JPH021778A - Coating liquid for forming oxide coating film and production of oxide coating film - Google Patents

Coating liquid for forming oxide coating film and production of oxide coating film

Info

Publication number
JPH021778A
JPH021778A JP1022041A JP2204189A JPH021778A JP H021778 A JPH021778 A JP H021778A JP 1022041 A JP1022041 A JP 1022041A JP 2204189 A JP2204189 A JP 2204189A JP H021778 A JPH021778 A JP H021778A
Authority
JP
Japan
Prior art keywords
film
coating liquid
oxide film
solution
coating film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1022041A
Other languages
Japanese (ja)
Other versions
JPH0559154B2 (en
Inventor
Hiroyuki Morishima
森嶋 浩之
Shunichiro Uchimura
内村 俊一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resonac Corp
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP1022041A priority Critical patent/JPH021778A/en
Publication of JPH021778A publication Critical patent/JPH021778A/en
Publication of JPH0559154B2 publication Critical patent/JPH0559154B2/ja
Granted legal-status Critical Current

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Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/02Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
    • C23C18/12Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
    • C23C18/1204Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
    • C23C18/1208Oxides, e.g. ceramics
    • C23C18/1212Zeolites, glasses

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Ceramic Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Paints Or Removers (AREA)
  • Formation Of Insulating Films (AREA)
  • Polymers With Sulfur, Phosphorus Or Metals In The Main Chain (AREA)
  • Silicon Polymers (AREA)
  • Local Oxidation Of Silicon (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

PURPOSE:To provide the subject coating liquid containing a reaction product produced by the hydrolysis and condensation of a specific silane compound and a specific metal alkoxide compound, having high thermal stability and good film-forming property and useful for the coating of an interlayer step in a multilayer wiring of semiconductor. CONSTITUTION:The objective coating liquid contains a reaction product produced by the hydrolysis and condensation of (A) a silane compound of formula RmSi(OR)4-m (R is 1-4C alkyl or aryl; m is 0-2) [e.g., Si(OCH3)4] and (B) a metal alkoxide compound of formula M(OR')n (M is Mg, B, P, Zr, Y, Ti or Ba; R' is 1-4C alkyl or aryl; n is atomic valence of M) [e.g., B(O-iC3H7)3] in a solvent in the presence of a catalyst (e.g., hydrochloric acid or oxalic acid).

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は酸化物被膜形成用塗布液および酸化物被膜の製
造法に関し、さらに詳しくは熱的に安定で、かつ成膜性
の良好な酸化物被膜の製造法およびこの酸化物被膜形成
用塗布液に関する。
Detailed Description of the Invention (Industrial Application Field) The present invention relates to a coating solution for forming an oxide film and a method for producing an oxide film, and more specifically to a coating solution for forming an oxide film and a method for producing an oxide film that is thermally stable and has good film formability. The present invention relates to a method for producing an oxide film and a coating liquid for forming the oxide film.

(従来の技術) 従来、IC,LSI等の半導体素子の眉間絶縁の方法と
して、シラノール化合物の加水分解・縮合物を焼成し、
酸化物被膜を形成する方法がよく知られている。テトラ
エトキシシラン(エチルシリケート)等の4官能シラン
を用いる方法が最も多く検討されているが、4官能シラ
ンのみを用いる方法では、焼成してシリカ被膜を形成す
る際、三次元加橋構造が非常に密になり剛直となるため
、膜厚が厚くなるとクラックが発生するという欠点があ
る。この欠点の改善のために2官能や3官能シランを共
加水分解する方法が特開昭57−191219号公報等
に示されているが、これらの方法では縮合物または膜の
中に多量の炭素が含まれ、焼成によって膜の中に炭素が
残存する場合は、その後の半導体製造工程でクラックが
発生するという欠点がある。また膜の中に含まれる炭素
を脱離するためKは、500℃以上の高温が必要であり
、炭素の脱離による膜の収縮または脱離後の膜とシリコ
ン、アルミ等の基体との熱膨張係数の差が大きいため、
膜にクラックが発生する欠点がある。
(Prior art) Conventionally, as a method for glabellar insulation of semiconductor devices such as ICs and LSIs, a hydrolysis/condensation product of a silanol compound is fired.
Methods of forming oxide films are well known. The most studied method is to use tetrafunctional silanes such as tetraethoxysilane (ethyl silicate), but in the method using only tetrafunctional silanes, the three-dimensional cross-linked structure is extremely difficult to form when firing to form a silica film. Since the film becomes dense and rigid, it has the disadvantage that cracks occur as the film becomes thicker. In order to improve this drawback, methods of co-hydrolyzing bifunctional and trifunctional silanes are shown in Japanese Patent Application Laid-open No. 191219/1983, but these methods do not contain a large amount of carbon in the condensate or film. is included, and if carbon remains in the film after firing, there is a drawback that cracks will occur in the subsequent semiconductor manufacturing process. In addition, in order to desorb carbon contained in the film, K requires a high temperature of 500°C or higher, and the film shrinks due to desorption of carbon or the heat generated between the desorbed film and the substrate such as silicon or aluminum. Due to the large difference in expansion coefficient,
There is a drawback that cracks occur in the film.

