JPH02103479A - Method for testing withstand voltage against electrostatic discharge - Google Patents

Method for testing withstand voltage against electrostatic discharge

Info

Publication number
JPH02103479A
JPH02103479A JP25774488A JP25774488A JPH02103479A JP H02103479 A JPH02103479 A JP H02103479A JP 25774488 A JP25774488 A JP 25774488A JP 25774488 A JP25774488 A JP 25774488A JP H02103479 A JPH02103479 A JP H02103479A
Authority
JP
Japan
Prior art keywords
voltage
time
waveform
electrostatic discharge
withstand voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25774488A
Other languages
Japanese (ja)
Inventor
Miharu Katsu
勝 美治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP25774488A priority Critical patent/JPH02103479A/en
Publication of JPH02103479A publication Critical patent/JPH02103479A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To shorten the test time and reduce the number of working processes by comparing a time waveform of an applying pulse and a reference waveform at a plurality of points of said waveform by a microcomputer thereby to automatize switching of a switch and a measuring method. CONSTITUTION:A test sample 2 is connected to a measuring terminal of a measuring instrument 1 which measures withstand voltage against electrostatic fault, thereby to detect a waveform by a voltage/time waveform detector 3. In comparing a waveform at a normal time with a waveform at an abnormal time when an impedance is changed to an electrostatic discharge destruction, the time differs to the same voltage. Therefore, if the voltage/time characteristic at an initial value is different from that at the measuring time, it is judged that the sample 2 is broken to the source voltage. The time difference is detected by a microcomputer 4 to determine the withstand voltage against electrostatic discharge, so that a mercury relay switch 6 of the measuring instrument 1 is controlled to stop the measurement. The voltage/time characteristic at the initial value to the source voltage E for each stage is stored in an input/output device 5 so as to be compared with the voltage/time characteristic at the measuring stage.

Description

【発明の詳細な説明】 〔概 要〕 電子部品の静電気放電時における耐圧試験方法に関し、 電圧印加毎にパルス波形により自動的にサンプルの破壊
の有無を判定することを目的とし、静電気放電耐圧測定
器に接続されるサンプルの両端に電圧/時間波形検出器
を接続し、印加パルスの時間波形と基準波形を波形上の
複数点において比較するマイクロコンピュータと、電圧
印加毎の初期測定値を記憶する入出力装置と、サンプル
の破壊を検出した時に上記静電気放電耐圧測定器の動作
を停止する機能と、電源電圧を段階的に制御する機能と
を備え、 該マイクロコンピュータの制御により、電圧印加毎にパ
ルスの時間波形を毎回モニタし、初期値に対する波形の
変化を検出して上記サンプルの破壊の有無を判定するよ
う構成する。
[Detailed Description of the Invention] [Summary] Regarding a withstand voltage test method during electrostatic discharge of electronic components, the purpose of this method is to automatically determine whether or not a sample is destroyed based on a pulse waveform each time a voltage is applied. A voltage/time waveform detector is connected to both ends of the sample connected to the device, and a microcomputer is used to compare the time waveform of the applied pulse and the reference waveform at multiple points on the waveform, and to store the initial measurement value for each voltage application. It is equipped with an input/output device, a function to stop the operation of the electrostatic discharge withstanding voltage measuring device when sample destruction is detected, and a function to control the power supply voltage step by step. The time waveform of the pulse is monitored every time, and a change in the waveform with respect to an initial value is detected to determine whether or not the sample is destroyed.

〔産業上の利用分野〕[Industrial application field]

本発明は、電子部品の静電気放電時における耐圧試験方
法に関する。
TECHNICAL FIELD The present invention relates to a withstand voltage test method for electrostatic discharge of electronic components.

電子部品のサンプルを抜き取って耐圧破壊試験するため
、従来から静電気放電耐圧測定器が使用されている。静
電気放電耐圧測定器はMIL規格に合わせて規定された
測定器で、高圧の電源電圧を電解コンデンサに充電し、
水根リレーのスイッチ動作によりコンデンサの充電電圧
をサンプルに放電して、サンプルの耐圧試験を行ってサ
ンプルの最高非破壊電圧即ち耐圧を算出する。
Electrostatic discharge voltage measuring instruments have traditionally been used to take samples of electronic components and conduct voltage breakdown tests. The electrostatic discharge withstand voltage measuring device is a measuring device specified in accordance with the MIL standard, which charges an electrolytic capacitor with a high power supply voltage.
The charged voltage of the capacitor is discharged to the sample by the switch operation of the water relay, and the sample is subjected to a withstand voltage test to calculate the maximum non-destructive voltage, that is, the withstand voltage of the sample.

