JPH02252071A - Image processor - Google Patents

Abstract

PURPOSE:To accurately measure a subject by converting the level of an inputted image signal by a formed signal and forming an electronic mask in the image. CONSTITUTION:When an image signal is received from an ITV 20 camera, the received signal is binarized by a binarizing circuit 2 and a subject 106 is displayed on a monitor 7. Images other than the subject are masked by electronic masks 100 to 103 in both the horizontal and vertical directions. Then, a measuring emission line 109 is displayed on the image of the monitor 7 and the emission line is moved to the size measuring position of the subject by operator's operation. Then, a measuring circuit 4 is driven and counts up the number of rasters based on the set position of the emission line 109 and the vertical and horizontal sizes of the subject 106 are respectively displayed on a counter display part 5. In such constitution, images to be design side causes such as a noise component other than the subject can be shielded and surely removed from the measuring object, so that the subject can be accurately measured.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to, for example, an image processing apparatus that applies an electronic mask to an image.

[Prior Art] Conventionally, this type of device has been used to inspect products for surface defects, measure the shape and length of objects, measure the number and distribution of granular objects, or 1.
It is used for image measurement such as object recognition of robot visual function.

For example, an optical mask (a mask treated with anti-reflection treatment such as flocking or a mask treated with optical anti-reflection treatment) may be used for the ITV lens, which is the image detection section, or the objective lens section of the microscope, to prevent noise. Image components are blocked. Also, Japanese Patent Application Laid-Open No. 62-23730 filed by Toshiba
According to the dimension measuring device disclosed in No. 7, image data is divided into a plurality of regions within the mesh, and weighting processing (for example, smoothing processing) is performed for each region. In this way, it is disclosed that highly accurate measurement with easy edge detection is performed. Also, the publication r Oplus
“Automation of visual inspection using Fuji video sensor” described in June 1988 (pH 6 to pi 33) of E, J.
According to the article, when measuring dimensions by receiving images of multiple objects on one screen, a maximum of 99 windows (divided inspection areas) are set up, and the dimensions of the object are measured for each window. A method is shown.

[Problems to be Solved by the Invention] However, according to the conventional example described above, when an optical mask is used, flare may occur from the mask surface, the mask may be changed to correspond to the area to be shielded, or subtle changes may occur. Since alignment and the like are required, there are disadvantages in that a lot of adjustment time is spent on the various image measurements mentioned above, and jigs and tools are required.

In addition, image measurement without optical masks has the disadvantage that images caused by ghosts, flares, dust, or dust may cause errors in measurement values or malfunctions during defect inspection. There is.

The present invention has been made in view of the above-mentioned drawbacks of the conventional example, and its purpose is to block dirt, dust, or extra images on the screen with a mask image to ensure that only the test image is exposed. The object of the present invention is to provide an image slice measuring device that eliminates measurement errors by performing measurements and can perform individual measurements by masking parallel images.

[Means for Solving the Problems] In order to solve the above-mentioned problems and achieve the object, an image slice measuring device according to the present invention is an image processing device that applies an electronic mask to an arbitrary region in an image. an input means for inputting information for converting the level of an image signal forming an image; a generating means for generating a signal for converting the level of the image signal based on the input information; and a generating means for generating a signal for converting the level of the image signal based on the input information; The electronic mask is characterized in that it has a conversion means for converting the level of the signal, and thus forms an electronic mask in the image.

[Operation] According to this configuration, the input means inputs information for converting the level of an image signal forming an image, and the generating means generates a signal for converting the level of the image signal based on the input information, and performs the conversion. The means converts the level of the input image signal using the signal generated by the generating means, and forms an electronic mask in the image.

[Embodiments] Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

<First Embodiment> FIG. 1 is a block diagram showing the configuration of an image slice measuring device according to a first embodiment. In the figure, 1 indicates an image slice measuring device, and this image slice measuring device 1 is connected to an ITV camera 20 by a cable 30, and inputs an image signal.

