JPH02183429A - Optical pickup for recording and reproducing information - Google Patents

Optical pickup for recording and reproducing information

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Publication number
JPH02183429A
JPH02183429A JP64000294A JP29489A JPH02183429A JP H02183429 A JPH02183429 A JP H02183429A JP 64000294 A JP64000294 A JP 64000294A JP 29489 A JP29489 A JP 29489A JP H02183429 A JPH02183429 A JP H02183429A
Authority
JP
Japan
Prior art keywords
thin film
holder
semiconductor laser
waveguide
film waveguide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP64000294A
Other languages
Japanese (ja)
Inventor
Koji Muraoka
村岡 幸治
Takeshi Shimano
健 島野
Susumu Saito
進 斉藤
Akira Arimoto
昭 有本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP64000294A priority Critical patent/JPH02183429A/en
Publication of JPH02183429A publication Critical patent/JPH02183429A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To adjust a position relation of a laser light source and a thin film waveguide by providing a guide plate between the thin film waveguide and its holder so that the waveguide can be brought to linear movement freely. CONSTITUTION:A thin film waveguide substrate 8 of an optical pickup is held by a holder 1 through guide plates 11, 12. These guide plates 11, 12 can be brought to linear movement freely against the holder 1 along a projecting part 1b, etc., of the holder 1 and its movement is brought to feedback control through a piezo-element, etc. In such a way, a position adjustment of a semiconductor laser chip 4 fixed to a T-type mount 2, and an optical waveguide of the substrate 8 provided with an optical collimation use geodesic lens 9, a comb line electrode 10 for generating a surface acoustic wave for polarizing a collimated light, etc., is executed easily and surely.

Description

【発明の詳細な説明】 [産業上の利用分野コ 本発明は情報記録再生用光ピックアップに係り、特に多
量の情報を取り扱う分野において光ディスク等の装置を
用いて情報を記録再生するのに好適な光ピックアップに
関する。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to an optical pickup for recording and reproducing information, and is particularly suitable for recording and reproducing information using a device such as an optical disk in a field that handles a large amount of information. Regarding optical pickups.

[従来の技術] 従来の装置は、特開昭61−85637号に記載のよう
に光源と薄膜導波路とのハイブリッド構造となっている
が、個々の部品機能の構成に主点を置いていた。
[Prior art] Conventional devices have a hybrid structure of a light source and a thin film waveguide, as described in Japanese Patent Application Laid-open No. 85637/1982, but the main focus has been on the configuration of the functions of individual components. .

[発明が解決しようとする課題] 上記従来技術は光源と薄膜導波路との調整及び組立技術
には配慮がなされておらず、実際に能率的に組立が行な
えるかという点で問題があった。
[Problem to be solved by the invention] The above-mentioned conventional technology does not take into consideration the adjustment and assembly technology between the light source and the thin film waveguide, and there is a problem in terms of whether assembly can actually be carried out efficiently. .

本発明の目的は光源と薄膜導波路の位置合わせを考慮し
、調整及び組立が容易に行なえる光ピックアップを提供
することにある。
An object of the present invention is to provide an optical pickup that can be easily adjusted and assembled by taking into consideration the alignment of the light source and the thin film waveguide.

[課題を解決するための手段] 上記目的は、光源である半導体レーザと薄膜導波路との
間を微動可能とする調整部材を付加することによって、
達成できる。
[Means for solving the problem] The above object is achieved by adding an adjustment member that allows fine movement between the semiconductor laser that is the light source and the thin film waveguide.
It can be achieved.

[作用] 光源である半導体レーザはベース基板に固定されている
。このベースに対して薄膜導波路の基板は保持部材の摩
擦力によって保持されている。
[Function] A semiconductor laser serving as a light source is fixed to the base substrate. The substrate of the thin film waveguide is held against this base by the frictional force of the holding member.

光源に対して位置合わせをする場合には、調整治具を新
たに組み込み、ベースと導波路基板を固定している摩擦
力を緩める方向に保持部材をたわませて光源との位置合
わせを行ない、それが完了した時点で、また摩擦力を復
元することにより固定して組立を終了する。
When aligning with the light source, install a new adjustment jig and flex the holding member in the direction of loosening the frictional force that fixes the base and waveguide substrate to align with the light source. , When it is completed, it is fixed again by restoring the frictional force to finish the assembly.

