JPH02115844A - Washing device for photomask - Google Patents
Washing device for photomaskInfo
- Publication number
- JPH02115844A JPH02115844A JP63268089A JP26808988A JPH02115844A JP H02115844 A JPH02115844 A JP H02115844A JP 63268089 A JP63268089 A JP 63268089A JP 26808988 A JP26808988 A JP 26808988A JP H02115844 A JPH02115844 A JP H02115844A
- Authority
- JP
- Japan
- Prior art keywords
- tank
- washing
- water
- masks
- cassette
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005406 washing Methods 0.000 title claims abstract description 36
- 229910021642 ultra pure water Inorganic materials 0.000 claims abstract description 16
- 239000012498 ultrapure water Substances 0.000 claims abstract description 16
- 238000004140 cleaning Methods 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract description 22
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、半導体製造分野において使用するフォトマス
クの洗浄装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a photomask cleaning apparatus used in the field of semiconductor manufacturing.
(従来の技術)
従来のこの種の洗浄装置では、フォトマスク(以下マス
クと略す)を洗浄液、例えば硫酸・過酸化水素水の混合
液等で洗浄後、水洗を行なう。洗浄方法は急速給排水槽
(以後QDR槽と称す)にて。(Prior Art) In a conventional cleaning apparatus of this kind, a photomask (hereinafter abbreviated as mask) is cleaned with a cleaning liquid, for example, a mixture of sulfuric acid and hydrogen peroxide, and then rinsed with water. The cleaning method is a rapid water supply and drainage tank (hereinafter referred to as a QDR tank).
シャワー、給水、排水の動作を所定回数だけ繰り返す。Repeat the shower, water supply, and drain operations a predetermined number of times.
上記水洗終了後は、マスクを次の水洗槽に移動し、適当
な時間静置した後、乾燥していた。After the washing was completed, the mask was moved to the next washing tank and left to stand for an appropriate period of time to dry.
(発明が解′決しようとする課題)
しかしながら、従来の洗浄装置の水洗槽の構成では、最
終水洗状態を時間だけで設定している。(Problems to be Solved by the Invention) However, in the configuration of the rinsing tank of the conventional cleaning device, the final rinsing state is set only by time.
そのため洗浄されるマスクの枚数の寡多にかかわらず水
洗時間は一定で、水洗の不足あるいは超純水の無駄な使
用という結果になってしまう。Therefore, regardless of the number of masks to be washed, the washing time remains constant, resulting in insufficient washing or wasteful use of ultrapure water.
本発明は上記従来の問題点を解決するもの゛で。The present invention solves the above-mentioned conventional problems.
水洗の状態を一定にし、かつ超純水の使用量を節約でき
るマスクの洗浄装置を提供することを目的とする。It is an object of the present invention to provide a mask cleaning device that can keep the water washing condition constant and save the amount of ultrapure water used.
(課題を解決するための手段)
上記目的を達成するために本発明の洗浄装置は、水洗槽
からあふれ出す超純水の比抵抗を測定するためのセンサ
ーと、該センサーの検出信号に基づいて前記超純水が所
定の比抵抗値になるまで洗浄を継続させる制御機能とを
有することを特徴としている。(Means for Solving the Problems) In order to achieve the above object, the cleaning device of the present invention includes a sensor for measuring the specific resistance of ultrapure water overflowing from a washing tank, and a sensor based on a detection signal of the sensor. It is characterized by having a control function to continue cleaning until the ultrapure water reaches a predetermined resistivity value.
(作 用)
この構成により、水洗の終了点を知ることができるため
、洗浄するマスクの枚数が何枚であっても1表面の洗浄
状態を常に一定にすることができる。また、無駄に超純
水を使うこともなくなる。(Function) With this configuration, it is possible to know the end point of water washing, so that the cleaning state of one surface can always be kept constant regardless of the number of masks to be cleaned. Also, there is no need to use ultrapure water unnecessarily.
(実施例)
以下本発明の一実施例について1図面を参照しながら説
明する。第1図は本発明によるマスク洗浄装置の水洗槽
の略図である。第1図において。(Example) An example of the present invention will be described below with reference to one drawing. FIG. 1 is a schematic diagram of a rinsing tank of a mask cleaning device according to the present invention. In FIG.
