JPH02189523A - Electrooptical device - Google Patents
Electrooptical deviceInfo
- Publication number
- JPH02189523A JPH02189523A JP1009558A JP955889A JPH02189523A JP H02189523 A JPH02189523 A JP H02189523A JP 1009558 A JP1009558 A JP 1009558A JP 955889 A JP955889 A JP 955889A JP H02189523 A JPH02189523 A JP H02189523A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- picture element
- element electrodes
- electro
- tin oxide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims abstract description 16
- 239000010409 thin film Substances 0.000 claims abstract description 5
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 9
- 230000000694 effects Effects 0.000 claims description 6
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 5
- 229910052738 indium Inorganic materials 0.000 claims description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 2
- 229910052760 oxygen Inorganic materials 0.000 claims 2
- 239000001301 oxygen Substances 0.000 claims 2
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 abstract description 12
- 229910001887 tin oxide Inorganic materials 0.000 abstract description 12
- 238000002834 transmittance Methods 0.000 abstract description 11
- 239000010408 film Substances 0.000 abstract description 9
- 239000000126 substance Substances 0.000 abstract description 7
- 229910003437 indium oxide Inorganic materials 0.000 abstract description 6
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 abstract description 6
- 239000010410 layer Substances 0.000 description 12
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 10
- 239000004973 liquid crystal related substance Substances 0.000 description 10
- 229910052581 Si3N4 Inorganic materials 0.000 description 8
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 8
- 239000011159 matrix material Substances 0.000 description 5
- 238000005530 etching Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は計測機の表示バネノー輸送手段のインストル
メントパネル、パーソナルコンピューター画像表示装置
5テレビジジン、プリンタ用液晶シャッターなどに使用
される、多数の画素数を有する電気光学装置に関する。[Detailed Description of the Invention] [Field of Industrial Application] This invention relates to a large number of pixels used in display springs of measuring instruments, instrument panels of transportation means, personal computer image display devices, liquid crystal shutters for printers, etc. The present invention relates to an electro-optical device having a number.
この発明は多数の画素を有するマトリクス構造電気光学
装置において、画素である透明電極材料の化学的安定性
を高めることにより、画素に接続されたスイッチング素
子の信頬性を高めることにより、電気光学装置の品質を
向上したものである。This invention provides an electro-optical device with a matrix structure having a large number of pixels, by increasing the chemical stability of the transparent electrode material that is the pixel and by increasing the reliability of the switching element connected to the pixel. The quality has been improved.
小型で軽量の電気光学装置として、エレクトロクロミズ
ムや液晶等のように、電気光学効果を有する材料を用い
た電気光学装置が実用化されている。近年この種の電気
光学装置の情報量増大化を計る目的で、TPT薄膜トラ
ンジスタなどによる3端子アクティブマトリクス液晶表
示装置や、非線型抵抗素子を各液晶画素と直列に設けた
2端子アクティブマトリクス液晶表示装置が脚光をあび
ている。2. Description of the Related Art As small and lightweight electro-optical devices, electro-optical devices using materials having an electro-optic effect, such as electrochromism and liquid crystal, have been put into practical use. In recent years, with the aim of increasing the information content of this type of electro-optical device, three-terminal active matrix liquid crystal display devices using TPT thin film transistors, etc., and two-terminal active matrix liquid crystal display devices in which a nonlinear resistance element is provided in series with each liquid crystal pixel have been developed. is in the spotlight.
例えば、窒化シリコンを非線型抵抗スイッチング素子材
料に用いた2端子アクテイブマトリクス液晶パネルは、
Proc、 of the 6th Internat
ionalDisplay Conference p
p、 72−74 (1986)に示されている。第2
図はその縦断面図であり、その構造は大略対向電極7を
有する基板8と、非線型抵抗素子41が形成された基板
1間に液晶が保持された構造となっている。この図で下
側の基板は次のような工程で作製される。For example, a two-terminal active matrix liquid crystal panel that uses silicon nitride as a nonlinear resistance switching element material,
Proc, of the 6th International
ionalDisplay Conference p
p., 72-74 (1986). Second
The figure is a longitudinal cross-sectional view of the same, and its structure is such that a liquid crystal is held between a substrate 8 having a counter electrode 7 and a substrate 1 having a nonlinear resistance element 41 formed thereon. The lower substrate in this figure is manufactured through the following steps.
