JPH02230037A - Cold heat environment testing device - Google Patents

Abstract

PURPOSE:To shorten a defrosting time and to shorten a test time by a method wherein hot gas of a high temperature freezing cycle is caused to flow in, and during exposure to a normal temperature and to a high temperature, defrosting is effected and growth of frost is delayed without the stop of a temperature cycle. CONSTITUTION:A vaporizer 12 of a low temperature cycle B, formed with a compressor 29, a cascade heat exchanger 28, and an expansion valve 30, and a heat exchanger 14, in which hot gas of a high temperature cycle A formed with a compressor 25, a condenser 26, an expansion valve 27, and a cascade heat exchanger 28 flows, are integrally disposed in a low temperature chamber 2. Since frost is apt to adhere between the fins of the front of a heat exchanger with which cold air 32 is first collided, a heat exchanger 14 for defrosting is arranged on the windward side of the vaporizer 12, and the vaporizer 12 is arranged. Refrigerant gas having a high temperature (of 70-100 deg.C) flows in through a hot gas inlet 36 and flows out through a hot gas outlet 37 and back to the inlet of the condenser 26. A refrigerant having a low temperature (of approximate -75 deg.C) flows in through a refrigerant inlet 38 for a vaporizer and flows out through a refrigerant outlet 39 for a vaporizer, and back to the compressor 29.

Description

[Detailed Description of the Invention] [Industrial Applicability] The present invention relates to a cold environment test device for performing a cooling, heating, and cycling test on a cooled object, and in particular, it relates to a cold environment test device that performs a cooling, heating, and curling test on a cooled object. The present invention relates to a structure characterized in that the time interval between aging and wealth reduction is reduced and the time interval until aging is reduced.

[Conventional technology]

In conventional thermal environment test equipment, the method of defrosting the evaporator in the cold room is to raise the temperature inside the cold room to about 40°C using an electric heater after a temperature cycle test for 80 to 40 hours, and then defrost the evaporator. This was carried out for about 80 minutes, and then the temperature in the low-temperature chamber was allowed to drop. Meanwhile, the temperature cycle is
It's stopped. For information on these matters, please refer to JP-A-Sho. lj
Examples include No. 1-173084 and JP-A-62-125230. Freezing 4 [Number #≠ to be solved by the invention] In the above conventional technology, since the time interval until removal J is short, removal must be performed during the temperature cycle test, and it is wasteful for the temperature cycle test. There was a lot of time. The purpose of the present invention is to extend the time interval until defrosting during the temperature cycle test as much as possible, and the frost grows and becomes difficult to melt with short defrosting. Furthermore, it is an object of the present invention to provide a thermal environment testing device that can shorten the defrosting time.

[Means to solve the problem]

The above purpose is to install a heat exchanger integrated with the evaporator on the upper side of the evaporator in the low-temperature room, allow hot gas from the high-temperature refrigeration cycle to flow in, expose it to room temperature, and remove it during the high-temperature period. This is achieved by slowing the growth of frost without stopping the temperature cycle.

[Effect]

Hot gas in a high temperature refrigeration cycle is around 70 to 100 degrees Celsius, so even in a low-temperature room temperature of -70 degrees C, the X' cucumbers between the heat exchange fins and the heat exchange pipes will grow and clog. You can prevent this from happening. This is because the heat exchange fins are integrated with the evaporator and the defrosting heat exchanger, so the heat from the defrosting heat exchange pipe is conducted to the 7-in, melting the frost between the fins.

〔Example〕

An embodiment of the present invention will be described below with reference to FIGS. 18 to 4. Fig. 1 is a longitudinal VFR view of the thermal environment test device of the present invention, Fig. 2 is a diagram of the cold room and refrigeration cycle shown in Fig. 1, and Fig. 8 shows the refrigerant passages of the evaporator and defrosting heat exchanger. The figure shown in FIG. 4 shows a temperature cycle pattern diagram of the test chamber.