1はカセット、2はマスク、3は水洗槽、4は底板、5
は給水管、6は比抵抗測定用センサー 7は比抵抗計、
8は制御部、9は制御部から試料移動機構への配線であ
る。以上のように構成された本実施例の水洗槽について
、以下にその動作を説明する。専用カセット1に洗浄す
るマスク2をセットし、水洗槽3内の底板4の上に置く
、水洗槽3は常時超純水で満たされている。また底板4
は下部から水が供給できるように多数の穴がある。1 is a cassette, 2 is a mask, 3 is a washing tank, 4 is a bottom plate, 5
is a water supply pipe, 6 is a resistivity measurement sensor, 7 is a resistivity meter,
8 is a control section, and 9 is a wiring from the control section to the sample moving mechanism. The operation of the washing tank of this embodiment configured as described above will be described below. A mask 2 to be washed is set in a dedicated cassette 1 and placed on a bottom plate 4 in a washing tank 3, which is always filled with ultrapure water. Also, the bottom plate 4
has numerous holes so that water can be supplied from the bottom.
水洗槽3内にカセット1を置くことによって、給水管5
より大量の超純水が槽内に供給され水洗が行なわれる。By placing the cassette 1 in the water washing tank 3, the water supply pipe 5
A larger amount of ultrapure water is supplied into the tank to perform water washing.
第1図のように超純水は水洗槽3よりあふれ出す、この
あふれ出した水の比抵抗をセンサー6で感知し、比抵抗
計7に表示させる。あらかじめ制御部8に比抵抗の値を
設定しておいて。As shown in FIG. 1, ultrapure water overflows from the washing tank 3. The resistivity of this overflowing water is detected by a sensor 6 and displayed on a resistivity meter 7. A specific resistance value is set in the control unit 8 in advance.
設定値以上の比抵抗値になると配線9を介して、水洗の
終了を試料の移動機構に伝達し、次の動作への信号を送
る。非自動装置の場合にはアラーム等で水洗の終了を知
らせる。When the specific resistance value exceeds the set value, the completion of water washing is transmitted to the sample moving mechanism via the wiring 9, and a signal for the next operation is sent. In the case of a non-automatic device, an alarm etc. will be used to notify the end of washing.
第2図に水洗槽の拡大図を示す、センサー6は感知部1
0の周囲をメβシュ状のカバーで覆い、センサーの破損
を防止するとともに、中の検知部に水が充分接触し、測
定中は常時置換が行われるような横進になっている。セ
ンサーは第2図のように水洗槽3の最上部に設け、感知
部のみが、あふれだす純水に常時接するように取り付け
る。更に感知部の中を充分に水が通りぬけるように槽壁
よりも少し離しておく。Fig. 2 shows an enlarged view of the washing tank.The sensor 6 is the sensing part 1.
0 is covered with a mesh-like cover to prevent damage to the sensor, and the sensor is horizontally moved so that water comes into sufficient contact with the detection part inside and is constantly replaced during measurements. The sensor is installed at the top of the washing tank 3, as shown in Figure 2, so that only the sensing part is always in contact with the overflowing pure water. Furthermore, it should be placed a little further away from the tank wall so that water can pass through the sensing part sufficiently.
我々の実験によれば、洗浄液にマスク1枚だけを浸漬し
、しかる後QDR操作を5回繰り返し。According to our experiments, only one mask was immersed in the cleaning solution, and then the QDR operation was repeated five times.
その後、静置による水洗を行った場合は、すでに水洗の
必要がない程度まで比抵抗が上昇しており、すぐに次の
槽へ移動させることができる。しかしマスクの枚数が多
数1例えば5枚になれば、水洗槽中の純水の比抵抗が1
枚の場合と同程度になるためには15〜20分の水洗を
要する。従来の装置では水洗時間は20分以上と決定さ
れるが1本発明のごとき構成の洗浄装置ではマスクの枚
数に応じて自動的に静置水洗時間が決定される。After that, when washing is performed by leaving it still, the resistivity has already increased to such an extent that washing with water is not necessary, and it can be immediately moved to the next tank. However, if the number of masks is large (1, for example 5), the specific resistance of the pure water in the washing tank will be 1.
