JPH02140383U - - Google Patents
Info
- Publication number
- JPH02140383U JPH02140383U JP4725389U JP4725389U JPH02140383U JP H02140383 U JPH02140383 U JP H02140383U JP 4725389 U JP4725389 U JP 4725389U JP 4725389 U JP4725389 U JP 4725389U JP H02140383 U JPH02140383 U JP H02140383U
- Authority
- JP
- Japan
- Prior art keywords
- input pin
- controller
- read
- write
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4725389U JPH02140383U (ko) | 1989-04-21 | 1989-04-21 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4725389U JPH02140383U (ko) | 1989-04-21 | 1989-04-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02140383U true JPH02140383U (ko) | 1990-11-22 |
Family
ID=31563021
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4725389U Pending JPH02140383U (ko) | 1989-04-21 | 1989-04-21 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02140383U (ko) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6013266A (ja) * | 1983-07-04 | 1985-01-23 | Hitachi Ltd | 診断容易化回路 |
JPS60171735A (ja) * | 1984-02-17 | 1985-09-05 | Hitachi Ltd | 半導体集積回路装置 |
JPS61262856A (ja) * | 1985-05-16 | 1986-11-20 | Nec Corp | 試験回路 |
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1989
- 1989-04-21 JP JP4725389U patent/JPH02140383U/ja active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6013266A (ja) * | 1983-07-04 | 1985-01-23 | Hitachi Ltd | 診断容易化回路 |
JPS60171735A (ja) * | 1984-02-17 | 1985-09-05 | Hitachi Ltd | 半導体集積回路装置 |
JPS61262856A (ja) * | 1985-05-16 | 1986-11-20 | Nec Corp | 試験回路 |