静電気放電耐圧はESD耐圧(Electro Sta
ticDischarge 5ensitivity)
と呼ばれ、電子部品の特性を規定するために随時測定す
る必要がある。このため電子部品のサンプルを抜き出し
て操り返し高圧パルスを印加してESD耐圧試験を行っ
ている。本発明は上記ESD耐圧試験を簡単に行う方法
を提供するものである。
Electrostatic discharge withstand voltage is ESD withstand voltage (Electro Sta.
ticDischarge 5 sensitivity)
It is called ``electronic component'' and must be measured from time to time to define the characteristics of electronic components. For this reason, ESD withstand voltage tests are conducted by extracting samples of electronic components and repeatedly applying high-voltage pulses to them. The present invention provides a method for easily performing the ESD withstand voltage test.

〔従来の技術〕[Conventional technology]

従来のESD耐圧試験方法を第5図に示す。図において
、lはESD耐圧測定器、2は試験用のサンプル、8は
電圧/電流特性測定器(ブラウン管)、9は切換スイッ
チを示す。
A conventional ESD withstand voltage test method is shown in FIG. In the figure, 1 is an ESD withstand voltage measuring device, 2 is a test sample, 8 is a voltage/current characteristic measuring device (braun tube), and 9 is a changeover switch.

ESD耐圧耐圧測定器布販のMIL規格により規定され
た測定器で、可変高圧電源Eと電解コンデンサCと水根
リレースイッチSと負荷回路用抵抗Rとから構成され、
連続的に変えられる高圧電源IEで電解コンデンサCを
充電し、水銀リレースイッチSを瞬間的に測定回数オン
オフすることにより、電解コンデンサCに充電された高
電圧を試験用の負荷サンプル2に印加する。
ESD withstand voltage withstand voltage measuring device This is a measuring device specified by the MIL standard, which is commercially available, and consists of a variable high voltage power supply E, an electrolytic capacitor C, a water root relay switch S, and a load circuit resistor R.
The high voltage charged in the electrolytic capacitor C is applied to the test load sample 2 by charging the electrolytic capacitor C with a continuously variable high voltage power supply IE and momentarily turning the mercury relay switch S on and off for the number of measurements. .

負荷回路には抵抗Rと直列に切換スイッチ9を設け、5
回印加終了後に手動切換によりサンプル2を電圧/電流
特性測定器8に接続換えする。電圧/電流特性測定器8
は(ブラウン管等の)カーブトレーサで、入力電圧に対
する出力電流の特性を表示する。第6図に電圧/電流検
出特性の一例を示す。図はサンプルとしてトランジスタ
或いはダイオード、IC等を使用した場合の一例でカー
ブ特性を表す。このカーブはサンプル2が非破壊ならば
、印加前の実線と同じ軌跡をたどる。段階的に電源電圧
Eを変えてゆきテストを繰り返し、このカーブが点線の
ように電圧印加前と変った時このサンプル2は破壊した
と判定する。例えば、点線■はショート破壊、点線■は
劣化破壊、点線■はオープン破壊した時の状態を示す。
A changeover switch 9 is provided in the load circuit in series with the resistor R.
After the application is completed, the sample 2 is connected to the voltage/current characteristic measuring device 8 by manual switching. Voltage/current characteristics measuring instrument 8
is a curve tracer (such as a cathode ray tube) that displays the characteristics of output current with respect to input voltage. FIG. 6 shows an example of voltage/current detection characteristics. The figure shows an example of curve characteristics when using a transistor, diode, IC, etc. as a sample. If sample 2 is not destroyed, this curve will follow the same trajectory as the solid line before application. The test is repeated by changing the power supply voltage E step by step, and when this curve changes from before voltage application as indicated by the dotted line, it is determined that sample 2 has been destroyed. For example, the dotted line ■ indicates short-circuit failure, the dotted line ■ indicates deterioration failure, and the dotted line ■ indicates open failure.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

したがって従来のESD耐圧測定方法では、電′a電圧
Eの切換えも、切換スイッチ9の切換えも手動で行い、
電圧/電流特性測定器8による判定も手動で行うため、
作業工数と時間がかかっていた。
Therefore, in the conventional ESD withstand voltage measurement method, both the voltage E and the changeover switch 9 are manually changed.
Since the judgment using the voltage/current characteristic measuring device 8 is also performed manually,
It took a lot of work and time.