まずガラス基板1上に酸化インジウムを主成分としてス
ズが添加されているITO(酸化インジウムスズ9)を
堆積し、画素電極lOとなるようパターニングする。次
いで窒化シリコン膜4および配線用電極5となる金属を
堆積してバターニングする。First, ITO (indium tin oxide 9), which is mainly composed of indium oxide and added with tin, is deposited on the glass substrate 1 and patterned to form the pixel electrode IO. Next, a silicon nitride film 4 and a metal that will become the wiring electrode 5 are deposited and patterned.
この種の液晶パネルで、良好な表示品質を得る為には、
画素電極10の可視光に対する透過率が高いことが望ま
れ、そのような観点からは酸化インジウムが好ましいが
、一方、画素電極10はその上の窒化シリコンをプラズ
マCVD法やスパッタ法などの気相成長法により堆積す
る場合に、イオンやラジカルなどにより損傷を受ける。In order to obtain good display quality with this type of LCD panel,
It is desired that the pixel electrode 10 has a high transmittance to visible light, and from that point of view indium oxide is preferable. When deposited using a growth method, it is damaged by ions, radicals, etc.
具体的には、インジウムが還元されて窒化シリコン中に
拡散し、スイッチング素子の信転性を低下させたり、窒
化シリコンが島状に成長してスイッチング素子の初期特
性が得られなかったりするという問題点があった。その
ような化学的安定性という観点からは、酸化スズあるい
はそのフン化物が考えられるが、酸化スズは、パターニ
ングの為のエツチングが困難であり、光透過率が低く、
さらには導電率が低いという欠点があった。Specifically, indium is reduced and diffused into silicon nitride, reducing the reliability of switching elements, and silicon nitride grows in island shapes, making it impossible to obtain the initial characteristics of switching elements. There was a point. From the viewpoint of chemical stability, tin oxide or its fluoride can be considered, but tin oxide is difficult to etch for patterning, has low light transmittance,
Furthermore, it had the disadvantage of low electrical conductivity.
ITOは酸化インジウムと酸化スズの中間的性質を持っ
ており、インジウムとスズの組成比により、要求する特
性に近い材料を選択するわけだが、既述の各種特性を全
て充分に満足する特性の材料を得るのは困難であった。ITO has properties intermediate between indium oxide and tin oxide, and depending on the composition ratio of indium and tin, a material with properties close to the required properties is selected. was difficult to obtain.
そこでこの発明は、画素電極として光透過率が高く、導
電性が高く、化学的に安定な構造を堤供し、電気光学装
置の表示品質を向上させ、信重頁性を高めることを目的
としている。Therefore, the purpose of this invention is to provide a pixel electrode with a structure that has high light transmittance, high conductivity, and is chemically stable, thereby improving the display quality of electro-optical devices and increasing reliability. .
本発明は上記問題点を解決するために、画素電極を2層
構造にし、基板側の第1層は酸化インジウムを主成分と
する層にすることにより高い導電率と光透過率を得、画
素電極の上に堆積される膜と界面を接する第2層は、酸
化スズを主成分とする層にすることにより高い化学的安
定性を得たものである。In order to solve the above problems, the present invention has a two-layer structure for the pixel electrode, and the first layer on the substrate side is a layer containing indium oxide as a main component to obtain high conductivity and light transmittance. The second layer, which is in contact with the film deposited on the electrode, has high chemical stability by making the layer mainly composed of tin oxide.
(作用〕
上記のような手段を講じることにより、両層の長所を兼
ね備えた画素電極を得、これを電気光学装置に用いる事
により、その表示品質と信顧性を高めたものである。(Function) By taking the above measures, a pixel electrode that combines the advantages of both layers is obtained, and by using this in an electro-optical device, its display quality and reliability are improved.
本発明の実施例を第1図に基づいて説明する。 An embodiment of the present invention will be described based on FIG.
構造の大略は第2図の従来例とほぼ同じで画素電極IO
が従来例と異なるものである。The general structure is almost the same as the conventional example shown in Figure 2, and the pixel electrode IO
is different from the conventional example.