(発明が解決しようとする課題) 本発明の目的は、前記従来技術の欠点を除去し。(Problem to be solved by the invention) The object of the present invention is to eliminate the drawbacks of the prior art.

熱的に安定で、かつ成膜性の良好な酸化物被膜の製造法
及びこの酸化物形成用塗布液を提供することにある。
The object of the present invention is to provide a method for producing an oxide film that is thermally stable and has good film formability, and a coating liquid for forming the oxide.

(課題を解決するための手段) 本発明者らは、前記目的を達成するため種々研究した結
果、シリコン、アルミ等の基体上でクラックが発生せず
、さらにその後の酸素7°ラズマ処理によってもクラッ
ク発生のない酸化物被膜を形成するためには、(1)焼
成時の硬化収縮歪を小さくする。(2)膜の熱膨張係数
を基体の値に近づける。
(Means for Solving the Problems) As a result of various studies to achieve the above object, the present inventors have found that no cracks occur on substrates such as silicon and aluminum, and even with subsequent oxygen 7° plasma treatment. In order to form a crack-free oxide film, (1) reduce the curing shrinkage strain during firing; (2) Bringing the coefficient of thermal expansion of the membrane close to that of the substrate.

(3)膜の中の炭素含有量を極めて少なくするかまたは
無くするという条件を満たす塗布液を用いることが必要
であり、該塗布液は、特定の化合物を溶剤の存在下に触
媒を用いて加水分解、縮合させて得られることを見出し
1本発明に到達した。
(3) It is necessary to use a coating solution that satisfies the condition of extremely reducing or eliminating the carbon content in the film, and the coating solution is made by applying a specific compound in the presence of a solvent using a catalyst. The present invention was achieved by discovering that it can be obtained by hydrolysis and condensation.

本発明は、囚一般弐Rm Sr (OR)4−m  (
式中。
The present invention is a general prisoner 2 Rm Sr (OR) 4-m (
During the ceremony.

几は炭素数1〜4のアルキル基または了り−ル基。几 is an alkyl group or an alkyl group having 1 to 4 carbon atoms.

mit、0〜2の整数を意味する)で表されるシラン化
合物と、(B)一般式M(OR’)n  (式中9Mは
マグネシウム、硼素、燐、ジルコニウム、イツトリウム
、チタンまたはバリウムの金属原子、R′は炭素数1〜
4のアルキル基またはアリール基、nは金属原子Mの原
子価を意味する)で表される金属アルコキシド化合物と
を、溶媒の存在下に触媒を用いて加水分解、縮合させて
得られる反応物を含んでなる酸化物被膜形成用塗布液お
よびこの塗布液の製造法に関する。
mit, meaning an integer from 0 to 2), and (B) a silane compound represented by the general formula M(OR')n (wherein 9M is a metal of magnesium, boron, phosphorus, zirconium, yttrium, titanium, or barium); Atom, R' has 1 or more carbon atoms
A reaction product obtained by hydrolyzing and condensing a metal alkoxide compound represented by the alkyl group or aryl group of 4 (n means the valence of the metal atom M) using a catalyst in the presence of a solvent. The present invention relates to a coating liquid for forming an oxide film comprising the coating liquid and a method for producing the coating liquid.

