JPH0192644A - Detecting device for surface state - Google Patents

Detecting device for surface state

Info

Publication number
JPH0192644A
JPH0192644A JP25042787A JP25042787A JPH0192644A JP H0192644 A JPH0192644 A JP H0192644A JP 25042787 A JP25042787 A JP 25042787A JP 25042787 A JP25042787 A JP 25042787A JP H0192644 A JPH0192644 A JP H0192644A
Authority
JP
Japan
Prior art keywords
bright spot
spot position
defect
signal
light beams
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP25042787A
Other languages
Japanese (ja)
Inventor
Yasuhide Nakai
康秀 中井
Yoshiro Nishimoto
善郎 西元
Yasushi Yoneda
米田 康司
Akio Arai
明男 新井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP25042787A priority Critical patent/JPH0192644A/en
Publication of JPH0192644A publication Critical patent/JPH0192644A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To remove vibration components and to extract only a component of variation due to a defect by comparing bright point position signals of two kinds of light beams which differ in beam diameter and generating their difference signal. CONSTITUTION:The surface of an object is irradiated with the two kinds of light beams which differ in beam diameter by laser beam irradiating devices 2 and 6 and 1st and 2nd bright point position detectors 5 and 8 detect their reflected light beams. A comparator 9 compares the bright point position signals I1 and I2 from two bright position detectors 5 and 8 with each other and outputs the signal I3 generated by removing their in-phase components. This signal I1 contains both a defect component and a vibration component. The bright point position signal I2, on the other hand, contains only the vibration component. The output signal I3 of the comparator 9 contains only the defect component.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、表面状態検出装置に関し、特に、ビデオディ
スク、磁気ディスク、ミラー、ウェハー等の表面欠陥の
検出装置として有用である。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a surface condition detection device, and is particularly useful as a surface defect detection device for video disks, magnetic disks, mirrors, wafers, and the like.

〔従来の技術〕[Conventional technology]

従来の表面状態検出装置として、ビデオディスク表面欠
陥検出装置の一例を第3図および第4図を参照して説明
する。
As a conventional surface condition detection device, an example of a video disc surface defect detection device will be described with reference to FIGS. 3 and 4.

この表面欠陥検出装置51は、ビデオディスクDの表面
に欠陥dがあるか否かを検出するもので、検出しようと
する欠陥dの大きさよりも小さいビーム径のレーザービ
ームAをビデオディスクDの表面に向けて照射するレー
ザービーム照射装置2と、ビームスプリッタ3と、レン
ズ4と、ビデオディスクDからの反射ビームaを受光し
その輝点位置の変化に応じた信号を出力する輝点位置検
出器5と、フィルタ52とを具備して構成されている。
This surface defect detection device 51 detects whether or not there is a defect d on the surface of the video disc D.The surface defect detection device 51 detects whether or not there is a defect d on the surface of the video disc D. a laser beam irradiation device 2 that irradiates toward the target, a beam splitter 3, a lens 4, and a bright spot position detector that receives the reflected beam a from the video disc D and outputs a signal corresponding to a change in the bright spot position. 5 and a filter 52.

10は検査台である。10 is an examination table.

レーザービームAでビデオディスクDの表面を走査して
いくと、欠陥dのある位置とない位置とでは反射ビーム
aの角度が異なるため、欠陥dの存在を輝点位置の変化
として検出することが出来る。
When the surface of the video disc D is scanned with the laser beam A, the angle of the reflected beam a differs between the position where the defect d is present and the position where there is no defect, so the presence of the defect d cannot be detected as a change in the position of the bright spot. I can do it.

ところが、装置51とビデオディスクDの相対振動によ
っても輝点位置が変化するので、輝点位置検出器5の出
力信号■、は、欠陥dの存在による変化分と振動による
変化分の両方を含んだものとなる。かかる輝点位置信号
1.を第4図に例示する。
However, since the bright spot position also changes due to the relative vibration between the device 51 and the video disc D, the output signal (2) of the bright spot position detector 5 includes both the change due to the presence of the defect d and the change due to the vibration. It becomes something. Such a bright spot position signal 1. is illustrated in FIG.

そこで、欠陥dの存在による変化分だけを取り出すため
、フィルタ52を用いて振動成分を除去している。
Therefore, in order to extract only the change due to the presence of the defect d, the filter 52 is used to remove the vibration component.

また、検査台10として除振台を採用し、振動を抑制す
ることも行われている。
Furthermore, a vibration isolation table is used as the inspection table 10 to suppress vibration.

