JPH02115175U - - Google Patents
Info
- Publication number
- JPH02115175U JPH02115175U JP2465189U JP2465189U JPH02115175U JP H02115175 U JPH02115175 U JP H02115175U JP 2465189 U JP2465189 U JP 2465189U JP 2465189 U JP2465189 U JP 2465189U JP H02115175 U JPH02115175 U JP H02115175U
- Authority
- JP
- Japan
- Prior art keywords
- conductor
- peripheral surface
- outer peripheral
- conductive contact
- insulating layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004020 conductor Substances 0.000 claims description 7
- 230000002093 peripheral effect Effects 0.000 claims 3
- 239000011248 coating agent Substances 0.000 claims 2
- 238000000576 coating method Methods 0.000 claims 2
- 238000007740 vapor deposition Methods 0.000 claims 2
- 239000012212 insulator Substances 0.000 claims 1
- 239000010410 layer Substances 0.000 description 3
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000011253 protective coating Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2465189U JPH02115175U (US20110009641A1-20110113-C00256.png) | 1989-03-03 | 1989-03-03 | |
| US07/424,511 US5004977A (en) | 1988-10-24 | 1989-10-20 | Contact probe |
| US07/939,852 US5291129A (en) | 1988-10-24 | 1992-09-02 | Contact probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2465189U JPH02115175U (US20110009641A1-20110113-C00256.png) | 1989-03-03 | 1989-03-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02115175U true JPH02115175U (US20110009641A1-20110113-C00256.png) | 1990-09-14 |
Family
ID=31244683
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2465189U Pending JPH02115175U (US20110009641A1-20110113-C00256.png) | 1988-10-24 | 1989-03-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02115175U (US20110009641A1-20110113-C00256.png) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012163529A (ja) * | 2011-02-09 | 2012-08-30 | Micronics Japan Co Ltd | 接触子及び検査装置 |
| JP2020165888A (ja) * | 2019-03-29 | 2020-10-08 | 東京特殊電線株式会社 | プローブ針及びプローブユニット |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60158357A (ja) * | 1984-01-30 | 1985-08-19 | Yokowo Mfg Co Ltd | 回路基板等の検査装置 |
| JPS6156981A (ja) * | 1984-08-27 | 1986-03-22 | Nec Corp | 半導体検査装置 |
| JPS61294373A (ja) * | 1985-06-21 | 1986-12-25 | Toshiba Corp | 針式プロ−ビング装置 |
| JPS6360966B2 (US20110009641A1-20110113-C00256.png) * | 1979-08-20 | 1988-11-28 |
-
1989
- 1989-03-03 JP JP2465189U patent/JPH02115175U/ja active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6360966B2 (US20110009641A1-20110113-C00256.png) * | 1979-08-20 | 1988-11-28 | ||
| JPS60158357A (ja) * | 1984-01-30 | 1985-08-19 | Yokowo Mfg Co Ltd | 回路基板等の検査装置 |
| JPS6156981A (ja) * | 1984-08-27 | 1986-03-22 | Nec Corp | 半導体検査装置 |
| JPS61294373A (ja) * | 1985-06-21 | 1986-12-25 | Toshiba Corp | 針式プロ−ビング装置 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012163529A (ja) * | 2011-02-09 | 2012-08-30 | Micronics Japan Co Ltd | 接触子及び検査装置 |
| JP2020165888A (ja) * | 2019-03-29 | 2020-10-08 | 東京特殊電線株式会社 | プローブ針及びプローブユニット |
