JPH02198103A - Trimming of film resistor - Google Patents

Trimming of film resistor

Info

Publication number
JPH02198103A
JPH02198103A JP1017969A JP1796989A JPH02198103A JP H02198103 A JPH02198103 A JP H02198103A JP 1017969 A JP1017969 A JP 1017969A JP 1796989 A JP1796989 A JP 1796989A JP H02198103 A JPH02198103 A JP H02198103A
Authority
JP
Japan
Prior art keywords
resistance value
trimming
film resistor
resistor
resistors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1017969A
Other languages
Japanese (ja)
Inventor
Takeshi Izeki
健 井関
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP1017969A priority Critical patent/JPH02198103A/en
Publication of JPH02198103A publication Critical patent/JPH02198103A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To trim a film resistor of a low resistance value, with high precision, by shorting an open place to determine a predetermined combined resistance value after a resistance circuit where an open place is disposed is formed and each of the film resistors is trimmed to a design resistance value. CONSTITUTION:On a board 11, a wiring conductor 12, a meter checking land 13a, a film resistor 14a, etc., are disposed. After each resistor is trimmed to a predetermined resistance value RX, if each trimming meter checking land is shorted by a solder bridge or a conductive paste 15a, a combined resistance value RX/5 is obtained. Therefore, in comparison with the resistance value RX/5 obtained by a conventional trimming method, the resistance value RX/5 can be obtained by enlarging a trimming resistance value to a five-fold RX. As a result, a resistance value trimming can be made with high precision.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、膜抵抗体のトリミング方法に関するものであ
る。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method for trimming a film resistor.

従来の技術 一般に、混成集積回路基板上の1つの抵抗値は、1つの
膜抵抗体の抵抗値トリミングによって得られている。1
つの抵抗値を2つ以上の膜抵抗体の抵抗値トリミングに
よって得る場合もあるが、この場合、2つ以上の膜抵抗
体は各々独立に抵抗値トリミングされるのではなく、こ
れらの膜抵抗体の合成抵抗値の抵抗値トリミングを行な
っている。
BACKGROUND OF THE INVENTION Generally, one resistance value on a hybrid integrated circuit board is obtained by trimming the resistance value of one film resistor. 1
In some cases, a single resistance value can be obtained by trimming the resistance value of two or more membrane resistors, but in this case, the two or more membrane resistors are not trimmed independently, but rather by trimming the resistance values of these membrane resistors. Resistance value trimming of the combined resistance value is performed.

発明が解決しようとする課題 この方法では、トリミング装置の電圧電流計の精度及び
、トリミング装置の検針の接触抵抗により、低い抵抗値
(数Ω以下)では抵抗値トリミング精度が極端に悪くな
ってしまう。
Problems to be Solved by the Invention In this method, the accuracy of trimming the resistance value becomes extremely poor at low resistance values (several Ω or less) due to the accuracy of the voltage-ammeter of the trimming device and the contact resistance of the meter reading of the trimming device. .

従って、本発明の目的は、低い抵抗値の膜抵抗体の抵抗
値トリミングを精度良く行い、高精度の低抵抗値膜抵抗
体を有する混成集積回路基板を提供することにある。
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to perform resistance value trimming of a low resistance film resistor with high accuracy and to provide a hybrid integrated circuit board having a highly accurate low resistance value film resistor.

課題を解決するだめの手段 上記目的を達成するだめの本発明の膜抵抗体のトリミン
グ方法は、回路上の1つの抵抗値を2つ以上の膜抵抗体
の並列の合成抵抗値により得られるように、かつ、この
2つ以上の膜抵抗体が各々独立に抵抗値が測定できるよ
うにオープン箇所を設けた抵抗回路を形成、前記膜抵抗
体の各々を設計抵抗値にトリミングした後に、オープン
箇所を短絡させ、所定の合成抵抗値を得るものである。
Means for Solving the Problem The method for trimming a membrane resistor of the present invention which achieves the above object is to trim one resistance value on a circuit so that it can be obtained by the combined resistance value of two or more membrane resistors in parallel. and form a resistance circuit with open points so that the resistance values of these two or more film resistors can be measured independently. After trimming each of the film resistors to the designed resistance value, open points are formed. is short-circuited to obtain a predetermined combined resistance value.

作用 本発明によれば、低い抵抗値を高い抵抗値に拡大して抵
抗値トリミングできるため、接触抵抗などの影響を小さ
くすることができ、低い抵抗値の膜抵抗体を精度良く抵
抗値トリミングすることが出来る。
According to the present invention, since a low resistance value can be expanded to a high resistance value for resistance value trimming, the influence of contact resistance etc. can be reduced, and the resistance value of a film resistor with a low resistance value can be precisely trimmed. I can do it.

実施例 次に、本発明の実施例について図面を用いて説明する。Example Next, embodiments of the present invention will be described using the drawings.

第1図は本発明の一実施例を示す平面図である。FIG. 1 is a plan view showing one embodiment of the present invention.

基板11には、配線導体12、検針ランド131L。On the board 11, a wiring conductor 12 and a meter-reading land 131L are provided.

13b、130,1311.13151膜抵抗体14a
 。
13b, 130, 1311.13151 film resistor 14a
.

