JPH02197931A - Automatic diagnosing device - Google Patents

Abstract

PURPOSE:To automatically diagnose the area of a fault caused by the secular change of a logical element, etc., by accelerating or decelerating the applying cycle of the action timing signal to execute again a diagnosing program in the case the diagnosing program is over normally to a suspected device. CONSTITUTION:The action timing signal generating means 121-12n are prepared to the devices 111-11n respectively. A diagnosing control means 20 gives an instruction to a clock control means 40 to change the output cycle of the action timing signal within an allowable range when a diagnosing program is over normally to a suspected device. The means 40 controls selectively the means 121-12n for the suspected device based on the received instruction. Then the action timing signal generating means of the suspected device accelerates or decelerates the output cycle of the action timing signal under the control of the means 40. Thus it is possible to automatically diagnose the area of a fault which is accidentally caused by the secular change of a logical element, etc., in a normal operation state.

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention is applied to an automatic diagnostic device of a system composed of a plurality of devices. In particular, it relates to an automatic diagnosis method that is effective when intermittent failures occur.

〔overview〕

The present invention provides an automatic diagnostic device in which an operation timing signal generation means is provided in each of a plurality of devices constituting the system, and when a diagnostic program for a suspect device is successfully completed, the cycle of applying the operation timing signal is accelerated or delayed, and the diagnosis is performed again. By executing the program, it is possible to automatically diagnose failure points due to age-related changes in logic elements that occur during normal operation.

[Conventional technology]

Conventionally, system automatic diagnostic equipment detects when a fault occurs in one of the devices that make up the system, selects the faulty device based on the details of the fault, and then returns the suspect device to normal operation of the system. It had a diagnostic control means that executed a program for diagnosing a fault location after logically separating it from the state, and pointed out and displayed the fault location if there was an abnormality in the result.

[Problem that the invention seeks to solve]

However, with such conventional automatic diagnostic equipment, if a fault in the suspect device occurs accidentally due to a temporary failure in the operating characteristics due to aging of the logic element parts, the results cannot be determined even if the diagnostic program is executed. The problem was that it was often impossible to pinpoint the location of the failure because it ended normally.

The present invention solves the above-mentioned drawbacks, and aims to provide an automatic diagnostic device that can automatically diagnose failure points due to accidental aging of logic elements during normal operation. .

[Means for solving problems]

The present invention provides a system including a plurality of devices and an operation timing signal generating means for outputting an operation timing signal to each device, and a system that puts a suspect device into a normal operating state within the system based on fault information from a device that has detected a fault. and a diagnostic control means for notifying the relevant device of an instruction to logically disconnect it from the system and running a diagnostic program to identify the failure location of the disconnected suspect device, the operation timing signal generating means described above. is provided for each of the above-mentioned devices, and includes means for varying the period for outputting the operation timing signal, and the diagnostic control means outputs the operation timing signal when the diagnostic program for the suspect device is normally completed. The present invention is characterized by comprising means for outputting an instruction to change the output cycle of the output cycle and executing the diagnostic program again, and further comprising a clock control means for selectively controlling the variable means based on the instruction.

[Effect]

An operation timing signal generating means is provided for each device. The diagnostic control means instructs the clock control means to change the output cycle of the operation timing signal within a permissible range when the diagnostic program for the suspected device is successfully completed. The clock control means selectively controls the operation timing signal generation means of the suspect device based on this instruction. The operation timing signal generation means of the suspect device speeds up or slows down the output cycle of the operation timing signal based on the control of the clock control means. By the above-described operation, it is possible to automatically diagnose the failure location of a failure caused by aging of the logic element, etc., which occurred during normal operation.

〔Example〕

Embodiments of the present invention will be described with reference to the drawings. The figure is a block diagram of an automatic diagnostic device according to an embodiment of the present invention.

In the figure, the automatic diagnostic device includes a plurality of devices 111 to 11.
, and each of these devices 111-11. .

