JPH02158123A - Heater - Google Patents

Heater

Info

Publication number
JPH02158123A
JPH02158123A JP31361288A JP31361288A JPH02158123A JP H02158123 A JPH02158123 A JP H02158123A JP 31361288 A JP31361288 A JP 31361288A JP 31361288 A JP31361288 A JP 31361288A JP H02158123 A JPH02158123 A JP H02158123A
Authority
JP
Japan
Prior art keywords
heat
conductive layer
buffering box
buffer box
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP31361288A
Other languages
Japanese (ja)
Inventor
Hidekazu Shirakawa
英一 白川
Kimiharu Matsumura
松村 公治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Kyushu Ltd
Original Assignee
Tokyo Electron Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Kyushu Ltd filed Critical Tokyo Electron Kyushu Ltd
Priority to JP31361288A priority Critical patent/JPH02158123A/en
Publication of JPH02158123A publication Critical patent/JPH02158123A/en
Pending legal-status Critical Current

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  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Furnace Details (AREA)

Abstract

PURPOSE:To realize miniaturization and weight reduction and manufacturing cost reduction and also to improve uniformity in heating by conducting a current through a conductive layer formed at the outside of a heat buffering box so as to heat a substance to be heated. CONSTITUTION:A heat buffering box 1 is made in container shape out of a substance which has characteristics excellent in heat conductivity and electric insulating property, for example, alumina, etc. Also, at the outside of this heat buffering box 1, a conductive layer 4 consisting of a film which is made by overlaying metal such as, for example, chrome, etc., by deposition, etc., is provided over almost the whole face, and this conductive layer 4 is connected with a power source 5. And, for example, a semiconductor wafer 3 on which photoresist is applied is provided on a stage 2 in the heat buffering box 1, and desired temperature is input to a temperature controller 7 and the temperature inside the heat buffering box 1 is made to the desired temperature and baking treatment is done for a specified time. At this time, joule heat which is generated in the conductive layer 4 by currents conduction is transmitted to the heat buffering box 1 which is excellent in heat conductivity, and the whole heat buffering box becomes almost uniform temperature. Accordingly, the semiconductor wafer 3 is heated uniformly from the circumference and baked uniformly.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は、加熱装置に関する。[Detailed description of the invention] [Purpose of the invention] (Industrial application field) The present invention relates to a heating device.

(従来の技術) 一般に、加熱装置例えば半導体製造における加熱処理工
程において用いられる加熱装置では、従来から半導体ウ
ェハ等の基板に均一な処理を施すため、半導体ウェハ等
の基板を均一に加熱することができるよう種々の工夫が
なされている。
(Prior Art) In general, heating devices, such as those used in the heat treatment process in semiconductor manufacturing, have conventionally been used to uniformly heat substrates such as semiconductor wafers in order to uniformly process the substrates such as semiconductor wafers. Various efforts have been made to make this possible.

例えば、米国特許第3838751号等では、熱伝導度
の高い物質で構成された熱緩衝箱と、この熱緩衝箱の外
側に設けられた多数の加熱用ランプとからなる加熱装置
が提案されている。すなわち、この加熱装置では、熱緩
衝箱内に゛被加熱物を設け、多数の加熱用ランプにより
熱緩衝箱を介して加熱するもので、熱伝導の良好な熱緩
衝箱の効果により被加熱物を周囲から均一に加熱するこ
とができるようにしたものである。
For example, U.S. Patent No. 3,838,751 proposes a heating device consisting of a thermal buffer box made of a material with high thermal conductivity and a number of heating lamps provided outside the thermal buffer box. . In other words, in this heating device, the object to be heated is placed inside a thermal buffer box, and the object to be heated is heated through the thermal buffer box using a large number of heating lamps. can be heated evenly from the surrounding area.

(発明が解決しようとする課題) しかしながら、上記説明の従来の加熱装置では、熱緩衝
箱の外側に多数の加熱用ランプを設ける必要があり、装
置が大型化するとともに、その製造コストも高くなると
いう問題がある。また、このような問題を避けるために
加熱用ランプの数を減少させると、加熱用ランプの近傍
と遠方とにより温度勾配が生じ、加熱均一性が悪くなる
という問題が生じる。
(Problem to be Solved by the Invention) However, in the conventional heating device described above, it is necessary to provide a large number of heating lamps on the outside of the thermal buffer box, which increases the size of the device and increases the manufacturing cost. There is a problem. Further, if the number of heating lamps is reduced in order to avoid such a problem, a problem arises in that a temperature gradient occurs between near and far from the heating lamps, resulting in poor heating uniformity.