本発明に用いられるシラン化合物は、前記一般式Rm 
S r (OR)4−mで表され、具体的には5i(O
CH3)4 、  Si (OC2H5)4 、 Si
 (OCsHy)4等の4官能シラン、  CHsSi
 (OCHs)s 、 CHsSi (OC2H5)3
 。
The silane compound used in the present invention has the general formula Rm
S r (OR)4-m, specifically 5i(O
CH3)4, Si (OC2H5)4, Si
Tetrafunctional silane such as (OCsHy)4, CHsSi
(OCHs)s, CHsSi (OC2H5)3
.

CHsSi  (OC3H7)3 、   CzHsS
i  (OCHs )3 、  CaHs 5i(OC
Hs)s 、 CH35i (OCaHs)s等の3官
能シラン。
CHsSi (OC3H7)3, CzHsS
i (OCHs)3, CaHs5i(OC
Trifunctional silanes such as Hs)s and CH35i (OCaHs)s.

(CHs)zsi (OCH3)21  (CHs)z
si (OCzHs)z。
(CHs)zsi (OCH3)21 (CHs)z
si (OCzHs)z.

(CH3)zsi (OCsHy)2*  (CzHs
)zsi (OCJ−13)2 *(CaHs)zsi
 (OCH3)21 (CHs)zsi (OCaHs
)z等の2官能シランが挙げられる。これらのシラン化
合物は単独でまたは2種以上混合して用いることができ
る。
(CH3)zsi (OCsHy)2* (CzHs
)zsi (OCJ-13)2 *(CaHs)zsi
(OCH3)21 (CHs)zsi (OCaHs
) z and other difunctional silanes. These silane compounds can be used alone or in combination of two or more.

本発明に用いられる金属アルコキシド化合物は。The metal alkoxide compound used in the present invention is:

前記一般弐M(OR’)nで表され、具体的にはB(0
−i C3H7)! 、 Mg (OC3H7)2 、
 P (0−i C3H?)3 。
It is represented by the general 2M(OR')n, specifically B(0
-i C3H7)! , Mg(OC3H7)2,
P (0-i C3H?)3.

Ti (0−i C3H7)4 、 Ti (OCI!
H5)4等が挙げられる。
Ti (0-i C3H7)4, Ti (OCI!
H5)4 etc. are mentioned.

これらの金属アルコキシド化合物は単独でまたは2種以
上混合して用いることができる。また前記一般式中のR
とR′は等しくても異なっていてもよい。
These metal alkoxide compounds can be used alone or in combination of two or more. Also, R in the general formula
and R' may be equal or different.

本発明に用いられる前記シラン化合物と金属アルコキシ
ド化合物との共重合組成としては、成膜性、炭素残渣等
の点から、シラン化合物70〜90モルチおよび金属ア
ルコキシド化合物10〜30モルチの範囲が好ましく、
またこれらのシラン化合物が、4官能シラン51(0几
)4であるか、4官能シランSi (OR)420〜4
0モルチ、3官能シランR8i (OR)s  20〜
60モルチ、および2官能シランR2Si (OR)2
0〜40モル係の混合物であることか好ましい。
The copolymerization composition of the silane compound and metal alkoxide compound used in the present invention is preferably in the range of 70 to 90 mol of the silane compound and 10 to 30 mol of the metal alkoxide compound, from the viewpoint of film formability, carbon residue, etc.
Moreover, these silane compounds are either tetrafunctional silane 51 (0 几) 4 or tetrafunctional silane Si (OR) 420-4
0 molti, trifunctional silane R8i (OR)s 20~
60 molti, and bifunctional silane R2Si (OR)2
Preferably, it is a mixture having a molar ratio of 0 to 40.

