JPH02144707U - - Google Patents
Info
- Publication number
- JPH02144707U JPH02144707U JP5366289U JP5366289U JPH02144707U JP H02144707 U JPH02144707 U JP H02144707U JP 5366289 U JP5366289 U JP 5366289U JP 5366289 U JP5366289 U JP 5366289U JP H02144707 U JPH02144707 U JP H02144707U
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- evaluation device
- shows
- focus
- standoff
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000011156 evaluation Methods 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000000691 measurement method Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5366289U JPH02144707U (enExample) | 1989-05-10 | 1989-05-10 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5366289U JPH02144707U (enExample) | 1989-05-10 | 1989-05-10 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02144707U true JPH02144707U (enExample) | 1990-12-07 |
Family
ID=31575042
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5366289U Pending JPH02144707U (enExample) | 1989-05-10 | 1989-05-10 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02144707U (enExample) |
-
1989
- 1989-05-10 JP JP5366289U patent/JPH02144707U/ja active Pending
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