本発明は、かかる従来の事情に対処してなされたもので
、従来に較べて装置の大幅な小形軽量化および製造コス
トの低減を図ることができるとともに、加熱均一性の向
上を図ることのできる加熱装置を提供しようとするもの
である。
The present invention has been made in response to such conventional circumstances, and it is possible to significantly reduce the size and weight of the device and reduce the manufacturing cost compared to the prior art, as well as to improve heating uniformity. The present invention aims to provide a heating device.

[発明の構成] (課題を解決するための手段) すなわち本発明は、熱緩衝箱内に被加熱物を設け、前記
熱緩衝箱の外側に設けられた加熱手段により、前記熱緩
衝箱を介して前記被加熱物を加熱するよう構成された加
熱装置において、前記熱緩衝箱の外面に導電層を形成し
、この導電層に通電することにより前記被加熱物を加熱
するよう構成したことを特徴とする。
[Structure of the Invention] (Means for Solving the Problem) That is, the present invention provides an object to be heated within a thermal buffer box, and heats the object through the thermal buffer box by a heating means provided outside the thermal buffer box. In the heating device configured to heat the object to be heated, the heating device is characterized in that a conductive layer is formed on the outer surface of the thermal buffer box, and the object to be heated is heated by passing electricity through the conductive layer. shall be.

(作 用) 本発明の加熱装置では、例えばクロム等の金属を、例え
ば蒸着等の方法により熱緩衝箱の外面に被着させて形成
した導電層に通電することにより、熱緩衝箱内に設けた
被加熱物を加熱するよう構成されている。
(Function) In the heating device of the present invention, a conductive layer formed by depositing a metal such as chromium on the outer surface of the thermal buffer box by a method such as vapor deposition is energized. The device is configured to heat an object to be heated.

したがって、多数の加熱用ランプを用いた従来の加熱装
置に較べて装置の大幅な小形軽量化および製造コストの
低減を図ることができるとともに、加熱均一性の向上を
図ることができる。
Therefore, compared to a conventional heating device using a large number of heating lamps, the device can be made significantly smaller and lighter, and manufacturing costs can be reduced, and heating uniformity can be improved.

(実施例) 以下、本発明を半導体ウェハ等の基板のベーキング処理
を行うベーキング装置に適用した実施例を図面を参照し
て説明する。
(Example) Hereinafter, an example in which the present invention is applied to a baking apparatus for baking a substrate such as a semiconductor wafer will be described with reference to the drawings.

熱緩衝箱1は、熱伝導性が良好でしかも電気絶縁性に優
れた性質を有する物質、例えばアルミナ等から容器状に
形成されており、内部に設けられた載置台2上に被加熱
物例えば半導体ウェハ3を載置し、収容する如く構成さ
れている。なお、上記熱緩衝箱1には、内部に半導体ウ
ェハ3をロード・アンロード可能とする如く、図示しな
い開閉機構が設けられている。
The thermal buffer box 1 is formed into a container shape from a material having good thermal conductivity and excellent electrical insulation properties, such as alumina. It is configured to place and accommodate a semiconductor wafer 3. The thermal buffer box 1 is provided with an opening/closing mechanism (not shown) so that the semiconductor wafer 3 can be loaded and unloaded therein.

また、この熱緩衝箱1の外側には、第2図にも示すよう
に、例えばクロム等の金属を、例えば蒸着等の方法によ
り熱緩衝箱1の外面に被着させて形成した厚さ例えば0
.1−100μm1好ましくは0.5〜2μmの薄膜か
らなる導電層4がほぼ全面に渡って設けられており、こ
の導電層4には、電源5が接続されている。
Further, as shown in FIG. 2, the outside of the thermal buffer box 1 is coated with a metal such as chromium, for example, by a method such as vapor deposition. 0
.. A conductive layer 4 made of a thin film of 1 to 100 μm, preferably 0.5 to 2 μm, is provided over almost the entire surface, and a power source 5 is connected to this conductive layer 4.

さらに、例えば上記熱緩衝箱1内の載置台2の下部等に
は、例えば熱電対等からなる温度81j定用センサ6が
設けられており、この温度1111J定用センサ6の温
度測定信号は、電源5から導電層4に供給する電力を調
節する温度制御器7に、温度制御のためのフィードバッ
ク信号として入力されるよう構成されている。
Further, for example, a temperature 81J constant sensor 6 made of a thermocouple or the like is provided at the lower part of the mounting table 2 in the thermal buffer box 1, and the temperature measurement signal of this temperature 1111J constant sensor 6 is transmitted from the power supply. 5 to a temperature controller 7 that adjusts the power supplied to the conductive layer 4 as a feedback signal for temperature control.

