JPH02113176U - - Google Patents

Info

Publication number
JPH02113176U
JPH02113176U JP2052989U JP2052989U JPH02113176U JP H02113176 U JPH02113176 U JP H02113176U JP 2052989 U JP2052989 U JP 2052989U JP 2052989 U JP2052989 U JP 2052989U JP H02113176 U JPH02113176 U JP H02113176U
Authority
JP
Japan
Prior art keywords
noise
power supply
voltage variable
variable circuit
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2052989U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2052989U priority Critical patent/JPH02113176U/ja
Publication of JPH02113176U publication Critical patent/JPH02113176U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2052989U 1989-02-25 1989-02-25 Pending JPH02113176U (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2052989U JPH02113176U (de) 1989-02-25 1989-02-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2052989U JPH02113176U (de) 1989-02-25 1989-02-25

Publications (1)

Publication Number Publication Date
JPH02113176U true JPH02113176U (de) 1990-09-11

Family

ID=31236976

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2052989U Pending JPH02113176U (de) 1989-02-25 1989-02-25

Country Status (1)

Country Link
JP (1) JPH02113176U (de)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8410791B2 (en) 2007-03-06 2013-04-02 Nec Corporation Impulse immunity test apparatus
JP2018059746A (ja) * 2016-10-03 2018-04-12 日本電信電話株式会社 イミュニティ試験波形生成装置およびイミュニティ試験波形生成方法
JP2021117156A (ja) * 2020-01-28 2021-08-10 Ｎｅｃプラットフォームズ株式会社 試験システム、試験方法、及びプログラム

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8410791B2 (en) 2007-03-06 2013-04-02 Nec Corporation Impulse immunity test apparatus
JP5177902B2 (ja) * 2007-03-06 2013-04-10 日本電気株式会社 インパルスイミュニティ評価装置
JP2018059746A (ja) * 2016-10-03 2018-04-12 日本電信電話株式会社 イミュニティ試験波形生成装置およびイミュニティ試験波形生成方法
JP2021117156A (ja) * 2020-01-28 2021-08-10 Ｎｅｃプラットフォームズ株式会社 試験システム、試験方法、及びプログラム

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