JPH02181667A - Electronic board with deterioration diagnostic function - Google Patents
Electronic board with deterioration diagnostic functionInfo
- Publication number
- JPH02181667A JPH02181667A JP32589A JP32589A JPH02181667A JP H02181667 A JPH02181667 A JP H02181667A JP 32589 A JP32589 A JP 32589A JP 32589 A JP32589 A JP 32589A JP H02181667 A JPH02181667 A JP H02181667A
- Authority
- JP
- Japan
- Prior art keywords
- data
- memory
- electronic board
- computing element
- deterioration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000006866 deterioration Effects 0.000 title claims abstract description 24
- 230000006870 function Effects 0.000 claims abstract description 4
- 238000003745 diagnosis Methods 0.000 claims description 5
- 238000011156 evaluation Methods 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 2
- 230000000694 effects Effects 0.000 description 3
- 230000032683 aging Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は電子基板に係り、特に劣化状態の経年変化の把
握と余寿命評価に好適な診断装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to electronic substrates, and particularly to a diagnostic device suitable for grasping aging changes in deterioration state and evaluating remaining life.
従来の装置としては、特開昭62−134568号に記
載のように赤外線を利用して電子基板の劣化を診断する
ものはあったが、劣化状態の把握は大部分は熟練者の目
視点検と定期点検時に実施する人出力特性試験データに
より判断するといった方法となっていた。Although there are conventional devices that use infrared rays to diagnose the deterioration of electronic boards, as described in Japanese Patent Application Laid-open No. 62-134568, the state of deterioration is mostly determined by visual inspection by experts. The method of judgment was based on human output characteristic test data conducted during periodic inspections.
上記従来技術は熟練者の判断が必要であること、定期点
検時においてのみ試験データが測定できること、また試
験データはその都度記#i紙に記入しており多大の労力
と時間を費やしていた。The above-mentioned conventional technology requires the judgment of a skilled person, test data can only be measured during periodic inspections, and the test data is written down on diary #i paper each time, consuming a great deal of effort and time.
また赤外線による劣化診断装置は装置が複雑となり稼動
中の電子基板においては実用的でないという問題があっ
た。Further, the deterioration diagnosis device using infrared rays has a problem in that the device is complicated and is not practical for use with electronic boards that are in operation.
本発明の目的は、このような従来の欠点を解決し、電子
基板内に劣化診断機能を設けて、劣化状態の経年変化と
余寿命評価ができるようにすることにある。An object of the present invention is to solve these conventional drawbacks and to provide a deterioration diagnosis function in an electronic board so as to be able to evaluate changes over time in the state of deterioration and remaining life.
(課題を解決するための手段〕
上記目的は、電子基板内にメモリを設けて演算器のデー
タを所定の時間ごとに記憶し、演算器の初期データや故
障データと比較することにより。(Means for Solving the Problem) The above object is achieved by providing a memory in the electronic board to store data of the computing unit at predetermined time intervals, and comparing the data with initial data and failure data of the computing unit.
達成される。achieved.
電子基板内に設けられたメモリには、演算器のデータが
時間変化とともに記憶される。A memory provided in the electronic board stores data of the arithmetic unit along with time changes.
記憶されたデータを演算器の初期データや故障データと
比較することにより、劣化状態の経年変化がわかる。ま
た経年変化のデータから、今後の劣化状態の推定ができ
るので余寿命評価もできることになる。By comparing the stored data with the initial data and failure data of the arithmetic unit, changes in deterioration over time can be determined. Furthermore, since the future state of deterioration can be estimated from the data on aging, it is also possible to evaluate the remaining lifespan.
以下、本発明の一実施例を第1図により説明する。1は
電子基板、2は演算器、3はメモリである。An embodiment of the present invention will be described below with reference to FIG. 1 is an electronic board, 2 is an arithmetic unit, and 3 is a memory.
演算器2は入力信号を取り込み演算を行なって出力する
ものであり、電子基板1としての機能を果たすものであ
る。The arithmetic unit 2 takes in input signals, performs arithmetic operations, and outputs the results, and functions as the electronic board 1.
メモリ3には、所定の時間ごとに演算器のデータが送ら
れ記憶される。必要な時にメモリ3よリデータを取り出
すことができ、このデータを演算器の初期データや故障
データ(誤差レベル、故障パターン)と比較することに
より1時間的な演算器の状態変化がわかり、劣化診断に
有効である。Data from the arithmetic unit is sent and stored in the memory 3 at predetermined time intervals. Data can be retrieved from memory 3 when necessary, and by comparing this data with the initial data of the computing unit and failure data (error level, failure pattern), changes in the status of the computing unit over an hour can be determined, and deterioration diagnosis can be performed. It is effective for
第2図は、その他の実施例を示す。FIG. 2 shows another embodiment.