本発明に用いられる溶媒としては、成膜性の点から、シ
ラン化合物中のアルキル基またはアリール基と同数の炭
素を有するアルコール、アルキル基またはアリール基と
反応しないN、N−ジメチルホルムアミド等のアミド系
の溶媒などが用いられる。これらは混合して用いてもよ
い。
From the viewpoint of film-forming properties, the solvent used in the present invention is an alcohol having the same number of carbon atoms as the alkyl group or aryl group in the silane compound, or an amide such as N,N-dimethylformamide that does not react with the alkyl group or aryl group. A system solvent is used. These may be used in combination.

本発明に用いられる反応触媒としては1例えば塩酸、硫
酸、燐酸、硼酸、フッ酸などの無機酸。
Examples of the reaction catalyst used in the present invention include inorganic acids such as hydrochloric acid, sulfuric acid, phosphoric acid, boric acid, and hydrofluoric acid.

五酸化燐、酸化硼素などの酸化物、シュウ酸などの有機
酸等が用いられる。該触媒の添加量は、シラン化合物と
金属アルコキシド化合物に対して合計量0.1〜5重量
%が好ましい。
Oxides such as phosphorus pentoxide and boron oxide, organic acids such as oxalic acid, and the like are used. The amount of the catalyst added is preferably 0.1 to 5% by weight in total based on the silane compound and metal alkoxide compound.

本発明の塗布液は、前記アルコキシシラン化合物と金属
アルコキシド化合物とを溶媒の存在下に前記触媒を用い
て加水分解、縮合させて得られる。
The coating liquid of the present invention is obtained by hydrolyzing and condensing the alkoxysilane compound and the metal alkoxide compound using the catalyst in the presence of a solvent.

また該溶液を用いて得られる酸化物被膜の熱膨張係数は
9選定する金属アルコキシド化合物の種類および量によ
って任意に変化させることができる。
Further, the thermal expansion coefficient of the oxide film obtained using the solution can be arbitrarily changed depending on the type and amount of the selected metal alkoxide compound.

本発明の塗布液を用いて酸化物被膜を形成するに際して
は、シリコン、ガラス、セラミックス。
When forming an oxide film using the coating liquid of the present invention, silicon, glass, and ceramics are used.

アルミ等の基体表面上に、スピナー、ノーヶ、スプレー
等で塗布液を塗布したのち9通常50〜200℃、好ま
しく!I′1100〜150℃で乾燥し9次いで通常4
00〜800℃、好ましくは400〜500℃で焼成す
る。
After applying the coating liquid onto the surface of a substrate such as aluminum using a spinner, sprayer, etc.9, the temperature is usually 50 to 200°C, preferably! I'1 Dry at 1100-150℃ 9 then usually 4
Firing is performed at 00 to 800°C, preferably 400 to 500°C.

本発明の塗布液を用いて得られる酸化物被膜は。The oxide film obtained using the coating liquid of the present invention is as follows.

従来のシラノール縮金物を用いて得られる酸化膜被膜と
比較して、炭素含有量が少なく、また第2成分としてマ
グネシウム、釦素、燐、ジルコニウム、イツトリウム、
チタンまたはバリウムの酸化物が含まれ、これらが81
02と共重合体を形成するために熱的に安定であり、成
膜性も良好となる。
Compared to the oxide film obtained using conventional silanol metal condensates, it has a lower carbon content and contains magnesium, phosphorus, phosphorus, zirconium, yttrium,
Contains oxides of titanium or barium, which are 81
Since it forms a copolymer with 02, it is thermally stable and has good film forming properties.

(実施例) 以下9本発明を実施例により詳しく説明する。(Example) The present invention will be explained in detail below with reference to nine examples.

実施例I Si (OCJ(3)451 g、 CH35j (O
CH3)3 45 g+(CH3)zsi(OCHs)
z 12 g、 B(i−OCsHy)s  31g 
、 Mg(OC3Ht)z 109をN、N−ジメチル
ホルムアミド1609およびメチルアルコール409の
混合溶媒中に溶解し、この溶液にさらにシュウ酸0.6
gを溶解させた水559を添加して加水分解。
Example I Si (OCJ(3) 451 g, CH35j (O
CH3)3 45 g+(CH3)zsi(OCHs)
z 12 g, B(i-OCsHy)s 31 g
, Mg(OC3Ht)z 109 was dissolved in a mixed solvent of N,N-dimethylformamide 1609 and methyl alcohol 409, and oxalic acid 0.6 was added to this solution.
Hydrolyze by adding 559 g of water dissolved in it.