他の従来技術としては、特開昭60−69539号公報
に開示の表面欠陥検査装置がある。
Another conventional technique is a surface defect inspection device disclosed in Japanese Patent Application Laid-Open No. 60-69539.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上記従来装置51におけるようにフィルタ52を用いて
も、輝点位置信号I、の変化の欠陥成分と振動成分とが
同位相、同周期あるいはそれに近い場合には、振動成分
だけを選択的に除去することが出来ない問題点がある。
Even if the filter 52 is used as in the conventional device 51, if the defect component and the vibration component of the change in the bright spot position signal I are in the same phase, the same period, or close to it, only the vibration component is selectively removed. There is a problem that it cannot be done.

また、除振台を用いる場合、振動を十分に抑制するには
高性能のものが必要で、装置が複雑になる問題点がある
Furthermore, when using a vibration isolation table, a high-performance one is required to sufficiently suppress vibrations, which poses the problem of complicating the device.

従って、本発明の目的とするところは、上記フィルタや
除振台とは異なる手段によって振動の影響を除去できる
ようにした表面状態検出装置を提供することにある。
Therefore, it is an object of the present invention to provide a surface state detection device that can eliminate the effects of vibration by means different from the filters and vibration isolation tables described above.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の表面状態検出装置は、対象物の表面にビーム径
の異なる2N類の光ビームを同時に照射する異径ビーム
同時照射手段と、前記2種類の光ビームの反射ビームを
受光し各反射ビームの輝点・ 位置の変化に応じた信号
を出力する輝点位置検出手段と、前記各敗者ビームの輝
点位置信号を相互に比較して差信号を出力する比較手段
とを具備してなることを構成上の特徴とするものである
The surface condition detection device of the present invention includes a different diameter beam simultaneous irradiation means for simultaneously irradiating the surface of an object with 2N light beams having different beam diameters, and a means for receiving reflected beams of the two types of light beams, and each of the reflected beams. bright spot position detection means for outputting a signal according to a change in the bright spot/position of the loser beam, and comparison means for comparing the bright spot position signals of each of the loser beams with each other and outputting a difference signal. is a structural feature.

上記構成において、2種類の光ビームの一方のビーム径
は、例えば、検出しようとする欠陥の大きさよりも小さ
い径とし、他方のビーム径は欠陥の大きさよりも大きい
径とするのが好ましい。
In the above configuration, it is preferable that the diameter of one of the two types of light beams be smaller than the size of the defect to be detected, and the diameter of the other beam be larger than the size of the defect.

〔作用〕[Effect]

例えばビデオディスクの表面の欠陥を検出する時、反射
ビームの輝点位置が欠陥の影響により変化する大きさは
、ビーム径により異なる。これに対し、振動の影響によ
り変化する大きさは、ビーム径によらず一定である。
For example, when detecting a defect on the surface of a video disc, the extent to which the bright spot position of the reflected beam changes due to the influence of the defect varies depending on the beam diameter. On the other hand, the magnitude of change due to the influence of vibration is constant regardless of the beam diameter.

従って、ビーム径の異なる2種類の光ビームの輝点位置
信号を比較して差信号をとれば、振動成分を除去し、欠
陥による変化の成分だけを抽出することが可能となる。
Therefore, by comparing the bright spot position signals of two types of light beams with different beam diameters and obtaining a difference signal, it is possible to remove the vibration component and extract only the component of change due to the defect.

〔実施例〕〔Example〕

以下、図に示す実施例に基づいて本発明を更に詳しく説
明する。ここに第1図は本発明の表面状態検出装置の一
実施例のビデオディスク表面欠陥検出装置の構成概念図
、第2図(al、 (b)、 (C1は第1図に示す実
施例装置の各信号波形図である。なお、図に示す実施例
により本発明が限定されるものではない。
Hereinafter, the present invention will be explained in more detail based on embodiments shown in the drawings. Here, FIG. 1 is a conceptual diagram of the configuration of a video disc surface defect detection device which is an embodiment of the surface condition detection device of the present invention, and FIGS. 2 is a diagram of each signal waveform. Note that the present invention is not limited to the embodiment shown in the figure.

第1図に示すビデオディスク表面欠陥検出装置1におい
て、レーザービーム照射装置2.ビームスプリッタ3.
レンズ4および輝点位置検出器5は、第3図を参照して
説明した従来装置における構成と同様の構成であり、同
じ参照番号を付している。
In the video disk surface defect detection device 1 shown in FIG. 1, a laser beam irradiation device 2. Beam splitter 3.
The lens 4 and the bright spot position detector 5 have the same configuration as the conventional device described with reference to FIG. 3, and are given the same reference numerals.

輝点位置検出器5の出力信号■1は、比較器9に入力さ
れている。
The output signal (1) of the bright spot position detector 5 is input to the comparator 9.

