JPH0225042A - Removal of chip - Google Patents

Removal of chip

Info

Publication number
JPH0225042A
JPH0225042A JP63174575A JP17457588A JPH0225042A JP H0225042 A JPH0225042 A JP H0225042A JP 63174575 A JP63174575 A JP 63174575A JP 17457588 A JP17457588 A JP 17457588A JP H0225042 A JPH0225042 A JP H0225042A
Authority
JP
Japan
Prior art keywords
chip
substrate
resin
heat
weaken
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63174575A
Other languages
Japanese (ja)
Inventor
Toshio Tatemichi
立道 敏夫
Toshio Tsuda
俊雄 津田
Hiroshi Yamazoe
山添 博司
Isao Ota
勲夫 太田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP63174575A priority Critical patent/JPH0225042A/en
Publication of JPH0225042A publication Critical patent/JPH0225042A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/98Methods for disconnecting semiconductor or solid-state bodies
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/799Apparatus for disconnecting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Die Bonding (AREA)

Abstract

PURPOSE:To make it possible to remove easily an IC chip from a substrate by a method wherein heat and ultrasonic vibrations are applied to the IC chip to weaken the adhesive force of a resin for solidifying the IC chip to the substrate and the residual part of the IC chip and the resin are removed from the substrate. CONSTITUTION:The point of a trowel 4 is brought into contact to an IC chip 1 fixed on a substrate 2 with a fixing resin 3 and heat and ultrasonic vibrations, desirably both are applied simultaneously to the chip to weaken the adhesive force of the resin 3. Thereby, the chip 1 and the resin 3 are easily removed from the substrate 2 by tweezers or the like.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、混成集積回路や表示装置の基板上のICチッ
プ除去の方法を提供するものである。これは、故障した
ICチップの交換等に是非、必要な手段である。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention provides a method for removing IC chips from a substrate of a hybrid integrated circuit or display device. This is a necessary means for replacing a failed IC chip.

従来の技術 混成集積回路や表示装置の基板上のICチップの故障に
対する修正法に関して、より具体的には故障したICチ
ップの除去法に関しては、現実的な方法は現在の所、無
い。
There is currently no practical method for correcting failures in IC chips on substrates of conventional technology hybrid integrated circuits and display devices, and more specifically for removing failed IC chips.

発明が解決しようとする課題 表示装置において、表示容量が大きくなり、高精細度化
してきつつあり、この場合、駆動回路との接続は従来の
異方導電性フィルムや銅箔を有する有機フィルムを用い
ての接続では限界がある。
Problems to be Solved by the Invention In display devices, the display capacity is increasing and the definition is becoming higher. There are limits to how many connections there are.

このときは、表示装置の基板上に、端部に駆動回路、あ
るいはその一部を設けて、前記基板からの配線を少なく
する必要がある。この場合、検査により、正常なICチ
ップを前記基板上に電気的に接続がとれるように積載し
、信転性を高めるために樹脂等で固化した場合、この過
程でICチップが破壊される確率は有限である。このと
き、ICチップの交換、すなはちICチップの基板から
の除去が歩留りを向上させるために必要となる。
In this case, it is necessary to provide the drive circuit or a part thereof at the end of the substrate of the display device to reduce the number of wiring lines from the substrate. In this case, if a normal IC chip is mounted on the board so that it can be electrically connected through inspection, and it is solidified with resin etc. to improve reliability, there is a probability that the IC chip will be destroyed in this process. is finite. At this time, it is necessary to replace the IC chip, that is, to remove the IC chip from the substrate in order to improve the yield.

この場合において、従来、信鯨し得るICチップの除去
法が無かったのは問題である。
In this case, the problem is that there has been no method to remove the IC chip that can be used in the past.

課題を解決するための手段 本発明は前述のような課題を解決するために、基板上に
樹脂等で固定されたICチップを基板上から除去するに
おいて、Icチップのみに熱または超音波振動、または
それらを共に加え、ICチップの基板への固化用樹脂の
接着力を弱め、ICチップの残部及び樹脂を基板から剥
離、除去するようなチップ除去法を提供するものである
Means for Solving the Problems In order to solve the above-mentioned problems, the present invention aims to remove an IC chip fixed on a substrate with a resin or the like from a substrate by applying heat or ultrasonic vibration to only the IC chip. Alternatively, the present invention provides a chip removal method in which the adhesion of the solidifying resin to the substrate of the IC chip is weakened by adding them together, and the remaining portion of the IC chip and the resin are peeled off and removed from the substrate.