[実施例] 以下、本発明の一実施例を第1図及び、第2図を用いて
説明する。
[Example] An example of the present invention will be described below with reference to FIGS. 1 and 2.

ホルダ1の取付面にT型マウント2が取り付けられてお
り、T型マウント2の上面にサブマウント3を介して半
導体レーザチップ4が取り付けられている。半導体レー
ザチップ4からのリード線5は絶縁板6を介してT型マ
ウント2に固定されているリード端子7にボンディング
される。また。
A T-shaped mount 2 is attached to the mounting surface of the holder 1, and a semiconductor laser chip 4 is attached to the upper surface of the T-shaped mount 2 via a submount 3. Lead wires 5 from the semiconductor laser chip 4 are bonded to lead terminals 7 fixed to the T-mount 2 via an insulating plate 6. Also.

ホルダ1には案内板11および12を介してチタンを拡
散したニオブ酸リチウムなどの材料によって薄膜導波路
が形成された導波路基板8がホルダ1から両側に張り出
した部材で摩擦力を利用して保持されている。導波路基
板8には半導体レーザチップ4からの出射光101を平
行光に変換するためのジオディシックレンズ9が形成さ
れている。
In the holder 1, a waveguide substrate 8, in which a thin film waveguide is formed using a material such as lithium niobate with titanium diffused through guide plates 11 and 12, is a member that extends from the holder 1 on both sides and uses frictional force. Retained. A geodisic lens 9 is formed on the waveguide substrate 8 to convert the emitted light 101 from the semiconductor laser chip 4 into parallel light.

さらに、平行光となって導波して来た光を偏向するため
に表面弾性波102を発生させる櫛形電極10が蒸着な
どの方法で形成されている。光は櫛形電極10に数百M
Hz程度の高周波を印加した時に発生する弾性表面波1
02の部分を通過する際、回折の作用を受け、直進する
0次光103と偏向された1次回折光104に分離され
る。この周波数を変化させると1次回折光104の方向
を変えることができる。
Furthermore, a comb-shaped electrode 10 that generates a surface acoustic wave 102 to deflect the light that has been guided as parallel light is formed by a method such as vapor deposition. The light is several hundred M into the comb-shaped electrode 10.
Surface acoustic wave 1 generated when applying a high frequency of about Hz
When passing through the portion 02, the light is subjected to the action of diffraction and is separated into a 0th-order light 103 that travels straight and a 1st-order diffracted light 104 that is deflected. By changing this frequency, the direction of the first-order diffracted light 104 can be changed.

導波路基板8に形成された導波路の厚さは1μm程度で
あり、その範囲に半導体レーザチップ4の活性層を合わ
せ込み、光を導波させなければならない。また、半導体
レーザチップ4の端面から出射される光101はガウシ
アン分布で広がっていくため、効率を考えた場合可能な
限り導波路端面に近接させ、1μm程度のオーダにする
ことが必要である。
The thickness of the waveguide formed on the waveguide substrate 8 is approximately 1 μm, and the active layer of the semiconductor laser chip 4 must be aligned within this range to guide light. Furthermore, since the light 101 emitted from the end face of the semiconductor laser chip 4 spreads in a Gaussian distribution, it is necessary to bring it as close to the waveguide end face as possible in consideration of efficiency, and to make it on the order of 1 μm.

その方法として、ホルダ1の左右にくびれ部1−aを作
り、たわみ易くシ、導波路基板8までの空間に、例えば
、ピエゾ素子13などを挿入し、ホルダ1と導波路基板
8との摩擦力を減少させる方向に電圧を印加しておく。
As a method, constrictions 1-a are made on the left and right sides of the holder 1 to make it flexible, and a piezo element 13, for example, is inserted into the space up to the waveguide substrate 8, and the friction between the holder 1 and the waveguide substrate 8 is A voltage is applied in the direction that reduces the force.