また、第2のレーザービーム照射装置6が設けられ、前
記第1のレーザービーム照射装置2による第1のレーザ
ービームSと区別するための異なる角度から第2のレー
ザービームBをビデオディスクDの表面に照射している
Further, a second laser beam irradiation device 6 is provided, and a second laser beam B is emitted onto the surface of the video disc D from a different angle to distinguish it from the first laser beam S emitted by the first laser beam irradiation device 2. is irradiated.

第2のレーザービームBのビーム径は、検出しようとす
る欠陥dの大きさよりも大きく、通常は、第1のレーザ
ービームAのビーム径より1桁オーダの大きい値にされ
ている。
The beam diameter of the second laser beam B is larger than the size of the defect d to be detected, and is usually one order of magnitude larger than the beam diameter of the first laser beam A.

第2のレーザービームBの反射ビームbは、レンズ7で
集束されて、第2の輝点位置検出器8に受光されている
The reflected beam b of the second laser beam B is focused by a lens 7 and is received by a second bright spot position detector 8 .

第2の輝点位置検出器8は、反射ビームbの輝点位置の
変化に応じた信号■2を前記比較器9に入力している。
The second bright spot position detector 8 inputs a signal 2 corresponding to a change in the bright spot position of the reflected beam b to the comparator 9.

比較器9は、2つの輝点位置検出器5.8からの輝点位
置信号■I+T2を比較し、同相成分を除去した信号I
3を出力している。
The comparator 9 compares the bright spot position signals I+T2 from the two bright spot position detectors 5.8 and generates a signal I with the in-phase component removed.
3 is output.

さて、レーザービームAとBによってビデオディスクD
の表面を走査すると、輝点位置検出器5による出力信号
■1は例えば第2図(alに示すようになる。この信号
■、は、欠陥成分と振動成分の両方を含んでいる。一方
、輝点位置検出器8の出力する輝点位置信号I2は例え
ば第2図(alに示すようになる。この信号■2は、検
出しようとする欠陥dの大きさよりも十分大きいために
欠陥dの存否の影響をほとんど受けず、振動成分だけを
含んだものとなる。そして、レーザービームAとBとは
ビデオディスクDの同位置に同時に照射されるので、輝
点位置信号IIとI2に含まれる振動成分は、同位相と
なる。
Now, by laser beams A and B, video disc D is
When scanning the surface of , the output signal 1 from the bright spot position detector 5 becomes as shown in FIG. The bright spot position signal I2 output from the bright spot position detector 8 is, for example, as shown in FIG. It is almost unaffected by the presence or absence of light and contains only vibration components.And since laser beams A and B are simultaneously irradiated to the same position on video disc D, they are included in bright spot position signals II and I2. The vibration components are in phase.

そこで、比較器9において両輝点位置信号■1゜I2か
ら同相成分を除去すれば、第2図(C)に示すように、
欠陥成分だけを含む信号■、が得られることとなる。か
くして、輝点位置信号IIに含まれる欠陥成分と振動成
分の信号が同位相、同周期でも問題なく振動成分だけを
選択的に除去することが出来る。
Therefore, if the in-phase component is removed from both bright spot position signals ■1°I2 in the comparator 9, as shown in FIG. 2(C),
A signal (2) containing only defective components is obtained. In this way, even if the defect component and vibration component signals included in the bright spot position signal II have the same phase and the same period, only the vibration component can be selectively removed without any problem.

他の実施例としては、前記ビーム径の大きなレーザービ
ームBに変えて、ビーム径が細く且つ互いに平行な複数
本のレーザービーム群を照射するものが挙げられる。こ
れは実質的にビーム径を大きくしたのを等価だからであ
る。
In another embodiment, instead of the laser beam B having a large beam diameter, a group of multiple laser beams having a narrow beam diameter and parallel to each other is irradiated. This is because this is essentially equivalent to increasing the beam diameter.

また、第1図では第1のレーザービームAを垂直に照射
し、第2のレーザービームBを斜めから照射しているが
、第1のレーザービームAを斜めに、第2のレーザービ
ームBを垂直に照射しても良い。
In addition, in Figure 1, the first laser beam A is irradiated vertically and the second laser beam B is irradiated obliquely, but the first laser beam A is irradiated obliquely and the second laser beam B is irradiated obliquely. It may also be irradiated vertically.

また、照射角度以外の方法(例えば2つの光ビームの波
長を変える等の方法)により両光ビームを区別すること
が出来れば、2つの光ビームの照射角度を同一にしても
良い。
Furthermore, if the two light beams can be distinguished by a method other than the irradiation angle (for example, by changing the wavelengths of the two light beams), the irradiation angles of the two light beams may be made the same.