縮合を行い1反応物溶液を作製した。Condensation was performed to prepare one reactant solution.

この溶液をスピナーを用いて3000 rpmでSi 
ウェハー上に塗布した後、150℃で1時間乾燥し9次
いで電気炉中、400℃で1時間焼成したところ、無色
透明でクラックのないシリカ系被膜が得られた。
This solution was applied to Si using a spinner at 3000 rpm.
After coating on a wafer, it was dried at 150° C. for 1 hour and then baked in an electric furnace at 400° C. for 1 hour, resulting in a colorless, transparent, crack-free silica-based coating.

該シリカ系被膜の膜厚を9表面あらさ計(商品名タリス
テップ、ランクテーラーホプソン社製)を用いて測定し
たところ、0.7μmであった。また該被膜の吸収スペ
クトルを赤外分光光度計を用いて測定したところ、5i
O−8i吸収の他に。
The thickness of the silica-based coating was measured using a 9 surface roughness meter (trade name: Talystep, manufactured by Rank Taylor Hopson) and found to be 0.7 μm. In addition, when the absorption spectrum of the coating was measured using an infrared spectrophotometer, it was found that 5i
In addition to O-8i absorption.

Mg−0,B−0結合の吸収が観察され、完全な酸化膜
であることが確認された。さらに本酸化膜をバレル型酸
素プラズマ灰化装置PR−501A型(ヤマト科学社展
)を用いて400Wで20分間処理したが、膜中にクラ
ックは認められなかった。
Absorption of Mg-0 and B-0 bonds was observed, and it was confirmed that the film was a complete oxide film. Furthermore, this oxide film was treated at 400 W for 20 minutes using a barrel-type oxygen plasma ashing device PR-501A (Yamato Kagakusha Exhibition), but no cracks were observed in the film.

また前記溶液を、厚さ0.7μm、ラインアンドスペー
ス幅0.5〜5μmのアルミパターンが蒸着されたSi
 ウェハー上に前記と同様の条件で成膜したところ、無
色透明でクラックのない酸化被膜が得られた。
In addition, the solution was applied to Si on which an aluminum pattern with a thickness of 0.7 μm and a line and space width of 0.5 to 5 μm was vapor-deposited.
When a film was formed on a wafer under the same conditions as above, a colorless and transparent oxide film without cracks was obtained.

さらに前記溶液を150℃で3時間乾燥した後。After further drying the solution at 150° C. for 3 hours.

得られた粉末を直径12Mnのベレット状に圧縮成形し
、電気炉中で1000℃で1時間焼成した。
The obtained powder was compression molded into a pellet shape with a diameter of 12 Mn, and fired at 1000° C. for 1 hour in an electric furnace.

この試料の熱膨張係数を理学電機社製、熱物理試験機T
MA8150型で測定したところ、室温から450℃ま
での平均線熱膨張係数は7.0X10”であった。
The thermal expansion coefficient of this sample was measured using a thermal physical tester T manufactured by Rigaku Denki Co., Ltd.
When measured with MA8150 model, the average linear thermal expansion coefficient from room temperature to 450° C. was 7.0×10”.

実施例2 Si (OCzHg)4145 g、 P (OC3H
7)3 41 y。
Example 2 Si (OCzHg) 4145 g, P (OC3H
7) 3 41 y.

Mg (OC3H?12 14 gをエチルアルコール
3009に溶解し、この液にさらにシュウ酸0.8gを
溶解させた水66gを添加して加水分解、縮合を行い反
応物溶液を作製した。
14 g of Mg (OC3H?12) was dissolved in 3009 ethyl alcohol, and 66 g of water in which 0.8 g of oxalic acid had been dissolved was added to the solution for hydrolysis and condensation to prepare a reaction product solution.