2 indicates a binarization circuit that binarizes the image signal received from the TTV camera 2o, and 3 indicates an electronic mask generation circuit that blocks images other than the subject in the video from the ITV camera 2o with an electronic mask, which will be described later. It shows. Reference numeral 4 indicates a measurement circuit that counts the width of the measurement portion of the subject in Lascou lines (or pulses), and 5 indicates a counter display section that displays the count value measured by the measurement circuit 4. Reference numeral 6 indicates a demodulation circuit that demodulates the signal of the image masked by the electronic mask generation circuit 3, and reference numeral 7 indicates a monitor that displays the image based on the image signal demodulated by the demodulation circuit 6.

Further, 8 indicates a CPU that controls the operation of the entire apparatus based on various programs in ROMe. A ROM 9 stores a control program, an error processing program, a program for operating the CPU 8 according to the program shown in FIG. 3, and the like. Reference numeral 10 indicates a RAM used as a work area for various programs and a temporary save area during error processing.

Next, the configuration of the above-mentioned image slice measuring device will be explained in more detail.

FIG. 2 is a circuit diagram of the device shown in FIG. According to FIG. 2, the binarization circuit 2 includes a comparator 201 that compares the image signal received from the ITV camera 20 with a predetermined threshold value and converts it into binary data. The electronic mask generation circuit 3 uses a one-shot IC (hereinafter referred to as rIC) that can freely change the one-shot trimmer resistance using a dial.
J) 401 to 44 and an AN for masking the image signal binarized by the binarization circuit 2 by the ICs 401 to 44
It has D gates 405 and 406.

Moreover, the demodulation circuit 6 is configured by a diode.

Here, the above masking method will be explained.

5A (a), (b), (c), (d) and 5B (a), (b), (c), (d) are generation of masked image signals of the first embodiment. It is a figure explaining a procedure. FIG. 6 is a diagram showing an example of an image in which parts other than the subject are masked according to the first embodiment. In FIG. 6, numerals 100 to 103 each indicate electronic masks set with a free width from the periphery of the screen of the monitor 7. The electronic masks 100 and 101 are electronically masked in the vertical direction, and the electronic masks 102 and 103 are electronically masked in the horizontal direction. Further, the IC 401 is an electronic mask 100. IC
402 is the electronic mask 101, and C403 is the electronic mask 1.
03, the IC 404 corresponds to the electronic mask 104.

1o6 indicates the subject of the image, 100 indicates the ITV camera 2
It shows the entire image sent from o. Reference numeral 109 indicates a bright line when using the image sectioning method for measurement, 107 indicates an image other than the subject shielded by the electronic mask 103, and 1
08 indicates image noise components such as ghosts and dust.

First, a method of generating an electronic mask based on a vertical synchronization signal will be explained with reference to FIGS. 5A, (a), (b), (c) and (d).

In FIG. 6, the vertical mask width of the electronic mask 100 is
It can be changed using the time constant and volume (variable resistance) of the one-shot timer of IC401. By the start pulse of the vertical synchronizing signal (15 ms ec) shown in FIG. 5A (a), a gate signal for a constant time tl corresponding to the mask width is generated as shown in FIG. 5A (b). This gate signal is logically summed with the image signal (original signal) binarized by the binarization circuit 2 shown in FIG. 5A (C) and the AND gate 4o5, and as shown in FIG. 5A (d). , a masked image signal with dust removed is obtained. In this way, the white dust on the screen changes to a black screen by applying the electronic mask, and is therefore erased from the screen. In addition, in this electronic mask, the monitor 7
The mask width is formed from the periphery to the center of the screen, and the mask width can be varied in various ways by adjusting the generation time of the gate signal.

Similarly, a method of generating an electronic mask based on a horizontal synchronization signal will be explained with reference to FIGS. 5B (a), (b), (c) and (d). The horizontal mask width of the electronic mask 102 can be changed by the time constant and volume (variable resistance) of the one-shot timer of the IC 404. When the start pulse of the horizontal synchronizing signal (64μ5ec) shown in FIG. 5B (a) enters the start shot (2) of the IC 404, the gate signal for a certain period of time t2 corresponding to the mask width is activated as shown in FIG. 5B (
It is generated as shown in b). This gate signal is shown in FIG. 5B (
The image signal binarized by the binarization circuit 2 shown in c) (
original signal) and the AND gate 405, and the fifth
As shown in Fig. B (d), an image signal covered with an electronic mask from which dust has been removed is obtained.