In FIG. 1, this thermal tomb test chamber 50 stores a sample in the test chamber, and conducts a heat shock test on the sample by alternating the inside of the test chamber between a low temperature environment and a high temperature environment. It is equipped with a test chamber 1 and a cold air generation cold room 2 and a hot air generation high temperature room 8 which are independent from the test room 1, respectively. A partition wall 2a between the test chamber 1 and the low temperature chamber 2 includes a cold air supply port 4 that allows cold air to flow into the test chamber 1, and a cold air supply port 4 that allows cold air to flow into the test chamber 1.
A cold air outlet 5 is provided to discharge the cold air inside.

The cold air supply opening and outlet 5 are provided with cold air switching dampers 6 and 7 that open and close them. In addition, a partition wall 8a between the test room 1 and the high temperature room 3 is provided with hot air to the test room 1.
A hot melon air inlet 8 and a hot air outlet 9 are provided to allow hot air to flow into the air. The hot air supply port 8 and the hot air discharge port 9 are provided with hot air switching dampers 10 and 11 that open and close them. The cold room 2P3 is provided with an evaporator 12 that cools the air in the room, a heater 18 that adjusts and holds the cooled air at a predetermined temperature, and also provides temperature-controlled cooling air (hereinafter referred to as A blower 15 is installed to send cold air to the viewing room l, and a cold air bypass passage l6 is provided to circulate the cold air during the preparation stage.On the windward side of the evaporator l2, a heat exchanger A heat exchanger 14 is provided to melt the frost formed between the fins 85.The electric motor 17 is used to drive the blower 15.When the cold air passes through the cold air bypass passage 16, the cold air switching is performed. Damper 6.
7 is closed as shown by the solid line, and the length damper 28 is also closed as shown by the solid line. Inside the high temperature room 3, there is a heater 18 that heats the air in the room, and a heater 18 that can store the heat amount of the heater 18.
A heat storage device 19 that maintains heated air at a predetermined temperature and a blower 20 that sends temperature-controlled heated air (hereinafter referred to as hot air) to the test chamber 1 are installed. A hot air bypass passage 21 is provided for discharging hot air. Electricity. 417 machine z2 is for driving the blower 20. Further, in the preparation stage, when the hot air passes through the hot air bypass passage 21, the hot air dampers 10 and 11 are closed, and the subdin bar 24 is also closed. Next, cold room 2
The refrigeration cycle system will be explained with reference to FIG. Inside the cold room 2, there are a compressor 29, a cascade heat exchanger 28,
Evaporator 12 of low-temperature cycle B consisting of shadow valve 30
A heat exchanger 14 for repair into which hot gas from a high-temperature cycle flows, which is composed of a compressor 25, a condenser 26, an expansion valve 27, and the cascade heat exchanger 28, is integrally installed. The hobto gas outward path system is provided with an on-off valve 40 such as a solenoid valve 11, and the on-off valve 40 is used for the condensation,
Connected to the condenser 26, a check valve 81 for preventing backflow is also provided on the inlet side of the condenser 26. Next, evaporator 1
2 and the refrigerant passage of the defrosting heat exchanger i514 will be explained with reference to FIG. The defrosting heat exchanger 14 was placed on the upwind side of the evaporator 12, and the 1c evaporator 12 was placed next because the fins tend to adhere between the fins on the front of the heat exchanger, which is the first area that the cold air 82 hits. Further, the heat exchange fino 85 is continuous and shares the heat exchange heat exchange pipe 33 for shaft removal and the heat exchange pipe 84 for the evaporator. High temperature (70 to 100'o) refrigerant gas flows in from the hoft gas outlet 86, flows out from the hoft gas outlet 87, and returns to the condenser 26. Further, a refrigerant at a lower temperature (about -75° C.) than the evaporator refrigerant population 38 flows in, flows out from the evaporator refrigerant outlet 39, and returns to the compressor 29.

