JPH02102464A - Electric field input stop mechanism for probe for surface potential measurement - Google Patents
Electric field input stop mechanism for probe for surface potential measurementInfo
- Publication number
- JPH02102464A JPH02102464A JP25540388A JP25540388A JPH02102464A JP H02102464 A JPH02102464 A JP H02102464A JP 25540388 A JP25540388 A JP 25540388A JP 25540388 A JP25540388 A JP 25540388A JP H02102464 A JPH02102464 A JP H02102464A
- Authority
- JP
- Japan
- Prior art keywords
- electric field
- detection
- probe
- surface potential
- potential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005684 electric field Effects 0.000 title claims abstract description 24
- 239000000523 sample Substances 0.000 title claims abstract description 19
- 238000005259 measurement Methods 0.000 title claims abstract description 7
- 238000001514 detection method Methods 0.000 claims abstract description 32
- 230000000694 effects Effects 0.000 description 2
- 210000000056 organ Anatomy 0.000 description 1
Landscapes
- Measurement Of Current Or Voltage (AREA)
- Control Or Security For Electrophotography (AREA)
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野）
物体、例えば複写機用感光ドラムの表面に分布する電位
の測定は、一般に表面電位計を用いて行なうが、本発明
はこの表面電位計のプローブに設ける電界入力孔を、小
さく調節できる機構に関するものである。Detailed Description of the Invention (Industrial Application Field) The potential distributed on the surface of an object, such as a photosensitive drum for a copying machine, is generally measured using a surface electrometer. This invention relates to a mechanism that can adjust the size of an electric field input hole provided in a probe.
（従来の技術）
第４図に示すように、表面電位計ａに用いる従来のプロ
ーブｂは、一般に導電性器体Ｃの内部に表面電位センサ
ｄを、前置増幅器ｅ等と共に設置し、センサｄの検知部
ｆに対向する器体Ｃの部分には電界人力孔ｇを設けてい
る。(Prior Art) As shown in FIG. 4, a conventional probe b used for a surface potential meter a generally has a surface potential sensor d installed inside a conductive body C together with a preamplifier e, etc. An electric field manual hole g is provided in the part of the container C facing the detection part f.
そして、実際の測定に際しては、まず表面電位が分布す
る測定対象物りの検知対象部ｉに、プローブｂを近づけ
て、電界人力孔ｇをこの検知対象部ｉに対向させる。こ
うすると、器体Ｃは導電性なので、たとえ測定対象物り
の表面に電位が広く分布していても、電界人力孔ｇには
検知対象部ｊにのみ分布する電位に基づく電界ｊだけが
、プロ−ブｂの内部に入り込み、センサｄの検知部ｆに
至るので、したがって検知対象部ｊにおける電位を検知
することができる。In actual measurement, first, the probe b is brought close to the detection target part i of the object to be measured, where the surface potential is distributed, and the electric field manual hole g is made to face the detection target part i. In this way, since the body C is conductive, even if the potential is widely distributed on the surface of the object to be measured, only the electric field j based on the potential distributed only on the detection target part j will be present in the electric field hole g. Since it enters the inside of the probe b and reaches the detection section f of the sensor d, the potential at the detection target section j can be detected.
（発明が解決しようとする問題点）
前記のように、従来のプローブｂにおいては、器体Ｃに
単に電界人力孔ｇを設けただけなので、この人力孔ｇの
大きさは容易に変えることができず、したがってこのよ
うなプローブｂでは、測定対象物りの検知対象部ｉも入
力孔ｇに対応して、その大きさは、固定となる。このた
め、検知対象部ｉをより微小な範囲に絞りたい場合には
、このように小さな検知対象部ｉに対応する小さな入力
ＪＬｇを有するプローブｂを別途用意しなければならず
、したがってコストがかかるという間Ｕ点がある。(Problems to be Solved by the Invention) As mentioned above, in the conventional probe b, the electric field manual hole g is simply provided in the vessel C, so the size of this manual hole g cannot be easily changed. Therefore, in such a probe b, the detection target part i of the object to be measured also corresponds to the input hole g, and its size is fixed. Therefore, if it is desired to narrow down the detection target part i to a smaller range, it is necessary to separately prepare a probe b having a small input JLg corresponding to such a small detection target part i, which increases the cost. There is a point U in between.