この液を実施例1と同様な条件でSiウェハー上に塗布
、乾燥、焼成したところ、膜厚0.5μmの無色透明で
クラックのないシリカ系被膜が得られた。また前記溶液
を実施例1と同様な条件でアルミパターンを蒸着したS
iウェハー上に成膜したところ、無色透明でクラックの
ない酸化物被膜が得られた。
When this liquid was applied onto a Si wafer under the same conditions as in Example 1, dried, and fired, a colorless, transparent, crack-free silica-based film with a thickness of 0.5 μm was obtained. Further, the solution was applied to S on which an aluminum pattern was vapor-deposited under the same conditions as in Example 1.
When a film was formed on an i-wafer, a colorless and transparent oxide film without cracks was obtained.

実施例3 Si (OC2H5)469 g、 CH35i fO
c2Hs )359 g。
Example 3 Si (OC2H5) 469 g, CH35i fO
c2Hs) 359 g.

(CH3)25i (OC2H5)2259. B(0
−i C3H7)3319をエチルアルコール269お
よびN、N−ジメチルホルムアミド1059の混合溶媒
中に溶解し、この溶液にさらにシュウ酸0.6gを溶解
させた水569を添加して加水分解、縮合を行い1反応
物溶液を作製した。
(CH3)25i (OC2H5)2259. B(0
-i C3H7) 3319 is dissolved in a mixed solvent of ethyl alcohol 269 and N,N-dimethylformamide 1059, and water 569 in which 0.6 g of oxalic acid is further dissolved is added to this solution to perform hydrolysis and condensation. 1. A reactant solution was prepared.

この溶液を実施例1と同様な条件でSi ウニ・・−お
よびアルミパターンを蒸着したSl ウェハー上に成膜
したところ、膜厚0.7μmの無色透明でクラックの々
い酸化物被膜が得られた。
When this solution was deposited under the same conditions as in Example 1 on a Sl wafer on which Si sea urchin and aluminum patterns had been deposited, a colorless and transparent oxide film with a thickness of 0.7 μm and no cracks was obtained. Ta.

実施例4 Si (OCH3)451 g 、  CHsSi (
OCH3)330 g。
Example 4 451 g of Si (OCH3), CHsSi (
OCH3) 330 g.

C5HsSi (OCHs)s 229.  (CH3
)zsi (OCH3)212 g、  B(i  0
03Hy)331 g、 Mg(OCaH7)zl 0
 g’&ジエチレングリコールジエチルエーテル200
gに溶解し、この溶液に燐酸0.59を溶解させた水5
59を添加して加水分解、縮合を行い。
C5HsSi (OCHs)s 229. (CH3
)zsi (OCH3)212 g, B(i 0
03Hy) 331 g, Mg(OCaH7)zl 0
g'& diethylene glycol diethyl ether 200
5 g of water and 0.59 g of phosphoric acid dissolved in this solution.
59 was added to perform hydrolysis and condensation.

反応物溶液を作成した。A reactant solution was created.

この溶液を実施例1と同様な条件でSi ウエノ・−お
よびアルミパターンを蒸着したSi ウエノ1−上に成
膜したところ、膜厚0.8μmの無色透明でクラックの
ない酸化物被膜が得られた。
When this solution was deposited under the same conditions as in Example 1 on Si Ueno-- and Si Ueno-1- on which an aluminum pattern had been deposited, a colorless, transparent, crack-free oxide film with a thickness of 0.8 μm was obtained. Ta.

比較例I Si (OC2H53435gを、エチルアルコール6
49および酢酸エチル269の混合溶媒に溶解し、この
溶液にさらにシュウ酸0.5gを溶解させた水129を
添加して加水分解、縮合を行い、シラノールオリゴマー
溶液を作製した。
Comparative Example I Si (53435 g of OC2H was dissolved in ethyl alcohol 6
49 and ethyl acetate 269, and water 129 in which 0.5 g of oxalic acid was further dissolved was added to perform hydrolysis and condensation to prepare a silanol oligomer solution.

この溶液を実施例1と同様にしてSl ウエノ・−上に
塗布したところ、約0.4μmの膜が得られたが、膜に
は多数のクラックが存在していた。
When this solution was applied onto Sl Ueno-- in the same manner as in Example 1, a film of about 0.4 μm was obtained, but the film had many cracks.