更に、輝点位置検出器5,8の受光面の大きさが、反射
ビームa、bの変化範囲より十分大きいと条件下では、
レンズ4.7を省略しても良い。
Furthermore, under the condition that the size of the light receiving surface of the bright spot position detectors 5 and 8 is sufficiently larger than the variation range of the reflected beams a and b,
Lens 4.7 may be omitted.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、対象物の表面にビーム径の異なる2M
類の光ビームを同時に照射する異径ビーム同時照射手段
と、前記2種類の光ビームの反射ビームを受光し各反射
ビームの輝点位置の変化に応じた信号を出力する輝点位
置検出手段と、前記各反射ビームの輝点位置信号を相互
に比較して差信号を出力する比較手段とを具備してなる
ことを特徴とする表面状態検出装置が提供され、これに
より対象物との間の相対振動の影響を除去することが出
来るので、好適に対象物の表面状態を検出できるように
なる。従って、微小な凹凸の検出も可能となり、更に、
相対振動を抑制するための高性能の除振台も必要としな
くなる。
According to the present invention, 2M beams with different diameters are placed on the surface of the object.
different diameter beam simultaneous irradiation means for simultaneously irradiating different diameter light beams, and bright spot position detection means for receiving the reflected beams of the two types of light beams and outputting a signal according to a change in the bright spot position of each reflected beam. , a comparing means for comparing the bright spot position signals of the respective reflected beams with each other and outputting a difference signal. Since the influence of relative vibrations can be removed, the surface condition of the object can be suitably detected. Therefore, it is possible to detect minute irregularities, and furthermore,
There is also no need for a high-performance vibration isolation table to suppress relative vibrations.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の表面状態検出装置の一実施例のビデオ
ディスク表面欠陥検出装置の構成概念図、第2図(al
、 (bl、 (C1は第1図に示す実施例装置の各信
号波形図、第3図は従来のビデオディスク表面欠陥検出
装置の構成概念図、第4図(al、 (blは第3図に
示す従来装置の各信号波形図である。 〔符号の説明〕 ■・・・ビデオディスク表面欠陥検出装置2・・・第1
のレーザービーム照射装置5・・・第1の輝点位置検出
装置 6・・・第2のレーザービーム照射装置8・・・第2の
輝点位置検出器 9・・・比較器 A・・・第1のレーザービーム B・・・第2のレーザービーム D・・・ビデオディスク d・・・欠陥。
FIG. 1 is a conceptual diagram of the configuration of a video disk surface defect detection device which is an embodiment of the surface condition detection device of the present invention, and FIG. 2 (al.
, (bl, (C1 is a diagram of each signal waveform of the embodiment device shown in FIG. 1, FIG. 3 is a conceptual diagram of the configuration of a conventional video disc surface defect detection device, 2 is a diagram of each signal waveform of the conventional device shown in FIG.
Laser beam irradiation device 5...First bright spot position detection device 6...Second laser beam irradiation device 8...Second bright spot position detector 9...Comparator A... First laser beam B...Second laser beam D...Video disc d...Defect.

Claims (1)

【特許請求の範囲】[Claims] 1、対象物の表面にビーム径の異なる2種類の光ビーム
を同時に照射する異径ビーム同時照射手段と、前記2種
類の光ビームの反射ビームを受光し各反射ビームの輝点
位置の変化に応じた信号を出力する輝点位置検出手段と
、前記各反射ビームの輝点位置信号を相互に比較して差
信号を出力する比較手段とを具備してなることを特徴と
する表面状態検出装置。
1. Different-diameter beam simultaneous irradiation means for simultaneously irradiating two types of light beams with different beam diameters onto the surface of an object, and a means for receiving reflected beams of the two types of light beams and changing the bright spot position of each reflected beam. A surface condition detection device comprising: bright spot position detection means for outputting a corresponding signal; and comparing means for comparing bright spot position signals of the respective reflected beams with each other and outputting a difference signal. .
JP25042787A 1987-10-02 1987-10-02 Detecting device for surface state Pending JPH0192644A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25042787A JPH0192644A (en) 1987-10-02 1987-10-02 Detecting device for surface state

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25042787A JPH0192644A (en) 1987-10-02 1987-10-02 Detecting device for surface state

Publications (1)

Publication Number Publication Date
JPH0192644A true JPH0192644A (en) 1989-04-11

Family

ID=17207724

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25042787A Pending JPH0192644A (en) 1987-10-02 1987-10-02 Detecting device for surface state

Country Status (1)

Country Link
JP (1) JPH0192644A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5979567B1 (en) * 2015-04-30 2016-08-24 パナソニックIpマネジメント株式会社 Plant stress detection apparatus and plant stress detection method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5979567B1 (en) * 2015-04-30 2016-08-24 パナソニックIpマネジメント株式会社 Plant stress detection apparatus and plant stress detection method
WO2016174803A1 (en) * 2015-04-30 2016-11-03 パナソニックIpマネジメント株式会社 Device for detecting plant stress and method for detecting plant stress

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