JPH0195738U - - Google Patents

Info

Publication number
JPH0195738U
JPH0195738U JP19236987U JP19236987U JPH0195738U JP H0195738 U JPH0195738 U JP H0195738U JP 19236987 U JP19236987 U JP 19236987U JP 19236987 U JP19236987 U JP 19236987U JP H0195738 U JPH0195738 U JP H0195738U
Authority
JP
Japan
Prior art keywords
probes
semiconductor device
device elements
wafer
semiconductor wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19236987U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19236987U priority Critical patent/JPH0195738U/ja
Publication of JPH0195738U publication Critical patent/JPH0195738U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP19236987U 1987-12-17 1987-12-17 Pending JPH0195738U (un)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19236987U JPH0195738U (un) 1987-12-17 1987-12-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19236987U JPH0195738U (un) 1987-12-17 1987-12-17

Publications (1)

Publication Number Publication Date
JPH0195738U true JPH0195738U (un) 1989-06-26

Family

ID=31483231

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19236987U Pending JPH0195738U (un) 1987-12-17 1987-12-17

Country Status (1)

Country Link
JP (1) JPH0195738U (un)

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