JPH02120041U - - Google Patents

Info

Publication number
JPH02120041U
JPH02120041U JP3072689U JP3072689U JPH02120041U JP H02120041 U JPH02120041 U JP H02120041U JP 3072689 U JP3072689 U JP 3072689U JP 3072689 U JP3072689 U JP 3072689U JP H02120041 U JPH02120041 U JP H02120041U
Authority
JP
Japan
Prior art keywords
temperature sensor
temperature
built
test
schematic diagram
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3072689U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3072689U priority Critical patent/JPH02120041U/ja
Publication of JPH02120041U publication Critical patent/JPH02120041U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP3072689U 1989-03-15 1989-03-15 Pending JPH02120041U (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3072689U JPH02120041U (ko) 1989-03-15 1989-03-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3072689U JPH02120041U (ko) 1989-03-15 1989-03-15

Publications (1)

Publication Number Publication Date
JPH02120041U true JPH02120041U (ko) 1990-09-27

Family

ID=31256043

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3072689U Pending JPH02120041U (ko) 1989-03-15 1989-03-15

Country Status (1)

Country Link
JP (1) JPH02120041U (ko)

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