JPH02122445U - - Google Patents

Info

Publication number
JPH02122445U
JPH02122445U JP3153289U JP3153289U JPH02122445U JP H02122445 U JPH02122445 U JP H02122445U JP 3153289 U JP3153289 U JP 3153289U JP 3153289 U JP3153289 U JP 3153289U JP H02122445 U JPH02122445 U JP H02122445U
Authority
JP
Japan
Prior art keywords
wafer
semiconductor device
semiconductor
diameter hole
small
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3153289U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3153289U priority Critical patent/JPH02122445U/ja
Publication of JPH02122445U publication Critical patent/JPH02122445U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3153289U 1989-03-20 1989-03-20 Pending JPH02122445U (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3153289U JPH02122445U (enrdf_load_stackoverflow) 1989-03-20 1989-03-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3153289U JPH02122445U (enrdf_load_stackoverflow) 1989-03-20 1989-03-20

Publications (1)

Publication Number Publication Date
JPH02122445U true JPH02122445U (enrdf_load_stackoverflow) 1990-10-08

Family

ID=31257451

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3153289U Pending JPH02122445U (enrdf_load_stackoverflow) 1989-03-20 1989-03-20

Country Status (1)

Country Link
JP (1) JPH02122445U (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009206272A (ja) * 2008-02-27 2009-09-10 Mitsumi Electric Co Ltd 半導体装置の検査方法及びプローバ装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009206272A (ja) * 2008-02-27 2009-09-10 Mitsumi Electric Co Ltd 半導体装置の検査方法及びプローバ装置

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