上記構成のこの実施例では、熱緩衝箱1内の載置台2上
に、例えばフォトレジストを塗布した半導体ウェハ3を
設ける。そして、温度制御器7に所望の温度を入力し、
熱緩衝箱1内の温度を所望の温度として、所定時間ベー
キング処理を行う。
In this embodiment with the above configuration, a semiconductor wafer 3 coated with, for example, photoresist is provided on a mounting table 2 within a thermal buffer box 1. Then, input the desired temperature into the temperature controller 7,
The temperature inside the thermal buffer box 1 is set to a desired temperature, and baking treatment is performed for a predetermined period of time.

この時、通電により導電層4で発生したジュール熱は、
熱伝導性の良好な熱緩衝箱1に伝わり、熱緩衝箱1は全
体がほぼ均一な温度となる。したがって、半導体ウェハ
3は、周囲から均一に加熱され、均一にベーキング処理
される。
At this time, the Joule heat generated in the conductive layer 4 by energization is
The heat is transmitted to the thermal buffer box 1, which has good thermal conductivity, and the entire thermal buffer box 1 has a substantially uniform temperature. Therefore, the semiconductor wafer 3 is uniformly heated from the surrounding area and uniformly baked.

すなわち、この実施例では、例えばアルミナ等の熱伝導
性が良好でしかも電気絶縁性に優れた性質を有する物質
から容器状に形成された熱緩衝箱1の外側に、例えばク
ロム等の金属を、例えば蒸着等の方法により被着させて
、薄膜からなる導電層4が設けられており、この導電層
4に通電することにより、熱緩衝箱1内の載置台2上に
設けた半導体ウェハ3等を加熱処理するよう構成されて
いる。したがって、従来のように例えば熱緩衝箱1の周
囲に多数の加熱用ランプ等を設ける必要がなく、装置の
大幅な小形軽量化および製造コストの低減を図ることが
できる。また、導電層4を熱緩衝箱1の外側はぼ全面に
形成することにより、加熱均一性の向上を図ることがで
きる。
That is, in this embodiment, a metal such as chromium is placed on the outside of a thermal buffer box 1 formed into a container shape from a material such as alumina that has good thermal conductivity and excellent electrical insulation properties. For example, a conductive layer 4 made of a thin film is provided by depositing it by a method such as vapor deposition. It is configured to heat-treat. Therefore, it is not necessary to provide a large number of heating lamps around the thermal buffer box 1 as in the conventional case, and it is possible to significantly reduce the size and weight of the device and the manufacturing cost. Further, by forming the conductive layer 4 on almost the entire surface of the outside of the thermal buffer box 1, it is possible to improve heating uniformity.

なお、上記実施例では、導電層4をクロムによって形成
した例について説明したが、本発明は係る実施例に限定
されるものではなく、導電層4は、例えばニッケル、白
金、タンタル、タングステン、スズ、鉄、鉛、アルメル
、ベリリウム、アンチモン、インジウム、クロメル、コ
バルト、ストロンチウム、ロジウム、パラジウム、マグ
ネシウム、モリブデン、リチウム、ルビジウム等の金属
単体、およびカーボンブラック、グラファイト等に代表
される炭素系単体のほか、ニクロム、ステンレス、青銅
、黄銅等の合金、ポリマーグラフトカーボン等のポリマ
ー系複合材料、ケイ化モリブデン等の複合セラミック材
料を含め、導電性があり、通電によって発熱抵抗体すな
わち熱源として機能するものであれば何れでもよく、発
熱温度に応じて適切な材質を選択することによって最適
に使用することができる。
In the above embodiment, an example was explained in which the conductive layer 4 was formed of chromium, but the present invention is not limited to such an embodiment. , metals such as iron, lead, alumel, beryllium, antimony, indium, chromel, cobalt, strontium, rhodium, palladium, magnesium, molybdenum, lithium, rubidium, and carbon-based substances such as carbon black and graphite. , alloys such as nichrome, stainless steel, bronze, and brass, polymer-based composite materials such as polymer-grafted carbon, and composite ceramic materials such as molybdenum silicide, which are electrically conductive and function as heating resistors, that is, heat sources when energized. Any material may be used, and it can be used optimally by selecting an appropriate material depending on the heat generation temperature.

また、導電層4の形成方法は、蒸着に限らず、その材質
によって例えばCVD、スパッター、イオンブレーティ
ング、溶射、爆射等の方法を用いることができる。
Further, the method for forming the conductive layer 4 is not limited to vapor deposition, and methods such as CVD, sputtering, ion blasting, thermal spraying, and explosion spraying can be used depending on the material.