本発明はマイクロコンピュータの使用により、スイッチ
切換え及び測定方法を自動化して試験時間の短縮、作業
工数の削減等を図ることを目的とする。
An object of the present invention is to automate switch switching and measurement methods by using a microcomputer, thereby shortening test time and reducing the number of work steps.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の静電気放電耐圧の試験方法を第1図に示す。図
において、1は静電気放電耐圧(E S D)測定器、
2は該静電気放電耐圧測定器の測定端子に接続される試
験用サンプル、3は該試験用サンプルの両端に接続され
る電圧/時間波形検出器、4は印加パルスの時間波形と
基準波形を波形上の複数点において比較するマイクロコ
ンピュータ、5は電圧印加毎の初期測定値を記憶する入
出力装置、6はサンプルの破壊を検出した時に上記静電
気放電耐圧測定器lの水銀リレースイッチSを制御する
機能、7は上記静電気放電耐圧測定器1の電源電圧Eを
段階的に制御する機能を示す。
The method for testing electrostatic discharge withstand voltage according to the present invention is shown in FIG. In the figure, 1 is an electrostatic discharge voltage (ESD) measuring device;
2 is a test sample connected to the measurement terminal of the electrostatic discharge withstand voltage measuring device, 3 is a voltage/time waveform detector connected to both ends of the test sample, and 4 is a waveform of the time waveform of the applied pulse and the reference waveform. 5 is an input/output device for storing the initial measurement value for each voltage application; 6 is for controlling the mercury relay switch S of the electrostatic discharge voltage measuring device 1 when destruction of the sample is detected; Function 7 indicates a function of controlling the power supply voltage E of the electrostatic discharge withstand voltage measuring device 1 in stages.

上記静電気放電耐圧測定器1の水銀リレースイッチSを
制御する機能6及び電源電圧Eを段階的に制御する機能
7は、マイクロコンピュータ4の制御により自動的に行
われる。また電圧/時間波形検出器3はオッシロスコー
プやブラウン管でESD破壊を検出する装置である。な
お入出力装置5は波形を入れて置くためのデータベース
で、ROM、IC又は磁気ディスク等よりなる。
The function 6 of controlling the mercury relay switch S and the function 7 of controlling the power supply voltage E in stages of the electrostatic discharge withstand voltage measuring device 1 are automatically performed under the control of the microcomputer 4. Further, the voltage/time waveform detector 3 is a device that detects ESD damage using an oscilloscope or a cathode ray tube. The input/output device 5 is a database for storing waveforms, and is composed of a ROM, an IC, a magnetic disk, or the like.

〔作用〕[Effect]

試験用サンプル2を静電気放電耐圧測定器1の測定端子
に接続し、電圧/時間波形検出器3で波形を検出する。
The test sample 2 is connected to the measurement terminal of the electrostatic discharge withstand voltage measuring device 1, and the voltage/time waveform detector 3 detects the waveform.

第2図に電圧/時間波形検出器3の波形のモニタの一例
を示す。図において、■は正常な波形、■はESD破壊
によりインピーダンスが変化した波形とすると、■の正
常時の波形と■の異常時の波形とを比較した時、同一電
圧に対する時間が異なってくる。したがって初期値にお
ける電圧/時間特性と測定時における電圧/時間特性が
異なれば、サンプル2はその電源電圧に対して破壊され
たと判定される。この時間差をマイクロコンピュータ4
で検出してESD耐圧を判定し、静電気放電耐圧測定器
1の水銀リレースイッチ6を制御して測定を停止する。
FIG. 2 shows an example of the waveform monitor of the voltage/time waveform detector 3. In the figure, if ■ is a normal waveform and ■ is a waveform whose impedance has changed due to ESD destruction, when comparing the normal waveform (■) and the abnormal waveform (■), the times for the same voltage will be different. Therefore, if the voltage/time characteristic at the initial value is different from the voltage/time characteristic at the time of measurement, it is determined that sample 2 is destroyed at that power supply voltage. This time difference is calculated by the microcomputer 4.
The electrostatic discharge withstand voltage is detected and the ESD withstand voltage is determined, and the mercury relay switch 6 of the electrostatic discharge withstand voltage measuring device 1 is controlled to stop the measurement.