比較例2 Si (OCH3)4179 、 CHsSi (OC
H3)s  25 gおよび(CHs)2si(OCH
3)z  5 gを、N、N−ジメチルホルムアミド4
8Gおよびメタノール69の混合溶媒に溶解し、この溶
液にさらに燐酸o、sgを溶解させた水209を添加し
て加水分解、縮合を行い、シラノールオリゴマー溶液を
作製した。
Comparative example 2 Si (OCH3)4179, CHsSi (OC
H3)s 25 g and (CHs)2si(OCH
3) z 5 g to N,N-dimethylformamide 4
The silanol oligomer solution was dissolved in a mixed solvent of 8G and methanol 69, and water 209 in which phosphoric acid o and sg were further dissolved was added to perform hydrolysis and condensation to prepare a silanol oligomer solution.

この溶液を実施例1と同様にして8i ウエノ・−上に
塗布したところ、約0.7μmの膜が得られた。
When this solution was applied onto 8i Ueno in the same manner as in Example 1, a film of about 0.7 μm was obtained.

被膜の吸収スペクトルを赤外分光光度計を用いて測定し
たところ、5i−0−8i吸収の他にSi −CH3の
強い吸収がみられ、完全KSiCh膜になっていないこ
とが確認された。またこの膜を実施例1と同様にして4
00Wで20分間酸素プラズマ処理したところ、膜中に
クラックが発生した。
When the absorption spectrum of the film was measured using an infrared spectrophotometer, strong absorption of Si-CH3 was observed in addition to 5i-0-8i absorption, and it was confirmed that the film was not a complete KSiCh film. In addition, this film was prepared in the same manner as in Example 1.
When oxygen plasma treatment was performed at 00W for 20 minutes, cracks occurred in the film.

(発明の効果) 本発明の酸化物被膜形成用塗布液は、熱的に安定で成膜
性に優れるため、該塗布液を用いて基体表面上に形成し
た酸化膜被膜には、1.5μm程度の厚さとしてもクラ
ックの発生がない。したがって本発明の酸化物被膜形成
用塗布液は、電子部品。
(Effects of the Invention) The coating solution for forming an oxide film of the present invention is thermally stable and has excellent film-forming properties, so that the oxide film formed on the surface of the substrate using the coating solution has a thickness of 1.5 μm. No cracks occur even at a certain thickness. Therefore, the coating liquid for forming an oxide film of the present invention can be applied to electronic parts.

特に半導体の多層配線における層間段差の被膜。In particular, coatings for interlayer steps in semiconductor multilayer wiring.

磁気バブルメモリー等の素子表面の平坦化等に有効であ
る。
It is effective for flattening the surface of devices such as magnetic bubble memories.

Claims (1)

【特許請求の範囲】 1、(A)一般式RmSi(OR)_4_−_m(式中
、Rは炭素数1〜4のアルキル基またはアリール基、m
は0〜2の整数を意味する)で表されるシラン化合物と
、(B)一般式M(OR′)n(式中、Mはマグネシウ
ム、硼素、燐、ジルコニウム、イットリウム、チタンま
たはバリウムの金属原子、R′は炭素数1〜4のアルキ
ル基またはアリール基、nは金属原子Mの原子価を意味
する)で表される金属アルコキシド化合物とを、溶媒の
存在下に触媒を用いて加水分解、縮合させて得られる反
応物を含んでなる酸化物被膜形成用塗布液。 2、請求項1記載の塗布液を、基体表面上に塗布後50
〜200℃で乾燥し、ついで400〜800℃で焼成す
る酸化物被膜の製造法。
[Claims] 1. (A) General formula RmSi(OR)_4_-_m (wherein R is an alkyl group or aryl group having 1 to 4 carbon atoms, m
means an integer from 0 to 2), and (B) a silane compound represented by the general formula M(OR')n (wherein M is a metal of magnesium, boron, phosphorus, zirconium, yttrium, titanium, or barium); Atom, R' is an alkyl group or aryl group having 1 to 4 carbon atoms, and n means the valence of the metal atom M) is hydrolyzed using a catalyst in the presence of a solvent. , a coating liquid for forming an oxide film, comprising a reactant obtained by condensation. 2. After coating the coating liquid according to claim 1 on the substrate surface,
A method for producing an oxide film by drying at ~200°C and then firing at 400-800°C.
JP1022041A 1988-02-02 1989-01-31 Coating liquid for forming oxide coating film and production of oxide coating film Granted JPH021778A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1022041A JPH021778A (en) 1988-02-02 1989-01-31 Coating liquid for forming oxide coating film and production of oxide coating film