14b、140,14d、14eが設けられている。各
抵抗体を所定の抵抗値Rxにトリミングした後、各トリ
ミング検針ランドをはんだブリッジまだは、導電ペース
ト151L、15b、150゜1sd 、 1seにて
短絡させれば、合成抵抗値Rx15が得られる。従来の
トリミング方法で抵抗値RX/6を得るのに比べ、トリ
ミング抵抗値を6倍のRxに拡大して、抵抗値R)C1
5を得ることが出来る。仮に、検針の接触抵抗が0.1
Ω、Rxが10Ωであるとすれば、RIC15に対する
接触抵抗の割合は6%に達するが、Rxに対する接触抵
抗の割合は1チに過ぎず、接触抵抗の影響を小さくし、
精度良く抵抗値トリミングをすることができる。
14b, 140, 14d, and 14e are provided. After each resistor is trimmed to a predetermined resistance value Rx, each trimming meter reading land is short-circuited using conductive pastes 151L, 15b, 150° 1sd, 1se to obtain a combined resistance value Rx15. Compared to obtaining a resistance value RX/6 using the conventional trimming method, the trimming resistance value is expanded to 6 times Rx, and the resistance value R)C1
You can get 5. Suppose that the contact resistance of the meter reading is 0.1.
If Ω and Rx are 10Ω, the ratio of contact resistance to RIC15 reaches 6%, but the ratio of contact resistance to Rx is only 1ch, which reduces the influence of contact resistance.
Resistance value trimming can be done with high precision.

なお、本発明は上記実施例のような各分割膜抵抗体の形
状およびトリミング抵抗値が同一の場合だけでなく、そ
れらの一部あるいは全てが異なる場合にも適用できる。
Note that the present invention can be applied not only to the case where the shape and trimming resistance value of each divided film resistor are the same as in the above embodiment, but also to the case where some or all of them are different.

発明の詳細 な説明したように、本発明によれば、低抵抗値のトリミ
ングを高抵抗値のトリミングに変換して所定の低抵抗値
を得ることが出来るため、接触抵抗などの影響を小さく
して低抵抗値の膜抵抗体の抵抗値トリミングを精度良く
行い、高精度の低抵抗値膜抵抗体を有する混成集積回路
基板を提供することが出来る。
As described in detail, according to the present invention, a predetermined low resistance value can be obtained by converting low resistance value trimming into high resistance value trimming, thereby reducing the influence of contact resistance etc. By using this method, it is possible to precisely trim the resistance value of a low resistance value film resistor, and to provide a hybrid integrated circuit board having a highly accurate low resistance value film resistor.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例による膜抵抗体のトリミング
方法を示す平面図である。 11・・・・・・基板、12・川・・配線導体、131
L。 13b 、 130 、13d 、 136・山、、検
針ラント、141L、14b、140,14d、146
.川、、膜抵抗体、152L、15b、150,16d
、16tlB・・・・・・はんだブリッジまたは導電ペ
ースト。 代理人の氏名 弁理士 粟 野 重 孝 ほか1多部 図 13a、r34.I3c、I3d、I3e −−−Δα
嵐を火、 14d、脚−−− 蟇   叛 Wj!W  鼻 停 情針うソ n低抗俸
FIG. 1 is a plan view showing a method for trimming a film resistor according to an embodiment of the present invention. 11... Board, 12... Wiring conductor, 131
L. 13b, 130, 13d, 136・mountain,, meter reading runt, 141L, 14b, 140, 14d, 146
.. Kawa,, membrane resistor, 152L, 15b, 150, 16d
, 16tlB...Solder bridge or conductive paste. Name of agent: Patent attorney Shigetaka Awano et al. Figure 13a, r34. I3c, I3d, I3e ---Δα
Fire the storm, 14d, legs --- Toad Rebellion Wj! W nose stationary needle lie n low resistance salary

Claims (1)

【特許請求の範囲】[Claims]  回路上の1つの抵抗値を2つ以上の膜抵抗体の並列の
合成抵抗値により得られかつ、この2つ以上の膜抵抗体
が各々独立に抵抗値が側定可能なようにオープン箇所を
設けた抵抗回路を形成し、前記膜抵抗体の各々を設計抵
抗値にトリミングした後に、オープン箇所を短絡させ、
所定の合成抵抗値を得ることを特徴とする膜抵抗体のト
リミング方法。
One resistance value on the circuit can be obtained by the combined resistance value of two or more membrane resistors in parallel, and open points are provided so that the resistance value of each of these two or more membrane resistors can be determined independently. After forming the provided resistance circuit and trimming each of the film resistors to the designed resistance value, short-circuiting the open points,
A method for trimming a membrane resistor, characterized by obtaining a predetermined combined resistance value.
JP1017969A 1989-01-27 1989-01-27 Trimming of film resistor Pending JPH02198103A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1017969A JPH02198103A (en) 1989-01-27 1989-01-27 Trimming of film resistor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1017969A JPH02198103A (en) 1989-01-27 1989-01-27 Trimming of film resistor

Publications (1)

Publication Number Publication Date
JPH02198103A true JPH02198103A (en) 1990-08-06

Family

ID=11958562

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1017969A Pending JPH02198103A (en) 1989-01-27 1989-01-27 Trimming of film resistor

Country Status (1)

Country Link
JP (1) JPH02198103A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014045104A (en) * 2012-08-28 2014-03-13 Panasonic Corp Manufacturing method of chip resistor
JP2017034289A (en) * 2016-11-15 2017-02-09 パナソニックIpマネジメント株式会社 Method of manufacturing chip resistor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014045104A (en) * 2012-08-28 2014-03-13 Panasonic Corp Manufacturing method of chip resistor
JP2017034289A (en) * 2016-11-15 2017-02-09 パナソニックIpマネジメント株式会社 Method of manufacturing chip resistor

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