JPH02204745A - Mask for exposing device - Google Patents

Mask for exposing device

Info

Publication number
JPH02204745A
JPH02204745A JP1025071A JP2507189A JPH02204745A JP H02204745 A JPH02204745 A JP H02204745A JP 1025071 A JP1025071 A JP 1025071A JP 2507189 A JP2507189 A JP 2507189A JP H02204745 A JPH02204745 A JP H02204745A
Authority
JP
Japan
Prior art keywords
mask
marks
well
exposing device
exposure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1025071A
Other languages
Japanese (ja)
Inventor
Kazuo Iwai
計夫 岩井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP1025071A priority Critical patent/JPH02204745A/en
Publication of JPH02204745A publication Critical patent/JPH02204745A/en
Pending legal-status Critical Current

Links

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  • Preparing Plates And Mask In Photomechanical Process (AREA)

Abstract

PURPOSE:To allow the easy automatic detection and visual discrimination of the front and rear surfaces as well as vertical and lateral directions of the mask by providing prescribed marks to the mask. CONSTITUTION:A mask substrate 11 for the exposing device is provided with the marks for identifying the front and rear surfaces as well as vertical and lateral directions of the mask 11, e.g.; notches 12, marks 22, etc. The marks 22 may be made into a rectangular shape or character. The automatic detection and visual discrimination of the mask are then facilitated.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、露光装置用マスクに関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a mask for exposure equipment.

マスクの表裏及び上下左右方向の判別をつけに(い為、
露光装置用マスクをセットした状態が正しいのかどうか
の判断が困醤であρた。誤ってセットさ、れた時は、そ
れが露光装置やマスクの搬送シスtムの場合はマスクの
アライメントエラーの原因となり、マスクを再度入れ直
さなければならなかった。またペリクル貼付機の場合は
ペリクルを再度貼り直さなければならないという問題点
を有していた。
In order to distinguish between the front and back of the mask, as well as the top, bottom, left and right directions.
It was difficult to judge whether the mask for the exposure device was set in the correct state or not. If the mask is set incorrectly, it may cause a mask alignment error in the case of an exposure device or a mask transport system, and the mask must be reinserted. Further, in the case of a pellicle pasting machine, there is a problem in that the pellicle must be pasted again.

そこで、本発明は従来のこのような問題点を解決するた
め、露光装置用マスクの表裏及び上下左右方向の判別が
容易に出来る露光装置用マスクを提供するところにある
SUMMARY OF THE INVENTION In order to solve these conventional problems, the present invention provides a mask for an exposure device that allows easy identification of the front and back sides of the mask, as well as the up, down, left and right directions.

[従来の技術] 従来の鱈光装置用マスクは、第4図に示す様に表裏、上
下、左右対象の形状を有していた。
[Prior Art] A conventional mask for a cod optical device has a shape that is symmetrical in front and back, top and bottom, and left and right sides, as shown in FIG.

[発明が解決しようとする課題] しかし、前述の従来の露光装置用マスクでは、[課題を
解決するための手段] 本発明の露光装置用マスクは、露光装置用マスクの表裏
及び上下左右方向の判別をつける為の目印を付けた事を
特徴とする特 [実施例コ 以下に本発明の実施例を図面にもとづいて説明する。第
1図において、露光装置用マスク基板11に切vJ欠き
12を設ける。この切り欠きは第1図に示す様に、底辺
1 cm +高さ2cmの直角主角形になっている。こ
の切シ欠きが第1図のごとくマスクの右下に来るのは一
種類のみであり、露光装置用マスクの表裏及び上下左右
は正確な状態に置かれる。
[Problem to be Solved by the Invention] However, in the conventional exposure equipment mask described above, [Means for Solving the Problem] The exposure equipment mask of the present invention provides Embodiments of the present invention will be described below with reference to the drawings. In FIG. 1, a notch VJ cutout 12 is provided in a mask substrate 11 for an exposure apparatus. As shown in FIG. 1, this notch is in the form of a right-angled main square with a base of 1 cm and a height of 2 cm. Only one type of mask has this notch in the lower right corner of the mask as shown in FIG. 1, so that the front and back, top, bottom, right and left sides of the mask for exposure equipment are placed in an accurate state.