さらに、熱緩衝箱1の材質としては、熱伝導性が良好で
しかも電気絶縁性に優れた性質を合せもつものとして、
アルミナの他に、例えば窒化アルミニウム、ジルコニア
、炭化ケイ素、ダイヤモンド等に代表されるセラミック
スのほか、石英、ルチル等の金属酸化物、高アルミナ煉
瓦、カーボン煉瓦等の煉瓦類も好適である。また、第3
図に示すように、導電性の材料により熱緩衝箱1aを形
成し、この外側に上述したような物質からなる絶縁層1
bを設け、この絶縁層1bの外側に導電層4を形成して
もよい。また、例えば第4図に示すように、導電層4a
を複数層形成し、さらに温度測定用センサー(図示せず
)も複数個分布配置して、分布加熱可能に構成すること
もできる。
Furthermore, the material for the thermal buffer box 1 is one that has good thermal conductivity and excellent electrical insulation properties.
In addition to alumina, ceramics such as aluminum nitride, zirconia, silicon carbide, and diamond, as well as metal oxides such as quartz and rutile, and bricks such as high alumina bricks and carbon bricks are also suitable. Also, the third
As shown in the figure, a thermal buffer box 1a is formed of a conductive material, and an insulating layer 1 made of the above-mentioned material is formed on the outside of the thermal buffer box 1a.
b, and the conductive layer 4 may be formed on the outside of the insulating layer 1b. Further, as shown in FIG. 4, for example, a conductive layer 4a
It is also possible to form a plurality of layers and further arrange a plurality of temperature measurement sensors (not shown) in a distributed manner to enable distributed heating.

[発明の効果] 上述のように、本発明の加熱装置では、従来に較べて装
置の大幅な小形軽量化および製造コストの低減を図るこ
とができるとともに、加熱均一性の向上を図ることがで
きる。
[Effects of the Invention] As described above, in the heating device of the present invention, it is possible to significantly reduce the size and weight of the device and reduce manufacturing costs compared to the conventional device, and it is also possible to improve heating uniformity. .

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の加熱装置の構成を示す図、
第2図は第1図の加熱装置の要部を示す断面図、第3図
および第4図は第1図の加熱装置の変形例の要部を示す
断面図である。 1・・・・・・熱緩衝箱、2・・・・・・載置台、3・
・・・・・半導体ウェハ、4・・・・・・導電層、5・
・・・・・電源、6・・・・・・温度測定用センサ、7
・・・・・・温度制御器。
FIG. 1 is a diagram showing the configuration of a heating device according to an embodiment of the present invention;
FIG. 2 is a sectional view showing a main part of the heating device shown in FIG. 1, and FIGS. 3 and 4 are sectional views showing main parts of a modification of the heating device shown in FIG. 1...Thermal buffer box, 2...Placement table, 3.
... Semiconductor wafer, 4 ... Conductive layer, 5.
...Power supply, 6...Temperature measurement sensor, 7
...Temperature controller.

Claims (1)

【特許請求の範囲】[Claims] (1)熱緩衝箱内に被加熱物を設け、前記熱緩衝箱の外
側に設けられた加熱手段により、前記熱緩衝箱を介して
前記被加熱物を加熱するよう構成された加熱装置におい
て、 前記熱緩衝箱の外面に導電層を形成し、この導電層に通
電することにより前記被加熱物を加熱するよう構成した
ことを特徴とする加熱装置。
(1) In a heating device configured to provide an object to be heated in a thermal buffer box and heat the object via the thermal buffer box by a heating means provided outside the thermal buffer box, A heating device characterized in that a conductive layer is formed on the outer surface of the thermal buffer box, and the object to be heated is heated by supplying electricity to the conductive layer.
JP31361288A 1988-12-12 1988-12-12 Heater Pending JPH02158123A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31361288A JPH02158123A (en) 1988-12-12 1988-12-12 Heater

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31361288A JPH02158123A (en) 1988-12-12 1988-12-12 Heater

Publications (1)

Publication Number Publication Date
JPH02158123A true JPH02158123A (en) 1990-06-18

Family

ID=18043414

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31361288A Pending JPH02158123A (en) 1988-12-12 1988-12-12 Heater

Country Status (1)

Country Link
JP (1) JPH02158123A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0982785A (en) * 1995-09-18 1997-03-28 Nec Corp Semiconductor wafer temperature controller

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0982785A (en) * 1995-09-18 1997-03-28 Nec Corp Semiconductor wafer temperature controller

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