作用 熱や超音波振動、あるいはこれらの相乗効果により、I
Cチップと基板との結合を弱め、その後適当な治具によ
り、チップにズリ応力を加え、チップを基板から外すわ
けである。
Due to action heat, ultrasonic vibration, or their synergistic effect, I
The bond between the C chip and the substrate is weakened, and then a suitable jig is used to apply shear stress to the chip and the chip is removed from the substrate.

実施例 以下、本発明の一実施例を説明する。Example An embodiment of the present invention will be described below.

本実施例では液晶表示用パネルの片側ガラス基板上に設
置されたICチップ(いわゆるC0G)の取り外しを行
った。なお、ICチップはガラス基板に強く固着されて
おり、ズリ応力を加えても、ガラス基板が破壊されるだ
けで、ICチップは基板から除去し得なかった。
In this example, an IC chip (so-called C0G) installed on one glass substrate of a liquid crystal display panel was removed. Note that the IC chip is strongly fixed to the glass substrate, and even if shear stress is applied, the glass substrate is only destroyed, and the IC chip cannot be removed from the substrate.

なお、ICチップは、信顛性を向上させるため、樹脂で
被覆される。従って、ICチップ周辺の基板表面は必然
的にこの樹脂で覆われる。このことは、COGにおいて
極く一般的である。
Note that the IC chip is coated with resin to improve reliability. Therefore, the substrate surface around the IC chip is inevitably covered with this resin. This is very common in COG.

ICチップに熱または超音波振動、またはそれらを共に
加えるための熱源や超音波振動源として、ガラスにイン
ジウム系合金を着けるための、いわゆるセラソルザー(
旭硝子製)のコテを使用した。
The so-called Cerasolzer (Cerasolzer) is used to apply indium-based alloy to glass as a heat source or ultrasonic vibration source for applying heat or ultrasonic vibration, or both of them, to IC chips.
A trowel manufactured by Asahi Glass was used.

コテの先端をICチップに着け、熱や超音波振動を加え
た。概略図に様子を示す0図において1はチップ、2は
基板、3は固着用樹脂、4はコテの先端である。
The tip of the iron was attached to the IC chip, and heat and ultrasonic vibrations were applied. In Figure 0, which shows the state in a schematic diagram, 1 is a chip, 2 is a substrate, 3 is a fixing resin, and 4 is the tip of a soldering iron.

熱と超音波振動の両方を加えた方が、チップを外すには
、より効果的であった。
Applying both heat and ultrasonic vibration was more effective at removing the chip.

次にシリコン片はピンセットや簡単な治具によリズリ応
力をかけると簡単に除去し得る。
The silicone pieces can then be easily removed by applying a gentle stress using tweezers or a simple jig.

かくて、容易にチップを外し得た。Thus, the chip could be easily removed.

発明の効果 以上本発明は基板上からICチップを容易に外し得る方
法を提供するものであり、産業上の価値は大なるものが
ある。
Effects of the Invention The present invention provides a method for easily removing an IC chip from a substrate, and has great industrial value.

【図面の簡単な説明】[Brief explanation of the drawing]

図はチップを剥す状況を示すための概略図である。 1・・・・・・チップ、2・・・・・・基板、3・・・
・・・固着用樹脂、4・・・・・・コテの先端。 代理人の氏名 弁理士 粟野重孝 はか1名1−−−チ
、ソフ 2−一一石1反 3−面着用尉朋 4−−−コy−−先を畠
The figure is a schematic diagram showing the situation in which the chip is peeled off. 1...chip, 2...substrate, 3...
...Fixing resin, 4...Tip of iron. Name of agent Patent attorney Shigetaka Awano Haka 1 person 1 --- Chi, Sofu 2 - Ichikoku 1 Antan 3 - Mengeki Naotomo 4 --- Coy --- Ahead of Hatake

Claims (1)