第1図における下側の基板は次のような工程で作製され
る。ガラス基板1上に酸化インジウムスズ2を堆積する
。膜厚の設定は、光透過率と電気抵抗のトレード・オフ
となるが、通常は100〜1000人である。スズとイ
ンジウムのモル比(Sn/In)はO−1/2である。The lower substrate in FIG. 1 is manufactured through the following steps. Indium tin oxide 2 is deposited on a glass substrate 1. Setting the film thickness is a trade-off between light transmittance and electrical resistance, but it is usually 100 to 1000. The molar ratio of tin to indium (Sn/In) is O-1/2.
スズの比がこれ以上大きくなると、光透過率と電導度が
低下する。スズを含まない酸化インジウムでもよいが、
スズの比が小さいほど化学的安定度は低下する。If the tin ratio becomes larger than this, the light transmittance and electrical conductivity will decrease. Indium oxide, which does not contain tin, may be used, but
The smaller the tin ratio, the lower the chemical stability.
次いで酸化インジウムスズ2の上に酸化スズを2主成分
とする層3を堆積する。酸化スズ3の第1の役割は、そ
の上の窒化シリコン4を堆積するときのダメージに対す
る下地の酸化インジウムスズ2の保護である。この観点
からは、膜厚は10Å以上であればよい、第2の役割は
加熱工程や電気光学装置の駆動等により起こる、酸化イ
ンジウムスズ2中のインジウム原子の窒化シリコン4中
への拡散の阻止である。この効果も膜厚10Å以上で効
果がある。一方、酸化スズ3が厚過ぎると光透過率が低
下し、また、画素電極にバターニングするためのエツチ
ングが困難になる。以上の諸事情を考慮すると、〜ヒス
ズ3の膜厚は500Å以下であることが望ましい。Next, a layer 3 having two main components of tin oxide is deposited on the indium tin oxide 2. The first role of tin oxide 3 is to protect the underlying indium tin oxide 2 from damage when silicon nitride 4 is deposited thereon. From this point of view, the film thickness should be at least 10 Å.The second role is to prevent the indium atoms in the indium tin oxide 2 from diffusing into the silicon nitride 4, which occurs during the heating process, driving the electro-optical device, etc. It is. This effect is also effective when the film thickness is 10 Å or more. On the other hand, if the tin oxide layer 3 is too thick, the light transmittance will decrease and etching for patterning the pixel electrode will become difficult. Considering the above circumstances, it is desirable that the film thickness of ~His tin 3 be 500 Å or less.
本実施例においては、酸化インジウムスズ2の膜厚を3
00人とし、酸化スズ3の膜厚を50人とした。In this example, the film thickness of the indium tin oxide 2 is set to 3
00 people, and the film thickness of tin oxide 3 was 50 people.
酸化インジウムスズあるいは酸化スズは、CVD法、真
空蒸着法、イオン化蒸着法、スバタリング法などによっ
て作製することができる。Indium tin oxide or tin oxide can be produced by a CVD method, a vacuum evaporation method, an ionization evaporation method, a sputtering method, or the like.
酸化スズ3の化学的安定性は、フン素を含有せしめるこ
とにより更に高めることができる。また、成膜後の10
0℃以上のアニールも、化学的安定性を高める上で効果
があった。The chemical stability of tin oxide 3 can be further enhanced by containing fluorine. In addition, 10
Annealing at 0° C. or higher was also effective in increasing chemical stability.
本発明による2層からなる画素電極を用いて第1図に示
した、窒化シリコンを用いた2#a子アクテイブマトリ
クス液晶電気光学装置を作製したところ、窒化シリコン
の異常成長などは全く発生せず、二端子素子の電流電圧
特性の駆動による変化が、第2図に示した従来の単層の
酸化インジウムスズを用いた場合に比べて著しく減少し
、かつ、充分な透過率と電気伝導度を有し、容易にエツ
チング等のプロセスを行うことができた。When a 2#a active matrix liquid crystal electro-optical device using silicon nitride as shown in FIG. 1 was fabricated using a two-layer pixel electrode according to the present invention, no abnormal growth of silicon nitride occurred. , the changes in the current-voltage characteristics of the two-terminal element due to driving are significantly reduced compared to the case of using the conventional single-layer indium tin oxide shown in Figure 2, and sufficient transmittance and electrical conductivity are achieved. It was possible to easily carry out processes such as etching.