その状態で第2図に示した縦断面図のように、ホルダ1
の底面の開孔部から中間部材14を微動テーブル15か
ら張り出し導波路基板8と連結しておく、微動テーブル
15はガイド16によって微動台17に対して直交2軸
に移動可能としておき、半導体レーザチップ4とのギャ
ップを調整する第2のピエゾ素子18と、高さを調整す
る第3のピエゾ素子19とによって、出射光101が導
波する位置に導波路基板8を移動させる。ホルダ1は突
起部1−b及び1−b′によって案内板11及び12と
噛み合っており、その案内溝によって直線的に移動する
ことが可能となる。そして、半導体レーザチップ4の近
傍まで近づけてくる。次に、第3のピエゾ素子19を用
いて導波路基板8を上下方向に移動させる。導波路基板
8は案内板11の突起部11−a、11−b及び案内板
12の突起部12−a。
In this state, as shown in the longitudinal cross-sectional view in Fig. 2, the holder 1
An intermediate member 14 is extended from a fine movement table 15 through an opening in the bottom surface and connected to the waveguide substrate 8.The fine movement table 15 is movable in two axes orthogonal to the fine movement table 17 by a guide 16, and the semiconductor laser The waveguide substrate 8 is moved to a position where the emitted light 101 is guided by the second piezo element 18 that adjusts the gap with the chip 4 and the third piezo element 19 that adjusts the height. The holder 1 is engaged with the guide plates 11 and 12 by the protrusions 1-b and 1-b', and can be moved linearly by the guide grooves. Then, it is brought close to the semiconductor laser chip 4. Next, the waveguide substrate 8 is moved in the vertical direction using the third piezo element 19. The waveguide substrate 8 includes projections 11-a and 11-b of the guide plate 11 and a projection 12-a of the guide plate 12.

12−bと噛み合うことによって上下方向の直線移動が
可能となる。そして、半導体レーザチップ4の光が効率
よく導波よく位置に来た時に、第1のピエゾ素子13の
電圧を下げることによってホルダ1の両側へのたわみ力
を解消し、導波路基板8への保持力を復元させて固定を
完了する。この案内板11及び12の突起部は、フッ素
樹脂などの摩擦係数の低い物質を貼付け、または、コー
ティングすることによって滑りを良くすれば、微少移動
がしやすくなる。
By engaging with 12-b, linear movement in the vertical direction is possible. When the light from the semiconductor laser chip 4 reaches the position with good waveguide efficiency, the voltage of the first piezo element 13 is lowered to eliminate the bending force on both sides of the holder 1, and the waveguide substrate 8 is Restore the holding force and complete the fixation. If the protrusions of the guide plates 11 and 12 are made to have smoother sliding by pasting or coating a material with a low coefficient of friction such as fluororesin, minute movements can be made easier.

本実施例によれば、案内板11及び12によって直交2
軸方向に繰り返し移動可能であるために調整が行ない易
く、調整後には機械的な可動部分が無いために信頼性の
高い組立を実現できるという効果がある。
According to this embodiment, the guide plates 11 and 12 allow two orthogonal
Adjustment is easy because it can be moved repeatedly in the axial direction, and since there are no mechanically moving parts after adjustment, highly reliable assembly can be achieved.

他の実施例を第3図及び第4図を用いて説明する。情報
記録円盤に記録された情報を読みだすためには薄膜導波
路から出射された光を集光、検出する光学系が必要とな
る。
Another embodiment will be described with reference to FIGS. 3 and 4. In order to read the information recorded on the information recording disk, an optical system is required to collect and detect the light emitted from the thin film waveguide.

