２７でデジタル化し、マ
イクロ・コンピュータ・システム２３の温度検出手段６
で電圧値に対する温度の変化を算出する。一方、ストレ
ンゲージ３のホイートストンブリッジの出力端間に出力
される重量に対する電圧■、を、アナログ・デジタル変
換器２２でデジタル化して（Ｖｔ）とし、マイクロ・コ
ンピュータ・システム２３の補正手段８で、記憶手段７
に記憶されている補正係数で補正して補正後の値を（Ｖ
Ｌ、）とすると、
（ｖＬ、） ＝ （ＶＬ ） ＋ （△ｖ１〕 〔Ｓ〕
にて、温度補正を行なった重量を算出できる。Further, for temperature correction, the partial voltage value of the resistor 25 of the voltage between the input terminals of the Wheatstone bridge of the strain gauge 3 is digitized by the analog-to-digital converter 27, and the voltage is digitized by the temperature detection means 6 of the microcomputer system 23.
Calculate the change in temperature with respect to the voltage value. On the other hand, the voltage (2) relative to the weight output between the output terminals of the Wheatstone bridge of the strain gauge 3 is digitized by the analog-to-digital converter 22 and set as (Vt), and the correction means 8 of the microcomputer system 23 converts it to Storage means 7
The corrected value is corrected using the correction coefficient stored in (V
L,), then (vL,) = (VL) + (△v1] [S]
The temperature-corrected weight can be calculated using .
上記実施例によれば、従来の規格品に設けられている温
度補償用抵抗４を用いて、新たに部品を追加することな
く、起歪部２の温度を正確に検出できる。According to the above embodiment, the temperature of the strain generating portion 2 can be accurately detected using the temperature compensating resistor 4 provided in a conventional standard product without adding any new parts.
本発明によれば、温度補償用抵抗を用いて、ストレンゲ
ージの電圧を温度により変化させ、この電圧を電圧測定
手段で検出し、温度検出手段でで起歪部の温度を算出し
て、補正手段で、記憶手段の温度補正値を入力して、温
度補償を行なうので、容易に温度補償を行なえる。According to the present invention, the voltage of the strain gauge is changed depending on the temperature using a temperature compensation resistor, this voltage is detected by the voltage measuring means, and the temperature of the strain generating part is calculated by the temperature detecting means, and the temperature is corrected. Since temperature compensation is performed by inputting the temperature correction value in the storage means, temperature compensation can be easily performed.
第１図は本発明のロードセル秤の一実施例を示すブロッ
ク図、第２図は同上ロードセルを示す斜視図、第３図は
同上斜視図、第４図は同上ブロック図である。
１・・ロードセル、２・・起歪部、３・・ストレンゲー
ジ、
温度補償用抵抗、
電
圧検出手段、
記憶手段、
補正手段。
平成元年３月２
日
発
明
者
西
山
義
久FIG. 1 is a block diagram showing one embodiment of the load cell scale of the present invention, FIG. 2 is a perspective view showing the same load cell, FIG. 3 is a perspective view same as the above, and FIG. 4 is a block diagram same as the above. 1...Load cell, 2...Strain generating unit, 3...Strain gauge, temperature compensation resistor, voltage detection means, storage means, correction means. March 2, 1989 Inventor Yoshihisa Nishiyama
Claims (1)
ジに接続された温度補償用抵抗を設けたロードセルを備
え、このロードセルの出力に基づいて重量を計測するロ
ードセル秤において、前記温度補償用抵抗の抵抗値の変
化により変化する電圧を検出する電圧検出手段と、 この電圧検出手段で検出された電圧から前記起歪部の温
度を算出する温度検出手段と、 温度補正値を記憶する記憶手段と、 前記温度検出手段で検出された温度に従って前記ストレ
ンゲージの出力を温度補正値により補正する補正手段と を具備したことを特徴とするロードセル秤。(1) In a load cell scale that includes a strain gauge in a strain generating part and a load cell provided with a temperature compensation resistor connected to the strain gauge, and measures weight based on the output of the load cell, the resistance of the temperature compensation resistor is Voltage detecting means for detecting a voltage that changes due to a change in value; Temperature detecting means for calculating the temperature of the strain generating section from the voltage detected by the voltage detecting means; Storage means for storing a temperature correction value; A load cell weigher comprising: correction means for correcting the output of the strain gauge using a temperature correction value in accordance with the temperature detected by the temperature detection means.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7545589A JPH02253130A (en) | 1989-03-28 | 1989-03-28 | Load cell weighing instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7545589A JPH02253130A (en) | 1989-03-28 | 1989-03-28 | Load cell weighing instrument |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02253130A true JPH02253130A (en) | 1990-10-11 |
Family
ID=13576778
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7545589A Pending JPH02253130A (en) | 1989-03-28 | 1989-03-28 | Load cell weighing instrument |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02253130A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0593742A (en) * | 1991-02-15 | 1993-04-16 | Crystal Semiconductor Corp | Method and device for reducing sensitivity to jamming signal and noise of proportional converter type circuit |
| WO2007108250A1 (en) | 2006-03-16 | 2007-09-27 | Omron Healthcare Co., Ltd. | Weighing machine |
| JP2008064497A (en) * | 2006-09-05 | 2008-03-21 | Ishida Co Ltd | Load cell unit, weight sorting machine, and electronic balance |
| JP2008116393A (en) * | 2006-11-07 | 2008-05-22 | Ishida Co Ltd | Load cell unit, weight checker, and balance |
| CN105222934A (en) * | 2015-11-18 | 2016-01-06 | 沈阳建筑大学 | A kind of external thermal insulation system temperature stress detection method and pick-up unit |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6039521A (en) * | 1983-08-12 | 1985-03-01 | Kawasaki Steel Corp | Force measuring device provided with temperature compensation |
| JPS63204103A (en) * | 1987-02-18 | 1988-08-23 | Ishida Scales Mfg Co Ltd | Method and apparatus for compensating temperature of load cell |
-
1989
- 1989-03-28 JP JP7545589A patent/JPH02253130A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6039521A (en) * | 1983-08-12 | 1985-03-01 | Kawasaki Steel Corp | Force measuring device provided with temperature compensation |
| JPS63204103A (en) * | 1987-02-18 | 1988-08-23 | Ishida Scales Mfg Co Ltd | Method and apparatus for compensating temperature of load cell |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0593742A (en) * | 1991-02-15 | 1993-04-16 | Crystal Semiconductor Corp | Method and device for reducing sensitivity to jamming signal and noise of proportional converter type circuit |
| US5579247A (en) * | 1991-02-15 | 1996-11-26 | Crystal Semiconductor Corporation | Method and apparatus for decreasing the interference and noise sensitivity of a ratiometric converter type of circuit |
| WO2007108250A1 (en) | 2006-03-16 | 2007-09-27 | Omron Healthcare Co., Ltd. | Weighing machine |
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