以上述べたように、本発明による画素電極を用いた電気
光学装置によれば、画素電極の光透過率と導電率の高さ
を保ったまま、画素電極およびスイッチング素子の安定
性を高めるので、電気光学装置の表示品質を高め、とく
に、その信頼性を向上させるという優れた効果を有する
。As described above, according to the electro-optical device using the pixel electrode according to the present invention, the stability of the pixel electrode and the switching element is increased while maintaining the high light transmittance and high conductivity of the pixel electrode. It has an excellent effect of improving the display quality of an electro-optical device, and particularly improving its reliability.
第1図は本発明による透明画素電極の第1層を酸化イン
ジウムスズ2とし第2層を酸化スズ3とする液晶電気光
学装置の縦断面図、第2図は従来の透明画素電極が酸化
インジウムスズの単層からなる液晶電気光学装置の縦断
面図である。
1、 8・・・基板
2・・・・・第1層
3・・・・・第2N
以上
出願人 セイコー電子工業株式会社FIG. 1 is a vertical cross-sectional view of a liquid crystal electro-optical device in which the first layer of a transparent pixel electrode is made of indium tin oxide 2 and the second layer is made of tin oxide 3, and FIG. 2 shows a conventional transparent pixel electrode made of indium tin oxide. FIG. 2 is a longitudinal cross-sectional view of a liquid crystal electro-optical device made of a single layer of tin. 1, 8...Substrate 2...First layer 3...2nd N Applicant: Seiko Electronics Co., Ltd.
Claims (1)
効果を有する材料の層と、第1の基板の内面に形成した
多数の画素および電極と、第2の基板の内面に形成した
電極とからなり、第1の基板の各画素にはスイッチング
素子が接続されている電気光学装置において、第1の基
板の画素が2層の薄膜からなり、その基板側の第1層の
薄膜がインジウムと酸素を主成分とし、その電気光学効
果を有する材料の層の側の第2層の薄膜がスズと酸素を
主成分とすることを特徴とする電気光学装置。Two opposing substrates, a layer of material having an electro-optic effect sandwiched between the substrates, a large number of pixels and electrodes formed on the inner surface of the first substrate, and a number of pixels and electrodes formed on the inner surface of the second substrate. In an electro-optical device, each pixel of the first substrate is made of a two-layer thin film, and the first layer of the thin film on the substrate side is An electro-optical device comprising indium and oxygen as main components, and a second thin film on the side of the layer of material having an electro-optic effect comprising tin and oxygen as main components.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1009558A JPH02189523A (en) | 1989-01-18 | 1989-01-18 | Electrooptical device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1009558A JPH02189523A (en) | 1989-01-18 | 1989-01-18 | Electrooptical device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02189523A true JPH02189523A (en) | 1990-07-25 |
Family
ID=11723613
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1009558A Pending JPH02189523A (en) | 1989-01-18 | 1989-01-18 | Electrooptical device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02189523A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102486917A (en) * | 2010-12-02 | 2012-06-06 | 三星电子株式会社 | Display apparatus and method of manufacturing same |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6353520A (en) * | 1986-08-22 | 1988-03-07 | Seiko Instr & Electronics Ltd | Production of multi-color display device |
JPS63289533A (en) * | 1987-05-22 | 1988-11-28 | Oki Electric Ind Co Ltd | Liquid crystal display device |
-
1989
- 1989-01-18 JP JP1009558A patent/JPH02189523A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6353520A (en) * | 1986-08-22 | 1988-03-07 | Seiko Instr & Electronics Ltd | Production of multi-color display device |
JPS63289533A (en) * | 1987-05-22 | 1988-11-28 | Oki Electric Ind Co Ltd | Liquid crystal display device |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102486917A (en) * | 2010-12-02 | 2012-06-06 | 三星电子株式会社 | Display apparatus and method of manufacturing same |
JP2012118531A (en) * | 2010-12-02 | 2012-06-21 | Samsung Electronics Co Ltd | Display device and method for manufacturing the same |
US9182640B2 (en) | 2010-12-02 | 2015-11-10 | Samsung Display Co., Ltd. | Display apparatus and method of manufacturing the same |
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