4はメモリ1.5はメモリ2.6は演算器2である。4 is a memory 1, 5 is a memory 2, and 6 is an arithmetic unit 2.
メモリ2には演算器の劣化診断に必要な初期データや故
障データがあらかじめ記憶されているものである。メモ
リ1には、第1図の場合と同様に所定の時間ごとに演算
器のデータが送られ記憶される。6の演算器2はメモリ
1とメモリ2のデータを比較し、劣化状態を判断するも
のである。The memory 2 stores in advance initial data and failure data necessary for diagnosing deterioration of the arithmetic unit. Data from the arithmetic unit is sent to the memory 1 at predetermined time intervals and stored therein, as in the case of FIG. Arithmetic unit 2 6 compares the data in memory 1 and memory 2 to determine the state of deterioration.
劣化状態を判定する一例を第3図に示す。An example of determining the state of deterioration is shown in FIG.
演算器の誤差により劣化状態を判断するものである。メ
モリ2には初期データ0%と誤差レベル±0.5%が記
憶されており、1力月ごとにメモリ1に演算器の誤差が
記憶され、演算器2により初期データ、誤差レベルと比
較され、誤差レベル以内であれば正常と見なす。さらに
誤差の時間変化を直線近似した場合に誤差レベルを超え
る月数を計算し、劣化の予測も行なうものである。The state of deterioration is determined based on the error of the arithmetic unit. The initial data 0% and the error level ±0.5% are stored in the memory 2, and the error of the calculator is stored in the memory 1 every month, and compared with the initial data and error level by the calculator 2. , it is considered normal if it is within the error level. Furthermore, when the time change of the error is approximated by a straight line, the number of months exceeding the error level is calculated, and deterioration is predicted.
本実施例によれば演算器の誤差により、劣化の程度と予
測が出来る効果がある。According to this embodiment, the degree of deterioration can be predicted based on the error of the arithmetic unit.
なお、上記実施例ではメモリ1とメモリ2とをそれぞれ
独立させた列を示したが、共通のメモリを使い分けるよ
うにしても良い。In the above embodiment, the memory 1 and the memory 2 are shown as independent columns, but a common memory may be used separately.
本発明によれば、電子基板の劣化状態の経年変化と余寿
命評価ができるので、電子基板の信頼性向上に多大の効
果がある。According to the present invention, it is possible to evaluate the secular change in the deterioration state of an electronic board and its remaining life, which has a great effect on improving the reliability of the electronic board.
第1図、第2図は本発明の実施例を示すブロック図、第
3図は劣化状態を判定する例として誤差変化の時間変化
を示す図である。
1・・・電子基板、2・・・演薯器、3・・・メモリ、
4・・・メモリ1.5・・・メモリ2,6・・・演算器
2゜第1図
第2図FIGS. 1 and 2 are block diagrams showing an embodiment of the present invention, and FIG. 3 is a diagram showing changes in error over time as an example of determining a state of deterioration. 1...Electronic board, 2...Speaker, 3...Memory,
4...Memory 1.5...Memory 2, 6...Arithmetic unit 2゜Figure 1Figure 2
Claims (1)
故障データをあらかじめ記憶したメモリと、演算器デー
タを所定の時間ごとに記憶するメモリとを設けて、劣化
状態の経年変化の把握と余寿命評価ができるようにした
事を特徴とする劣化診断機能付の電子基板。1. The electronic board is equipped with a memory that stores initial data and failure data necessary for deterioration diagnosis in advance, and a memory that stores computing unit data at predetermined intervals to understand changes in deterioration status over time and to understand the remaining life. An electronic board with a deterioration diagnosis function that enables evaluation.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32589A JPH02181667A (en) | 1989-01-06 | 1989-01-06 | Electronic board with deterioration diagnostic function |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32589A JPH02181667A (en) | 1989-01-06 | 1989-01-06 | Electronic board with deterioration diagnostic function |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02181667A true JPH02181667A (en) | 1990-07-16 |
Family
ID=11470753
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP32589A Pending JPH02181667A (en) | 1989-01-06 | 1989-01-06 | Electronic board with deterioration diagnostic function |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02181667A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0487460U (en) * | 1990-11-30 | 1992-07-29 | ||
JP2006003344A (en) * | 2004-05-20 | 2006-01-05 | Semiconductor Energy Lab Co Ltd | Evaluation method for semiconductor device |
-
1989
- 1989-01-06 JP JP32589A patent/JPH02181667A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0487460U (en) * | 1990-11-30 | 1992-07-29 | ||
JP2006003344A (en) * | 2004-05-20 | 2006-01-05 | Semiconductor Energy Lab Co Ltd | Evaluation method for semiconductor device |
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