なお各段階毎の電源電圧已に対する初期値の電圧/時間
特性は入出力装置5に記憶しておき、測定段階における
電圧/時間特性と比較する。
Note that the voltage/time characteristics of the initial values for the power supply voltage at each stage are stored in the input/output device 5, and compared with the voltage/time characteristics at the measurement stage.

〔実施例〕〔Example〕

本発明の実施例を第1図の原理構成図により説明する。 An embodiment of the present invention will be described with reference to the principle configuration diagram shown in FIG.

図において、電?R電圧Eはマイクロコンピュータ4か
らの制御機能7により段階的に制御される。電源電圧は
トランスにより100Vの電源電圧を昇圧し変圧して送
出する。水銀リレースイッチSはマイクロコンピュータ
4からの制御機能6により、自動的に電解コンデンサC
の充電及び放電を順次行う。
In the figure, electricity? The R voltage E is controlled in stages by a control function 7 from the microcomputer 4. The power supply voltage is 100V boosted and transformed by a transformer and sent out. The mercury relay switch S is automatically switched to the electrolytic capacitor C by the control function 6 from the microcomputer 4.
Charging and discharging are performed sequentially.

次に電圧/時間波形検出器3における電圧と時間の測定
は、電圧に4段階の判定基準を設けて時間測定を行う。
Next, the voltage/time waveform detector 3 measures voltage and time by setting four criteria for voltage.

第3図に印加電圧の判定基準点の実施例を示す。図にお
いて、電源電圧Vpを100OVとし、判定基準点を1
00χ及び立上がりと立下がりの各々の90χ、5(1
%、10χの合計7点として基準電圧νpに対する時間
Tpを求めると、電圧ν、。、 vso、 v、。
FIG. 3 shows an example of reference points for determining applied voltage. In the figure, the power supply voltage Vp is 100OV, and the judgment reference point is 1
00χ and each rising and falling 90χ, 5(1
%, 10χ, total 7 points, and calculate the time Tp for the reference voltage νp, the voltage ν,. , vso, v,.

に対する時間と初期値における電圧/時間特性と上記7
点で比較して、電圧/時間特性の変化を検出する。
Voltage/time characteristics at time and initial value and above 7
By comparing points, changes in voltage/time characteristics are detected.

次に実施例におけるマイクロコンピュータの制御フロー
チャートを第4図に示す。図において、(11電源電圧
Eを段階的制御機能7により電圧Vpを設定する。
Next, FIG. 4 shows a control flowchart of the microcomputer in this embodiment. In the figure, (11 power supply voltage E is set to voltage Vp by stepwise control function 7).

(2)水銀スイッチ制御機能6により静電気放電耐圧試
験のテストをスタートする。
(2) Start the electrostatic discharge withstand voltage test using the mercury switch control function 6.

(3)  テスト電圧Vpに対する測定値Tp’  (
7点)を検出し、予め入出力装置6に格納された初期値
’rp(7点)と比較する。
(3) Measured value Tp' (
7 points) is detected and compared with the initial value 'rp (7 points) stored in the input/output device 6 in advance.

(4)測定結果が誤差内または同一であればテストを続
行する。(上記テストを5回繰り返す)(5)テスト0
にであれば、次の電圧vp1を設定してスタートする。
(4) If the measurement results are within the error or the same, continue the test. (Repeat the above test 5 times) (5) Test 0
If so, the next voltage vp1 is set and started.

(6)前記動作を繰り返すこ、とにより、順次高い電源
電圧を設定してテストを行う。
(6) By repeating the above operation, a test is performed by sequentially setting higher power supply voltages.

(7)設定された初期値7p1 と測定時の測定結果7
p1″が異なる、或いはその他の判定基準点において比
較して規定範囲外であると判定すれば一つ前の設定値ν
pを静電気放電耐圧と判定する。
(7) Set initial value 7p1 and measurement result 7 during measurement
p1'' is different, or if it is determined that it is outside the specified range by comparison at other determination reference points, the previous set value ν
Determine p as the electrostatic discharge withstand voltage.