本発明は、このような問題点を解決することを目的とす
るものである。The present invention aims to solve these problems.
（問題点を解決するための手段）
本発明の構成を実施例に対応する第１図〜第３図に基づ
いて説明すると、本発明の機構は、導電性器体１の内部
に表面電位センサ２を設置し、このセンサ２の検知部３
に対向する器体１の部分に電界人力孔４を設けた表面電
位測定用プローブ５において、電界人力孔４よりも小さ
な開口部６を有する導電性じゃへい板７を、この開口部
６が電界人力孔４を狭ばめるように、器体１に着脱自在
に構成したものである。(Means for Solving the Problems) The structure of the present invention will be explained based on FIGS. 1 to 3 corresponding to embodiments. is installed, and the detection part 3 of this sensor 2
In the probe 5 for surface potential measurement, which has an electric field power hole 4 in the part of the vessel body 1 facing the electric field power hole 4, a conductive baffle plate 7 having an opening 6 smaller than the electric field power hole 4 is connected to the conductive baffle plate 7. It is configured to be detachably attached to the container body 1 so as to narrow the manual hole 4.
（作用および実施例） 本発明の作用を実施例と共に説明する。(Actions and Examples) The operation of the present invention will be explained with reference to examples.
第２図に示すように、プローブ５の器体１に設けた電界
人力孔４の大きさに対して充分小さな検知対象部８ごと
に測定対象物９の表面電位分布を計測したい場合には、
まずこの検知対象部８と同程度の大きさの開口部６を導
電性じゃへい板７に開けておき、これを第１図に示すよ
うに、開口部６が電界人力孔４を狭ばめるように、入力
孔４の前方からねじ１０等で器体１に取り付けて、電気
的にも器体１に短絡した状態とする。As shown in FIG. 2, when it is desired to measure the surface potential distribution of the object to be measured 9 for each detection object part 8 which is sufficiently small compared to the size of the electric field power hole 4 provided in the body 1 of the probe 5,
First, an opening 6 of the same size as the detection target part 8 is made in the conductive shroud 7, and as shown in FIG. It is attached to the container body 1 from the front of the input hole 4 with screws 10 etc. so that it is electrically short-circuited to the container body 1.
このような状態にしたプローブ５を、測定対象物９に近
づけて、その表面に開口部６を対向させると、表面に分
布する電位に基づく電界１４のうち、プローブ５内のセ
ンサ２の検知部３に至るものは、開口部６に対応する小
さな検知対象部８にのみ分布する電位に基づくものだけ
で、検知対象部８以外の所に分布する電位に基づく電界
は、導電性じゃへい板７にさえぎられる等して、センサ
２の検知部３に至ることはなく、したがって検知対象部
８の電位検知への影響を除去することができる。When the probe 5 in such a state is brought close to the object to be measured 9 and the opening 6 is opposed to the surface thereof, the detection part of the sensor 2 in the probe 5 will be absorbed by the electric field 14 based on the potential distributed on the surface. 3 is based on the electric potential distributed only in the small detection target part 8 corresponding to the opening 6, and the electric field based on the potential distributed in other parts than the detection target part 8 The light does not reach the detection section 3 of the sensor 2 due to obstruction, etc., and therefore, the influence on potential detection of the detection target section 8 can be eliminated.
このように、しやへい板７を取り付けたプローブ５にお
いては、その検知対象部８の大きさは開口部６の大きさ
に対応するので、開口部６の大きさを電界人力孔４の大
きさよりも小さな範囲でいろいろ変えれば、これに対応
して検知対象部８の大きさも変えることができる。In this way, in the probe 5 to which the flexible plate 7 is attached, the size of the detection target part 8 corresponds to the size of the opening 6, so the size of the opening 6 is set to the size of the electric field power hole 4. By making various changes within a smaller range, the size of the detection target portion 8 can be changed accordingly.
しやへい板７は、第１図に示すように、開口部６を１個
だけ設けたものを、器体１に着脱自在としても良いし、
あるいは第３図に示すように、大きさの異なる開口部６
を複数、導電性の長尺部材１１に設け、これを器体１に
着脱自在な構成としても良い。As shown in FIG. 1, the shield plate 7 may be provided with only one opening 6 and may be detachably attached to the container body 1.
Alternatively, as shown in FIG. 3, openings 6 of different sizes
A plurality of conductive elongated members 11 may be provided with a structure in which the conductive elongated members 11 are detachably attached to the container body 1.
（発明の効果）
以上のように、本発明の機構は、開口部を設けた導電性
じゃへい板を器体に取り付けるだけという極めて簡単な
手段で、検知対象部を所望の大きさに絞り込めるので、
検知対象部の大きさごとにプローブを用意する必要がな
く、したがって表面電位計全体のコストを低減し得ると
いう効果がある。(Effects of the Invention) As described above, the mechanism of the present invention can narrow down the area to be detected to a desired size by simply attaching a conductive baffle plate with an opening to the device body. So,
There is no need to prepare a probe for each size of the detection target portion, which has the effect of reducing the overall cost of the surface electrometer.
第１図〜第３図は本発明の実施例に対応するもので、第
１図（ａ）は模式的全体斜視図、（ｂ）は要部の模式的
縦断面図、第２図は作用説明的縦断面図、第３図は池実
施例の模式的斜視図、第４図は従来例の説明的縦断面図
である。
符号１・・・導電性器体、２・・・表面電位センサ、３
・・・検知部、４・・・電界入力孔、５・・・表面電位
測定用プローブ、６・・・開口部、７・・・導電性じゃ
へい板、８・・・検知対象部、９・・・測定対象物、１
０・・・ねじ、１１・・・長尺部材、１２・・・前置増
幅器、１３・・・表面電位計本体、
１４・・・電界。
第２図
（α）
図
第３図1 to 3 correspond to embodiments of the present invention, in which FIG. 1(a) is a schematic overall perspective view, FIG. 2(b) is a schematic vertical sectional view of main parts, and FIG. 2 is an operational example. FIG. 3 is a schematic perspective view of the pond embodiment, and FIG. 4 is an explanatory longitudinal sectional view of the conventional example. Code 1... Conductive organ body, 2... Surface potential sensor, 3
...Detection part, 4...Electric field input hole, 5...Surface potential measurement probe, 6...Opening part, 7...Conductive baffle plate, 8...Detection target part, 9 ...Measurement object, 1
0... Screw, 11... Long member, 12... Preamplifier, 13... Surface electrometer body, 14... Electric field. Figure 2 (α) Figure 3
Claims (1)
の検知部に対向する前記器体の部分には電界入力孔を設
けた表面電位測定用プローブにおいて、前記電界入力孔
よりも小さな開口部を有する導電性しやへい板を、該開
口部が前記電界入力孔を狭ばめるように、前記器体に着
脱自在に構成したことを特徴とする前記表面電位測定用
プローブにおける電界入力絞り機構。A surface potential measuring probe in which a surface potential sensor is installed inside a conductive body and an electric field input hole is provided in a part of the body facing a detection part of the sensor, wherein the opening is smaller than the electric field input hole. An electric field input aperture in the surface potential measurement probe, characterized in that a conductive shield plate having a conductive shield plate is configured to be detachably attached to the vessel body so that the opening narrows the electric field input hole. mechanism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25540388A JPH02102464A (en) | 1988-10-11 | 1988-10-11 | Electric field input stop mechanism for probe for surface potential measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25540388A JPH02102464A (en) | 1988-10-11 | 1988-10-11 | Electric field input stop mechanism for probe for surface potential measurement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02102464A true JPH02102464A (en) | 1990-04-16 |
Family
ID=17278282
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP25540388A Pending JPH02102464A (en) | 1988-10-11 | 1988-10-11 | Electric field input stop mechanism for probe for surface potential measurement |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02102464A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07260478A (en) * | 1994-03-24 | 1995-10-13 | Asahi Seimitsu Kk | Survey machine |
| JP2010223934A (en) * | 2009-02-27 | 2010-10-07 | Fujitsu Ltd | Electric field sensing probe, method of detecting electric field, and method of manufacturing circuit board |
-
1988
- 1988-10-11 JP JP25540388A patent/JPH02102464A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07260478A (en) * | 1994-03-24 | 1995-10-13 | Asahi Seimitsu Kk | Survey machine |
| JP2010223934A (en) * | 2009-02-27 | 2010-10-07 | Fujitsu Ltd | Electric field sensing probe, method of detecting electric field, and method of manufacturing circuit board |
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