JPH0215019B2 - - Google Patents

Description

[Detailed description of the invention]

The present invention relates to a method of flaw-detecting a test material using ultrasonic echoes and image-measuring a defective portion existing in the test material using various data obtained from the flaw detection. In a conventionally known method, when an ultrasonic pulse is emitted from an ultrasonic probe into a specimen, the pulse travels almost straight inside the specimen as an ultrasonic beam with sharp directivity. If a defect exists inside the material being tested, a portion of the ultrasonic energy is reflected by the defect, and this reflected pulse (echo) reaches the ultrasonic probe and is detected (analog measurement). exchanged into a signal (digitized). The pulses exchanged into electrical signals are amplified within the receiver and displayed on a display device such as a cathode ray tube.The display methods include the A scope display method, the B scope display method, and the C scope display method. Examples include the scope display method. However, with the A scope display method, the size of the reflection source can be estimated from the distance to the reflection source and the amount of reflection, but it can only display the results of one probe point, and changes in the shape cannot be recorded as a record. By displaying the distance to the reflection source and the position of the flaw detection point on the screen in rectangular coordinates, it is easy to intuitively understand the distribution of defects within the cross section of the test material, but the magnitude of the reflection amount cannot be determined. In the C-scope display method, the flaw detection position and defect position are displayed on the rectangular coordinates on the screen, making it easy to intuitively understand the distribution of defects seen from a plane, but the distance to the reflection source, the amount of reflection, etc. They said they didn't know. In other words, each of the display methods described above is only a qualitative measurement method and is extremely insufficient to be called a quantitative method. Even if you try to display the defect image, you must first calculate the area of the defect image displayed on this image, and quantitative data cannot be expected from the C scope image, which is originally a qualitative distribution display. Determining the defect area of the insulated material from the echo receiving distance using the A-scope display method is far from practical, as it takes a great deal of time to judge the results. Moreover, the data given to this type of measurement that has been proposed in the past is based on the assumption that the probe follows the material under test in an ideal state, and that defective echoes are received based on this state. However, if the defect area ratio is measured based on data that is not based on such data, it will be even less practical. SUMMARY OF THE INVENTION Therefore, an object of the present invention is to solve the above-mentioned circumstances and to find, as a result of various studies, that defect images that are sequentially displayed on a B or C scope display method have already been quantitatively measured. Another object of the present invention is to provide an ultrasonic flaw detection measurement method that shows that the probe can successfully follow the test material in an ideal state when drawing this defect image. Specifically, the plane perpendicularity (X, Y) data of the probe with respect to the defective part, the beam path W data and the echo amplitude H at this position are measured on an analog display, and these are processed through an information processing means. When digitizing and sequentially displaying the digital data at each position as the B scope display or C scope display, the settings are set in advance in the display area (X, Y).