The system 10 includes an operation timing generating means 12 that outputs an operation timing signal to the system 10, and an instruction to logically disconnect the suspected device from the normal operating state in the system 10 based on fault information from the device that detected the fault. A diagnostic control means 20 that notifies the device and executes a diagnostic program to identify the failure location of the disconnected suspect device, a program storage means 30 that stores the diagnosis program, and a diagnosis control means 20 that identifies the failure location. and display means 50 for displaying the information.

Here, the feature of the present invention is that the operation timing generating means 12. ~12, each device 11. - 11, each including means for varying the cycle of outputting the operation timing signal, and the diagnostic control means 20 outputs the operation timing signal when the diagnostic program for the suspect device ends normally. including means for outputting an instruction to change the cycle and running the diagnostic program again;
The clock control means 40 is provided to selectively control the variable means based on this instruction.

The operation of the automatic diagnostic device having such a configuration will be explained. In the figure, when a fault occurs in the system 10, the device that detects the fault notifies the diagnostic control means 20 of the fault information. Upon receiving this, the diagnostic control means 20 executes a diagnostic program to identify the failure location of the suspected device that may have failed based on this fault information. Issue an instruction to the necessary equipment to logically disconnect it from its normal operating state.

The device that has received the logical disconnection instruction is logically disconnected from the normal operating state of the system 10 by logically cutting off connections with other devices to be disconnected while maintaining the normal operating state.

After disconnecting the suspect device, the diagnostic control means 20 then loads a diagnostic program for the suspect device from the program storage means 30, diagnoses the suspect device using this program, and if the result is abnormal, determines the failure location from the information. is displayed on the display means 50.

If the diagnosis result is normal, the diagnosis control means 2Q
clock control means 4 so as to advance or delay the operation timing signal of the suspect device within the allowable value range without stopping the diagnosis.
Instruct to 0. Upon receiving this instruction, the clock control means 40 issues an instruction to the operation timing generation means connected to the suspect device to change the time interval of the generated operation timing signals to the value instructed by the diagnostic control means 20.

The operation timing generating means connected to the suspect device supplies the suspect device with an operation timing signal that is different from the normal operating state at time intervals within a permissible range, and the suspect device operates based on this operation timing signal.

Next, the diagnostic control means 20 executes the diagnostic program for the suspected device again, and if there is an abnormality in the program execution result, displays the failure location on the display means 50 from this information.

If the execution result of this second diagnostic program is normal again, the diagnostic control means 20 further controls the clock control means 4.
0 to set the generation time interval of the operation timing signal of the suspect device to a value different from the first instruction value, run the diagnostic program for the suspect device again, and if there is an abnormality in the results, use this information. The location of the failure is displayed on the display means 50.

As described above, if the diagnosis result of the diagnostic program is normal, the diagnostic control means 20 of the present invention changes the operation timing signal of the suspect device within the allowable range of the device and re-executes the diagnostic program, thereby identifying the location of the failure. Run discovery automatically.

〔Effect of the invention〕

As described above, the present invention has the profound effect of automatically diagnosing the failure location of a failure caused by aging of a logic element that occurs during normal operation.

[Brief explanation of the drawing]

The figure is a block diagram of an automatic diagnostic device according to an embodiment of the present invention. 10... System, 111~11°... Apparatus, 12,~1
2. ．． . . . Operation timing generating means, 20 . . . Diagnosis control means, 30 . . . Program storage means, 40 .
Clock IIJ control means, 50...display means. Example

Claims (1)

[Scope of Claims] 1. A system including a plurality of devices and an operation timing signal generation means for outputting an operation timing signal to each device; In an automatic diagnostic device equipped with a diagnostic control means that notifies the relevant device of an instruction to logically disconnect it from the normal operating state of the device and executes a diagnostic program to identify the failure location of the disconnected suspect device, the above operation is performed. The timing signal generating means is provided for each of the above-mentioned devices, and includes means for varying the period for outputting the operation timing signal, and the diagnostic control means is configured to generate a signal when the diagnostic program for the suspect device is normally completed. It is characterized by comprising means for outputting an instruction to change the output cycle of the operation timing signal and executing the diagnostic program again, and comprising a clock control means for selectively controlling the variable means based on the instruction. automatic diagnostic equipment.