It takes 15 to 20 minutes of water washing to achieve the same level as with a sheet. In the conventional apparatus, the washing time is determined to be 20 minutes or more, but in the washing apparatus configured as in the present invention, the standing washing time is automatically determined according to the number of masks.
前記の洗浄装置では、QDR槽と本発明による水洗槽は
別であるが、他の実施例では、比抵抗測定用センサーを
QDR槽に取付けている。取付は箇所は、QDR槽にお
いて第2図と同様の場所でよい。QDR槽に取付ければ
、マスク枚数に応じて自動的にQDRの回数が決定され
、静置水洗槽に取付けたのと同様の効果が得られる。In the cleaning device described above, the QDR tank and the washing tank according to the present invention are separate, but in another embodiment, a resistivity measuring sensor is attached to the QDR tank. The installation location may be similar to that shown in Figure 2 in the QDR tank. When attached to a QDR tank, the number of QDRs is automatically determined according to the number of masks, and the same effect as when attached to a stationary rinsing tank can be obtained.
(発明の効果)
以上のように本発明によれば、QDR槽あるいは水洗槽
で超純水の比抵抗を測定することによって、カウンター
でQDRの回数、タイマーで水洗槽における静置時間を
制御することができる。また、洗浄するマスクの枚数に
応じた水洗条件が自動的に得られ、水洗不足、あるいは
超純水の無駄使いを抑制でき、洗浄工程におけるスルー
プットの向上およびコストの削減ができる。さらに、レ
ジスト塗布前の洗浄に用いる際にも、マスクの表面状態
が均一なプレートが安定して得られる。(Effects of the Invention) As described above, according to the present invention, by measuring the specific resistance of ultrapure water in the QDR tank or the washing tank, the number of QDRs is controlled by the counter and the standing time in the washing tank is controlled by the timer. be able to. In addition, water washing conditions can be automatically obtained depending on the number of masks to be washed, and insufficient washing or wasteful use of ultrapure water can be suppressed, thereby improving throughput and reducing costs in the washing process. Furthermore, even when used for cleaning before resist coating, a plate with a uniform mask surface condition can be stably obtained.
第1図は本発明の一実施例における洗浄の水洗槽まわり
の略図で、第2図は水洗槽部の拡大図である。
1 ・・・カセット、 2 ・・・マスク、 3 ・・
・水洗槽、 4 ・・・底板、 5・・・給水管、6・
・・センサー 7・・・比抵抗計、8・・・制御部、
9 ・・・制御部からの配線、IO・・・センサーの感
知部。
特許出願人 松下電子工業株式会社
第
図FIG. 1 is a schematic view of the rinsing tank and its surroundings in an embodiment of the present invention, and FIG. 2 is an enlarged view of the rinsing tank. 1...Cassette, 2...Mask, 3...
・Washing tank, 4...bottom plate, 5...water supply pipe, 6...
...Sensor 7...Resistivity meter, 8...Control unit,
9...Wiring from the control section, IO...sensing section of the sensor. Patent applicant: Matsushita Electronics Co., Ltd.
Claims (1)
センサーと、該センサーの検出信号に基づいて前記超純
水が所定の比抵抗値になるまで洗浄を継続させる制御機
能とを有するフォトマスクの洗浄装置。A photo sensor having a sensor for measuring the resistivity of ultrapure water overflowing from a washing tank, and a control function for continuing washing until the ultrapure water reaches a predetermined resistivity value based on the detection signal of the sensor. Mask cleaning equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63268089A JPH02115844A (en) | 1988-10-26 | 1988-10-26 | Washing device for photomask |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63268089A JPH02115844A (en) | 1988-10-26 | 1988-10-26 | Washing device for photomask |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02115844A true JPH02115844A (en) | 1990-04-27 |
Family
ID=17453735
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63268089A Pending JPH02115844A (en) | 1988-10-26 | 1988-10-26 | Washing device for photomask |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02115844A (en) |
-
1988
- 1988-10-26 JP JP63268089A patent/JPH02115844A/en active Pending
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