JPH02118277U - - Google Patents

Info

Publication number
JPH02118277U
JPH02118277U JP2620089U JP2620089U JPH02118277U JP H02118277 U JPH02118277 U JP H02118277U JP 2620089 U JP2620089 U JP 2620089U JP 2620089 U JP2620089 U JP 2620089U JP H02118277 U JPH02118277 U JP H02118277U
Authority
JP
Japan
Prior art keywords
detection element
test head
position detection
integrated circuit
respect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2620089U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2620089U priority Critical patent/JPH02118277U/ja
Publication of JPH02118277U publication Critical patent/JPH02118277U/ja
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の一実施例を示すIC測定装置
構成図、第2図は同実施例のテストヘツド部正面
図、第3図は同実施例制御部のフローチヤート図
、第4図は本考案の他の実施例を示すIC測定装
置構成図、第5図は同実施例のテストヘツド部正
面図、第6図は同実施例制御部のフローチヤート
図、第7図は従来のIC測定装置構成図、第8図
は同テストヘツド部斜視図である。 1……ICテスタ、2……ICハンドラテスト
ヘツド部、2b,2c,2d……発光窓、3a,
3b……ICハンドラストツパピン、4,5……
IC、4a……IC端子、7……発光素子、8…
…受光素子、9……ブザー、10,11……制御
部、12……表示器。
Fig. 1 is a configuration diagram of an IC measuring device showing an embodiment of the present invention, Fig. 2 is a front view of the test head section of the same embodiment, Fig. 3 is a flowchart of the control section of the embodiment, and Fig. 4 is a diagram of the present invention. A configuration diagram of an IC measuring device showing another embodiment of the invention, FIG. 5 is a front view of the test head section of the same embodiment, FIG. 6 is a flowchart of the control section of the same embodiment, and FIG. 7 is a conventional IC measuring device. The configuration diagram and FIG. 8 are perspective views of the test head section. 1...IC tester, 2...IC handler test head section, 2b, 2c, 2d...light emitting window, 3a,
3b...IC hand last pin, 4,5...
IC, 4a...IC terminal, 7...Light emitting element, 8...
...Light receiving element, 9...Buzzer, 10, 11...Control unit, 12...Display device.

Claims (1)

【実用新案登録請求の範囲】 音声又は光による報知手段と、 テストヘツド部に対する集積回路の位置を判別
する位置検出素子と、 該位置検出素子の検出に基づき上記集積回路位
置が上記テストヘツド部に対してずれている際に
上記報知手段を駆動せしめる制御部と、から構成
されることを特徴とするIC測定装置。
[Scope of Claim for Utility Model Registration] An audio or optical notification means; a position detection element for determining the position of the integrated circuit with respect to the test head; and a position detection element that determines the position of the integrated circuit with respect to the test head based on detection by the position detection element. An IC measuring device comprising: a control section that drives the notification means when there is a deviation.
JP2620089U 1989-03-08 1989-03-08 Pending JPH02118277U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2620089U JPH02118277U (en) 1989-03-08 1989-03-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2620089U JPH02118277U (en) 1989-03-08 1989-03-08

Publications (1)

Publication Number Publication Date
JPH02118277U true JPH02118277U (en) 1990-09-21

Family

ID=31247612

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2620089U Pending JPH02118277U (en) 1989-03-08 1989-03-08

Country Status (1)

Country Link
JP (1) JPH02118277U (en)

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