The electronic masks 100 to 103 in the horizontal and vertical directions are generated by the method described above, and the noise component 108 is removed from the screen.

Furthermore, the measurement procedures in the vertical and horizontal directions will be briefly described.

Figure 7A (a), (b), (c) and Figure 7B (a),
(b), (C), and (d) are diagrams illustrating a procedure for counting measured values in the first embodiment.

First, the procedure for counting the measured values in the vertical direction will be described with reference to FIGS. 7A, (a), (b), and (c).

First, when the monitor 7 forms one screen with 256 raster lines (the number of Rascoux lines is reduced in the figure), the image signal of the subject 106 is as shown in FIG. 7A (a
) is generated. Also, the bright line 1 in the vertical direction
The bright line signal of bright line 109 is generated as shown in FIG. , the vertical length of the subject 106 is one field represented by the number of pulses shown in FIG. 7A (C). This number of pulses is counted by the measuring circuit 4, and the count value is displayed on the count display section 5 in units of vertical length.

Further, the procedure for counting the measured values in the horizontal direction will be explained with reference to FIGS. 7B (a), (b), (C) and (d).

Here, the field of the subject 106 shown in FIG. 7A(a) and the horizontal bright line signal 10 shown in FIG. 7B(a) are shown.
is ANDed with the field formed by 9. In the horizontal direction, as shown in Fig. 7B (a), the emission line 1
The bright line signal 9 of 09 is only one raster line. In this way, the signal representing the width of the subject 106 is
It is generated as shown in Figure (b). The field shown in FIG. 7B(b) is ANDed with the pulse shown in FIG. 7B(C) to obtain the pulse shown in FIG. 7B(d). This number of pulses is counted by the measuring circuit 4, and the count value is displayed on the count display section 5 in units of horizontal length.

Next, the image slice measuring method of the first embodiment will be explained.

FIG. 3 is a flowchart explaining the operation of image section measurement in the first embodiment, and FIG. 4 (a), (b), (c), (
d) is a diagram illustrating the flow of operations related to image slice measurement in the first embodiment.

First, when an image signal is received from the ITV camera 20,
The image signal is binarized by the binarization circuit 2 and displayed on the monitor 7.
At the top, the subject 106 is imaged as shown in FIG. 4(a) (step S1). And IC401~
trimmer resistance of 404 is adjusted by the operator;
As shown in FIG. 4(b), in both the horizontal and vertical directions, images other than the subject (noise components) are
3 (step S3).

Next, a measurement bright line 109 is displayed on the image on the monitor 7, and this measurement bright line 109 is changed to the fourth
As shown in Figure (C), the subject is moved to a measurement location for size (step S4). Then, the measurement circuit 4 is operated in response to an instruction from the operator to start measurement, and the measurement circuit 4 counts Lascou lines (or pulses) based on the set position of the measurement bright line 109 (step S6). As shown in d), the vertical and horizontal sizes of the subject 106 are each displayed on the count display section 5 (step S7);
To start the measurement, press the switch (not shown).
This is carried out when the PU8 detects it.

As explained above, according to the first embodiment, in image measurement such as the image sectioning method, noise components other than the subject image, that is, images that cause erroneous measurements such as dirt and dust, are blocked and the measurement target is Since the sample can be reliably removed from the sample, accurate measurement of the subject becomes possible.

Furthermore, by using an electronic circuit, costs are reduced and the effort of adjustments such as alignment can be saved. In addition, flare caused by disturbance light or reflected light entering the TV lens can be removed by using an electronic circuit during post-processing of the image pickup tube.

Here, an explanation is added when measuring multiple subjects.

FIGS. 8 and 9 are diagrams for explaining the measurement procedure for a plurality of subjects. In FIGS. 8 and 9, the image 107 is the subject 106.
The subject to be measured is the same as that of . When the images of subjects 106 and 107 are displayed on the monitor 7, as shown in FIG. 8 or 9, the subject to be measured is shielded with an electronic mask, and the bright line 109 is All you have to do is align and measure. By performing the measurement on the next subject in the same manner, reliable measurement on a plurality of subjects becomes possible. Note that a plurality of electronic masks can be generated. In this case, it is effective when the bright line is applied to a plurality of subjects, and subjects who are not currently involved in the measurement may be shielded with an electronic mask.

