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Priority to JP9007688UpriorityCriticalpatent/JPH0212648U/ja
Publication of JPH0212648UpublicationCriticalpatent/JPH0212648U/ja
Dispositif de caracterisation dielectrique d'echantillons de materiau de surface plane ou non plane et application au controle non destructif de l'homogeneite dielectrique desdits echantillons.