導波路基板8の端面から出射される1次回折光104は
、円柱レンズ20で平行光に戻され、回折格子21を通
過することによって、トラック情報を得るための3つの
スポットを形成する。その光は、偏向ビームスプリッタ
22.1/4波長板23、レンズ駆動コイル25で焦点
位置を変えられる対物レンズ24を通り、情報記録円盤
26に集光される。その反射光は、もう−度対物レンズ
24.1/4波長板23を通ることによって偏光方向が
変わり、偏光ビームスプリッタ22で集光レンズ27に
導かれ、検出器28によって信号の検出が行われる。こ
の光学系は基板29上に配置されており、薄膜導波路8
以降は、基板29の基準面を利用して調整不用なように
一体構造とする。
The first-order diffracted light 104 emitted from the end face of the waveguide substrate 8 is returned to parallel light by the cylindrical lens 20, and passes through the diffraction grating 21, thereby forming three spots for obtaining track information. The light passes through a deflection beam splitter 22, a 1/4 wavelength plate 23, and an objective lens 24 whose focal position can be changed by a lens drive coil 25, and is focused on an information recording disk 26. The reflected light changes its polarization direction by passing through an objective lens 24 and a quarter wavelength plate 23, is guided to a condensing lens 27 by a polarizing beam splitter 22, and a signal is detected by a detector 28. . This optical system is arranged on a substrate 29, and a thin film waveguide 8
Thereafter, the reference plane of the substrate 29 is used to form an integral structure so that no adjustment is required.

半導体レーザチップ4を固定しているT型マウント2は
、導波路基板8の端面側にわずかに溝を作り、その溝の
所に半導体レーザチップ4が導波路基板8の端面に対し
て1〜3″程度傾いて、かつ、T型マウント2の端面よ
り1〜2μm程度内側と゛なる位置に組み立てる。基板
29は案内板11及び12を介してホルダ1に固定され
ている。
The T-type mount 2 that fixes the semiconductor laser chip 4 has a slight groove formed on the end surface side of the waveguide substrate 8, and the semiconductor laser chip 4 is placed in the groove by 1~ The board 29 is assembled at a position inclined about 3" and about 1 to 2 .mu.m inward from the end surface of the T-shaped mount 2. The substrate 29 is fixed to the holder 1 via guide plates 11 and 12.

組立及び調整時には、光学系全体が登載されている基板
29を、第2図に示したような微動台を用いて、半導体
レーザチップ4に対して微動させる。本実施例では、ホ
ルダ1に固定されたT型マウント2に向かって案内板1
1及び12を、第2図に示す微動台などを用いて近づけ
、T型マウント2端面と接触させるだけで、半導体レー
ザチップ4と導波路基板8端面との適正なギャップが実
現できる。その後に、基板29を第3のピエゾ素子など
を用いて上下方向に微動させる。そして、最適位置を見
つけるために、予め対物レンズ24との関係で決まる適
正な位置に、情報記録円盤26もしくは反射板などを置
いておき、検出器28へ入る光量をモニターすることに
よって調整が可能となる。その最大光量の時で、ホルダ
1と基板29の摩擦力を第1の実施例のような方法で復
帰させ、固定を完了する。
During assembly and adjustment, the substrate 29 on which the entire optical system is mounted is slightly moved relative to the semiconductor laser chip 4 using a fine movement table as shown in FIG. In this embodiment, the guide plate 1 is directed toward the T-shaped mount 2 fixed to the holder 1.
An appropriate gap between the semiconductor laser chip 4 and the end surface of the waveguide substrate 8 can be achieved by simply bringing the components 1 and 12 close to each other using a fine movement table shown in FIG. 2 and bringing them into contact with the end surface of the T-shaped mount 2. Thereafter, the substrate 29 is slightly moved in the vertical direction using a third piezo element or the like. In order to find the optimal position, the information recording disk 26 or a reflector plate is placed at an appropriate position determined in advance in relation to the objective lens 24, and adjustment can be made by monitoring the amount of light entering the detector 28. becomes. When the amount of light is at its maximum, the frictional force between the holder 1 and the substrate 29 is restored in the same manner as in the first embodiment, and the fixation is completed.