Next, the operation of this embodiment will be explained with reference to FIG. When performing a heat-on-look test on a sample, the low-temperature switching pumps 6 and 7 and the high-temperature switching pumps 10 and 11 are closed by means for driving the pump (not shown), and the cold room 2 is closed by a centrifuge installed in the low-temperature room. (not shown), and then the low-temperature length cycle B causes the cooling curve to become r.
vlJ l1I4lL, the cold air is circulated through the cold air bypass passage 16 and the temperature is -15'c lower than the test temperature curve "A".
Cooling operation is performed to about 70°C. (Pre-cooling operation started) On the other hand, the high temperature chamber 8 uses a senna installed in the high temperature chamber (not shown in the figure) to generate hot air as shown in the heating curve ``...'' by the high temperature cycle A, shielding the hot air bypass passage 21. A heating operation is performed at about +180'C, which is about +80°C higher than the test temperature curve A. (Preheating operation B) When performing a cooling operation in the low temperature 2, the refrigerant flow is similar to that of the younger brother 2.
As shown in the figure, refrigerant gas is discharged from the compressor 25 of the high temperature cycle A, and is condensed by radiating heat to the outside air or cooling water in the +a Md device 26. This condensate flows into the vacuum colander cascade heat exchanger 28 through the expansion valve 27, where it is evaporated by 48 exchange with the cryogenic vehicle B and returned to the compressed + AZIC. The refrigerant gas discharged from the compressor 29 of the low-temperature tickle B radiates heat to the above-mentioned high-temperature cycle A in the cascade heat exchanger 28, where it is cooled and condensed. After this condensate is depressurized by the expansion valve 30, it flows into the evaporator 1z, where it is connected to the blower 15.
The low-temperature circulation air is cooled, evaporated, and returned to the compressor 29.

Next, when the temperature inside the low temperature chamber reaches a predetermined temperature, the low temperature switching dampers 6 and 7 are opened by a signal indicating the temperature inside the low temperature chamber and low temperature exposure operation P is started. After the low temperature switching dampers 6 and 7 are opened, the sample in the test chamber 1 is cooled down by the temperature sensor 51 provided in the test chamber 1. When the test chamber 1 reaches a predetermined temperature, the heater 18 is driven by a signal from the temperature sensor f'51 to heat the air and control the temperature. Next, when a predetermined low temperature test time P is reached, the cold air switching damper 6.7 is closed and the hot air switching damper 10, 11 is opened to heat the sample in the test chamber 1. <Q) This is a case of 2 zones,
In the case of 3 zones, the room temperature damper (not shown) is opened and the high and low temperature dampers 6, 7, 10.11 are closed and exposed to room temperature air. (X) At this time, inside the cold room 2, the cold air switching da/ba 6, 7
At the same time as the temperature sensor closes, the temperature sensor is switched to the low temperature chamber 2, and the cooling operation R starts, which is lower than the low temperature test 4 temperature curve "A". At the same time, on-off valve 4 such as a solenoid valve for high temperature cycle A
0 opens, hot gas flows into the defrosting heat exchanger l4 and melts the frost. Hot gas flows only during R time, and after the low temperature exposure P of each temperature cycle is completed, high temperature Q or room temperature exposure Y
Rather than letting it flow repeatedly until the end.

According to this embodiment, frost formation on the evaporator in the low temperature chamber is minimized, and the time interval between raising the temperature in the low temperature chamber 2 to about 40° C. with the heater 13 and defrosting is You can make it longer. Furthermore, since the amount of frost formation is reduced, the defrosting time is shortened, the temperature cycle can be extended for a long time, and the test time can be shortened.

FIG. 5 shows a rod heater 60 embedded in the 7-in 85 of the evaporator 1z to serve as a heat source for defrosting. According to this, the overall size of the evaporator 12 can be reduced. . Figure O shows that the evaporator is divided into 12A to 12c, and
On-off valve 4 that switches hot gas and low-temperature refrigerant to each
1 to 46 are provided to improve the cleaning effect.

〔Effect of the invention〕

According to the present invention, since frost formation on the evaporator in the low-temperature room can be reduced, the number of times of defrosting within a predetermined period of time is reduced, the defrosting time is shortened, and the test time can be shortened.