【特許請求の範囲】[Claims] 基板上に樹脂等で固持されたICチップを基板上から除
去するにおいて、ICチップのみに熱または超音波振動
、またはそれらを共に加え、ICチップの基板への固化
用樹脂の接着力を弱め、ICチップの残部及び樹脂を基
板から剥離、除去することを特徴するチップ除去法。
When removing an IC chip fixed on a substrate with a resin or the like from the substrate, heat or ultrasonic vibration, or both of them are applied only to the IC chip to weaken the adhesive force of the solidifying resin of the IC chip to the substrate. A chip removal method characterized by peeling off and removing the remaining part of an IC chip and resin from a substrate.
JP63174575A 1988-07-13 1988-07-13 Removal of chip Pending JPH0225042A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63174575A JPH0225042A (en) 1988-07-13 1988-07-13 Removal of chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63174575A JPH0225042A (en) 1988-07-13 1988-07-13 Removal of chip

Publications (1)

Publication Number Publication Date
JPH0225042A true JPH0225042A (en) 1990-01-26

Family

ID=15980955

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63174575A Pending JPH0225042A (en) 1988-07-13 1988-07-13 Removal of chip

Country Status (1)

Country Link
JP (1) JPH0225042A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0600289A3 (en) * 1992-11-27 1994-07-06 Matsushita Electric Ind Co Ltd Semiconductor chip removal process and apparatus.
JP2005105263A (en) * 2003-09-12 2005-04-21 Yazaki Corp Method for separating bonded body
JP2005281533A (en) * 2004-03-30 2005-10-13 Sekisui Chem Co Ltd Method for peeling member off
JP2006124564A (en) * 2004-10-29 2006-05-18 Yazaki Corp Method for separating bound body
WO2024046983A1 (en) * 2022-08-31 2024-03-07 Pac Tech - Packaging Technologies Gmbh Method and device for separating a semiconductor component from a carrier

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0600289A3 (en) * 1992-11-27 1994-07-06 Matsushita Electric Ind Co Ltd Semiconductor chip removal process and apparatus.
US5425833A (en) * 1992-11-27 1995-06-20 Matsushita Electric Industrial Co., Ltd. Semiconductor chip removal process and apparatus
JP2005105263A (en) * 2003-09-12 2005-04-21 Yazaki Corp Method for separating bonded body
JP4644455B2 (en) * 2003-09-12 2011-03-02 矢崎総業株式会社 Method for separating adhesive
JP2005281533A (en) * 2004-03-30 2005-10-13 Sekisui Chem Co Ltd Method for peeling member off
JP4660106B2 (en) * 2004-03-30 2011-03-30 積水化学工業株式会社 Part peeling method
JP2006124564A (en) * 2004-10-29 2006-05-18 Yazaki Corp Method for separating bound body
WO2024046983A1 (en) * 2022-08-31 2024-03-07 Pac Tech - Packaging Technologies Gmbh Method and device for separating a semiconductor component from a carrier

Similar Documents

Publication Publication Date Title
US6952250B2 (en) Pressure-welded structure of flexible circuit boards
JPH0582616A (en) Method and apparatus for connecting circuit chip and temporary carrier for burn-in test
JPH0225042A (en) Removal of chip
JPH0430542A (en) Electronic device
US11228124B1 (en) Connecting a component to a substrate by adhesion to an oxidized solder surface
JP2544523B2 (en) How to remove electronic components
JP3055193B2 (en) Circuit connection method and liquid crystal device manufacturing method
JP2001264794A (en) Method for manufacturing liquid crystal display device
JPH09329795A (en) Liquid crystal display panel and its manufacture
JP2011047919A (en) Contact probe unit for integrated circuit and method for manufacturing the same
JP2008091408A (en) Semiconductor device, and its manufacturing method
JPH10256458A (en) Semiconductor device
JP2002353274A (en) Method for repairing failure of semiconductor lsi chip
JPH08111360A (en) Semiconductor device
JP2004031757A (en) Mounting method of semiconductor element
KR20080018027A (en) Tab package and method of reworking tab package
JP2006269699A (en) Semiconductor device and manufacturing method thereof
JPH05259167A (en) Semiconductor device
JP3096192B2 (en) IC mounting structure and liquid crystal display driving IC mounting method
JP3142129B2 (en) Manufacturing method of liquid crystal display device
JPH07175077A (en) Structure of liquid crystal display element and its production
JPH09153523A (en) Method and structure for connecting single layer wiring lead frame
JPS6329546A (en) Electronic device mounted with integrated circuit device
JPS62280887A (en) Connection of lead block
JPH07114034A (en) Liquid crystal display device