本実施例によれば、半導体レーザチップ4端面と導波路
基板8端面が傾いて取り付けられているために、導波路
基板゛8端面からの戻り光によるノイズの影響が低減で
き、かつ、T型マウント2が基準面となり、導波路基板
8の端面に接触させれば良いため、位置合わせが容易に
行なえ、さらに、半導体レーザチップ4の傾き角をブラ
ッグ角とすれば、導波路基板8に対して櫛形電極10を
平行にすれば良いので1作成が容易となる。また、位置
合わせ確認のために、信号検出用の検出器28が利用で
きるため、調整のための測定装置が不用となり、調整が
容易に行なえるという効果がある。
According to this embodiment, since the end face of the semiconductor laser chip 4 and the end face of the waveguide substrate 8 are attached at an angle, the influence of noise due to the return light from the end face of the waveguide substrate 8 can be reduced, and the T-shaped Since the mount 2 serves as a reference plane and only needs to be brought into contact with the end surface of the waveguide substrate 8, alignment can be easily performed.Furthermore, if the inclination angle of the semiconductor laser chip 4 is the Bragg angle, Since it is sufficient to make the comb-shaped electrodes 10 parallel to each other, it is easy to make one. Further, since the detector 28 for signal detection can be used to confirm alignment, a measuring device for adjustment is not required, and there is an effect that adjustment can be easily performed.

[発明の効果] 本発明によれば、光源である半導体レーザと薄膜導波路
との微小な位置合わせのための調整が容易に行なえ、最
適な利用効率で光を導波させることができ、かつ、再!
F1mlや交換が容易に行えるという効果がある。
[Effects of the Invention] According to the present invention, it is possible to easily perform minute alignment adjustments between a semiconductor laser as a light source and a thin film waveguide, and to guide light with optimal utilization efficiency. , re!
It has the effect that F1ml and exchange can be done easily.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の斜視図、第2図は第1図の
縦断面図、第3図は第2の実施例の平面図、第4図は第
2の実施例の側面図である。 1・・・ホルダ     1−a・・・くびれ部1−b
・・・突起部   2・・・T型マウント3・・サブリ
マウント 4・・・半導体レーザチップ5・・・リード
線     6・・・M縁板7・・・リード端子   
8・・・導波路基板9 ・・・ジオディシックレンズ 
     10・・・櫛形電極11・・・案内板   
 11−a・・・突起部11−b・・・突起部  12
・・・案内板12−a・・・突起部  12−b・・・
突起部13・・・ピエゾ素子  14・・・中間部材1
5・・・微動テーブル 16・・・ガイド17・・・微
動台    18・・・ピエゾ素子9・・・ピエゾ素子 1・・・回折格子 3・・・174波長板 5・・・レンズ駆動コイル 7・・・集光レンズ 9・・・基板 01・・・出射光 03・・・0次光 ・・・円柱レンズ ・・・偏光ビームスブリフタ ・・対物レンズ ・・・情報記録円盤 ・・・検出器 102・・・弾性表面波 104・・・1次回折光 ′f3z目
Fig. 1 is a perspective view of one embodiment of the present invention, Fig. 2 is a vertical sectional view of Fig. 1, Fig. 3 is a plan view of the second embodiment, and Fig. 4 is a side view of the second embodiment. It is a diagram. 1...Holder 1-a...Neck part 1-b
...Protrusion 2...T-type mount 3...Sub-remount 4...Semiconductor laser chip 5...Lead wire 6...M edge plate 7...Lead terminal
8... Waveguide substrate 9... Geodisic lens
10... Comb-shaped electrode 11... Guide plate
11-a...Protrusion 11-b...Protrusion 12
...Guide plate 12-a...Protrusion 12-b...
Projection 13... Piezo element 14... Intermediate member 1
5... Fine movement table 16... Guide 17... Fine movement table 18... Piezo element 9... Piezo element 1... Diffraction grating 3... 174 Wave plate 5... Lens drive coil 7 ...Condensing lens 9...Substrate 01...Outgoing light 03...0th order light...Cylindrical lens...Polarized beam subrifter...Objective lens...Information recording disk...Detection Device 102...Surface acoustic wave 104...1st order diffracted light 'f3z'th

Claims (1)

【特許請求の範囲】 1、ヒートシンクを兼用したベースに設けられた半導体
レーザ光源、薄膜導波器、該半導体レーザ光源から出た
光をコリメートするジオディシックレンズ、コリメート
された光を偏向するための表面弾性波を発生させる櫛形
電極からなり、上記薄膜導波路とそれを保持するホルダ
の間に案内板を設けて直線的な移動を可能とし、上記半
導体レーザ光源と上記薄膜導波路との位置関係を調整可
能としたことを特徴とする情報記録再生用光ピックアッ
プ。 2、上記半導体レーザ光源と上記薄膜導波路との位置合
わせは、位置合わせ時にのみ上記ホルダに付加する微動
機構により行なうことを特徴とする請求項1記載の情報
記録再生用光ピックアップ。 3、上記半導体レーザ光源の出射面は、上記薄膜導波路
の入射面に対して1〜3゜程度傾いていることを特徴と
する請求項1又は2に記載の情報記録再生用光ピックア
ップ。
[Claims] 1. A semiconductor laser light source provided on a base that also serves as a heat sink, a thin film waveguide, a geodisic lens for collimating the light emitted from the semiconductor laser light source, and for deflecting the collimated light. A guide plate is provided between the thin film waveguide and a holder that holds it to enable linear movement, and the position of the semiconductor laser light source and the thin film waveguide is An optical pickup for recording and reproducing information, characterized in that the relationship can be adjusted. 2. The optical pickup for recording and reproducing information according to claim 1, wherein the alignment between the semiconductor laser light source and the thin film waveguide is performed by a fine movement mechanism added to the holder only at the time of alignment. 3. The optical pickup for recording and reproducing information according to claim 1 or 2, wherein the output surface of the semiconductor laser light source is inclined by about 1 to 3 degrees with respect to the input surface of the thin film waveguide.
JP64000294A 1989-01-06 1989-01-06 Optical pickup for recording and reproducing information Pending JPH02183429A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP64000294A JPH02183429A (en) 1989-01-06 1989-01-06 Optical pickup for recording and reproducing information

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP64000294A JPH02183429A (en) 1989-01-06 1989-01-06 Optical pickup for recording and reproducing information

Publications (1)

Publication Number Publication Date
JPH02183429A true JPH02183429A (en) 1990-07-18

Family

ID=11469886

Family Applications (1)

Application Number Title Priority Date Filing Date
JP64000294A Pending JPH02183429A (en) 1989-01-06 1989-01-06 Optical pickup for recording and reproducing information

Country Status (1)

Country Link
JP (1) JPH02183429A (en)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61158049A (en) * 1984-12-28 1986-07-17 Olympus Optical Co Ltd Recording information reader
JPS6275508A (en) * 1985-09-30 1987-04-07 Hitachi Ltd Extreme value retrieving system for automatic optical axis aligning device
JPS6289250A (en) * 1985-10-16 1987-04-23 Fuji Photo Film Co Ltd Pickup for optical disk
JPS63103451A (en) * 1986-10-20 1988-05-09 Hitachi Ltd Optical pickup head
JPS63139290A (en) * 1986-12-02 1988-06-11 オリンパス光学工業株式会社 Fine adjustment mechanism
JPS63183636A (en) * 1986-09-09 1988-07-29 Hitachi Ltd Thin film optical waveguide type optical head
JPS63191327A (en) * 1987-02-04 1988-08-08 Hitachi Ltd Solid-state optical pickup
JPS63241729A (en) * 1987-03-27 1988-10-07 Nec Home Electronics Ltd Mounting and adjusting mechanism for semiconductor laser of optical head

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61158049A (en) * 1984-12-28 1986-07-17 Olympus Optical Co Ltd Recording information reader
JPS6275508A (en) * 1985-09-30 1987-04-07 Hitachi Ltd Extreme value retrieving system for automatic optical axis aligning device
JPS6289250A (en) * 1985-10-16 1987-04-23 Fuji Photo Film Co Ltd Pickup for optical disk
JPS63183636A (en) * 1986-09-09 1988-07-29 Hitachi Ltd Thin film optical waveguide type optical head
JPS63103451A (en) * 1986-10-20 1988-05-09 Hitachi Ltd Optical pickup head
JPS63139290A (en) * 1986-12-02 1988-06-11 オリンパス光学工業株式会社 Fine adjustment mechanism
JPS63191327A (en) * 1987-02-04 1988-08-08 Hitachi Ltd Solid-state optical pickup
JPS63241729A (en) * 1987-03-27 1988-10-07 Nec Home Electronics Ltd Mounting and adjusting mechanism for semiconductor laser of optical head

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