JPH02135875U - - Google Patents
Info
- Publication number
- JPH02135875U JPH02135875U JP4376089U JP4376089U JPH02135875U JP H02135875 U JPH02135875 U JP H02135875U JP 4376089 U JP4376089 U JP 4376089U JP 4376089 U JP4376089 U JP 4376089U JP H02135875 U JPH02135875 U JP H02135875U
- Authority
- JP
- Japan
- Prior art keywords
- liquid crystal
- crystal display
- display panel
- connection terminal
- movable arm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004973 liquid crystal related substance Substances 0.000 claims description 11
- 239000000523 sample Substances 0.000 claims description 4
- 230000007547 defect Effects 0.000 claims description 2
- 238000007689 inspection Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Liquid Crystal (AREA)
Description
第１図は本考案に係る液晶表示パネルの欠陥検
査装置の一実施例を示す平面図、第２図はその正
面図、第３図は同じくその作用説明図、第４図は
バツクライト表示方式の液晶表示装置の構成を示
す平面図、第５図はその断面図である。
１…液晶表示パネル、１ａ…液晶表示部、１ｂ
…接続端子、１１…支持板、１２…バツクライト
光源、１４ａ〜１４ｄ…移動アーム、１６…プロ
ーブカード、１７…プローブ針、１８…液晶駆動
回路。
Fig. 1 is a plan view showing an embodiment of a defect inspection device for liquid crystal display panels according to the present invention, Fig. 2 is a front view thereof, Fig. 3 is an explanatory diagram of its operation, and Fig. 4 is a backlight display method. FIG. 5 is a plan view showing the structure of the liquid crystal display device, and FIG. 5 is a cross-sectional view thereof. 1...Liquid crystal display panel, 1a...Liquid crystal display section, 1b
... connection terminal, 11 ... support plate, 12 ... backlight light source, 14a to 14d ... moving arm, 16 ... probe card, 17 ... probe needle, 18 ... liquid crystal drive circuit.
Claims (1)
動アームと、この移動アームに取付けられ前記液
晶表示パネルの接続端子に対応するプローブ針を
有するプローブカードと、このプローブカードに
接続され前記プローブ針を介して前記液晶表示パ
ネルの接続端子に液晶駆動用の信号を送出する液
晶駆動回路とを具備してなることを特徴とする液
晶表示パネルの欠陥検査装置。 a movable arm that moves in a direction perpendicular to the liquid crystal display panel; a probe card that is attached to the movable arm and has a probe needle that corresponds to a connection terminal of the liquid crystal display panel; 1. A defect inspection device for a liquid crystal display panel, comprising: a liquid crystal drive circuit that sends a liquid crystal drive signal to a connection terminal of the liquid crystal display panel.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989043760U JPH088459Y2 (en) | 1989-04-14 | 1989-04-14 | LCD panel defect inspection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1989043760U JPH088459Y2 (en) | 1989-04-14 | 1989-04-14 | LCD panel defect inspection device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02135875U true JPH02135875U (en) | 1990-11-13 |
| JPH088459Y2 JPH088459Y2 (en) | 1996-03-06 |
Family
ID=31556448
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1989043760U Expired - Fee Related JPH088459Y2 (en) | 1989-04-14 | 1989-04-14 | LCD panel defect inspection device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH088459Y2 (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63182578A (en) * | 1987-01-23 | 1988-07-27 | Matsushita Electric Ind Co Ltd | Inspection device for liquid crystal display device |
| JPS63289590A (en) * | 1987-05-22 | 1988-11-28 | セイコーエプソン株式会社 | Inspection of active matrix panel |
| JPH01143983A (en) * | 1987-11-30 | 1989-06-06 | Teru Kyushu Kk | Probe device |
-
1989
- 1989-04-14 JP JP1989043760U patent/JPH088459Y2/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63182578A (en) * | 1987-01-23 | 1988-07-27 | Matsushita Electric Ind Co Ltd | Inspection device for liquid crystal display device |
| JPS63289590A (en) * | 1987-05-22 | 1988-11-28 | セイコーエプソン株式会社 | Inspection of active matrix panel |
| JPH01143983A (en) * | 1987-11-30 | 1989-06-06 | Teru Kyushu Kk | Probe device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH088459Y2 (en) | 1996-03-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |