JPH02135590A - Ic card - Google Patents

Ic card

Info

Publication number
JPH02135590A
JPH02135590A JP63290711A JP29071188A JPH02135590A JP H02135590 A JPH02135590 A JP H02135590A JP 63290711 A JP63290711 A JP 63290711A JP 29071188 A JP29071188 A JP 29071188A JP H02135590 A JPH02135590 A JP H02135590A
Authority
JP
Japan
Prior art keywords
card
inspection
checking
eeprom
program area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63290711A
Other languages
Japanese (ja)
Inventor
Toshiyuki Matsubara
利之 松原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP63290711A priority Critical patent/JPH02135590A/en
Publication of JPH02135590A publication Critical patent/JPH02135590A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To promptly investigate the checking history data of an IC card by providing the checking history data before the shipment of the IC card at one part of the program area of a nonvolatile memory. CONSTITUTION:The IC card consists of a CPU 1, a ROM 2, a RAM 3, an EEPROM 4 to be the nonvolatile memory, etc. As a checking result, for the IC card to be non-defective and shipped, the checking result data are written from an I/O terminal through an input/output circuit 6 and a bus 5 to the program area of the EEPROM 4, and then the IC card is shipped. After the shipment, when a trouble such as a defective operation is generated, and the investigation of the checking history is required, the program area of the EEPROM 4 where the checking result of the IC card is written is read. Thus, the checking hysteresis can be immediately obtained, and the investigation can be made to promptly advance.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、検査履歴データをＩＣカード内のメモリに格
納したＩＣカードに関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an IC card that stores inspection history data in a memory within the IC card.

〔従来の技術〕[Conventional technology]

第３図は従来のＩＣカードにおける出荷検査工程及びト
ラブルが発生した場合の検査工程を示す作業工程図であ
る。FIG. 3 is a work process diagram showing a shipping inspection process for a conventional IC card and an inspection process when a trouble occurs.

従来、ＩＣカードの検査を行なった後、その検査データ
を検移表に記入する。そして、その検移表は製造者側に
保管され、ＩＣカードの出荷が行われる。Conventionally, after inspecting an IC card, the inspection data is entered in a transfer sheet. Then, the inspection table is stored at the manufacturer's side, and the IC card is shipped.

その後、動作不良等のトラブルが発生し検査履歴の調査
等が必要となった場合、保管されている検移表を検索し
、上ラブルが発生したＩＣカードの検査データを調査す
る。Afterwards, if a problem such as malfunction occurs and inspection history needs to be investigated, the stored inspection and transfer table is searched and the inspection data of the IC card in which the problem occurred is investigated.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

従来、ＩＣカードの出荷検査及び検査工程は以上のよう
に行われていたので、大量生産されているＩＣカードに
おいては、検移表の検索に多大の時間を必要としていた
。このため、そのトラブルに迅速に対処することができ
ないという結果を招いていた。Conventionally, the shipping inspection and inspection process for IC cards have been carried out as described above, and therefore, for IC cards that are mass-produced, a large amount of time is required to search the inspection and transfer table. This has resulted in the inability to promptly deal with the problem.

本発明は上記のような欠点を解消するためになされたも
ので、ＩＣカードの検査履歴データを迅速に調査できる
ＩＣカードを得ることを目的とする。The present invention has been made in order to eliminate the above-mentioned drawbacks, and an object of the present invention is to obtain an IC card that allows quick investigation of inspection history data of the IC card.

〔課題を解決するための手段〕[Means to solve the problem]

本発明に係るＩＣカードは、ＩＣカードの出荷前におけ
る検査履歴データを不揮発性メモリのプログラム領域の
一部に備えている。The IC card according to the present invention includes inspection history data before shipment of the IC card in a part of the program area of the nonvolatile memory.

〔作　用〕[For production]

トラブルが発生した場合、ＩＣカードの不揮発性メモリ
からＩＣカードの出荷前における検査履歴データを読み
取る。When a trouble occurs, inspection history data of the IC card before shipment is read from the non-volatile memory of the IC card.

〔実施例〕〔Example〕

次に、本発明について図面を参照して説明する。 Next, the present invention will be explained with reference to the drawings.

第１図は本発明の一実施例を示すＩＣカードのブロック
図である。図において、１はＩＣカード全体を制御する
ＣＰＵ、２はＲＯＭ、３はＲＡＭ、４は不揮発性メモリ
にあたるＥＥＰＲＯＭ、５はバス、６は入出力回路であ
る。なお、Ｉｌｏは入出力端子、ＲＳＴはリセット端子
、ＣＬＫクロック端子、Ｖ　ＣＣは電源端子、ＧＮＤは
グランド端子である。FIG. 1 is a block diagram of an IC card showing one embodiment of the present invention. In the figure, 1 is a CPU that controls the entire IC card, 2 is a ROM, 3 is a RAM, 4 is an EEPROM which is a non-volatile memory, 5 is a bus, and 6 is an input/output circuit. Note that Ilo is an input/output terminal, RST is a reset terminal, CLK clock terminal, VCC is a power supply terminal, and GND is a ground terminal.

また、第２図は本発明のＩＣカードにおける出荷検査工
程及びトラブルが発生した場合の検査工程を示す作業工
程図である。Further, FIG. 2 is a work process diagram showing a shipping inspection process for the IC card of the present invention and an inspection process in case a trouble occurs.

さて、従来のようにＩＣカードの検査を行なった後、そ
の検査結果を検移表に記入する。次に、検査の結果、良
品となり出荷するＩＣカードに対して、その検査結果の
データを第１図におけるＩ１０端子より入出力回路６及
びバス５を介してＥＥＰＲＯＭ４のプログラム領域に書
き込み、ＩＣカードを出荷する。Now, after inspecting the IC card as in the past, the inspection results are entered in the transfer form. Next, for IC cards that are found to be non-defective as a result of the inspection and shipped, the data of the inspection results is written from the I10 terminal in FIG. 1 to the program area of the EEPROM 4 via the input/output circuit 6 and the bus 5, and the IC card is Ship.

出荷後、動作不良等のトラブルが発生し、検査履歴の調
査が必要となった場合、そのＩＣカードの検査結果が書
き込まれているＥＥＰＲＯＭ４のプログラム領域を読み
出す。これにより、検査履歴を即座に得ることができ、
調査を迅速に進めることができる。After shipment, if a problem such as malfunction occurs and inspection history needs to be investigated, the program area of the EEPROM 4 in which the inspection results of the IC card are written is read out. This allows you to instantly obtain inspection history,
Investigations can proceed quickly.

このように本実施例におけるＩＣカードは、検査履歴を
ＩＣカードのＥＥＰＲＯＭ４に格納しているので、ＩＣ
カードにトラブルが発生した場合でも即座に検査履歴を
調査することができ、このトラブルに対して迅速に対処
することができる。In this way, the IC card in this embodiment stores the inspection history in the EEPROM 4 of the IC card.
Even if a problem occurs with the card, the inspection history can be investigated immediately, and the problem can be quickly dealt with.

なお、上記実施例では、検査履歴をＥＥＰＲＯＭ４のメ
モリ領域に書き込んだものを説明したが、ＲＯＭ２がプ
ログラム可能な不揮発ｉ生メモリであれば、ＲＯＭ２に
検査履歴を書き込んでもよい。In the above embodiment, the test history is written in the memory area of the EEPROM 4, but if the ROM2 is a programmable non-volatile raw memory, the test history may be written in the ROM2.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、ＩＣカードの出荷前にお
ける検査履歴データを不揮発性メモリのプログラム領域
の一部に備えているため、ＩＣカードにトラブルが発生
した場合でも即座に検査履歴を調査することができ、こ
のトラブルに対して迅速に対処することができる。As explained above, the present invention includes inspection history data before shipment of the IC card in a part of the program area of the non-volatile memory, so even if a problem occurs with the IC card, the inspection history can be immediately investigated. This allows you to quickly deal with this problem.

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本発明の一実施例を示すＩＣカードのブロック
図、第２図はその作業工程図、第３図は従来の作業工程
図である。 １・・・ＣＰＵ、４・・・ＥＥＰＲＯＭ、５・・・バス
、６・・・入出力回路。 第１図 代　理　人　大岩増雄 Ｉ／　ＲＳＴ　ＣＬにＶｃｃ　ＧＮＤ 第２図 第３図FIG. 1 is a block diagram of an IC card showing an embodiment of the present invention, FIG. 2 is a working process diagram thereof, and FIG. 3 is a conventional working process diagram. 1...CPU, 4...EEPROM, 5...Bus, 6...I/O circuit. Figure 1: Representative Masuo Oiwa I/RST Vcc GND to CL Figure 2 Figure 3

Claims (1)

【特許請求の範囲】[Claims] 　不揮発性メモリを備えたＩＣカードにおいて、前記Ｉ
Ｃカードの出荷前における検査履歴データを前記不揮発
性メモリのプログラム領域の一部に備えたことを特徴と
するＩＣカード。In an IC card equipped with a non-volatile memory, the I
An IC card characterized in that a part of the program area of the nonvolatile memory is provided with inspection history data of the C card before shipment.
JP63290711A 1988-11-16 1988-11-16 Ic card Pending JPH02135590A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63290711A JPH02135590A (en) 1988-11-16 1988-11-16 Ic card

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63290711A JPH02135590A (en) 1988-11-16 1988-11-16 Ic card

Publications (1)

Publication Number Publication Date
JPH02135590A true JPH02135590A (en) 1990-05-24

Family

ID=17759532

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63290711A Pending JPH02135590A (en) 1988-11-16 1988-11-16 Ic card

Country Status (1)

Country Link
JP (1) JPH02135590A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005309520A (en) * 2004-04-16 2005-11-04 Dainippon Printing Co Ltd Interposer-mounted sheet, wound body thereof, and inspection method therefor
JP2014056588A (en) * 2013-10-23 2014-03-27 Dainippon Printing Co Ltd Ic chip, ic card, and operation method of ic chip

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005309520A (en) * 2004-04-16 2005-11-04 Dainippon Printing Co Ltd Interposer-mounted sheet, wound body thereof, and inspection method therefor
JP2014056588A (en) * 2013-10-23 2014-03-27 Dainippon Printing Co Ltd Ic chip, ic card, and operation method of ic chip

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