なお、第2図は、露光装置用マスク基板21に方向判別
マーク22を設けたものである。この方向判別マークは
、露光装置用マスクに被露光パターンを設ける時に同時
に設ける事ができる。そしてこのマークは長方形など、
マスクな反転2回転させても同一位置に同一形状の図形
が来ない様なものを設定する。こうする事により、機械
での自動検出も可能となる。
In addition, FIG. 2 shows a mask substrate 21 for an exposure apparatus provided with a direction discrimination mark 22. In FIG. This direction discrimination mark can be provided at the same time as a pattern to be exposed is provided on a mask for an exposure apparatus. And this mark is a rectangle, etc.
Set the mask so that no figure with the same shape will come to the same position even if it is rotated twice. By doing this, automatic detection by a machine is also possible.

さらに、第5図に示すよ5に、露光装置用マスク基板3
1に位置判別マーク52を設け、マスクが正確な状態に
あるか文字で判断できるようにすることも可能である。
Furthermore, as shown in FIG.
It is also possible to provide a position determination mark 52 on the mask 1 so that it can be determined by text whether the mask is in an accurate state.

これによって、目視ですぐにマスクの状態を判別する事
ができる。
This allows the condition of the mask to be immediately determined visually.

また、第1図から第5図までの実施例を組み合わせる事
も可能であり、それによってマスクの正確な状態を、機
械による自動検出や目視判別が容易に出来る。
Furthermore, it is also possible to combine the embodiments shown in FIGS. 1 to 5, thereby making it easy to automatically detect the exact state of the mask by a machine or to visually determine it.

〔発明の効果コ 本発明の露光装置用マスクは、以上説明した様に、マス
クの表裏及び上下左右方向判別をつける為の目印を付け
た事により、マスクの正確な状態を機械によって自動的
に検出させたり、目視での確認を容易にする効果がある
[Effects of the Invention] As explained above, the mask for exposure equipment of the present invention has marks for distinguishing the front and back sides of the mask, as well as the top, bottom, left, and right directions, so that the exact state of the mask can be automatically determined by a machine. This has the effect of facilitating detection and visual confirmation.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図及び第5図は、本発明の露光装置用マス
クの平面図。 第4図は、従来の露光装置用マスクの平面図。 第11図 121品 篤31図 算+1辺
1, 2, and 5 are plan views of a mask for an exposure apparatus according to the present invention. FIG. 4 is a plan view of a conventional mask for exposure equipment. Figure 11 121 Shinaatsu 31 illustrations + 1 side

Claims (1)

【特許請求の範囲】[Claims] 露光装置用マスクにおいて、マスクの表裏及び上下左右
方向の判別をつける為の目印を付けた事を特徴とする露
光装置用マスク。
A mask for exposure equipment, characterized in that it has marks for distinguishing the front and back sides of the mask, as well as the top, bottom, left and right directions.
JP1025071A 1989-02-03 1989-02-03 Mask for exposing device Pending JPH02204745A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1025071A JPH02204745A (en) 1989-02-03 1989-02-03 Mask for exposing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1025071A JPH02204745A (en) 1989-02-03 1989-02-03 Mask for exposing device

Publications (1)

Publication Number Publication Date
JPH02204745A true JPH02204745A (en) 1990-08-14

Family

ID=12155695

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1025071A Pending JPH02204745A (en) 1989-02-03 1989-02-03 Mask for exposing device

Country Status (1)

Country Link
JP (1) JPH02204745A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010008738A (en) * 2008-06-27 2010-01-14 Hoya Corp Method for manufacturing photomask
JP2018017933A (en) * 2016-07-28 2018-02-01 京セラドキュメントソリューションズ株式会社 Manufacturing method of image reading device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010008738A (en) * 2008-06-27 2010-01-14 Hoya Corp Method for manufacturing photomask
JP4536804B2 (en) * 2008-06-27 2010-09-01 Hoya株式会社 Photomask manufacturing method
JP2018017933A (en) * 2016-07-28 2018-02-01 京セラドキュメントソリューションズ株式会社 Manufacturing method of image reading device

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