JPH02135804U - - Google Patents
Info
- Publication number
- JPH02135804U JPH02135804U JP4528689U JP4528689U JPH02135804U JP H02135804 U JPH02135804 U JP H02135804U JP 4528689 U JP4528689 U JP 4528689U JP 4528689 U JP4528689 U JP 4528689U JP H02135804 U JPH02135804 U JP H02135804U
- Authority
- JP
- Japan
- Prior art keywords
- needle
- diameter
- screw
- explanatory diagram
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 8
- 238000005259 measurement Methods 0.000 description 5
- 238000000691 measurement method Methods 0.000 description 2
- 239000000725 suspension Substances 0.000 description 1
Landscapes
- A Measuring Device Byusing Mechanical Method (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4528689U JPH02135804U (enrdf_load_stackoverflow) | 1989-04-18 | 1989-04-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4528689U JPH02135804U (enrdf_load_stackoverflow) | 1989-04-18 | 1989-04-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02135804U true JPH02135804U (enrdf_load_stackoverflow) | 1990-11-13 |
Family
ID=31559325
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4528689U Pending JPH02135804U (enrdf_load_stackoverflow) | 1989-04-18 | 1989-04-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02135804U (enrdf_load_stackoverflow) |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7304488B2 (en) | 2002-05-23 | 2007-12-04 | Cascade Microtech, Inc. | Shielded probe for high-frequency testing of a device under test |
| US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7417446B2 (en) | 2002-11-13 | 2008-08-26 | Cascade Microtech, Inc. | Probe for combined signals |
| US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
| US7427868B2 (en) | 2003-12-24 | 2008-09-23 | Cascade Microtech, Inc. | Active wafer probe |
| US7443186B2 (en) | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
| US7449899B2 (en) | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
| US7456646B2 (en) | 2000-12-04 | 2008-11-25 | Cascade Microtech, Inc. | Wafer probe |
| US7498829B2 (en) | 2003-05-23 | 2009-03-03 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7504842B2 (en) | 1997-05-28 | 2009-03-17 | Cascade Microtech, Inc. | Probe holder for testing of a test device |
| US7609077B2 (en) | 2006-06-09 | 2009-10-27 | Cascade Microtech, Inc. | Differential signal probe with integral balun |
| US7619419B2 (en) | 2005-06-13 | 2009-11-17 | Cascade Microtech, Inc. | Wideband active-passive differential signal probe |
| JP2010101700A (ja) * | 2008-10-22 | 2010-05-06 | Toyota Motor Corp | ねじ有効径測定用保持治具 |
| JP5846514B1 (ja) * | 2014-12-15 | 2016-01-20 | 茂夫 五十嵐 | 三針ゲージ |
-
1989
- 1989-04-18 JP JP4528689U patent/JPH02135804U/ja active Pending
Cited By (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7504842B2 (en) | 1997-05-28 | 2009-03-17 | Cascade Microtech, Inc. | Probe holder for testing of a test device |
| US7456646B2 (en) | 2000-12-04 | 2008-11-25 | Cascade Microtech, Inc. | Wafer probe |
| US7495461B2 (en) | 2000-12-04 | 2009-02-24 | Cascade Microtech, Inc. | Wafer probe |
| US7436194B2 (en) | 2002-05-23 | 2008-10-14 | Cascade Microtech, Inc. | Shielded probe with low contact resistance for testing a device under test |
| US7304488B2 (en) | 2002-05-23 | 2007-12-04 | Cascade Microtech, Inc. | Shielded probe for high-frequency testing of a device under test |
| US7518387B2 (en) | 2002-05-23 | 2009-04-14 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7482823B2 (en) | 2002-05-23 | 2009-01-27 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7417446B2 (en) | 2002-11-13 | 2008-08-26 | Cascade Microtech, Inc. | Probe for combined signals |
| US7498829B2 (en) | 2003-05-23 | 2009-03-03 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7501842B2 (en) | 2003-05-23 | 2009-03-10 | Cascade Microtech, Inc. | Shielded probe for testing a device under test |
| US7427868B2 (en) | 2003-12-24 | 2008-09-23 | Cascade Microtech, Inc. | Active wafer probe |
| US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
| US8013623B2 (en) | 2004-09-13 | 2011-09-06 | Cascade Microtech, Inc. | Double sided probing structures |
| US7449899B2 (en) | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
| US7619419B2 (en) | 2005-06-13 | 2009-11-17 | Cascade Microtech, Inc. | Wideband active-passive differential signal probe |
| US7609077B2 (en) | 2006-06-09 | 2009-10-27 | Cascade Microtech, Inc. | Differential signal probe with integral balun |
| US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7443186B2 (en) | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
| JP2010101700A (ja) * | 2008-10-22 | 2010-05-06 | Toyota Motor Corp | ねじ有効径測定用保持治具 |
| JP5846514B1 (ja) * | 2014-12-15 | 2016-01-20 | 茂夫 五十嵐 | 三針ゲージ |