The method is characterized in that only the minimum value of the beam path W and the maximum value of the echo amplitude H are selected from among the data detected within the division, and these are graphically displayed. The purpose is to provide an ultrasonic flaw detection measurement method. Hereinafter, one embodiment of the present invention will be described in conjunction with the accompanying drawings. Fig. 1 shows a group of devices configured to suitably carry out the method of the present invention, in which a manual scanning jig is installed on a plate-shaped specimen 1 having a defective part, and a manual scanning jig is installed at the tip of the jig. Attach feeler 3. This jig 2 consists of arms 2b and 2c which are pivotally attached to a base 2a via a rotating part 2a', and each rotating part 2b' and 2c' and the rotating part 2a' of these arms 2b and 2c have a Rotation angle detection potentiometers are provided to interlock with each other, and the position of the probe 3 on the specimen 1 can be determined from the plane orthogonal coordinates based on the rotation angle of these potentiometers and the mechanical dimensions of the jig 2. Analog measurement is performed assuming that it can correspond to (X, Y). 4 receives the defect signal from probe 3
Using a conventional flaw detection device that performs scope display, data on the beam path W and the echo amplitude H are measured and displayed in analog form. 5 is a B/C scope processor with a built-in information processing means, and in order to display the measurement method of the present invention, necessary data of plane orthogonal coordinates (X, Y) indicating the probe position is sent from the jig 2; Beam path W and echo amplitude H data are input from the flaw detection device 4. As shown in FIG. 2, this processor 5 processes three signals inputted from the flaw detection device 4, namely a flaw detection synchronization signal a, an echo signal b, and a date signal c, into a beam path d and an echo signal through a built-in information processing means. digitize each signal of amplitude e (i.e. beam path length W ₁ indicated by signal b,
W ₂ and echo amplitudes H ₁ and H ₂ are converted into signals d and e as digital signals and measured), and the necessary coordinates (X, Y) data from the jig 2 are converted into coordinates (X, Y) via the same information processing means. Y) axis.
For convenience, test material 1 is 100mm in the X-axis direction and 100mm in the y-axis direction.
100mm, Z-axis direction 50mm. Next, each data digitized in this way is
When displaying images on the B and C scope display sections (graphic section) 5a of the CRT (cathode ray tube) installed in the processor 5, the graphics section 5a is displayed in advance based on the coordinate (X, Y) axes as shown in FIG. ,
Sections are formed in X and Y sections, that is, on the multiset surface of 1CELL. For example, set the X-axis to 100mm and the Y-axis to 100mm.
When the scale is set to mm, the graphic section 5a has 1 side.
It becomes a collection surface of 10,000 mm square cells. At this time, if you specify 1CELL5b in the set plane, this 1CELL
5b is the orthogonal coordinate (X, Y) data that is input as the position of the probe on the test material 1 and is converted into coordinates (X, Y) through the information processing means. This is one predetermined section whose address is set in the section 5a. Furthermore, as shown in Fig. 4, this 1CELL 5b is composed of four DOTs 5c represented by two pixels in the horizontal direction and two pixels in the vertical direction, and these four DOTs 5c are connected to the beam path W or the echo. The amplitude H is made to follow five levels (level 0 to level 4) of control data stored in advance in the information processing means on the graphic display section 5a through the operation of a separate data input keyboard 6. The following explanation will be given based on the c-scope display measurement method. For example, in the case of an echo amplitude level H level, the brightness is changed as shown in Table 1 below. Note that the shaded area within the frame indicates a bright spot, and the blank area indicates a dark spot.
displayed on CRT

[Table] Full/Scale is set to 100%. First, according to Table 1, the echo amplitude display gradation ranges from a graphic drawing table when the input echo amplitude H is small (level 0: complete dark spot) to a graphic drawing table when the input echo amplitude H is large. (level 4: complete bright spot). Therefore, even if multiple echo amplitude H signal data are input to the specified 1CELL 5b, the maximum value among them will be selected and displayed in the end. I will cut it even if it comes to me. The above constitutes a quantitative measurement method for the echo amplitude of a defective part based on the C-scope display. , as shown in Figure 5, X axis 3mm, Y axis 4mm
Level 4 is 4 cells to level 1 within ² sections of 12mm
Suppose that the defective part of 3CELL is displayed in the drawing.
So, if you want to find the area of this defective part, 4
×4/4+2×3/4+2×2/4+3×3/4=7.25
mm ² and the defect area ratio is presented as 100×7.25/12≈60%. Also, in the display gradation of the beam path W, brightness is changed as shown in Table 2 below. Note that the shaded area within the frame is a bright spot, and the blank area is a dark spot.
Use as the boundary value for each level range (10 mm intervals). First, according to Table 2

[Table] The beam path display gradation ranges from the graphic drawing representation when the input beam path W is short (level 0: dark spot) to the graphic drawing representation when the input beam path W is long (level 4: bright spot). ) are selected and displayed in order. Therefore, the above specified
Even if data of a plurality of beam path W signals are inputted to 1CELL 5b, the minimum value among them is finally selected and displayed, and any display with a value larger than that is cut off no matter how many data are input thereafter. At the same time, the above constitutes a quantitative measurement method for the beam path of the defective part based on the C-scope display, and here, the same defect measurement display is shown on the graphic display section 5a via the information processing means as described above. , as shown in Figure 6, level 4 is vertically located from the left within the same two 12mm ^blocks , 3mm on the X axis and 4mm on the Y axis.
3CELL, level 3 and level 1 in the center respectively
2CELL by 2CELL and on the right, the defective parts of level 2 and 4CELL are displayed. Therefore, the distance of this defective portion from the surface of the test material 1 is quantitatively calculated based on Table 2. Next, explain this to the graphic section 5a.
Switch to the B scope display method displayed in . First, a cursor 7 is drawn on the defective part shown in FIG. Then, by performing a predetermined keyboard operation, the defective portion, which was displayed as an echo amplitude display in the C scope display method, is displayed on the graphic display section 5a as shown in FIG. 6 so that it is displayed as a beam path display. Let it come out. Note that the cursor 7 is displayed as a cursor 7' without changing its position, and each CELL related to the cursor 7' is selected.
From the left: Level 4, Level 3, Level 2 CELLs
is switched directly to the B scope display direction,
The drawing is displayed as shown in FIG. Therefore, if the scale corresponds to the Z-axis, a given CELL at level 4 indicates a defect at a depth of 40 mm from the surface 1 of the inspected material, similarly, a CELL at level 3 indicates a defect at a depth of 30 mm, and a cell at level 2 indicates a defect at a depth of 40 mm from the surface 1 of the inspected material.
indicates a depth of 20mm. However, at the time of measurement, the level 0 shown in Tables 1 and 2 above shall be met.
Since it is necessary to set the lower upper limit of the range, the minimum value is set as a reference at level 0 in Table 1 to 0%, and the reference is set to the surface of the material to be inspected at level 0 in Table 2. The above is a method for defect display measurement by drawing and displaying the echo amplitude H and beam path W using the C scope display method, and this is confirmed using the B scope display method. It is also possible to obtain confirmation using the C scope display method from flaw detection measurements. As described above, in the ultrasonic flaw detection measurement method of a defective part according to the present invention, the defect image drawn and displayed on the B or C scope is an image that has already been measured quantitatively, and the inspector can easily obtain the quantitative value. Also
If 1CELL is still extremely low compared to the surrounding level and is only displayed at level 1 or 2, the probe operation at that position is incomplete (for example, even though it is a vertical probe, this is the material to be inspected). There is also a possibility that the defect was not contacted vertically (at the top), and the display indicates that it is necessary to perform flaw detection again. Therefore, it is possible to ensure that the flaw detection is complete. .

[Brief explanation of drawings]

FIG. 1 is a schematic explanatory diagram of an embodiment of the ultrasonic flaw detection measurement method according to the present invention, and FIG. 2 shows each signal input from the flaw detection device 4 shown in FIG. 1 to the B/C scope processor 5. The pattern diagram, FIG. 3, is the graphic display section 5a of FIG.
1CELL pattern diagram, FIG. 4 is an explanatory diagram showing the structure of 1CELL, and FIGS. 5 to 7 are pattern diagrams of a defective portion drawn and displayed on the display section 5a. Drawing symbols: 1...Test material, 2...Manual scanning jig, 3...Probe, 4...Flaw detection device,
5... B/C scope processor, 6... Keyboard, 7... Cursor.

Claims (1)

[Claims] 1 Plane orthogonal coordinate (X, Y) data of the probe for the defective part and beam path length W at this position
When measuring the data and echo amplitude H using analog display, digitizing them through an information processing means, and sequentially displaying the digital data at each position as a B scope display or a C scope display, the above display is used in advance. Select only the minimum value for the beam path length W and the maximum value for the echo amplitude H among the data detected within that section for the X and Y sections set in the section, and display these as a drawing table as a graphic display. An ultrasonic flaw detection measurement method characterized by the fact that