(8)水銀スイ・ソチ制御機能6により静電気放電耐圧
試験のテストをストップする。
(8) Stop the electrostatic discharge withstand voltage test using the mercury switch control function 6.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、電子部品のESD耐圧試験の際、従来
のようにスイッチを切換えたり、測定装置により部品の
特性を直接測定する必要がなく、作業工数の削減及び時
間短縮を図れる。また、電流に敏感な種類のサンプルの
場合でも、特性確認のためにサンプルに電流を通す必要
がな(、サンプルを誤って劣化させる危険性がなく、正
確な耐圧値を測定できる。
According to the present invention, when performing an ESD withstand voltage test on an electronic component, there is no need to change a switch or directly measure the characteristics of the component using a measuring device, unlike in the past, and the number of work steps and time can be reduced. Furthermore, even in the case of samples that are sensitive to current, there is no need to pass current through the sample to confirm the characteristics (there is no risk of accidentally degrading the sample, and accurate withstand voltage values can be measured).

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の原理構成図、第2図は電圧/時間波形
検出特性図、第3図は実施例の印加電圧判定基準点、第
4図は実施例の制御フローチャート、第5図は従来例の
測定構成図、第6図は電圧/電流特性検出測定図を示す
。 図において、1は静電気放電耐圧測定器、2は試験用サ
ンプル、3は電圧/時間波形検出器、4はマイクロコン
ピュータ、5は入出力装置、6は水銀リレースイッチ制
御機能、7は電源電圧制御機能、8は電圧/電流特性測
定器、9は切換スイッチを示す。なお(1)〜(8)は
制御フローチャートのステップ番号を示す。 実施例の制御フローチャート 第 図
Fig. 1 is a diagram of the principle configuration of the present invention, Fig. 2 is a voltage/time waveform detection characteristic diagram, Fig. 3 is an applied voltage judgment reference point of the embodiment, Fig. 4 is a control flowchart of the embodiment, and Fig. 5 is a diagram of the voltage/time waveform detection characteristics. FIG. 6 shows a measurement configuration diagram of a conventional example, and a voltage/current characteristic detection measurement diagram. In the figure, 1 is an electrostatic discharge withstand voltage measuring device, 2 is a test sample, 3 is a voltage/time waveform detector, 4 is a microcomputer, 5 is an input/output device, 6 is a mercury relay switch control function, and 7 is a power supply voltage control 8 is a voltage/current characteristic measuring device, and 9 is a changeover switch. Note that (1) to (8) indicate step numbers of the control flowchart. Control flowchart of the embodiment

Claims (1)

【特許請求の範囲】 電子部品の静電気放電時における耐圧試験方法において
、 静電気放電耐圧測定器(1)に接続される試験用サンプ
ル(2)の両端に電圧/時間波形検出器(3)を接続し
、印加パルスの時間波形と基準波形を波形上の複数点に
おいて比較するマイクロコンピュータ(4)と、電圧印
加毎の初期測定値を記憶する入出力装置(5)と、サン
プルの破壊を検出した時に上記静電気放電耐圧測定器(
1)の動作を停止する機能(6)と、、電源電圧を段階
的に制御する機能(7)とを備え、 該マイクロコンピュータ(4)の制御により、電圧印加
毎にパルスの時間波形を毎回モニタし、初期値に対する
波形の変化を検出して上記サンプルの破壊の有無を判定
することを特徴とする静電気放電耐圧の試験方法。
[Claims] A voltage/time waveform detector (3) is connected to both ends of a test sample (2) connected to an electrostatic discharge voltage measuring device (1) in a voltage test method for electrostatic discharge of electronic components. A microcomputer (4) that compares the time waveform of the applied pulse with the reference waveform at multiple points on the waveform, an input/output device (5) that stores the initial measurement value for each voltage application, and a device that detects sample destruction. Sometimes the above electrostatic discharge withstand voltage measuring device (
It is equipped with a function (6) to stop the operation of 1) and a function (7) to control the power supply voltage in stages, and under the control of the microcomputer (4), the time waveform of the pulse is changed every time the voltage is applied. 1. A test method for electrostatic discharge withstand voltage, which comprises monitoring and detecting a change in waveform with respect to an initial value to determine whether or not the sample is destroyed.
JP25774488A 1988-10-13 1988-10-13 Method for testing withstand voltage against electrostatic discharge Pending JPH02103479A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25774488A JPH02103479A (en) 1988-10-13 1988-10-13 Method for testing withstand voltage against electrostatic discharge