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2237088 1988-02-02
JP63-22370 1988-02-02
JP1022041A JPH021778A (en) 1988-02-02 1989-01-31 Coating liquid for forming oxide coating film and production of oxide coating film

Publications (2)

Publication Number Publication Date
JPH021778A true JPH021778A (en) 1990-01-08
JPH0559154B2 JPH0559154B2 (en) 1993-08-30

Family

ID=12080747

Family Applications (1)

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Country Status (3)

Country Link
EP (1) EP0327311B1 (en)
JP (1) JPH021778A (en)
DE (1) DE68918124T2 (en)

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JPH02258840A (en) * 1989-03-31 1990-10-19 Fuji Xerox Co Ltd Production of semiconductive inorganic and organic composite material
JPH02258842A (en) * 1989-03-31 1990-10-19 Fuji Xerox Co Ltd Production of semiconductive inorganic and organic composite material
JPH02258841A (en) * 1989-03-31 1990-10-19 Fuji Xerox Co Ltd Production of inorganic and organic composite material
JPH04230029A (en) * 1990-06-13 1992-08-19 Wacker Chemitronic Ges Elektron Grundstoffe Mbh Manufacture of abrasion silicon wafer with storage stability surface
US5340373A (en) * 1992-02-18 1994-08-23 Canon Kabushiki Kaisha Method for producing optical element by press molding a blank having a component removed layer and a hydrocarbon coating
KR20070108658A (en) * 2006-05-08 2007-11-13 유영선 Method for preparation method of coating composition for insulating membrane of semiconductor device and prepared coating composition)
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JPS5638472A (en) * 1979-09-06 1981-04-13 Tokyo Denshi Kagaku Kabushiki Formation of silica coating
JPS60258477A (en) * 1984-06-02 1985-12-20 Nippon Steel Corp Formation of insulating film on silicon steel sheet

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02258839A (en) * 1989-03-31 1990-10-19 Fuji Xerox Co Ltd Production of inorganic and organic composite material
JPH02258840A (en) * 1989-03-31 1990-10-19 Fuji Xerox Co Ltd Production of semiconductive inorganic and organic composite material
JPH02258842A (en) * 1989-03-31 1990-10-19 Fuji Xerox Co Ltd Production of semiconductive inorganic and organic composite material
JPH02258841A (en) * 1989-03-31 1990-10-19 Fuji Xerox Co Ltd Production of inorganic and organic composite material
JPH04230029A (en) * 1990-06-13 1992-08-19 Wacker Chemitronic Ges Elektron Grundstoffe Mbh Manufacture of abrasion silicon wafer with storage stability surface
US5340373A (en) * 1992-02-18 1994-08-23 Canon Kabushiki Kaisha Method for producing optical element by press molding a blank having a component removed layer and a hydrocarbon coating
JP4499907B2 (en) * 2000-12-07 2010-07-14 富士化学株式会社 Method for producing inorganic polymer compound, inorganic polymer compound, and inorganic polymer compound film
KR20070108658A (en) * 2006-05-08 2007-11-13 유영선 Method for preparation method of coating composition for insulating membrane of semiconductor device and prepared coating composition)
JP2009545649A (en) * 2006-08-04 2009-12-24 ダウ・コーニング・コーポレイション Silicone resin and silicone composition

Also Published As

Publication number Publication date
EP0327311B1 (en) 1994-09-14
DE68918124T2 (en) 1995-02-23
JPH0559154B2 (en) 1993-08-30
EP0327311A3 (en) 1990-08-01
EP0327311A2 (en) 1989-08-09
DE68918124D1 (en) 1994-10-20

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