JPH0178906U - - Google Patents
Info
- Publication number
- JPH0178906U JPH0178906U JP1987176269U JP17626987U JPH0178906U JP H0178906 U JPH0178906 U JP H0178906U JP 1987176269 U JP1987176269 U JP 1987176269U JP 17626987 U JP17626987 U JP 17626987U JP H0178906 U JPH0178906 U JP H0178906U
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- probe
- contact
- waveform shaping
- vibrator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 10
- 238000001514 detection method Methods 0.000 claims description 8
- 238000007493 shaping process Methods 0.000 claims description 5
- 230000010355 oscillation Effects 0.000 claims description 2
- 230000007423 decrease Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 230000003321 amplification Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
Landscapes
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
Description
第１図は本考案の一実施例を示すプローブの断
面図、第２図は検知回路を示すブロツク図、第３
図および第４図は原理図、第５図は従来のタツチ
信号プローブの原理を示す図である。
１１……本体としてのプローブケース、１３…
…測定子、１４……測定子軸、１５……鍔部、１
６……接触子、１８……振動子、２１……検知手
段としての検知回路、２２……発振回路、２３…
…増幅回路、２４……検波回路、２５……波形整
形回路、２７……記憶回路、２８……比較回路。
Fig. 1 is a sectional view of a probe showing one embodiment of the present invention, Fig. 2 is a block diagram showing a detection circuit, and Fig. 3 is a cross-sectional view of a probe showing an embodiment of the present invention.
4 and 4 are principle diagrams, and FIG. 5 is a diagram showing the principle of a conventional touch signal probe. 11...Probe case as main body, 13...
...Measuring element, 14... Measuring element axis, 15... Flange, 1
6... Contactor, 18... Vibrator, 21... Detection circuit as detection means, 22... Oscillation circuit, 23...
...Amplification circuit, 24...Detection circuit, 25...Waveform shaping circuit, 27...Memory circuit, 28...Comparison circuit.
Claims (1)
、 この本体に基端部が固定されかつ先端部に被測
定物に当接する接触子を有する測定子と、 前記本体に前記測定子の基端部に対して所定圧
力で当接する状態で固定されるとともに、電圧が
印加された際超音波振動を行う振動子と、 この振動子に電圧を印加して前記測定子内に超
音波を発信させるとともに、この超音波の反射波
を電気信号として受信し、その受信した信号の変
化から前記測定子と被測定物との接触を検知する
検知手段と、 を具備したことを特徴とするタツチ信号プローブ
。 (2) 実用新案登録請求の範囲第１項において、
前記検知手段は、前記振動子に電圧を印加する発
振回路と、前記振動子によつて変換された反射波
信号を検波する検波回路と、この検波回路からの
信号を波形整形する波形整形回路と、前記測定子
が非接触状態における前記波形整形回路からの出
力を記憶する記憶回路と、この記憶回路の値と前
記測定子が被測定物に接した状態における前記波
形整形回路からの出力とを比較し、記憶回路の値
に対して前記波形整形回路の出力が所定レベルま
で低下したときタツチ信号を発する比較回路と、
から構成されていることを特徴とするタツチ信号
プローブ。[Claims for Utility Model Registration] (1) A main body that is attached to a movable member of a measuring device, a measuring element whose base end is fixed to the main body and whose distal end has a contact element that comes into contact with the object to be measured; A vibrator is fixed to the main body so as to be in contact with the proximal end of the measuring element under a predetermined pressure, and generates ultrasonic vibration when a voltage is applied; Detection means for transmitting ultrasonic waves into the probe, receiving reflected waves of the ultrasonic waves as electrical signals, and detecting contact between the probe and the object to be measured from changes in the received signals. A touch signal probe characterized by: (2) In paragraph 1 of the claims for utility model registration,
The detection means includes an oscillation circuit that applies a voltage to the vibrator, a detection circuit that detects a reflected wave signal converted by the vibrator, and a waveform shaping circuit that shapes the signal from the detection circuit. , a memory circuit that stores the output from the waveform shaping circuit when the probe is in a non-contact state; and a memory circuit that stores the value of this memory circuit and the output from the waveform shaping circuit when the probe is in contact with the object to be measured. a comparison circuit that compares and issues a touch signal when the output of the waveform shaping circuit decreases to a predetermined level with respect to the value of the storage circuit;
A touch signal probe comprising:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987176269U JPH0178906U (en) | 1987-11-17 | 1987-11-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987176269U JPH0178906U (en) | 1987-11-17 | 1987-11-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0178906U true JPH0178906U (en) | 1989-05-26 |
Family
ID=31468011
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987176269U Pending JPH0178906U (en) | 1987-11-17 | 1987-11-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0178906U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017531795A (en) * | 2014-09-29 | 2017-10-26 | レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ | Measuring probe |
-
1987
- 1987-11-17 JP JP1987176269U patent/JPH0178906U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017531795A (en) * | 2014-09-29 | 2017-10-26 | レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ | Measuring probe |
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