In this way, when measuring a large number of subjects, it becomes possible to measure a large number of subjects by generating electronic masks one after another by shielding images other than the subject image.

Second Embodiment Next, a second embodiment in which an electronic mask can be generated at any position on the monitor 7 will be described.

FIG. 10 is a diagram showing an example of changing the size of the electronic mask. In this example, a noise component 108 exists at the lower right position of the subject 112, and this noise component 1
Generate a spot mask of the electronic mask at position 08,
By adjusting the size, a rectangular electronic mask 113
can be formed.

In this way, according to the second embodiment, since the amount of the electronic mask is variable, any part can be freely shielded regardless of the position and size of the noise component.

Third Example> Next, a third example will be described in which one object is measured as a subject among objects displayed at random positions.

FIGS. 11 to 15 are diagrams illustrating a method for measuring a subject according to the third embodiment. In Figure 11, 120-1
Reference numeral 23 indicates images of objects not to be measured that are arranged randomly on the screen of the monitor 7, and reference numeral 118 indicates a subject displayed surrounded by images 120 to 123. This subject 118
When measuring the vertical and horizontal sizes of the object, a local electronic mask 114 is first applied to the subject 118 as shown in FIG. 12, and then the entire image is measured as shown in FIG. Then, the image is inverted to white level by an inverter (not shown) and displayed. Then, the image shown in FIG. 13 and the image shown in FIG. 11 are ANDed, and only the subject 118 is extracted as a white level image as shown in FIG. 14. Thereafter, similarly to each of the above embodiments, the bright line 109 is moved to the measurement position of the subject 118 determined to be at the white level,
The vertical and horizontal diameters are each measured.

As explained above, according to the third embodiment, even if objects other than the subject cannot be shielded by one electronic mask among randomly arranged objects, the object corresponding to the subject is extracted using a local electronic mask. By removing noise components (objects other than the subject) in this manner, the subject can be reliably measured. Of course, when measuring a plurality of randomly arranged objects, it is sufficient to measure the objects while sequentially moving the local electronic mask.

[Effects of the Invention] As explained above, according to the present invention, in image measurement such as the image section method, noise components other than the subject image, that is,
It is possible to block images of dirt and dust that may cause measurement errors and reliably remove them from the measurement target, making it possible to accurately measure the target.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing the configuration of the image slice measuring device of the first embodiment, FIG. 2 is a circuit diagram of the device shown in FIG. 1, and FIG.
Flowchart explaining the operation of image section measurement in the embodiment; FIGS. Figure 5A (a), (b), (c), (d) and Figure 5B (a), (b), (C), (d) are images with the electronic mask of the first embodiment applied. A diagram explaining the signal generation procedure, FIG. 6 is a diagram showing an example of an image of an object other than the subject covered with an electronic mask according to the first embodiment, and FIG. 7A (a), (b), (c) and Figure 7B(a),
(b), (C), -(d) are diagrams explaining the procedure for counting measured values in the first embodiment; Figures 8 and 9 are diagrams explaining the procedure for measuring multiple subjects; FIG. 10 is a diagram showing an example of changing the size of the electronic mask, and FIGS. 11 to 15 are diagrams illustrating a method for measuring a subject according to the third embodiment. In the figure, 1... Image section measuring device, 2... Binarization circuit, 3... Electronic mask circuit, 4... Measurement circuit, 5...
・Counter circuit, 6... demodulation circuit, 7... monitor,
8...CPU, 9-ROM, 10-RAM120・
ITV camera, 30...cable, 100-103,
113.114...electronic mask, 106,112,1
18...Subject, 107,120-123...Image,
108... Noise component, 109... Bright line, 201...
... Comparator, 401-404-IC, 405, 4
06...AND circuit.

Claims (1)

[Scope of Claims] An image processing device that applies an electronic mask to an arbitrary region in an image, comprising: input means for inputting information for converting the level of an image signal forming an image; The method includes a generating means for generating a signal for converting the level of a signal, and a converting means for converting the level of an input image signal using the generated signal, and thus forms an electronic mask in an image. Characteristic image processing device.