[Brief explanation of the drawing]

FIG. 1 is a longitudinal cross-sectional view showing a cold-thermal collapse test device of the present invention;
Figure 2 is a diagram of the cold room and refrigeration cycle shown in Figure 1, Figures 8 (a) and (b) are diagrams showing the refrigerant passages of the evaporator and the heat exchanger for descaling, and Figure 4 is the temperature of the test chamber. Cycle pattern diagram, Figure 5 is a state diagram including the rod heater of another embodiment, Figure 6
The figure shows another example in which the evaporator is divided into eight parts. 1...Testing room 2...Cold room 3....High temperature room 4...Cold air common supply port 5...Cold air outlet 6.
7...Cold air switching damper 8...Hot air supply port 9
...Hot air outlet 10.11...Hot air switching damper 1z...Evaporator 13...7Ij heater 1
t...Heat exchanger for exhaustion l5...Blower elm l6
...Cold air bypass passage l7...Electric motor 18
...Heater 19...Regenerator 20...Blower z1...Hot air bypass passage 22...''ton @ machine 2.3, 24...Sub damper A...High temperature cycle B...・Low temperature cycle 25... Compressor 2t5... Condenser 27... Expansion valve 28...
・Cascade heat exchanger 29... Compressor 30...
Kohari valve 3l...Check valve 82...Cold air 38.
...Heat exchange pipe for defrosting 84...Heat exchange pipe for evaporator 35...Fin for heat exchange 86...Hot gas inlet 87...Hot gas outlet 88...
Evaporator refrigerant population 39... Evaporator refrigerant outlet
40...Solenoid valve. Liao 1 mouth I 恢き幇Inn i51F Ruru Yuya 4 冫-1 い Gorge tノ≧“Ro 13.18 60 Sakaki, port crossing stone I 11 砒 逅 benefit +ｑ % ya foreign agent patent attorney Masaru Ogawa Male 2nd mouth ↑ 14 hours■

Claims (1)

[Claims] 1. A cooling and thermal environment testing device in which a test chamber, a low temperature chamber, and a high temperature chamber are arranged independently, and cold air from the low temperature chamber or hot air from the high temperature chamber is circulated through the test chamber by switching dampers. A binary refrigeration system comprising a high-temperature refrigeration cycle composed of a compressor, a condenser, an expansion valve, and a cascade heat exchanger, and a low-temperature refrigeration cycle composed of a compressor, the cascade heat exchanger, an expansion valve, and an evaporator. A defrosting heat exchanger, which is equipped with a cycle and a heater and is integrated with the evaporator on the windward side of the evaporator of the low-temperature refrigeration cycle, is disposed in the low-temperature room, and the defrosting heat exchanger is equipped with the high-temperature refrigeration cycle. A thermal environment test device characterized in that it is configured to allow hot gas to flow in. 2. After the low-temperature exposure during the temperature cycle in the test chamber, open the on-off valve installed between the compressor and condenser of the high-temperature refrigeration cycle, and let hot gas flow during the room-temperature and high-temperature exposures. A thermal environment testing device according to claim 1, characterized in that it is configured as follows. 3. In a thermal environment test device, which is constructed by independently arranging a test chamber, a low temperature chamber, and a high temperature chamber, and circulating cold air from the low temperature chamber or hot air from the high temperature chamber into the test chamber by switching dampers, The high temperature chambers are precooled and preheated in parallel, and after reaching a predetermined temperature, the cold air in the low temperature chamber is introduced into the test chamber to perform a low temperature exposure operation (P) of the sample,
Furthermore, after a predetermined period of time has elapsed, a room temperature exposure operation (X) or a high temperature exposure operation (Q) is performed, and a cooling operation (R) is performed in the low temperature chamber, during which hot air is transferred to the defrosting heat exchanger in the low temperature chamber. A method of operating a thermal environment testing device characterized by performing defrosting operation by flowing gas.