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25774488A JPH02103479A (en) 1988-10-13 1988-10-13 Method for testing withstand voltage against electrostatic discharge

Publications (1)

Publication Number Publication Date
JPH02103479A true JPH02103479A (en) 1990-04-16

Family

ID=17310499

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25774488A Pending JPH02103479A (en) 1988-10-13 1988-10-13 Method for testing withstand voltage against electrostatic discharge

Country Status (1)

Country Link
JP (1) JPH02103479A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030042920A (en) * 2001-11-26 2003-06-02 현대자동차주식회사 Automobile Door Hinge Pin
JP2007239838A (en) * 2006-03-07 2007-09-20 Oiles Ind Co Ltd Cylindrical bearing bushing with collar, its manufacturing method, and hinge structure using the cylindrical bearing bushing with collar
JP2008007984A (en) * 2006-06-28 2008-01-17 Sando Kogyosho:Kk All-purpose hinge
JP2008014058A (en) * 2006-07-07 2008-01-24 Sando Kogyosho:Kk Torque adjustable hinge
JP2009171293A (en) * 2008-01-17 2009-07-30 Nuflare Technology Inc Standard pulse generator and standard pulse generating method
JP2016138820A (en) * 2015-01-28 2016-08-04 三菱電機株式会社 Static electricity breakdown voltage test method and static electricity breakdown voltage test device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20030042920A (en) * 2001-11-26 2003-06-02 현대자동차주식회사 Automobile Door Hinge Pin
JP2007239838A (en) * 2006-03-07 2007-09-20 Oiles Ind Co Ltd Cylindrical bearing bushing with collar, its manufacturing method, and hinge structure using the cylindrical bearing bushing with collar
JP2008007984A (en) * 2006-06-28 2008-01-17 Sando Kogyosho:Kk All-purpose hinge
JP2008014058A (en) * 2006-07-07 2008-01-24 Sando Kogyosho:Kk Torque adjustable hinge
JP2009171293A (en) * 2008-01-17 2009-07-30 Nuflare Technology Inc Standard pulse generator and standard pulse generating method
JP2016138820A (en) * 2015-01-28 2016-08-04 三菱電機株式会社 Static electricity breakdown voltage test method and static electricity breakdown voltage test device

Similar Documents

Publication Publication Date Title
EP1046923B1 (en) Apparatus for inspecting electric component for inverter circuit
US6356086B1 (en) Method and apparatus for the in-circuit testing of a capacitor
EP0990150A1 (en) Detecting a bad cell in a storage battery
JP3108455B2 (en) How to measure breakdown voltage
JPH02103479A (en) Method for testing withstand voltage against electrostatic discharge
US3983476A (en) Defibrillator testing device
US4267503A (en) Method and instrument for testing the operating characteristics of a capacitor
JPS6255571A (en) Automatic insulating characteristic analyzer
US10944259B2 (en) System and method for over voltage protection in both positive and negative polarities
JP4789717B2 (en) Method for measuring characteristic impedance of electrostatic discharge protection circuit and apparatus for realizing the measurement.
JP2529086B2 (en) Pressure test equipment
RU2122215C1 (en) Device testing quality of electric insulation
JP2962654B2 (en) Inspection method for electrolytic capacitors
JP4259692B2 (en) Circuit board inspection equipment
JP2017219352A (en) Power supply device for insulation inspection
JP3549160B1 (en) LED degradation inspection method and device
US3453539A (en) Apparatus for sequentially monitoring electrical voltages including a capacitor transfer system and marginal prediction means
JP6621891B1 (en) DC voltage tester, DC voltage test method, and DC voltage test program
JPH01131467A (en) Discrimination device for external noise in partial discharging measurement
JPH04223283A (en) Electrostatic breakdown voltage tester
SU1698841A1 (en) Method of nondestructive quality control of electrical products insulation
JP2002250752A (en) Method and apparatus for measurement of surge-current resistant amount of element
JPH05281287A (en) Interlayer withstand voltage testing device
JPS63275968A (en) Testing apparatus of semiconductor device
JPH0743411B2 (en) Integrated circuit test equipment